Functional ATE
Automated application specific testing system.
See Also: Functional Test, ATE, Functional Test Systems
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Portable Functional Near-Infrared Spectroscopy System For Research
LIGHTNIRS
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Shimadzu Portable functional Near-Infrared Spectroscopy (fNIRS) System for Research* Near infrared light, which readily diffuses easily through biological tissue, can be used to measure localized blood oxygenation levels of the brain to monitor where activity occurs in response to a task of stimulus. The portability of LIGHTNIRS allows visualizing brain function activity in real time in a more natural state than other methods. Consequently, it is being used in a wide range of applications including medical research, developmental psychology, education, cognitive science and engineering.
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S-GW Functional Tester
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The LTE SGW Functional Tester provides a wrap-around test solution for the Serving Gateway by emulating all the LTE network elements surrounding the SGW (System Under Test). The S-GW Functional Tester emulates an LTE eNodeB and other Core Network entities such as the MME, P-GW, S-GW, RNC and SGSN. It tests the S1-u, S11, S5/S8 , S12 and S4 interfaces of the S-GW.
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Flexible Functional Tester
igentic® 421t
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Electronics customers require greater test flexibility to address the growing trend towards high-mix, low-volume printed circuit board (PCB) production. Sterner Automation is pleased to introduce the igentic® 421t, the next generation of automated test solution specially engineered to address these challenges. The igentic® 421t provides the flexibility, reliability and efficiency needed in one standard platform, allowing our customers to test multiple PCB's and significantly reduce individual product testing costs.
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Product
PXI Multi-Channel Function Generator Module, 16-Channel
41-625-003
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The 41-625-003 (PXI) and 43-625-003 (PXIe) are function generator modules that provide 16 channels in a single PXI/PXIe slot. They can generate sine waves to 300 kHz with 5.76 mHz frequency resolution referenced to the 10 MHz PXI clock. The output voltage range is up to +/-25 V in a 16-bit resolution. It also support PXI trigger functions allowing events from other instruments to initiate waveform generation or sweeps.
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3 Function Slot MOSA Nano Data Concentrator Unit (DCU)
NIU3A-DCU-01
Data Concentrator Unit
NIU3A-RDC-01 is a Modular Open Systems Approach (MOSA) Data Concentrator with low power high performance ARM Cortex -A53 processing. 8 GB RAM, 32 GB SATA Flash, 2 x 10/100/1000Base-T Ethernet.
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Double Function Tester with Shielded HF Test Chambers
End-of-line Tester UTP 9010 RF
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The UTP Series 9010 is a scalable test series available in a variety of feature-rich variants and many designs. The UTP 9010 RF function tester shown here as an example is suitable for tests with a medium number of channels and complexity. It is designed for parallel testing of two or more test items. The measuring instruments used are used alternately for several test items. Due to its compact design and construction as a modular system, this powerful tester can easily be expanded to larger numbers of channels.The integrated HF test chamber UTP 5070 developed by NOFFZ allows an independent shielded test. It can be operated manually or fully automatically by a robot .The basic version of the UTP 9010 series is an ideal system for functional and end-of-line tests and is already preconfigured for this purpose. The RF tester presented in the example is used in particular to test infotainment and eCall modules in the vehicle as well as IoT products with wireless technologies.
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Semiconductor Functional Verification Tools
Trek5
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Breker’s solutions enable test reuse across simulation, emulation, prototyping and actual silicon, eliminating redundant effort across the development flow. The Breker “Trek” suite solves challenges across the functional verification process for large, complex semiconductors.
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Arbitrary Function Generator
AFG31000
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The AFG31000 series with InstaView™ technology is the first high-performance AFG with built-in waveform generation applications, patented real-time wave monitoring, and a modern user interface.
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Arbitrary Waveform Function Generator PXI Card
GX1110
Waveform Generator
The GX1110 is a high performance, single-channel PXI arbitrary waveform generator that offers function generator and arbitrary waveform generator functionality within one instrument. Built-in waveforms are available for use with both the DDS or AWG modes of operation and include Sine, Triangle, Ramp, Noise, Gaussian pulse and Sinx / x. A flexible sequencer is also available as part of the AWG's architecture, supporting the generation of complex waveforms.
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Dual Function Slot MOSA Data Concentrator Unit (DCU)
NIU2A-DCU-01
Data Concentrator Unit
NIU2A-DCU-01 is a Modular Open Systems Approach (MOSA) Data Concentrator Unit with low power high performance ARM Cortex -A9 processing. 512 MB RAM, 32 GB SATA Flash, 2 x 10/100/1000Base-T Ethernet and optional Fiber Optic Ethernet support
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120MHz DDS Function Generator
SM-4120
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*High resolution, high accuracy, high stability, superb price/performance.*High visible VFD display, easy-to-use knob and keys.*Multi-wave forms are suitable for various application areas.*Wide sweep frequency range, start and stop frequency can be set independantly in sweep function. It can be used as digital sweep analyzer with an oscilloscope.*SMT craft. New-style metal case.*MTBF: >1000h
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Function Module - 2 pieces of MX1710 required for each CPCI-1710
MX1710
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Two pieces of MX1710 required for each CPCI-1710.
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Functional Testing Services
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We manage an in-house team of testing specialists having sufficient experience to perform quality functional testing activities.ImpactQA exhibits cross-browser & cross-platform testing capabilities together with the latest interoperability testing methods to assess functionalities across multi-faceted systems.Unlike other functional testing services, our testing model is loaded with adaptable properties to perform white-box testing and functional testing of Java and .Net applications.
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Gateway Inverse Function
InverTS
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InverTS is ENENSYS’ DVB-T2 Gateway inverse function that de-encapsulates a T2-MI stream into one or several MPEG-2 Transport Streams over ASI and IP.The InverTS is designed to receive a single PLP or Multiple PLP T2-MI stream over ASI or IP in order to de-encapsulate the T2-MI stream into one or several MPEG-2 TS over ASI and IP. It outputs the MPEG-2 TS encapsulated by a DVB-T2 Gateway.The InverTS can also apply to a lot of use cases wherever applications require to retrieve the genuine and multiple MPEG-2 TS that are carried over the T2-MI stream. It can be operated for re-multiplexing a DVB-T2 stream with regular TS content or for simulcasting the same content over different networks.The InverTS is the ideal product to help monitoring a T2-MI stream either using its optional internal advanced monitoring tools or by connecting it to existing monitoring tools through ASI or IP. The Advanced monitoring option enables to supervise in real-time PLP bandwidth allocation, DVB-T2 transmission parameters and the MPEG-2 TS encapsulated within the T2-MI stream.
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DDS Function Generator
FG-2000 Series
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Based on the latest advances in DDS (Direct Digital Synthesis) technology, the FG-2000 series is a portable high precision sine, square, and triangle waveform function generator. The FG-2000 series utilize microprocessor control that delivers clean and accurate waveforms up to 20MHz with 5V peak-to-peak amplitude in a portable hand-held unit.
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Product
Arbitrary / Function Generator
AFG2000
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Usually, generating a range of signals requires investment in a high-end signal generator. Introducing the Tektronix AFG2000. With 20 MHz bandwidth, 14-bit resolution, and 250 MS/s sample rate, the AFG2021 Arbitrary / Function Generator can create simple and complex signals. But perhaps its most impressive feature is its entry-level price.
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Analog Functions
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Analog Devices designs amplifiers and linear products that deliver high performance and high value. We combine circuit design, manufacturing process innovation, and applications expertise to create products that simplify signal conditioning design.
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Function Test Fixtures
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Modulized UUT BFT Test Fixture, Multilevel BFT Fixture, Over Clamp Test Fixture, Rack Mount Test Fixture, Self Contained Pogopin Test Fixture, Simple Low Cost PCBA Test Fixture, Tight Seal Required RF F/T Fixture, and more from IST Engineering
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Functional Test Fixtures
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EMC Technologies designs and manufactures discretely wired and wireless functional test fixtures used for performance verification of PCBs and Electronic Assemblies. Commercial applications have included work in support of many industries including: satellite TV, computer servers, medical, networking, and telecommunication.
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Flow Detector with Pressure Loss Compensation Function
FP-213S / FP-2140S
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The Volumetric Flow Detector FP-213S, FP-2140S are volumetric flow detectors, used in combination with the Digital Flow Meter FM/DF series, for precision measurement of fuel flow such as gasoline, light oil and kerosene.They are suitable for those who want to evaluate the engine performance by measuring the minute flow rate of a small engine and making the fuel supply pressure as close as possible to the actual vehicle state.
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GLP2 Safety and Functional Tester
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A cost-effective, fully featured solution for testing the safety and function of a variety of electrical products. Designed for machine builders and OEMs, the Whitelegg GLP series is a simple to use fast and effective tool for benchtop or production testing.
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0.1Hz-10MHz Functional Generator
MFG-3010
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Features:*Frequency of the models: 0.1Hz~2MHz/5MHz/10MHz/13MHz/15MHz*Output waveform:Sine,Triangle,Square,±Ramp,±Pulse*Voltage Control Frequency (VCF) capability*TTL/CMOS and OUTPUT synchronous output*Less than 1% distortion at 10Hz~100kHz*Less than 0.5dB frequency response at 0.1Hz~100kHz*1Hz~30MHz frequency counter*AM/FM function optional (models with suffix "A" include this function)*FM/Sweep function optional (models with suffix "C" include this function)
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Drive Controller Function Test – Universal Functional Test System for Industrial Electronics
Functional Test
General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.
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PXI 4 Slot BRIC 368x4 1-Pole (4 sub-cards)
40-560A-021-368X4
Matrix Switch Module
This version of our BRIC is part of a range of high-density PXI matrix modules. These modules are available in 2, 4 or 8 slot PXI sizes to suit all high-performance matrix requirements and are constructed using instrumentation quality reed relays. With this high level of switching density, these PXI matrix modules allow a complete Functional ATE system to be housed in a single 3U PXI chassis. These BRIC matrix modules allow the use of lower cost 8 or 14-slot PXI chassis.
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Distributed 4-Axis Motion Control Modules (with High-Speed Trigger Function)
MNET-4XMO-(C)
Motion Controller
The MNET-4XMO is a 4-axis motion controller module for Motionnet distributed motion systems. It can generate fast frequency pulses (9.9 MHz) to drive stepper or servomotors in the machine automation field. As a motion controller, it can provide comprehensive motion functions which include 2 axis circular interpolation, 2-4 axis linear interpolation, or continuous interpolation for continual velocity and so on. Also, changing position/speed on the fly is available with a single axis operation.
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Pulse Function Arbitrary Noise Generator
81150A
Arbitrary Waveform Generator
1 - 120 MHz pulse generation with variable rise/fall time1 - 240 MHz sine waveform output14-bit, 2 GSa/s arbitrary waveforms512k samples deep arbitrary waveform memory per channel Noise with a selectable crest factor and signal repetition time of 26 days FM, AM, PW, PWM, FSK modulation capabilities up to 10 MHz1 or 2 channel, coupled and uncoupled Differential outputs
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Automated Functional Testers
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Don Alan testers are compact integrated systems with very few if any connected instruments. This reduces the unit cost of the test systems dramatically. With the lower unit cost, more test systems can be made available. Having more testers provides redundancy and higher throughput and allows duplication of the same test process in house by the customer. This means the customer can effectively handle warranty return issues on the spot (the retest results get tied to the original test results for warranty analysis). It also allows customers to do sample based quality assurance.
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30 MHz Function / Arbitrary Waveform Generator
DS345
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Stanford Research Systems, Inc.
The DS345 Function Generator is a full-featured, 30 MHz instrument that uses an innovative Direct Digital Synthesis (DDS) architecture.
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Functional Testing
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To verify the functionalities of your software, to check for the quality of your product, and to see that the applicationis working against business requirements, opt for Functional Testing.
