Functional ATE
Automated application specific testing system.
See Also: Functional Test, ATE, Functional Test Systems
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Product
PXI 8 Slot BRIC 90x16 2-pole (6 sub-cards)
40-561A-122-90X16
Matrix Switch Module
This version of our BRIC is part of a range of high-density PXI matrix modules. These modules are available in 2, 4 or 8 slot PXI sizes to suit all high performance matrix requirements and are constructed using instrumentation quality reed relays. With this high level of switching density, these PXI matrix modules allow a complete Functional ATE system to be housed in a single 3U PXI chassis. These BRIC matrix modules allow the use of lower cost 8 or 14-slot PXI chassis.
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Product
Arbitrary Function Generator 14-bit, 100Msa/s
PXI-5412
Function Generator
The PXI-5412 is a 20MHz arbitrary waveform generator for generating custom arbitrary waveforms and other standard functions such as sine, square, triangle, and ramp. The arbitrary generator generates signals from -6 V to +6 V and uses direct digital synthesis (DDS) to generate precise waveforms.
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Product
Compact Functional Test System
E2230C / TS-5040
Functional Test
The Keysight TS-5040 functional test system is a robust, and reliable test system that ensures an economical ownership experience. When coupled with Keysight software such as KS8400A PathWave Test Automation with KS8328A PathWave Test Executive for Manufacturing (PTEM) or TestExec SL with TS-5000 libraries, it provides a streamlined development process and accelerated deployment. The TS-5040 seamlessly integrates into heavily automated production areas. It is a minimalistic one-box solution for automotive and industrial applications that saves valuable rack and floor space.
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Product
NI's Electrical Functional Test Solution
Functional Test
PXI instrumentation ensures complete and accurate test coverage with a modular architecture mounted in ultra-reliable PXI chassis.TestStand and LabVIEW software provide rapid development of complex test steps and sequences. PXI systems conserve floorspace because of their small, light form factor. Order them preassembled and installed using NI ATE Core Configurations.SystemLink™ software deploys updates and democratizes data insights to optimize operational efficiency.
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Product
High Performance PXI Functional Test System with Mac Panel Interface
TS-5400
Functional Test
The Keysight TS-5400 PXI Series Functional Test System provides automotive, aerospace and defense and industrial control manufacturers with an off-the-shelf PXI hardware and software platform with support for single or multiple DUT test. Designed for testing electronics control modules such as, power train control, complex body electronics and industrial controllers, the TS-5400 PXI Series helps manufacturers achieve higher throughput for their design validation and manufacturing functional test needs with the capacity to empower them to anticipate future functional test needs.
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Product
Wireless Device Functional Test Reference Solution
Functional Test
The Keysight S8890A Wireless Device Functional Test Reference Solution provides an automation environment which is both simple to use, yet comprehensive and powerful. Based on the Test Automation Platform www.keysight.com/find/TAP, S8890A provides optional instrument driver/plug-ins offering simplified logically grouped control steps. These steps can be sequenced, looped and swept to provide powerful individual test cases or comprehensive sequences. Each driver/plug-in is provided with extensive starter sample test cases which can be modified by Keysight or the end user the UE to be tested. Plug-in options:
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Product
PXI 4 Slot BRIC 132x8 2-Pole (6 sub-cards)
40-562A-022-132X8
Matrix Switch Module
This version of our BRIC is part of a range of high-density PXI matrix modules. These modules are available in 2, 4 or 8-slot PXI sizes to suit all high performance matrix requirements and are constructed using instrumentation quality reed relays. With this high level of switching density, these PXI matrix modules allow a complete Functional ATE system to be housed in a single 3U PXI chassis. These BRIC matrix modules allow the use of lower cost 8 or 14-slot PXI chassis.
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Product
JTAG Functional Test
JFT
Functional Test
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
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Product
NI's Wireless Connectivity Functional Test Solution
Functional Test
The proliferation of wireless functionality in electronic devices is pressuring test developers to deliver more complex testers within shrinking project schedules. Evolving standards and the integration of multiple wireless technologies into new product designs mean developers must prioritize measurement speed and quality to maintain throughput and yield targets. For a solution to meet these sorts of demands, it must:
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Product
Drive Controller Function Test – Universal Functional Test System for Industrial Electronics
Functional Test
General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.
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Product
Electronic Control Unit Functional Test
Functional Test
End-of-line tests are critical to ensure passenger safety in the era of smarter vehicles. A flexible test solution is needed to ensure extensive test coverage and high test throughput with a low total cost of ownership.
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Product
Functional Test
UTS
Functional Test
The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
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Product
PXI Three Channel Function Generator
Function Generator
Our PXI Function Generator is capable of generating sine, square and triangle waveforms to 10MHz with 48-bit frequency resolution referenced to the 10MHz PXI clock or to an external standard. It can generate fast swept frequency signals, permitting the output to emulate the operation of variable speed devices. The module can also generate arbitrary waveforms loaded into its internal 256k memory, allowing the emulation of many waveform types including the typical waveforms of automotive and aerospace sensors.
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Product
Functional Test for Engineering Lab
Spectrum BT
Functional Test
Designed to meet the needs of product engineering labs, production lines, test development centers, and repair depots, the Spectrum BT is a configurable and scalable functional test system. This focused system solves typical functional test coverage challenges throughout the defense/aerospace product life cycle—and it’s upgradable as test requirements evolve.
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Product
Automated Multi-Functional Tester
QTouch 1408 C
Functional Test
Qmax Test Technologies Pvt. Ltd.
QTouch 1408 C – Automated Multi-Functional Tester with in-built camera is designed to make automatic image capturing and probing of electrical signals with ease and speed especially in PCBs with high density/high pin count device that are mounted on the PCB. It is designed to move on X, Y, Z directions making it possible to probe every component as close as 20 mils. Easy tagging feature allows the user to get the real time XY coordinates using the library information with minimal intervention. CAD import feature is available for Auto Test Generation/to extract the XY coordinates from the CAD data. Qmax Automated Multi Functional Tester can perform Board level functional test of a PCB and guided probe / Back tracking diagnostics utility to reliably test Digital, Analog and Mixed Signal PCBs and fault isolation to the PCB level or component level.
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Product
2-Quadrant Source/Measure Unit for Functional Test, 20 V, 1 A or 6 V, 3 A, 20 W
N6782A
Functional Test
The Keysight N6782A is a source/measure unit (SMU) designed specifically for advanced functional testing of a device. The ability to modulate the output up to 100 kHz along with capability to source and sink current (2-quadrant operation) makes the N6782A a perfect fit for advanced functional test of a variety of devices such as DC/DC converters, power management units, power amplifiers, and power management ICs. The input stage of the DUT can be stimulated by the fast sourcing and waveform capabilities. While the output stage can be loaded down and measured with the electronic load capabilities, providing a total test solution.
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Product
Arbitrary Function Generator
HMF2525/HMF2550
Function Generator
Powerful pulse generator Provides pulses with a recurrence rate of up to 12.5 MHz/25 MHz; the pulse width can be set from 15 ns to 999 s with a resolution of 5 ns. Rise/fall time can be selected from 8 ns to 500 ns – a very useful feature when characterizing input hysteresis of semiconductor devices Easily create arbitrary waveforms Arbitrary waveforms can be developed with PC software. Stored waveforms can be loaded via front USB port or imported via the complimentary HMExplorer software (available for download)
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Product
Functional Test Fixtures
Functional Test
Forwessun’s Functional Test Fixtures are tailored to validate the performance of your electronic assemblies, ensuring each product meets critical quality and functional standards. With customisable designs and precision engineering, these fixtures support a range of testing needs—from checking connectivity and function to confirming performance under real-world conditions. Built to handle rigorous demands, Forwessun's solutions are ideal for industries requiring reliable and repeatable results. Whether for high-volume production or specialised testing, our fixtures provide robust, adaptable support to maintain efficiency and accuracy throughout the testing process. We also create, and work with Ingun to create fixtures using the Ingun kit.
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Product
Functional Test Trainer System
QT65
Functional Test
Qmax Test Technologies Pvt. Ltd.
Functional Test Trainer system, is a test system which can perform various Power- On functional tests of digital devices(ssl/MSI/LSIs and analog devices in the out- circuit and in-E conditions. Unified Library of vast number of devices to effectively test devices in in-circuit as well as out of circuit conditions.
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Product
PXI Functional Test System
U8989A
Functional Test
The TS-8989 PXI functional test system is an integrated, all in one switch, load and measurement system in a box for high voltage or current mechatronics functional test applications of up to 104 nodes and 40A current loads.
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Product
PXI 4 Slot BRIC 45x16 1-Pole (3 sub-cards)
40-561A-021-45X16
Matrix Switch Module
This version of our BRIC is part of a range of high-density PXI matrix modules. These modules are available in 2, 4 or 8 slot PXI sizes to suit all high performance matrix requirements and are constructed using instrumentation quality reed relays. With this high level of switching density, these PXI matrix modules allow a complete Functional ATE system to be housed in a single 3U PXI chassis. These BRIC matrix modules allow the use of lower cost 8 or 14-slot PXI chassis.
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Product
Functional Test
xUTS
Functional Test
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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Product
PXI 8 Slot BRIC 352x4 1-Pole (8 sub-cards)
40-562A-121-352X4
Matrix Switch Module
This version of our BRIC is part of a range of high-density PXI matrix modules. These modules are available in 2, 4 or 8-slot PXI sizes to suit all high performance matrix requirements and are constructed using instrumentation quality reed relays. With this high level of switching density, these PXI matrix modules allow a complete Functional ATE system to be housed in a single 3U PXI chassis. These BRIC matrix modules allow the use of lower cost 8 or 14-slot PXI chassis.
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Product
PXI 2 Slot BRIC Solid State 96x8 1-Pole (3 sub-cards)
40-563A-221-96X8
Matrix Switch Module
This version of our BRIC is part of a range of high-density PXI matrix modules. These modules are available in 2, 4 or 8-slot PXI sizes to suit all high performance PXI matrix requirements and are constructed using solid-state switches. With this high level of switching density, these PXI matrix modules allow a complete Functional ATE system to be housed in a single 3U PXI chassis. These BRIC matrix modules allow the use of lower cost 8 or 14-slot PXI chassis.
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Product
At-Speed Non-Intrusive Functional Testing
ScanExpress JET
Functional Test
Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.
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Product
Arbitrary/Function Generator,2 Ch,8-DIG ch, 150 MHz,16 bit,128Mpts/Ch,6 Vpp output, Wave Sequencing
T3AWG2152-D
Function Generator
Arbitrary/Function Generator,2 Ch,8-DIG ch, 150 MHz,16 bit,128Mpts/Ch,6 Vpp output, Wave Sequencing.
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Product
Optimize Throughput And Cost For MmWave 5G Device Functional Test
Functional Test
Test engineers always have faced tough new test-coverage challenges. Those introduced by 5G measurements at mmWave are no exception, as they require over-the-air (OTA) radiated test solutions. But never have these pressures seen today’s intense time-to-market, manufacturing volume, and operational expectations! A solution that meets these demands must:
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Product
Digital Bit Pattern Generator
FAB-3226
Function Generator
The FAB-3226 Digital Bit Pattern Generator connects digital ports to an user-defined FPGA logic. As the FPGA is user-programmable all kind of operation can be implemented: input, output, and closed loop operation where input and output are processed in real-time. All this can be controlled by an user-defined application program running on a computer system (PC or embedded).
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Product
PXI 4 Slot BRIC 66x16 1-Pole (6 sub-cards)
40-562A-021-66X16
Matrix Switch Module
This version of our BRIC is part of a range of high-density PXI matrix modules. These modules are available in 2, 4 or 8-slot PXI sizes to suit all high performance matrix requirements and are constructed using instrumentation quality reed relays. With this high level of switching density, these PXI matrix modules allow a complete Functional ATE system to be housed in a single 3U PXI chassis. These BRIC matrix modules allow the use of lower cost 8 or 14-slot PXI chassis.
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Product
Functional Test
cUTS
Functional Test
Get the essentials of measurement automation to power tests of simpler PCBAs and subassemblies. compactUTS (cUTS) is a cost-effective platform for automating manual tests of devices with fewer than fifty cable-accessible test points in manufacturing environments with moderate production volume. DUT-specific electrically keyed cables make changeover quick and easy.
