High Voltage Test
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Product
Photonics Module Test System
58625
Test System
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
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Product
sbRIO-9222, Non-Enclosed, ±10 V, 500 kS/s/ch, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module
785479-01
Voltage Input Module
Non-Enclosed, ±10 V, 500 kS/s/ch, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module - The sbRIO‑9222 performs differential analog input. This module is well suited for applications such as ballistics, impact, and blast wave testing. The sbRIO‑9222 can sample at the maximum sample rate per channel while the module next to it samples at a much slower rate, which is ideal for mixed-measurement test systems. There are two connector options for the sbRIO‑9222: a 10‑position screw terminal or a 25‑pin D‑SUB connector.
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Product
PCI Express 3.0 Test Platform with SMBus Support
Test Platform
The Summit Z3-16 Test Platform with SMBus Support allows the Summit Z3-16 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen3, Gen2 or Gen1 hosts and devices. In addition, it supports the Summit Z3-16 with SMBus Support by providing SMBus tapping connectivity.
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Product
Photonics Wafer Probing Test System
58635
Test System
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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Product
Electronics Functional Test
Functional Test
Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
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Product
NI-9202, ±10 V, 10 kS/s, 24-Bit, 16-Channel C Series Voltage Input Module
784400-01
Voltage Input Module
±10 V, 10 kS/s, 24-Bit, 16-Channel C Series Voltage Input Module - The NI-9202 has excellent flexibility to meet the needs of your applications. The module has 16 simultaneous sampling, differential input channels to create large, distributed systems in a rugged form factor. It also has configurable filters to eliminate noise in your system while maintaining low-latency to be used in control systems.
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Product
NI-9223, ±10 V, 1 MS/s, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module
781398-01
Voltage Input Module
±10 V, 1 MS/s, 16-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module - The NI‑9223 performs differential analog input. This module is well suited for applications such as ballistics, impact, and blast wave testing. The NI‑9223 can sample at the maximum sample rate per channel while the module next to it samples at a much slower rate, which is ideal for mixed-measurement test systems. There are two connector options for the NI‑9223: either four, 2‑position screw terminal connectors or four BNC connectors.
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Product
Isolated Digital I/O 60VDC, 150mA
OTP2 module no.186
Test Platform
The National Instruments PXI-6528, PCI-6528, and PXI-6529 Digital I/O Modules are isolated digital I/O interfaces for PCI and PXI. These modules can use inputs from NI 6528 and PXI 6529 devices to capture the status of sensors, actuators, and logic devices. NI 6528 devices have 24 SSR outputs for switching external devices with input currents up to 150 mA. The NI 6528 and PXI-6529 devices are suitable for a variety of applications, from automotive development and industrial factory automation to aerospace, laboratory research, and biomedical applications due to their high current handling capacity and isolation.
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Product
sbRIO-9201, Non-Enclosed, ±10 V, 500 kS/s, 12-Bit, 8-Channel C Series Voltage Input Module
781113-01
Voltage Input Module
Non-Enclosed, ±10 V, 500 kS/s, 12-Bit, 8-Channel C Series Voltage Input Module - The sbRIO‑9201 is an effective combination of channel count and speed at a low price for an economical multifunction system. In addition to the absolute protection from the isolation, the module features up to 100 V of overvoltage protection for errant signal connection or unexpected outputs to the individual channels. Non-enclosed modules are designed for OEM applications.
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Product
Medalist i1000D
U9401B
In-Circuit Test System
The Keysight Medalist i1000D is now even better. Improving from its previous state of an analog-only ICT, the new digital release of the system now features per pin programmable digital cards and a whole new set of intuitive software graphical user interfaces (GUIs) that makes programming and development effortless.
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Product
SoC Test System
T2000
Test System
SoC devices require small-lot high-mix manufacturing methods in the present era of rapid generation change. Semiconductor makers struggle with requirements to replace their testers on a 2-3 year cycle. The T2000 addresses their needs by enabling rapid response to market needs with minimum capital investment.
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Product
EBIRST 200-pin LFH Coaxial Adapter - 56 SMBs
93-002-202
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
6TL08 Benchtop Test Platform
H710008
Test Platform
The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettesThe platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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Product
Wireless Device Functional Test Reference Solution
Functional Test
The Keysight S8890A Wireless Device Functional Test Reference Solution provides an automation environment which is both simple to use, yet comprehensive and powerful. Based on the Test Automation Platform www.keysight.com/find/TAP, S8890A provides optional instrument driver/plug-ins offering simplified logically grouped control steps. These steps can be sequenced, looped and swept to provide powerful individual test cases or comprehensive sequences. Each driver/plug-in is provided with extensive starter sample test cases which can be modified by Keysight or the end user the UE to be tested. Plug-in options:
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Product
In-Circuit Test System Calibrations
Test System
Regular calibration is essential to ensure accuracy and reliability in testing. Forwessun offers precise calibration services tailored to your test systems, verifying that all components meet industry standards. Our calibration services maintain peak accuracy and compliance, so you can be confident in your system’s performance for any testing application. Choose from one-off calibrations or scheduled service contracts to meet your needs.- HP3070 - Agilent- Keysight - GenRad- Teradyne
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Product
Advanced SoC/Analog Test System
3650
Test System
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
Test Fixture
80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
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Product
Application Software for Electronic Test & Instrumentation
test
Application software provides configuration-based workflows for electronic test and instrumentation applications. Application software is part of the NI software portfolio.
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Product
Electrification Testing Solutions
Test System
When looking for a partner to assist with your electrification testing or power electronics testing challenge, Ball Systems has the expertise and experience to ensure your energy storage or power conversion project moves forward efficiently.
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Product
LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Test Instrument
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Product
Advanced SoC Test System
3680
Test System
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
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Product
Conformance Test System
TS-RRM
Test System
The R&S®TS-RRM 5G and LTE test system is a test solution for running 5G NR and LTE inter-RAT RRM test cases for certification of wireless devices.It is a fully automated conformance test system for running validated RRM conformance test cases. In addition to the RRM test cases required by GCF/PTCRB, the R&S®TS-RRM also supports carrier acceptance specific RRM tests.
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Product
Test Fixture (SMD Components)
16034E
Test Fixture
Perform impedance evaluation on a minimum SMD size of 1.6(L) x 0.8(W) [mm]
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Product
FD-11603, 8-Channel, ±10 V Voltage Input Device for FieldDAQ
785639-01
Voltage Input Module
The FD-11603 can measure up to eight channels with a voltage input range of ±10 V. It features 24-bit resolution with simultaneous sample rates up to 100 kS/s. The FD-11603 offers channel-to-channel isolation, which eliminates noise from ground loops and protects instrumentation circuitry from high-transient voltages. The FD-11603 has an ingress protection rating up to IP67 (dust- and water-resistant), can operate in -40 °C to 85 °C environments, and can sustain 100 g shock and 10 g vibration. The FD-11603 incorporates Time Sensitive Networking (TSN) and features an integrated network switch and built-in power circuitry for simple daisy chaining. You program the FD-11603 with NI-DAQmx, which automatically synchronizes multiple FieldDAQ™ devices. The FD-11603 is ideal for test cell and outdoor environments.
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Product
High-Voltage Test Hood
HVE900
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The large, bright test room with a ball-bearing cover is designed for high production quantities. Thanks to the easily exchangeable exchangeable plate, retrofitting for testing different products is also a simple task. Product properties: External dimensions (W * D * H) approx. 940 * 716 * 640mm Usable test space (W * D * H) approx. 750 * 500 * 460mm Contacting Installation space approx. 100mm high under removable plate Dielectric strength min 10kV Application area up to 2000m above sea level Pollution degree 1 without condensation Standard conformity EN50191 / EN61010-1 Schmersal safety switch AZM161 with guard locking Lid is supported by ball bearings for high number of cycles, the bearings can be easily exchanged for servicing Optionally available, Not included in the price: - Red / green signal light - Mobile substructure trolley with 19 "
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Product
Brute High Current Probe
P4301-1Z
High Current Probe
Current Rating (Amps): 50Current Rating Remark: 40 Amps for BeCu plungersAverage Probe Resistance (mOhm): 5Test Center (mil): 300Test Center (mm): 7.62Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 1,750Overall Length (mm): 44.45
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Product
NI-9252, ±10 V, 50 kS/s/ch, 24-Bit, 8-Channel C Series Voltage Input Module
786783-01
Voltage Input Module
±10 V, 50 kS/s/ch, 24-Bit, 8-Channel C Series Voltage Input Module - The NI-9252 is an 8-channel analog input module for CompactDAQ and CompactRIO systems. Each channel provides a ±10 V measurement range and 24 bits of resolution at a 50 kS/s sample rate. The NI-9252 features a number of programmable hardware filters. By choosing the specific Butterworth and comb filters for your application, you can significantly reduce the noise in your system.
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Product
In-Line RF Test Station
AP770
RF Test System
ICT, Functional, Hipot, Vision, ISP and RF test with low cost fixtures in a very compact test station footprint Works with PCBs up to 450×550 mm or with palletized devices Space for up to 25 VPC mass interconnect modules or YAV switching units
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Product
NI-9205, ±10 V, 250 kS/s, 16-Bit, 32-Channel C Series Voltage Input Module
779357-01
Voltage Input Module
±10 V, 250 kS/s, 16-Bit, 32-Channel C Series Voltage Input Module - The NI‑9205 performs single-ended or differential analog inputs, with four programmable input ranges for each. It is an effective combination of channel count and speed at a low price for an economical multifunction system. You can choose from four programmable input ranges. To protect against signal transients, the NI‑9205 includes up to 60 V of overvoltage protection between input channels and common. In addition, the NI‑9205 also includes a channel-to-earth ground double isolation barrier for safety, noise immunity, and high common-mode voltage range. It is rated for 1,000 Vrms transient overvoltage protection.
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Product
ARINC-708/453 2-Channel Test & Simulation Module for the Weather Radar Display Databus
M8K708
Test Module
The M8K708 module is an ARINC-708 / 453 2-channel test and simulation module for the Weather Radar Display Databus. The M8K708 supports two ARINC-708 / 453 channels, each selectable as transmit or receive. Each channel implements an 64K×16 FIFO and supports polling and/or interrupt driven operation.The M8K708 comes complete with Windows software, a C-driver software library including source code and may be used with Exalt, Excalibur’s Analysis and Laboratory Tools, a Windows monitoring application. In addition, Excalibur produces adapter cables that convert the carrier board I/O Molex™ connector to two twinax CJ70-49 connectors. The cable may be purchased at an additional cost.
