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Unit Under Test
assures a constituent's interoperability in a system.
See Also: UUT, EUT, System Under Test, Device Under Test
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Electrical Insulation Tester Kit with Dual Display
420001
When undertaking power installations, the 420001-insulation tester can provide special help to test wiring. This unit can provide 125V,250V, 500V and 1000V source for the test, and under each range it can supply 1mA current to feed the capacitance load. With the auto-range function, it can measure up to 4,000 Megaohm with the resolution of 1Kohm.
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Universal Breakout Test Fixture
CA-323
The CA-323 Universal Breakout test fixture was designed to provide, as the name suggests, a universal test solution for aircraft trouble-shooting. The unit gives the technician the ability to monitor (100) different conductors or open an individual conductor for simulation or measurement. Any avionics component can be extended and in many cases with only a voltmeter and oscilloscope the operation in question of the Unit Under Test can be determined.
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VXI Analog Instrument
Ai-710
The Ai-710 is a Core System Instrument (CSi)—a single-slot, multi-function VXI analog test instrument. It eliminates the requirement for multiple discrete instruments that often provide inadequate test coverage for newer Units Under Test (UUTs). The single-slot VXI form factor reduces tester footprint, as well.
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Test Line • Equipment For Testing For Function
The test equipment is used for qualitative functional testing of discharge power supply units and / or ionization units from the static line and air line (discharge). The devices are usually operated with a single button and indicate via LED, whether the device under review functions properly.
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Quad 4x32 Reed Matrix for 34980A
34934A
The Keysight 34934A module for the 34980A Multifunction Switch/Measure Unit offers the highest density matrix for connecting paths between your device under test and your test equipment, allowing for multiple instrument connections to multiple points on your device under test at the same time.
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Thermal Shock Testing
DATASYST Engineering & Testing Services, Inc.
Thermal shot testing is a accomplished through the use of two-zone temperature chambers where the unit under test is shuttled between chambers.
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Keysight Dual/Quad 4x8 Reed Matrix for 34980A
34933A
The Keysight 34933A module for the 34980A Multifunction Switch/Measure Unit gives you the most flexible connection path between your device under test and your test equipment, allowing different instruments to be connected to multiple points on your device under test at the same time. Dual 4x8, 8x8, or 4x16 2-wire configurations 64 2-wire or 128 1-wire cross-points High-speed reed relays Connections to the internal DMM Expandable via four 2-wire analog buses Relay counter ±150 V peak, .5 A switch, 1.5 A carry current
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SWB-2834, 8x34, 2 A, Electromechanical Relay Matrix Module for SwitchBlock
781421-34
8x34, 2 A, Electromechanical Relay Matrix Module for SwitchBlock - The SWB‑2834 is an electromechanical relay matrix card for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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AOI Handlings System
The AOI handling system is a compact facility with various test units. Via an ionization cleaning station the ceramics are transferred to the contacting station. There, the resistance values of the substrates are tested with a rigid needle adapter. Afterward, the ceramics are further conveyed to the three (optionally four) AOI test stations (for automatic optical inspection) and are tested for cracks, unevenness, faulty imprints, contamination, etc. The poorly evaluated ceramics arrive at a review station where the operator can assess and evaluate the errors on the monitor. If the operator is uncertain about a fault, the ceramic in question can be positioned under the microscope position and inspected by eye. Poorly defined ceramics are marked accordingly with an ink pen.
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SWB-2811, 8x21, 1 A, Reed Relay Matrix Module for SwitchBlock
781421-11
8x21, 1 A, Reed Matrix Module for SwitchBlock - The SWB‑2811 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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RSE Wireless EMC Spurious Emission
TS8996
The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.
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96 Channel DPST Relay And Control PXI Carrier Card
GX6196
The GX6196 is a 6U PXI switch and control board that can be used to create custom switching, signal conditioning, or specific UUT control interfaces. The board provides 96, 2 pole, form A relays, 8 digital I/O lines, and a serial digital interface. All of these resources are available via (5) inter-board connectors which interface to the user defined daughter / mezzanine board. The mezzanine board provides all connections to the unit under test (UUT) via two 78 pin D-sub connectors. The GX6196 is supplied with a front panel which accepts (2) 78 pin D-sub connectors.
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In-Circuit Tester Integration
The benefits of boundary-scan are noticed in all phases of a product life cycle. By coupling the power of Corelis boundary-scan tools with an In-Circuit Tester (ICT), a complete, integrated solution is available that offers the best advantages of both technologies.Boundary-scan operates as the perfect companion to ICT. Boundary-scan is capable of testing areas of printed circuit board assemblies that are difficult to access due to physical space constraints and loss of physical access, which is often due to fine pitch components such as Ball Grid Array (BGA) devices. Conversely, the ICT is able to check the non-boundary-scan compatible portion of the unit under test (UUT) such as analog.
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Digital and Analog Test Sets
Our analog and digital automated test system experience covers a wide variety of applicationsfrom multiple path resistance, capacitance, and inductance testing using various Interface Test Adapters (ITA)to inter-connect multiple customer units under test (UUT). Other systems have included: equipment to monitor and record telemetry, digital data streams, and systems that evaluate packet data using a variety of VME, VXI, PXI, and LXI equipment.
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On-board Emissions Measurement System
OBS-ONE PM unit
OBS-ONE PM unit is the industry-leading on-board Particulate Matter (PM) measurement system. It collects PM on a filter paper, using a partial flow gravimetric sampling method, while simultaneously measuring real-time PM. A key feature of this design is the use of a venturi flow meter which enables reliable proportional sampling and accurate exhaust gas flow measurement under transient flow conditions. Combine the GAS unit and PM unit to perform certification tests on heavy duty and non-road vehicles.
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4 x 8 Two-Wire Matrix Module for 34970A/34972A
34904A
The Keysight 34904A module for the 34970A/34972A Data Acquisition/Switch Unit gives you the most flexible connection path between your device under test and your test equipment, allowing different instruments to be connected to multiple points on your DUT at the same time. Rows or columns may be connected between multiple modules to build 8 x 8, 4 x 16 or larger matrices, with up to 96 crosspoints in a single frame.
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HIGH FREQUENCY DC BIAS
6565 SERIES
The 6565 HF DC Bias Unit is intended to be used with a Wayne Kerr 6500 analyzer, either the 6500B Precision Impedance Analyzer or the 6500P HF LCR Meter. Its function is to provide a source of DC bias current through the Device Under Test (DUT) while the analyzer is making AC measurements. Each 6565 unit can provide up to 10 A of DC current, and up to six 6565 units can be connected in parallel to supply a maximum 60 A. A digital ammeter on the front panel allows the user to see the dc bias current value and an indicator LED shows when the bias current is enabled.
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2 GHz Dual 1:4 RF Mux, 50 Ohm Module for 34970A/34972A
34905A
The Keysight 34905A RF multiplexer module for the 34970A/34972A Data Acquisition/Switch Unit offers broadband switching capabilities for high-frequency and pulsed signals. Use it to route test signals between your device under test and your signal generator, oscilloscope, spectrum analyzer, or other instrumentation.
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Polarity Tester
PT-1
International Electro-Magnetics, Inc.
The PT-1 provides a simple and easy way to determine the relative polarity of coil windings. It allows for an in-process test that takes a minimum of time to perform. By placing a coil on the platform and making connection to the start and end of a winding, a test signal is induced in the winding. The induced signal is low level and completely safe for the operator. By comparing the test signal phase of the coil under the test output, the relative polarity is indicated by the Red/Green LED. The tester operates by inducing a signal voltage in the coil under test by means of a magnetic flux field. The field is generated by a coil located in the probe base. The coil configuration is designed to provide optimum field distribution. We have also applied this basic circuit to a 5-channel scanning unit.
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Dynamic Digital I/O with Per Channel Programmable Logic Levels and PMU PXI Card
GX5295
The GX5295 offers outstanding digital test capabilities and channel density in a compact 3U PXI form factor. Offering both performance digital and analog test capabilities, the GX5295 provides a cost-effective, tester per pin architecture - making this card the ideal choice for high throughput, mixed-signal component test applications. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).
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Turns Ratio Testers
TRT Standard Series
When it comes to choosing a transformer turns ratio tester, TRT Standard series offers some of the most advanced instruments with LCD display out in the market. Each model measures transformer excitation current and phase shift performs automatic vector group detection and magnetic balance on three-phase transformers and three-phase autotransformers. Furthermore, they have a built-in true three-phase power source. Because of that, TRT Standard instruments can test transformers with special configurations, such as phase-shifting, rectifier, arc-furnace, traction transformers, etc.The instruments can output test voltages from 1 V AC to 250 V AC, depending on the chosen model. High test voltage of 250 V AC provides more accurate turns ratio testing compared to other turns ratio testers on the market and extremely low test voltage of 1 V AC enables turns ratio verification of current transformers.TRT Standard series consists of:TRT03 Models (TRT03A, TRT03B, TRT03C) – single-phase voltage up to 100 VTRT3x Models (TRT30A, TRT30B, TRT30C, TRT33A, TRT33B, TRT33C) – single and true three-phase voltage up to 100 VTRT63 Models (TRT63A, TRT63B, TRT63C) – single and true three-phase voltage up to 250 VMore about models differences can be found under the downloads tab, in brochures and comparison sheets.A user can create test templates using the DV Win software and store them in the PC’s memory for later use when in the field.TRT Standard series models have a built-in tap changer control unit. Consequently, it enables remote control of an on-load tap changer (OLTC) directly from the tester. In order to make the most out of this feature, the DV-Win software can be programmed to do everything automatically – running turns ratio tests, changing OLTC tap positions and saving results. This option, especially in combination with test templates, significantly facilitates and shortens the turns ratio testing time.
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PXI-2515, 35-Channel, 0.25 A PXI Signal Insertion Switch Module
778572-15
35-Channel, 0.25 A PXI Signal Insertion Switch Module—The PXI‑2515 is a multiplexer switch module that enables connectivity by routing high-speed digital I/O (DIO) signals between a device under test (DUT) and an NI high-speed DIO device or a parametric measurement device. You can use modules such as PXI Source Measure Units (SMUs) and PXI Digital Multimeters (DMMs) with high-speed digital devices. With the PXI‑2515, you can perform parametric tests on digital pins without external connectivity or impedance mismatch challenges.
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SWB-2813, 4x21, 1 A, 2-Wire Reed Matrix Module for SwitchBlock
781420-13
4x21, 1 A, 2-Wire Reed Matrix Module for SwitchBlock - The SWB‑2813 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Interface Panel for SLSC
THROUGHPOINT™
Bloomy's ThroughPoint™ Interface Panel provides a simple, yet highly-flexible connection between the unit under test and resources in a National Instruments Switch/Load/Signal Conditioning (SLSC)-based test system.
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Power Supply Testers
Qmax Test Technologies Pvt. Ltd.
Power Supply Tester is an integrated package of hardware such as AC/DC Power Sources, DC Loads, Noise Measurement Unit, and DMM etc configured as per user applications, which makes it suitable for testing wide range of Power Supplies and provide economic solution for testing AC/ DC and DC/DC power supplies and converters. The Power Supply Boards that passed in the first level of screening for Go-No Go tests will undergo a second level testing. The second level of testing measures all the key parameters of the power supply such as line regulation, load regulation, efficiency etc and check whether the results are within the mentioned limit, if not declare the UUT (Power Supply Board Under Test) as a failed one.
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SpaceWire Physical Layer Tester
141
The SpaceWire Physical Layer Tester (SPLT) is a tool designed to test, validate and verify a SpaceWire system across all levels of the SpaceWire standard. Two SpaceWire ports employ a special LVDS interface which allows the transmitted signals to be deliberately and measurably manipulated to test the capability of a unit under test to receive signals of varying quality.
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Display Color Analyzer
Model 7123
Luminance and chromaticity measurement of Color Display0.005 cd/m2low luminance measurement (A712301)Wide luminance range: 0.0001 to 25,000 cd/m2 (A712301) 0.01 to 200,000 cd/m2 (A712302)High accuracy measurementMaximum 9 display modes: xyY, TΔuvY, u’ v’ Y, RGB, XYZ, Contrast, ProgramAble to control Video Pattern Generator and UUT (Unit Under Test)Built-in contrast measurement function to calculate the contrast ratio directlyEquipped with programmable test items that can complete the planned tests with one single buttonSupport USB flash disk that can copy the test procedures to other station for useJudgment function embedded to judge the test result automatically with one single buttonCalibration period setting and reminding functionMemory for storing 100 channels of standard color data and calibration dataBuilt-in flat display calibration data LCD-D65 & LED-D65* to be applied for chromaticity measurement instantlyOptional display white balance alignment system can be used to integrate all optical test stations to one single station
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Test Program Execution for High-Volume Production Systems
ScanExpress Runner Gang
Electronic manufacturing test systems must be fast and efficient. Schedules today are shorter, products are more complex, and the market demands higher speed—the product needs to be built and shipped yesterday.ScanExpress Runner Gang Edition is a concurrent boundary-scan and in-system programming test executive designed specifically for high volume production. Unlike traditional test systems which execute sequentially on a single unit under test (UUT) at a time, ScanExpress Runner Gang Edition provides concurrent (gang) testing on up to 8 UUTs for improved test and programming times.
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Camera Testing
FLIR
CI Systems' FLIR turn-key test stations carry out all the necessary tests to verify and compare the quality of an infrared/thermal camera. The FLIR test systems are based on CI Systems' NIST traceable blackbody radiation sources, collimators and special thermally controlled targets, designed to provide very accurate IR test patterns. All these combine to project standardized targets with known geometry and intensity to the Unit Under Test(UUT).
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22 Bit / 2 MS/s Arbitrary Waveform Generator
AWG22
The AWG22 is a 22 bit Arbitrary Waveform Generator for medium-speed / high resolution waveform generation. The module combines an exceptional dynamic performance with a very high DC accuracy.The AWG22 is upwards compatible with the AWG20 and also features differential outputs with a programmable common-mode voltage.The module has 8 output ranges starting at 80mVpp up to 10.20Vpp, which covers a wide range of Unit Under Test input voltages.
