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Product
Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
test
Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
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Product
Flexible Cable Set, 2.4 Mm To 7 Mm
85135F
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Achieve phase stability with these 62.9-cm cables when a DUT is connected between cable ends
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Product
Test Contactor/Probe Head
cBoa
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cBoa™ test contactors and probe heads are the solutions for contacting high-frequency devices for package test or final test at wafer. The robust design and materials of the cBoa probe withstand the rigors of high-volume test by providing longer life and higher yield. The homogeneous DUT side plunger provides longer run times between cleaning and increased probe life.The cBoa features a stainless-steel spring for tri-temp testing and performs in operating temperatures of -55°C to +155°C and bandwidth of up to 35 GHz @ -1 dB.
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Product
High Voltage Optically Isolated Probes
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High Voltage Optically Isolated Probes are designed to aid in device characterization measurements. Whether it is low or high voltage signals sitting on HV busses, high bandwidth, extreme precision, and optical isolation means floating measurements are easily made with minimal DUT loading.
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Product
RF Test Enclosure Ideal For High-volume Repeatable Testing, ≥90 DB Isolation, 300 MHz - 18 GHz
dbGUARD
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The dbGUARD provides up to 90 dB isolation from 300 MHz to 18 GHz. The IASG (Inverted Asymmetric Squarewave Gasket) design eliminates any leakage along the perimeter of the RF enclosure. This makes the dbGUARD conducive to testing all wireless technologies including 5G/LTE, Wi-Fi, Bluetooth, ZigBee, WiMAX, etc. The interior cavity is finished with a next-generation RF absorptive coating similar to what is found in stealth technology. This allows for positioning the DUT in the shielded box without affecting attenuation caused by reflections.
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Product
Memory Burn-In Test
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The N3500 is Neosem Technology’s fourth generation memory test system. Specifically designed for Flash Components and Flash Cards, the N3500 tester-on-a-board architecture targets the broadest range of DUT technologies in various form factors and packages. Each Tester Board (or “Blade”) contains 288 I/O pins and 32 DPS supplies.
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Product
3U CPCI 32-bit Test Extender
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Measurement and testing of CompactPCI® assemblies in the 3U Euro-board form factor is greatly facilitated by the use of this test adapter. Easy access to the DUT is guaranteed because the adapter has plug-in connections on 3 sides. The Modern BRIDGE design permits up to 3 CompactPCI® cards and one standard PCI® card to be inserted in one CompactPCI® slot. This allows system developers to implement a large number of tests with little effort and enables you to achieve vital time to market.
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Product
High Temperature Operating Life
7000 Series
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With ever decreasing geometries, the way we perform HTOL requires careful consideration. In lower geometry device leakage currents are not only higher but vary greatly. Temperature control at DUT level – required to achieve correct junction temperature at every DUT. For higher geometries, HTOL can be performed in a more traditional way but with devices consuming more power, the ambient temperatures required varies greatly. Multiple temperature zones are required – multi zones system or multiple smaller HTOL systems.
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Product
Network Analyzer Test Setup Assistant (NTSA)
S94605B
Network Analyzer
Spreadsheet-based measurement configuration assistant aides users in setting up and calibrating complex measurements for a multiport DUT with a VNA based system
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Product
Solar Array Simulator
Simulator
Among other things, solar array simulators are required for testing satellite power supplies. An SAS (Solar Array Simulator), consisting of an interconnection of several Solar Array Simulator modules, maps the solar panels and displays the individual strings connected in parallel. Optionally, the individual SAS modules are monitored by a Second Level Protection, so that the test object is not damaged in case of errors with the voltage sources. Additional circuitry is implemented via project-specific test modules. The signal path to the DUT can be separated, e.g. for dynamic current measurements.The Keysight Solar Array Simulators used were specially developed for satellite applications and cover the significantly higher requirements regarding the control speed of MPP tracking compared to terrestrial applications.
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Product
Characterization Platform
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This standalone integral software and hardware platform is capable of functioning as an independent single-channel or virtual multi-channel characterization test subsystem. The platform is USB controlled to provide temperature, RF-signal and bias-control to a device-under-test (DUT) for semiconductor performance measurement. When used in conjunction with Accel-RF's embedded Pulser-Card Assembly, the test device is capable of pulsed DC and RF stimulus.
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Product
Vibration Testing
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Vibration testing includes kinetic energy transfer to the test specimen, often described as the Device Under Test or simply DUT. Typically specified in terms of displacement, velocity, acceleration or the corresponding power spectral density units as a function of frequency. The form of the vibration may be sinusoidal, random, or a combination.
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Product
PXIe-2515, 35-Channel, 0.25 A PXI Signal Insertion Switch Module
780587-15
Signal Module
PXIe, 35-Channel, 0.25 A PXI Signal Insertion Switch Module—The PXIe‑2515 is a multiplexer switch module that enables connectivity by routing high-speed digital I/O (DIO) signals between a device under test (DUT) and an NI high-speed DIO device or a parametric measurement device. You can use modules such as PXI Source Measure Units (SMUs) and PXI Digital Multimeters (DMMs) with high-speed digital devices. With the PXIe‑2515, you can perform parametric tests on digital pins without external connectivity or impedance mismatch challenges.
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Product
Network Emulation 100GE, 50GE, 40GE, 25GE, 10GE
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Chimera by Xena is a network impairment emulator that makes it easy to introduce consistent, accurate, well-defined and repeatable impairments (e.g. packet manipulation, latency, jitter, bandwidth control and shaping) to traffic between DUTs in the lab. All rates from 10GE to 100GE are supported by a single 2-slot test module.
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Product
Phase Noise Analyzers
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Holzworth Instrumentation, Inc.
Holzworth's Real Time Phase Noise Analyzers are each designed to provide data faster than any other system, while maintaining data accuracy and repeatibilty. There is no guess work as to whether results are valid to the DUT or if there are unwanted variations or contributions coming from the measurement system itself.
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Product
TVAC CalPod, 20 GHz
85532B
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CalPods provide a new and unique way to quickly and easily refresh a network analyzer calibration, at the push of a button, and without removing the DUT or re-connecting standards. Very useful in thermal-vacuum chamber testing, where it is desired to remove the thermal effects of the test cables and connectors from the DUT’s response, and where it is impractical to stop the testing to perform a normal re-calibration.
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Product
CTL503
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The CTL503 Curve Tracer is a low-cost transistor (BJT and FET) computer controller curve tracer. Unlike other simple curve tracing units the CTL503 is designed to measure devices to 100V and upto 3A. Four collector resistors (relay selected) allow the user to test the smallest of BJT’s and FET’s as well as extracting meaningful curves from larger TO3/TO247 packaged devices. Limits on both peak test voltage and peak test current can be easily set to prevent exceeding device parameters.Pulse testing (80us/300us) is used to minimise device heating and to ensure the CTL503 can be powered via USB. This may be disabled for smaller parts.Connected and powered via USB and running our own free software the CTL503 is easily configured using a built in wizard (for quick results), or the user can adjust every instrument parameter to suit. Works with EPIC 21.010 and above.Users can save data from runs, as well simply grab images directly from EPIC.Connections are made to the DUT (device-under-test) with the built-in colour coded test leads with crocodile clips.
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Product
Transformer Turns Ratio Meter
TTRM 101
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SCOPE introduces state of the art precision single phase Transformer Turns Ratio Meter (TTRM ) designed for field testing as well as factory testing of power transformers, instrument transformers and distribution transformers of all types. TTRM 101 measures only turns ratio where as TTRM 102 along with turns ratio, measures ratio deviation, phase angle deviation, magnetizing current and detects tap-position of single phase transformer in charged switchyard condition. The range of AC voltage selection offers high accuracy in measurement.Both the instrument have in-built TFT display with touch screen and thermal printer. The user friendly, simple instrument makes the testing more easy. With the touch keypad it is possible to enter required DUT information.The ratio results are displayed with % error. Internal non-volatile memory gives the provision of storing test results.Further data can be downloaded to PC or copied to memory stick through USB port provided.
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Product
Vector Signal Generator
R&S®SMW200A
Vector Signal Generator
Performance and functionality requirements vary depending on test setup and application. The R&S®SMW200A is unrivaled in mastering this challenge and sets new standards for signal generators. When developing and verifying any type of DUT, including component, module and complete base stations – the R&S®SMW200A always easily generates the appropriate test signals with top performance. The flexible modular design of the R&S®SMW200A can be equipped with the exact options required for specific applications. Any configuration is possible, from a classic single-path vector signal generator to a multichannel MIMO receiver tester.
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Product
Automatic Calibration Module
ACM2509
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ACM2509 is an automatic calibration module that can be used with all CMT Vector Network Analyzers operating in frequency range up to 9 GHz. It is a fully automatic USB-controlled and powered electronic calibration module. Minimizing the number of steps required by technicians reduces the risk of human error and expedites the calibration process. Automating the calibration routine also reduces wear and tear on the analyzer and RF cables. To perform full two-port calibration, each end of the ACM need only be connected to the analyzer once, as opposed to seven connections with a traditional calibration. The ACM also contains a factory characterized 20dB in-line attenuator which acts as a simulated device under test (DUT). The confidence check feature loads the factory stored DUT into memory so proper calibration can be verified.
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Product
PXIe-4141, 4-Channel, ±10 V, 100 mA, Precision PXI Source Measure Unit
781743-01
Source Measure Unit
PXIe, 4-Channel, ±10 V, 100 mA, Precision PXI Source Measure Unit - The PXIe-4141 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4 wire) sensing for accurate measurements. The fast sample rate of the PXIe-4141 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4141 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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Product
Hardware Platform
SmartScan 3D
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SmartScan-3D is another hardware platform that allows 3D scan using a six axis robot and DUT holder. A DUT is placed on a 360 degree rotating DUT holding jig. Vertical scanning without rotating DUT holder is one variation of SmartScan-3D for any DUT that is standing up, rather than laying flat on X-Y plane. Any scan technology can be integrated to the SmartScan-3D.
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Product
Multi-Channel Attenuation Control Unit (5-channels), DC to 18 GHz, 0 to 121 dB, 1 dB Step
J7205B
Attenuator
The J7205B is a multi-channel (5-channels) attenuation solution for signal attenuation and conditioning of up to 5 devices under test (DUT). Operating frequency from DC to 18 GHz, with 121 dB, 1 dB steps. Exceptional 0.03 dB insertion loss repeatability per section for the entire 5 million cycles and excellent attenuation accuracy and flatness, the J7205B reduces cost of ownership and provide the best measurement accuracy.
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Product
Vibration Shakers
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Vibration Shakers and Modal ExcitersFull range of modal and inertial shakers with integrated and easy-to-use amplifiers. Our permanent magnet shakers are compact, lightweight, and powerful general-purpose shakers that can be used for modal and vibration testing. They have a high DUT capacity despite their small sizes.
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Product
PXIe-4113, 2-Channel, 10 V, 6 A PXI Programmable Power Supply
782857-02
Programmable Power Supply
The PXIe‑4113 is a programmable DC power supply with isolated outputs. It helps simplify the task of designing automated test systems for a wide range of applications—from aerospace and defense to automotive and component test—by eliminating the need to mix multiple instrumentation form factors in a given test rack. It also has standard output disconnect functionality that allows isolation from the device under test (DUT) when not in use, and remote sense to correct for losses in system wiring.
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Product
Device Measurement EXpert (DMX)
S94601B
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Device Measurement eXpert (DMX) is a measurement configuration assistant that aides users in setting up and optimizing complex measurements for various types of devices. The customizable wizard guides users through DUT connection, measurement setup, and display. DMX provides repeatability across the workflow by automatically setting up measurements in a consistent and optimal manner.
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Product
DC Power Module, 20V, 5A, 100W
N6743B
Power Module
The Keysight N6743B is a 100 W basic DC power module that provides programmable voltage and current, measurement and protection features at a very economical price, making these modules suitable to power the DUT or to provide power for ATE system resources such as fixture control.
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Product
Cryogenic Applications
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Over the last 20 years the Celadon Engineering team has developed an expertise in cryogenic materials which has resulted in a solid reputation in the industry for producing extremely stable cryogenic on-wafer probe card as well as DUT probing solutions. These custom cryogenic probe card solutions are widely used to test Space, Military, Medical and Quantum Computing products. Celadon’s cryogenic solutions vary from standard VersaTile™ footprints which interface to positioners to innovative custom PCB based designs to allow for flexibility when testing at these very cold temperatures. Lakeshore cryogenic wire is used in standard DC solutions for high density cableout designs to support high pin count applications. During the development process, Celadon works closely with the cryogenic prober vendor to ensure the integrated solution is optimized for current and future testing needs.
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Product
Assay System (Rest System for Longevity)
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New polymers are constantly being developed and component manufacturing techniques appear, allowing the gradual replacement of metallic materials by plastics or composites, in various fields of application, in different industries. In particular, in the air conditioning, heating and water supply sector, plastic components are subject to the aging process due to the temperature to which they are subjected or due to the amount of oxygen in the fluids. The Test System for Longevity and Accelerated Aging Tests developed by Controlar allows to foresee, in accelerated test, the wear throughout the life of the plastic components of the hydraulic systems, in order to prevent eventual failures during the useful life cycle of the DUT.
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Product
RF-Antenna Communication Links Functional Test
Functional Test
The application encompasses functional tests of very large quantities of automotive antenna amplifiers, plus parallelization of tests by implementing several test stations in a rotary indexing table. The DUTs are inserted manually and after final assembly, they are loaded into the rotary table; this requires manual triggering by the operator.
