Radar Test
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Product
Automotive Radar Test Solutions
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Analyze and generate automotive radar signals across the full frequency range for 24 GHz, 77 GHz, and 79 GHz radar with scalable analysis bandwidth from 2.5 GHz to > 5 GHz
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Product
Radar Power Bus Simulation
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AMETEK Programmable Power, Inc.
Provides sequenced programmable power to a phased array radar test facility
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Product
Automotive Radar Test ∙ Evaluation
XRE
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KEYCOM develops and manufactures various radar systems to measure and evaluate such functionalities of mass-produced millimeter and microwave radars including in-vehicle radars as transmission power, frequency, antenna beam alignment, distance accuracy, bearing accuracy and receiving accuracy. KEYCOM’s product line includes the Radar Test System (RTS) that measures radar distance accuracy and transmission power, and the Rader Alignment System (RAS) that assists you to adjust the mounting position of the in-vehicle radar.
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Product
Radar Target Simulator
E8707A
Simulator
Rapid developments in the autonomous vehicle and demand for greater safety features is fueling the need for more sensitive and accurate automotive radar technology being deployed in advanced driver assistance systems (ADAS). With its rich expertise in radar test technology, Keysight now offers the E8707A radar target simulator to help automotive electronics manufacturers confidently simulate radar targets in various realistic scenarios.
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Product
Monolithic Microwave Integrated Circuit (MMIC) Amplifiers & Switches
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Microsemi's portfolio of MMIC products targets a broad range of applications including those in electronic warfare, radars, instrumentation (test and measurement) and microwave communications. The portfolio comprises broadband amplifiers (both power and low-noise), amplifier modules, prescalers, attenuators and switches spanning DC to 65GHz based on high-performance process technologies. Microsemi offers 18 distributed amplifier products including industry-leading DC-65GHz MMICs. Microsemi's prescalers combine higher frequency operation, the flexibility to divide by a large number of ratios and very good residual phase noise.
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Product
NI PXIe Based Platform for Radar/EW Test
BAT
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• NI PXIe Based Platform for Radar/EW Test- Leverages a Variety of NI FPGAs/VSTs/Upconverters up to 44GHz- LabVIEWTM and LabVIEWTM FPGA Software Environment• Provides PDW to IQ Generation• Multi-Emitter System- Faster Simulation Setup- More Complex Scenario Testing- Ease of Changing Scenarios• Supports Multiple PDW Formats- Simple, Built-In PDW Format- Industry Standard PDW Formats (e.g., NEWEG)- Custom PDW Formats• PDW Data Accessible via Stored Files, or Live Streaming• Factory to Field Deployable
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Product
Antenna Test Chamber for Automotive Radar
ATS1500C
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The R&S®ATS1500C radar test chamber is a compact antenna test range (CATR), consisting of a gold-plated parabolic reflector and a two-axis positioner for 3D movements of the radar module. Combined with the R&S®AREG800A target simulator and other Rohde & Schwarz test and measuring instruments, it can be used for a variety of applications, including antenna characterization, module calibration, RF performance validation, interference testing or in-band compliance testing. The chamber is equipped with a universal feed antenna which gives access to both polarizations in parallel. Automated temperature testing over the range of -40 to 85°C is possible with an optional enclosure.
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Product
PXIe-5668, Up to 26.5 GHz PXI Vector Signal Analyzer
783156-02
Signal Module
Up to 26.5 GHz PXI Vector Signal Analyzer - The PXIe‑5668 offers wide bandwidth with high-performance measurement performance and speed. It meets the challenging requirements of applications such as wireless communications, radio frequency integrated circuit characterization, RADAR test, and spectrum monitoring and signal intelligence. With its implementation as a PXI instrument, the PXIe‑5668 also features the fast measurement speed required for high-volume manufacturing test, and multi-instrument synchronization capabilities for phase-coherent MIMO test. You can use the optionally included PXIe-5698 preamplifier to improve dynamic range and sensitivity near the instrument noise floor.
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Product
RADAR Stability Testing
PN9002
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Radar component and system testing usually evokes images of complex, expensive measurement systems occupying multiple equipment racks. In some cases, radar equipment designers have even used entire radar systems as a proving ground for their new components and modules. With the introduction of the PN9002 pulse-to-pulse radar stability test set from Noise eXtended Technologies , radar testing has become significantly less complex and costly. The modular PN9002 system provides outstanding dynamic range at frequencies from 2 to 18 GHz and optionally from 0.4 to 18 GHz.
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Product
PSG Analog Signal Generator, 100 kHz to 67 GHz
E8257D
Signal Generator
Address your toughest requirements with metrology-grade frequency & level accuracy with excellent distortion & spurious characteristicsTest high-power devices & overcome test system losses with 1 W output powerAddress the demanding needs of Doppler radar, ADC & receiver-blocking tests with the PSG's extremely low phase noiseCharacterize devices & circuits by adding AM, FM, PM & pulse modulation to your signalMeet test system needs up to 1.1 THz with frequency extender modules
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Product
Pulse Radar Reference Test Solution
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Compact Reference Solution with ADP7104, M8195A, WR15CCU, WR15CCD, N5183B combines commercial off-the-shelf COTS modular hardware and software from Guzik, Keysight Technologies, KJ Microwave and Virginia Diodes, which provides a flexible testbed for radar waveform generation and analysis. Generate and analyze pulse radar waveforms. Pre-correct waveforms for overall channel response. Supports many topologies for radar transmitter / receiver testing (IQ, IF, RF, microwave, millimeter-wave).
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Product
Testing Large Radar Sensors with CATR Technology
CATR Radar Test System UTP 5069
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Modern driver assistance systems must recognize increasingly complex traffic scenarios and convert them into appropriate vehicle reactions with the help of artificial intelligence (AI) and specific algorithms. Imaging radar sensors with a higher spatial resolution, so-called imaging radar sensors, are therefore required. These can better distinguish larger from smaller objects and, due to the larger antenna apertures, also require larger dimensions of the test environment or larger far-field distances. Testing these sensors in the direct far field ( UTP 5065 ) would therefore require very large absorber chambers up to ten meters in size and more.Our efficient test system UTP 5069 offers exactly the right solution:By using CATR technology (Compact Antenna Test Range), 4D, imaging and other radar sensors with large far-field distances are calibrated with high precision in a small footprint. With the extremely low-reflection NOFFZ absorber chamber, the system is very well suited not only for validation, but also for EOL tests.
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Product
Radar Altimieter Test Panel for ALT-50/55
TA-55
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Radar altimeter panel designed after the ALT-50A test fixture. (Ref. Fig. 5-1). Panel allows testing of the indicator or R/T independently or together. An internal power supply is provided to support stand alone testing of the indicator. This panel contains a 4 digit DVM and comes with enclosure. This panel will allow by the book testing.
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Product
FPGA Digital IO XMC
XF07-523
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Curtiss-Wright Defense Solutions
The XF07-523 is a rugged Kintex-7 FPGA based XMC with digital IO. The combination of direct high-speed I/O ports and FPGA processing makes the XF07-523 ideal for demanding applications including radar, imaging and test equipment across commercial and defense market spaces. The XMC form-factor is ideal to SWaP constrained platforms such as UAVs and fighter aircraft.
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Product
Wafer-Level Parametric Test
test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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Product
Automated Aerospace and Defense Test
test
Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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Product
Imperial Test Executive
ITE
test
The Imperial Test Executive (iTE) is a UI shell that sits on top of National Instruments TestStand. It provides a simple but elegant interface to execute your NI TestStand sequences. The iTE software was designed to allow general operators to execute ATE testing software without requiring any knowledge of NI TestStand. Training an operator to use this system typically takes less then 5-minutes.
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Product
NI Automated Test Software Suite
test
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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Product
Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
test
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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Product
Wireless Device Test
test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Product
Universal OTP Functional Test System for the Production of Level and Fluid Sensors
Functional Test
Multifunctional function tester with parallel test function based on the LXinstruments OTP2 system platform. The system is used for assembly, final test and calibration of liquid and level sensors for commercial vehicles, construction machinery and shipbuilding in a high mix / medium volume environment.
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Product
SoC Test Systems
Test System
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Product
Test Fixture, Axial And Radial
16047A
Test Fixture
The 16047A is designed for impedance evaluation of axial/radial lead type devices of up to 13MHz. The 16047A employs Kelvin contacts which realize a wide impedance measurement range. The contact tip can be changed according to the device shape.
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Product
Automated Compliance and Device Characterization Tests
N5990A
Test Platform
The Keysight N5990A test automation software platform is the most powerful tool for serial and multi-lane gigabit testing. It is the unique universal platform for testing a wide range of digital buses such as PCI Express, USB, HDMI or MIPI. The same graphical user interface and operating principles are used for all applications. This boosts productivity, especially when testing devices which support multiple digital buses. The N5990A can be tailored to your individual test needs with the flexible test sequenzer and controls all instruments needed for your tests. The configurable database interface of the N5990A test automation platform enables the convenient storage of all test results. A web interface allows an effective and easy operation. Custom calibration and test procedures can be implemented easily with User Programming.
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Product
Ethernet and Fibre Channel Test Platform
SierraNet M1288
Test Platform
The SierraNet M1288 Ethernet and Fibre Channel test platform provides best in class analysis, jamming and generation for traffic capture and manipulation for testing application and link characteristics. SierraNet M1288 is the latest in the line of industry leading test and measurement tools from Teledyne LeCroy, designed for today’s high-speed storage and communications fabrics. SierraNet M1288 supports examination and modification of Ethernet and Fibre Channel links utilizing both Pulse Amplitude Modulation 4 (PAM4) and legacy Non-Return to Zero (NRZ) technologies.
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Product
Standardize Production Test Software For PCBAs And Electronic Devices
test
The vast majority of test project man-hours are spent on software development, so the choices that teams make in software tools and architecture have significant impact on deployment schedules. Standardizing software across a team or organization increases both efficiency and proficiency, lowering the risk of missed deadlines and improving test quality and reliability. Test software must:
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Product
Portable, Integrated O-Level Test Platform
Guardian™
Test Platform
Guardian is a ruggedized automated testing platform that quickly and accurately verifies the operational readiness of complex electronics systems in aircraft, ships, and vehicles.
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Product
Battery Management (BMS) Environmental Test System
Test System
The BMS Environmental Test System is a configurable platform simulating the essential signals used by Battery Management Systems (BMS) and cell-monitoring modules with the ability to perform environmental testing on multiple BMS units simultaneously. The system implements single-point value testing to evaluate specific BMS functions such as cell over and under voltage scenarios, cell leakage current, lost communications, or faulty system IO.
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Product
VXI Digital Multiplier
4152A
Test System
The 4152A’s advanced features like limit testing, averaging, speed/resolution trade-offs, and fast function changes provide the high “test system” throughput required in today’s production test environments.
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Product
Image Sensor Test System
IP750
Test System
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
