Test Switches
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PXI/PXIe MEMS Optical Switch, Triple Insert/Bypass, Single-Mode, 9/125 Fiber, LC Connectors
42-860A-432
The 40/42-860A-432 is a PXI/PXIe triple insert/bypass switch with LC connectors and is part of Pickering's range of PXI Fiber Optic MEMS Switching modules.
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Microwave SPDT Plug-In Switch Card
1260-160B/E
The Astronics 1260-160B/E is a 1 or 2-slot microwave switch plug-in for use in either the Astronics 1260-100 Adapt-a-Switch™ VXI carrier or the 1256, GPIB/RS-232 Switching Mainframe.
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Electronic Control Unit Functional Test
End-of-line tests are critical to ensure passenger safety in the era of smarter vehicles. A flexible test solution is needed to ensure extensive test coverage and high test throughput with a low total cost of ownership.
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Semiconductor Testers
Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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PCI Express 5.0 Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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PXI/PXIe RF Switch, Hex SPDT, Terminated, 8GHz, 50Ω, SMA
42-880B-003
The 40-880B-003 (PXI) and 42-880B-003 (PXIe) are hex SPDT 50Ω RF switches with 8GHz bandwidth. The 40/42-880B range have automatic termination of unused signals and are available as a dual switch in 1 slot, a quad switch in slots or hex and octal switches in three slots.
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Batterie Inspektor
By combining the most diverse hardware and software modules, Batterie Inspektor™ delivers innovative, automated, and digitalized battery testing at every stage of manufacturing. With this flexible test platform, all modules can be adapted to their respective quality requirements. Manufacturing is simplified through a scalable and standardized framework for both new projects and upgrades.
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PXI/PXIe MEMS Optical Switch, Dual Insert/Bypass, Single-Mode, 9/125 Fiber, SC/PC Connectors, With Interlock
42-860A-222-HI
The 40/42-860A-222-HI is a PXI/PXIe dual insert/bypass switch with SC/PC connectors, includes hardware interlock and is part of Pickering's range of PXI Fiber Optic MEMS Switching modules.
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PXI/PXIe MEMS Optical Switch, Quad Insert/Bypass, Single-Mode, 9/125 Fiber, LC Connectors
42-860A-442
The 40/42-860A-442 is a PXI/PXIe quad insert/bypass switch with LC connectors and is part of Pickering's range of PXI Fiber Optic MEMS Switching modules.
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Test Fixture Kits
More then ten years of experience in special, customized engineering and manufacturing brought us to the highest level of creating reliable, flexible and robust Test Fixtures. Currently our HQ is located in Vecsés, Hungary together with our R&D. Equip Group has Test Fixture Kit manufacturing plant in Serbia, focusing on supplying competitive, high – quality and high – volume products for the global market.With more then 180 employees, Equip – Test is able to offer our customers turnkey solutions in fixturing with test program generation. No matter if you have a simple or complex, high-density PCB (Printed Circuit Boards), or if you have DUT (Device Under Test) already assembled into metal or plastic housing, we can offer you a very stable technical solution.
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Alternate 1.10 (31.18) - 7.20 (204.00) Switch Probe
TSP100-FK180-2
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,990Overall Length (mm): 50.60Switch Point (mil): 59Switch Point (mm): 1.50
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ATE Self Test Fixtures
AL663
AL663 fixtures include all the electronic parts required to perform an effective test platform diagnostic. The AQ818 device allows to perform a series of tests, obtaining a report of the faulty instruments or switch modules and also a report about the relay contacts estimated life.
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ARINC-708 Module
M4K708
The M4K708 module is an ARINC-708 / 453 2-channel test and simulation module for the Weather Radar Display Databus. The M4K708 supports two ARINC-708 / 453 channels, each selectable as transmit or receive.
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Standard 2.90 (82.20) - 5.40 (153.00) Switch Probe
TSP157-H200-1
Current Rating (Amps): 10Average DC Resistance lower than (mOhm): 20Test Center (mil): 157Test Center (mm): 3.99Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 984Overall Length (mm): 25.00Switch Point (mil): 67Switch Point (mm): 1.70
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Modular VXI Switch Card Carrier
1260-100
The 1260-100 Switch Carrier accommodates up to six plug-in switch cards, providing optimum switching solutions while reducing the ATE size requirements.
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96-Pin Male SCSI to 96-Pin Female SCSI Switch Cable, 1.5m
150275-1R5
96-Pin Male SCSI to 96-Pin Female SCSI Switch Cable, 1.5m - The SH96F-96M SwitchBlock SCSI Cable provides connectivity for SwitchBlock modules. You can connect these to the TBX-2809 Terminal Block, which exposes each channel of the switch module to screw terminals.
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SoC Test Systems
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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VXI Digital Multiplier
4152A
The 4152A’s advanced features like limit testing, averaging, speed/resolution trade-offs, and fast function changes provide the high “test system” throughput required in today’s production test environments.
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High-Density PXI Multiplexer Switch Modules
This range of High-Density Multiplexer Switch Modules provides a compact array of MUX solutions with differing combinations of channel counts and poles. Most of our high-density solutions include isolation relays that allow the MUX to be disconnected from the single input/output port, enabling the convenient interconnection of other channels.
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Functional Test
cUTS
Get the essentials of measurement automation to power tests of simpler PCBAs and subassemblies. compactUTS (cUTS) is a cost-effective platform for automating manual tests of devices with fewer than fifty cable-accessible test points in manufacturing environments with moderate production volume. DUT-specific electrically keyed cables make changeover quick and easy.
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Wireless Device Test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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NTS Platform
Manufacturers all over the world are leveraging our NTS platform for products with rotating or otherwise moving parts, or produce sounds. Typical applications include mass production of air conditioning units, pumps or small electric motors, where errors in assembly can cause malfunctions or significantly shorten service life. This test platform is customized to your specification and application. Feasibility studies are available to ensure your solution is exactly what you are looking for.
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3-Axis Non-Robotic Automated Testing System
AT3
The Instron AT3 is a space-efficient, highly adaptable 3-axis mechanical testing platform designed for automated execution of tensile, compression, flexural, and lap shear tests. Built to comply with a broad spectrum of ASTM and ISO standards, it’s well-suited for evaluating materials such as plastics, elastomers, thin films, foils, and metals. The system streamlines the entire testing workflow from specimen measurement and handling to strain measurement and specimen disposal—enabling users to load up to 160 samples and let the AT3 take care of the rest. Boost productivity, reduce manual intervention, and achieve consistent, dependable results with every test cycle.
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6TL08 Benchtop Test Platform
H710008
The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettesThe platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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PXI Flexible Microwave Module, Dual SP6T 40 GHz, Single SPDT 40 GHz, 50 Ω, SMA
40-890-005
The 40-890 (PXI) and 42-890 (PXIe) range of PXI microwave modules allows users to specify the mix of relay types, frequencies and quantities based on the application requirements within the capabilities of the module driver card. Choose from the extensive relay selection already available in the Pickering microwave range to create a flexible solution.
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EV-DO Analysis Using NI PXI RF Test Instruments
NI-RFmx EV-DO
Highly optimized RF measurement experiencePerform physical layer analysis on EV-DO cellular signals including MODACC, ACPR, CHP, OBW, and SEMSimple access to advanced measurement parallelism
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Battery Management (BMS) Environmental Test System
The BMS Environmental Test System is a configurable platform simulating the essential signals used by Battery Management Systems (BMS) and cell-monitoring modules with the ability to perform environmental testing on multiple BMS units simultaneously. The system implements single-point value testing to evaluate specific BMS functions such as cell over and under voltage scenarios, cell leakage current, lost communications, or faulty system IO.
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High 2.90 (82.20) - 12.60 (357.00) Switch Probe
TSP100-C100-3
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,990Overall Length (mm): 50.60Switch Point (mil): 59Switch Point (mm): 1.50
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PXI 10A Fault Insertion Switch 6-chan 2-bus
40-192-012
This PXI fault insertion switch uses solid state switching elements and is capable of switching current up to 10A. It is designed to be able to insert three different fault conditions between the test fixture and the equipment under test: Open-Circuit. Short-Circuit between UUT connections. Short-Circuit to external signals. Through relays on each channel enable signals to the UUT to be set open-circuit. Fault Insertion Buses allow any channel to be shorted to any other channel and also enable any channel to be connected to an external signal such as Power, Ignition or Ground to simulate fault conditions. The module is supplied with 2 fault buses.
