Scanning Electron Microscopes
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopy, SEM
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Atomic Force Microscope
FlexAFM
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For success in research, scientists depend on professional tools that can readily provide the information needed, regardless of the tasks at hand.
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Product
End Face Inspection Microscopes
D SCOPE EFI – D SCOPE EFI-C – D SCOPE EFI-C LWD
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The new D Scope EFI for MTP/MPO and multifibers field connectors is a cost effective microscope for inspecting fiber optic patchcords and cassettes.
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NanoFluorescence Microscope
NFM
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The NFM is a specialized optical microscope system custom-designed for imaging individual single-walled carbon nanotubes (SWCNTs) through their intrinsic short-wave infrared fluorescence. It is ideal for SWCNT studies in physics, chemistry, biomedicine, and environmental research. The NFM is the new, more affordable replacement for our pioneering NM1 Fluorescence Microscope.
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Printed Electronics & Printed Sensors
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The first membrane switch was developed and produced in 1978 using printed electronics. Conductive pastes can now also be printed on substrates such as paper, textiles, or metal in addition to polyester. Our functional foils and printed electronics enable compact, and extremely efficient electronic products that are used in every industry. Processing intelligent pastes that have various physical properties enable the production of new and innovative applications in minimized form factors without the use of additional, highly complex electronic components.
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OEM Microscope Components for Integration
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The performance of your microscope optics directly affects the final quality of your products. Olympus OEM components seamlessly integrate into large systems to provide the exceptional optical quality you need to deliver a high-quality final product.
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Product
150~300W DC Electronic Loads
JT631 Series
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Nanjing Jartul Electronic Co., Ltd
JT631 series electronic load is functioned with 500KHz high-speed synchronous sampling, DSP technology, powerful dynamic test and multi-aspect intelligence analysis. All these are fully integrated into auotmatic test function, which makes JT631 series load very suitable for testing power supply when produced in large quantity. Besides, JT631 series load also possesses the features of current rising slew rate programmable, high-speed dynamic loading and programmable list function, which makes JT631 series load satisfing most of R&D requirements. Moreover, JT631 series load’s special parallel operation method can satisfy the synchronous loading requirements of multi-channels output power supply and satisfy single-channel output power supply requirement for big power.
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Test system for Electronic Device
PCB
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The main focus of the test system is validation and functional testing of electronic devices. The tests include electrical parameters and logical functions of the firmware. Device groups can be stimulated externally and output signals can be acquired by the test points on the board. Limits and ranges of the acquired signals can be monitored and stored for verification.
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Product
ELECTRONIC CIRCUIT TRACER
PPECT3000
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*Locate short and open circuits without having to remove plastic panels, molding and carpet*Traces shorts and open wires with visual navigation and sound indicators*Pinpoint shorts, open circuits, switches and breaks in wires
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Surgical Microscopes
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The surgical microscopes of Leica Microsystems are exactly geared to the requirements of microsurgery. A compact optical unit delivers clear and sharply focused images and the modular system gives the surgeon optimum maneuverability.
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Transmission Electron Microscope
TEM
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Atomic Resolution Electron Microscope offering a maximum accelerating voltage of 300 kV, and equipped with JEOL’s own Cs Correctors. This instrument guarantees an unprecedented STEM-HAADF image resolution of 63 pm.
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Product
Fabry-Perot Based Scanning Filter
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This new type Fabry-Perot Based Scanning Filter (FPSF) is based on Optoplex proprietary fiber optical Fabry-Perot Etalon technology. It offers F-P based scanning filter with central wavelength at 1060nm, 1310nm, 1550nm or other customized wavelength. It can be tuned manually or automatically by scanning over a wide spectral range from 10nm to 100nm with bandwidth from 0.05nm to 1.0nm. FPSF features less than 3dB insertion loss and as high as 1kHz scanning frequency. Its unique high reliability and low insertion loss design presents the most cost-effective solution for OEM application from telecommunication to fiber sensing interrogation.
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Product
Scanning Probe Microscopy
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SPECS Surface Nano Analysis GmbH
As Scanning Probe Microscopy (SPM) is a key tool for nanotechnology, SPECS offers dedicated solutions for highly demanding requirements.In UHV, strong emphasis lies on spectroscopic methods such as scanning tunneling spectroscopy and inelastic tunneling spectroscopy as well as single atom and molecule manipulation. With the invention of a Joule-Thomson cryostat by Prof. Wulf Wulfhekel, SPECS now offers the JT-STM , operating sample and sensors in thermal equilibrium below 1K with optional high magnetic field.
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Indicators - Electronic
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An electronic device used to read an input value from a measuring device and show a displayed value.
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Microscope Automation
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Prior Scientific is the world leader in microscope automation, microscope automated precision components and customized sub-assemblies. We offer a wide range of off-the-shelf components such as XY motorized stages, Z focus motors and translation stages, high-resolution microscope stage controllers and robotic slide loaders as well as high-intensity bright field and fluorescence illumination sources.
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Product
PXI Electronic Load Module
Load Module
PXI Electronic Load Module provides the electronic load capabilities of sinking DC power with high-accuracy measurements in a compact form factor optimized for design validation, characterization, and production test.
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Product
Wafer Cathodoluminescence Microscope
Säntis 300
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Attolight’s Quantitative CL-SEM offers “No Compromise” large field fast scanning simultaneous acquisition of SEM images, hyperspectral CL maps, and optical spectra. Smaller diameter wafers, or miscellaneously shaped substrates are manually loaded on intermediary 300mm susceptors subsequently handled automatically by the tool.
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Product
Power Electronic Boards Tester
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Power electronic boards play a vital role in transforming and delivering power to electronic devices. Every board component’s failure can represent a huge cost, often interrupting essential services such as electricity and telecommunications.While power electronic boards vary in complexity and size, they typically all include power devices such as inverters, power supplies, power drivers, or frequency converters combined with different technologies (digital boards, power boards, displays, …) that are often called to work in tough environments for many years.Testing power electronic boards has become indispensable to ensure the performance of the power components that often dictate the efficiency, safety, and reliability of the entire final product.
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Product
Precision Electronic Test Leads
34133A
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The Keysight 34133A precision electronic test leads are designed specifically for working with small components and dense circuit boards. Each kit includes two test leads (one red and one black).
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Electronic Production Measuring & Testing Instruments
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Wuhan Fanke Transformer Manufacture Co., LTD
Electronic Production Measuring & Testing Instruments
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Electronic Component Testing Services
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New Jersey Micro Electronic Testing, Inc.
NJMET is proud to provide procurement and testing services to the commercial, military, aerospace, industrial automotive and medical industries. We also provide custom engineering consultation services. NJMET Inc. is AS9100/ISO9001:2008 certified and has recently successfully completed of The Defense Logistic Agency’s (DLA) laboratory suitability assessment and is qualified to test federal stock classes (FSC) 5961 (Semiconductor Devices) and FSC 5962 (Microcircuits) to DLA’s QTSL test requirements.
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Electronic Crockmeter
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TESTEX Testing Equipment Systems Ltd.
Electronic Crockmeter, to determine the colour fastness of textiles to dry or wet rubbing. A pinned acrylic sample holder ensures rapid sample mounting and repeatability of results. Crockmeter Fitted with a pre-determined electronic counter for strokes up to 999,999 times.
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Inspection Microscope
Z-NIR
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The McBain Z-NIR Near Infrared Inspection System is best-in-class for wafer-to-wafer and die-to-die alignment measurement and verification. This unique tool has been sold into many industries with various applications including sub-surface wafer and die inspection for cracks and bond integrity, MEMS, wafer bonding, 3-D chip stacking, failure analysis, process development, tool verification, part characterization, environmental testing and more.
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Atomic Force Microscope
NX-Hivac
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Park NX-Hivac allows failure analysis engineers to improve the sensitivity of their measurements through high vacuum Scanning Spreading Resistance Microscopy (SSRM). Because high vacuum scanning offers greater accuracy, better repeatability, and less tip and sample damage than ambient or dry N2 conditions, users can measure a wide range of dope concentration and signal response in failure analysis applications.
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USB Line Scan Camera
Inexpensive
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Compact USB line scan camera with high sensitivity and resolutions from 2048 to 4096 pixels. The programming interfaces, including drivers, libraries and programming examples, enable the USB line camera to be integrated into your own application. The line scan camera is supported under the following operating systems:*Windows*Linux*Linux ARM 32Bit (Raspberry PI)*Linux ARM 64Bit (NanoPi M4 & NVIDIA Jetson Nano)
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Product
Advantage Xi Radar Scan Converter
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Curtiss-Wright Defense Solutions
The Advantage Xi radar scan converter is a half-size PCI card. Radar video arrives into the card through the PCI bus, which allows the card to be used in a client-server configuration with radar distributed over a network, or in conjunction with a radar interface card such as the Virgo PCI and Osiris PCI.
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Product
DC Electronic Load
3310G Series（75W~400W）
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Each 3310G Series module has its own control and display panel, CC / CR / CV / CP / Dynamic modes, plug in 3302G / 3305G / 3300G mainframe with 150 sets Store / Recall memory which provides load set-up more efficiently, also can be controlled via RS232、Ethernet、USB and GPIB interface.
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64-Channel Boundary-Scan Digital I/O Scan Module
JT 2111/MPV DIOS IDC
Digital I/O
The JT 2111/MPV is a 64 channel boundary-scan digital I/O scan module enclosed in an impact resistant housing. The module is designed to test and control edge connectors, on-board connectors and logic clusters in boundary-scan applications. Multiple modules can be connected serially to increase the number of I/Os. Available with 96-pin DIN 41612 connectors and 20-pin 0.1″ pitch IDC connectors.
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Electron Backscatter Diffraction (EBSD) Camera
Velocity™
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high-speed EBSD mapping with the highest indexing performance on real-world materials. Velocity™ EBSD camera combines indexing speeds greater than 3,000 indexed points per second with indexing success rates of 99% or better. At these speeds, the Velocity™ uses 120 x 120 pixel EBSD patterns for improved band detection. This image resolution, combined with proven EDAX triplet indexing routines, provides orientation precision values of less than 0.1°.
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Galvo-Resonant Scan Head and Controller
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Our LSK-GR08(/M) Galvo-Resonant Scanner contains one resonant scan mirror and one galvo scan mirror that deflect an incident laser beam in X and Y, respectively. Identical to the galvo-resonant scanner used in our Bergamo® II multiphoton microscopes and complete Cerna®-based confocal systems, the 8 kHz resonant frequency of the resonant scan mirror enables much higher-speed scans than a galvo-galvo system. In our Bergamo system, the scanner can achieve 30 fps at 512 x 512 pixels image resolution.
