High Voltage Test
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Product
Test System Optimized for High Volume Production Testing of Integrated Circuits
ETS-364 / ETS-600
Test System
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture. The test system offers separate floating resources for each site, improving site isolation and measurement accuracy coupled with digital instrumentation enabling the most efficient, high-volume testing available. The system supports up to 240 analog pin channels, and offers 133 MVPS digital vector rate with up to 128 digital pin channels. Eagle's scalability includes the ability to double the capacity of an ETS-364, providing more than 480 analog pin channels and up to 256 digital I/O pin channels with the ETS-600.
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Product
Flash Memory Test System
T5830
Test System
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
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Product
H(3)TRB & HTGB Test Systems
Test System
SET offers two H(3)TRB and HTGB product lines which differ in the number of test object channels and the range of technical possibilities. The innovative systems are scalable, modular and standardized.
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Product
Non-Signaling RF Test Platform for Validation & Production
Universal Wireless Tester
Test Platform
Wireless communication standards are increasingly integrated into vehicles as well as smart home and Internet-of-Things applications. They form the basis for connected services, advanced HMIs, and autonomous driving. The combination of constantly evolving standards and the integration of multiple wireless technologies with many RF channels into new product designs means that measurement speed and quality are becoming a priority.
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Product
Rack based antenna test system
R&S®ATS800R CATR
Test System
Very compact far-field over-the-air (OTA) test system based on compact antenna test range (CATR) technologyUnrivaled quiet zone size within 0.8 m2 footprintState-of-the-art reflector ensuring a high quiet zone accuracyUnique rack based CATR system supporting over 50 GHzIndirect far-field method (approved by 3GPP for 5G OTA testing)
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Product
SAS Protocol Test System
Sierra M124A
Test System
The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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Product
HTOL Test Systems
Test System
Our IOL & Power-Cycling systems increase measurement quality & throughput while simultaneously reducing the Total Cost of Test (TCoT) of an open platform. We focus on complete monitoring and precise temperature control for each device under test.
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Product
CC15010X, 10 MHz, 150 A Current Oscilloscope Probe
786849-01
High Current Probe
The CC15010X, or Hioki 3274, is a clamp-on current probe that offers a wide DC to 10 MHz bandwidth and 150 A of continuous input. It is ideal for capturing transient current signals from switching power supplies, inverters, and motor controllers. The probe requires an external power supply.
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Product
In-Circuit Test
TestStation LH
Test System
The TestStation LH in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne's popular, award winning TestStation product family. TestStation LH features SafeTest protection technologies for accurate, reliable, and safe testing of the latest low-voltage technologies.
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Product
Semiconductor Test Software
Test System
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Product
sbRIO-9223, Non-Enclosed, ±10 V, 1 MS/s, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module
785480-01
Voltage Input Module
Non-Enclosed, ±10 V, 1 MS/s, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module - The sbRIO-9223 performs differential analog input. This module is well suited for applications such as ballistics, impact, and blast wave testing. The sbRIO-92233 can sample at the maximum sample rate per channel while the module next to it samples at a much slower rate, which is ideal for mixed-measurement test systems. There are two connector options for the sbRIO-9223: a 10‑position screw terminal or a 25‑pin D‑SUB connector.
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Product
Magnetic Material Test Fixture
16454A
Test Fixture
The 16454A is designed for accurate permeability measurements of toroidal-shaped magnetic materials. Since the construction of this fixture creates one turn around the toroid (with no magnetic flux leakage), the need of winding a wire around the toroid is unnecessary. Complex permeability is calculated from the inductance with and without the toroid. When the E4991A/4291B with option 002 is used as the measurement instrument, direct readouts of complex permeability are possible. In addition, it is furnished with a small and a large fixture to adapt to a wide range of sizes.
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Product
OLED Lifetime Test System
58131
Test System
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Product
FD-11605, 8-Channel, ±60 V Voltage Input Device for FieldDAQ
786469-01
Voltage Input Module
The FD-11605 can measure up to eight channels with a voltage input range of ±60 V. It features 24-bit resolution with simultaneous sample rates up to 100 kS/s. The FD-11605 offers channel-to-channel isolation, which eliminates noise from ground loops and protects instrumentation circuitry from high-transient voltages of up to 1000 V. The FD-11605 has an ingress protection rating of IP65/IP67 (dust-tight and water-resistant),can operate in -40 °C to 85 °C environments, and can sustain 100 g shock and 10 g vibration. The FD-11605 incorporates Time Sensitive Networking (TSN) and features an integrated network switch and built-in power circuitry for simple daisy chaining. You program the FD-11605 with NI-DAQmx, which automatically synchronizes multiple FieldDAQ™ devices. The FD-11605 is ideal for test cell and outdoor environments.
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Product
400 MHz High Voltage Differential Probe
DP0001A
High Current Probe
The DP0001A is a 400 MHz high voltage differential probe with 2 kV mains isolated or 1 kV CAT III rating designed for making accurate high-voltage power measurements required for testing today’s WBG power devices, power converters or motor drives.
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Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
Test System
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Product
SoC/Analog Test System
3650-S2
Test System
The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
Automotive Test Platform
ETS-800
Test Platform
Next-Gen Automotive Test Platform With the Industry’s Highest Throughput and Fastest Time to Market
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Product
Scienlab Charging Discovery System (CDS) – High-Power Series
SL1047A
Battery Test Platform
The Scienlab Charging Discovery System – High-Power Series from Keysight enables you to test charging interfaces of electric vehicles (EVs) and EV supply equipment (EVSE) during high-power charging up to 1,500 V DC and ±600 A DC. With the CDS can perform all necessary conformance and interoperability tests according to worldwide charging standards. Our new solution, which features the separate Scienlab Cooling Unit with interchangeable liquid-cooled charging adapters, also enables a high-power upgrade of the SL1040A Scienlab Charging Discovery System - Portable Series.
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Product
Audio and Acoustic Functional Test Solution
Functional Test
With the growing popularity of Internet of Things devices worldwide, many electrical products are adopting voice commands as their user interface. This means that acoustic and audio test challenges are likely to impact more products than ever before. Test teams must meet extended test coverage requirements to ensure product quality while maintaining throughput and operational efficiency. For a solution to meet these sorts of demands, it must:
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Product
sbRIO-9264, Non-Enclosed, 25 kS/s/ch Simultaneous, ±10 V, 16-Channel C Series Voltage Output Module
781119-01
Voltage Output Module
Non-Enclosed, 25 kS/s/ch Simultaneous, ±10 V, 16-Channel C Series Voltage Output Module - The sbRIO‑9264 is a simultaneously updating analog output module that accommodates higher‑channel‑count systems. Higher density modules conserve chassis space, which leaves room for other measurement types. Each channel has its own digital‑to‑analog converter. The spring-terminal version of the sbRIO‑9264 uses a 36‑position connector for the output channels, and each channel has a ground connection. Non-enclosed modules are designed for OEM applications.
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Product
Desktop PCB Test System
BOARDWALKER 9627
Test System
Qmax Test Technologies Pvt. Ltd.
QT9627 is a cost effective entry level model Desktop PCB Test System. It can be configured to maximum 64 Channels of In-circuit Functional Test Channels and 64 Channels of QSM V-I Signature Test .Maximum Digital Test Speed 10MHz in the QT9627 .
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Product
Functional Test Fixtures
Test Fixture
Reliable connections to device under test (DUT) test points are essential for robust functional test. Bloomy provides rugged fixtures and cable sets (ITAs) built for thousands and thousands of cycles in manufacturing environments. With the industry’s best mass interconnects and internal electronic keying, our fixtures are easy to change out and are automatically recognized by the test system.
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Product
Standard 1.90 (53.90) - 8.00 (226.80) High Frequency Probe
CSP-40B-012
High Frequency Probe
Nominal Impedance (Ohms): 50Dielectric VTE Rating (k VAC): 1Bandwidth @ -1dB (GHz): 6.00Return Loss @ -20dB (GHz): 2.30Test Center (mil): 250Test Center (mm): 6.35Full Travel (mil): 200Full Travel (mm): 5.08Full Travel Remark: Shield: 275 (6.99) including travel of probesRecommended Travel (mil): 133Recommended Travel (mm): 3.38Recommended Travel Remark: Shield: 211 (5.36) including travel of probesOverall Length (mil): 1,151Overall Length (mm): 29.24
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Product
Dielectric Material Test Fixture
16453A
Test Fixture
The 16453A is designed for accurate dielectric constant and loss tangent measurements on the E4991A/4291A/B. It employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. The E4991A/4291A/B measures the capacitance created from the fixure, and option 002 firmware calculates the relative complex permittivity as described in the 16451B. Adjustment to insure parallel electrodes is required when using the 16451B. This adjustment is not required with the 16453A because the fixure has a flexible electrode that adjusts automatically to the material surface.
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Product
NI-9264, 25 kS/s/ch Simultaneous, ±10 V, 16-Channel C Series Voltage Output Module
780927-01
Voltage Output Module
25 kS/s/ch Simultaneous, ±10 V, 16-Channel C Series Voltage Output Module - The NI‑9264 is a simultaneously updating analog output module that accommodates higher‑channel‑count systems. Higher density modules conserve chassis space, which leaves room for other measurement types. Each channel has its own digital‑to‑analog converter. The spring-terminal version of the NI‑9264 uses a 36‑position connector for the output channels, and each channel has a ground connection.
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Product
FD-11601, 8-Channel, ±10 V Powered-Sensor Voltage Input Device for FieldDAQ
786374-01
Voltage Input Module
The FD-11601 measures up to eight channels with a voltage input range of ±10 V. Each input channel supports TEDS and provides 24 V DC to power external-powered sensors without additional power supplies. The FD-11601 features 24-bit resolution, simultaneous sample rates up to 100 kS/s/ch, and channel-to-channel isolation. It is IP65/IP67 rated to be dust-tight and water-submersible, operates in -40 °C to 85 °C environments, and can sustain 100 g shock and 10 g vibration. The FD-11601 incorporates Time Sensitive Networking (TSN) and features an integrated network switch and built-in power circuitry for simple daisy chaining. You program the FD-11601 with NI-DAQmx, which automatically synchronizes multiple FieldDAQ™ devices. The FD-11601 is ideal for test cell and outdoor environments.
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Product
In-Line RF Test Platform
AR925
Test Platform
This functional and RF test platform combines outstanding productivity with substantial equipment savings. The Faraday chamber of the fixture comes with an interchangeable cassette to minimize the testing cost of each new product
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Product
NI-9206, ±10 V, 250 kS/s, 16-Bit, 32-Channel, 60 VDC Isolation C Series Voltage Input Module
779526-01
Voltage Input Module
±10 V, 250 kS/s, 16-Bit, 32-Channel, 60 VDC Isolation C Series Voltage Input Module - The NI‑9206 performs differential analog input with four programmable input ranges. The module provides up to 600 VDC (400 VDC in Europe) channel‑to‑earth ground isolation, making the module ideal for accurately monitoring large fuel cell and battery stacks. By referencing the module common (COM) to the middle of the NI‑9206 bank, you can measure 16 consecutive cells and remain within 10 V of the module COM.
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Product
VLSI Test System
3380D
Test System
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
