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Product
Automotive Test Platform
ETS-800
Test Platform
Next-Gen Automotive Test Platform With the Industry’s Highest Throughput and Fastest Time to Market
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Product
WEIGHING SYSTEM TESTING
1006
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The Tester 1006 has a simultaneous control function of up to 4 load cells in any weighing system, upload and download function for programming the DAT and MC 302 series instruments, but it can also be used as a Calibrator and Peak detector. It is very useful for the correct mechanical installation and for fault diagnosis. The Tester 1006 is supplied as standard with cable for connection to our junction boxes / sum mod. CEM 4 / C and CGS 4 / C. Simultaneous display of the signal of each individual load cell allows to control the entire weighing system, weight distribution, overloads, faulty cells and faulty connections. OUT OF PRODUCTION. Pavone systems provides a new version of Tester 1006: Tester 1008.
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Product
EMC Test System
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An electric product might cause the malfunction to other electric appliances by discharging the emission noise from it, or is oppositely caused the malfuction by the emission noise from other electric appliances. The former is checked by the EMI test and the latter is checked by the EMS test. The international standard like the CISPR standard is provided so that such an accident should not happen, and the manufacturer must declare by themselves beforehand that their product meets the standard. The generic name of the EMI test (Electro-Magnetic Interference) of the emission measurement and the EMS test (Electro-Magnetic Susceptibility) of the immunity
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Product
NI Semiconductor Test Systems
Test System
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
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Product
Closed-Loop Servohydraulic Test Bench Control System
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Closed-loop servohydraulic test bench control system is based on digital devices of ZETSENSOR series with CAN interface. This system has fast response characteristics, high precision, and compact dimensions. The system enables comprehensive control of the servo drive in automated mode in compliance with the set test parameters such as pressure (force), displacement, along with the parallel control of other system parameters such as temperature, pressure, filter plugging, oil pressure, etc.
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Product
Combined Environmental Reliability Test System
VTC SERIES
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HALT/HASS testing challenges the design, components, sub-assemblies and final assemblies of today's manufactured products. Stresses are applied through a number of conditions to set operational limits and ultimately precipitate failure in the HALT/HASS test environment. Rapid thermal change rate is one of the classic conditions that facilitate product stress.VTC Series chambers are equipped with an LN2 cooling system, with modulating valve and directed air flow to the product, provides the rapid thermal change rates required to achieve maximum product stress. Additionally, these rates are accomplished with smaller space requirements, lower audible noise, no water requirement, and lower maintenance costs than a typical refrigeration system.
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Product
Power mixed test system
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Power device or module with which are digitally controlled and memory can be measured per system.
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Product
Vibration Test Chamber Gantry Frame System
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Guangdong Test EQ Equipment co., Ltd.
- Structural Design: Monolithic construction with seamless TIG welding for durability and aesthetics. Lever-driven door lock mechanism.- Smart Control System: Features a Chinese/English-language color LCD touchscreen HMI + high-performance PLC, powered by TESTEQ's proprietary software for automated, intelligent, and user-friendly operation.- Energy Efficiency: Incorporates TESTEQ's patented "Static Balance" technology, reducing energy consumption by over 30% during low-temperature stabilization.- Vibration Integration: Gantry Frame System: Worm gear-driven vertical adjustment and lateral positioning via wireless remote.- Advanced Sealing: Custom flexible connectors ensure airtight integration between temperature/humidity chambers and vibration platforms.
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Product
High Voltage Test System
CKT1175-15
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12.5 mV – 2000 VDCIR measurements to 5000 megohmsHipot testingDwell time prog. from 1 ms to 1000s in 1 ms steps
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Product
Optics Test Systems
Lens Test
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Optik Elektronik Gerätetechnik GmbH
LensTest enables the measurement of air gaps, lens thickness, lens radii and lens surface centration errors in mounted lenses as well as the active alignment of lens surfaces during optics assembly for centering without rotating the assembly.
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Product
System on Demand (SoD): HiL Test System
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System on Demand (SoD) is a unique, agile and standardized principle to design HiL test systems. SoD shifts the focus away from technical-only solutions to a proven automated design process – targeting our customer‘s real issues: time, budget and flexibility.
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Product
Test Program Sets & Custom System Level Software
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WesTest Engineering Corporation
WesTest Engineering Corporation offers turnkey test solutions for the military and aerospace sectors. Our engineering capabilities present an unmatched ability to take customer test requirements and design, developand integrate Test Program Sets (TPS) with diagnostics to the component level. This is further supported by a full complement of documentation, from Test Requirements Documents, to TPS Flowcharts, to Test Reports.With 36 years’ experience and 1000+ TPSs in our history, the WesTest Engineering Staff remains as one of the top notch senior staff’s in the TPS sector today. Our leadership and program management have the historicalexperience to lead WesTest capability to meet the customer’s requirement.
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Product
Solar Cell PL/EL/IV 3-in-1 Testing System
VS6841
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Industrial Vision Technology Pte Ltd.
This luminescence Analyzer integrates a Photoluminescence (PL), Electroluminescence (EL) , and I-V Measurement Technology, has a Device’s PL image, EL image, as well Device’s I-V characteristics in One system. It is being using to quantitatively map Minority-Carrier Lifetime, and to characterize the defect of silicon wafer & solar wafer, and measure the key parameters from solar cell I-V Curve. It is also a useful tool for scientist to develop other methodology & parameters that can be used as a promising technique for online material monitoring and process control.
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Product
Spectrophotometer & Integrating Sphere Test System
LPCE-1
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This Test System is suitable for photometric and colorimetric measurement of luminaries such as Energy-saving lamps, Fluorescent lamps, HID lamps (high voltage sodium lamps and high voltage mercury lamps), CCFL and LED. The measured data meets the requirements of CIE and IES LM-79 for the measurement of photometry and colorimetry.
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Product
Test Tables / System Solutions
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WEETECH, as a manufacturer of test equipment, offers its customers also a "Ready To Use" test system solution. It consists of the test table, the customer-specific adaptation as well as the test device, and is very quickly ready for use at the customer's site. According to the customer's requirements, the set-up is designed as a system with permanently installed adaptations for the production of constant cable harnesses in large quantities or with interchangeable adapters for the flexible production of different cable harnesses. Depending on the application, a larger table version or a smaller desk version is available. Various interfaces are available for integrating these solutions into a complete production automation system.
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Product
System Tests Radar Pulse Stability
PN9002
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Noise eXtended Technologies S.A.S.
The cost-effective PN9002 test simplifies the testing and analysis of pulse-to-pulse amplitude and phase stability for radar systems and components to 18GHz.
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Product
Test Systems & Sub-systems Development and Integration
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Research, development and the production of electronic test equipment, systems and subsystems for the industrial, scientific, and defense markets.
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Product
EMI and EMC Test System
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EMI receiver system. It is a main test system for EMI (Electro Magnetic Interference) testing. The EMI-9KB is produced by the full closure structure and strong electro-conductibility material, which has high shielding effect. Due to the new technology for the EMI Test System, it solved the instrument self-EMI problem.
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Product
Swept Test System For Optical Components
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measurement platform for optical components with a fastscan speed, high resolution and accuracy. The systemcombinesour tunable lasers, polarization controller, power meter and software.
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Product
Modular Breakout System 37-Pin D-type Plugin Module for 40-293
95-293-001
Modular Breakout System
The 95-293-001 Plugin Breakout Module is designed to be fitted to a PXI 40-293 Programmable Resistor Module as part of the Pickering MBoS. The Modular Breakout System is designed to Simplify HILS (Hardware In the Loop Simulation) Applications.
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Product
DC Power / Energy Absorber Test System
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AMETEK Programmable Power, Inc.
The Energy Absorber Test System includes power supplies and a regenerative energy absorber with a rating of 400VDC at ±150A. The system consists of DC power supplies, an AC distribution and interlock system, an energy absorber chassis and an absorber load resistor chassis. The power sources are equipped with a remote control option allowing control via GPIB or with front panel controls in local mode. The operation of the specific parts of the system is described in the sections below.
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Product
Electrolyzer Test Systems
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Advanced Test System for Research & Development of PEM Electrolyzers
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Product
Sound Level Test System
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In a world where precision and performance rule, measuring and controlling sound levels can be crucial to the success of your product or project. The team at Integrated Test & Measurement (ITM) have developed a customized solution that not only measures and collects sound-level data, but will help your team identify the specific components causing all that noise.
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Product
Millimeter-Wave Automated Accelerated Reliability Test Systems
nm-Wave AARTS System
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AARTS fully integrated, automated, turnkey system provides flexibility and accuracy in determining RF and DC performance degradation with aging to predict life expectancy for compound semiconductor devices. Our millimeter-wave Automated Accelerated Reliability Test Systems (AARTS) and fixture solutions are available in standard frequency ranges from 26.5 to 67 GHz.
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Product
Test DVD For OmniMic Precision Measurement Systems
OMDVD Version 1
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The Dayton Audio OMDVD Test DVD brings the ease of the OmniMic V2 system to measurements of 5.1-channel audio systems. It’s the essential tool for professional installers and home theater enthusiasts to ensure proper audio calibration and optimization of a home theater or multichannel music system for the highest possible performance. The full functionality of the OmniMic V2 measurement system is now available through every channel of a 5.1-channel audio system thanks to the OMDVD Test DVD’s suite of high-quality test tones, and an intuitive menu structure that has been optimized for ease of use.
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Product
High Impact Shock Test System
KRD16 series
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High impact shock test system meets MIL-S-901D standard which covers shock testing requirements for ship board machinery, equipment, systems, and structures, excluding submarine pressure hull penetrations. The purpose of these requirements is to verify the ability of shipboard installations to withstand shock loadings which may be incurred during wartime service due to the effects of nuclear or conventional weapons.
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Product
K-Band Silicon SATCOM Rx Quad Core IC
AWS-0102
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The AWS-0102 is a highly integrated silicon quad core IC intended for satellite communications applications. The device supports four dual polarization radiating elements with full programmable polarization flexibility. The device provides 22 dB of gain with a noise figure of 3.4 dB. Additional features include gain compensation over temperature and temperature reporting. The chip features ESD protection on all pins, operates from a +1.8 V supply, and is packaged in a 56 lead 7x7 mm QFN for easy installation in planar phased array antennas.
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Product
Measurement System
A0010A RIN
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realizes world's widest 40 GHz measurement bandwidth with high-sensitivity, low-noise 40 GHz optical receiver and Agilent high-performance X-series signal analyzer. SYCATUS developed unique calibration method, which achieves high accuracy and repeatability.Feature
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Product
Commercial Test Systems
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IR Target Projectors, IR/Visible Target Projections, Wide FOV Target Projectors, Focal Plane Array Tester, Fused IR/Visible Projectors, High Volume Tester, IR/Visible Ranging Projectors, Dual Blackbody Wide FOV, Future Test Requirements.
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Product
RF Conducted Immunity Test System
RFCI61000-4-6
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RFCI61000-4-6 RF Conducted Immunity Test System is an automatic test system which is for the conduction sensitivity testing, it is fully meets IEC61000-4-6.2006, ISO11452-4, GB/T17626.6-2008 and GTB152B-CS114 etc standards. RFCI61000-4-6 internal source and broadband power amplifier can be generated 3 voltage test levels: 1v, 3v and 10v, and has the function of the real detect output level. It has two operation software which is calibration software and test software. When measuring, the signal is in 1 KHZ sine wave amplitude modulation system (80%) to simulate the actual harassment, and can through the coupling/decoupling network (CDN or electromagnetic clamp) to make the harassment signal coupled to the device.
