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Flaw Detector & Thickness Gauge
DFX-7+
Measurement Gates: Two independent gates (Flaw), and three gates (thickness). Start & width adjustable over full range. Amplitude 5-95%, 1% steps. Positive or negative triggering for each gate with audible and visual alarms.
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High Speed Digitizers
High performance and high speed digitizers with wide bandwidth and high dynamic range. Featuring high-speed Analog-to-Digital Converters (ADC) with Real-Time Field Programmable Gate Array (FPGA) based digital processors. Long acquisition memory coupled with fast PCIe offload and streaming over optical data interfaces (ODI).
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High-density Power Drivers
Gate drivers, FETs and protection circuitry integrated into a single package to drive loads in industrial and home-appliance applications, with increased power density per cm². ST’s high-density power drivers are System in Package (SiP) solutions integrating in compact QFN packages the STDRIVE gate drivers and MOSFET-based power stages, responding to the industrial market trend towards higher levels of integration and lower development costs.
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Half, Full Bridge & Three Phase Drivers
Renesas' half-bridge (h-bridge), full-bridge and three-phase drivers handle voltages up to 100V, with industry-leading gate rise and fall times and exceptional input-to-output propagation delay performance.
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40-67 GHz Power Amplifier
1GG6-8070
The 1GG6-8070 is a high gain, medium power mmwave amplifier. It can be used as part of a banded solution to achieve respectable mmwave power. Input and output ports are matched to 50W. The amplifier is biased with a single positive drain supply (VDD) and a single negative gate supply (VG1).
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VFTLP+ Test System
4012
The Model 4012 VFTLP+™ test system was developed in early 2000 to add high speed measurements to the usual I-V plot, to measure and record the real TDDB waveform which causes oxide failure.*Accurate measurements of this waveform have finally been identified by Barth Electronics Inc. and CDM protection can now be based on known dimensional design parameters. We identify the response of your CDM protection circuits with 100ps risetime pulses which simulate the real CDM test. This is the only way with which to provide the total gate oxide threat voltage data.*Convenient, precise, repeatable operation*Computer controlled for automated testing
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Laureate Time Interval Meter
Model FRI
Configured to time periodic events which produce start and stop pulses from 1 s to 199.99 s over a programmed gate time up to 199.99 s. Timing resolution to 0.2 s. Optional data I/O and relays for alarm or control. Six 0.56" (14.2 mm) high digits, 1/8 DIN case.
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1.3GHz Frequency Counter
Model 1122 / 1122X
- Wide Frequency Range 0.2Hz to 1.3GHz- 2 Separate Channels, for LOW & HIGH Frequencies- High Sensitivity- 8 Digit Green LED Display- Microcontroller based Advance Technology- Optional RS232 Interface- Reciprocal Counting Technique for High Resolution at Low Frequency- Period Measurement- Low Pass Filter for Noisy Low Frequency (<100KHz)- 4 Selectable Gates (10ms, 100ms, 1sec, 10sec)
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Advanced SoC Test System
3680
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
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Precision SOT-23 FGA™ Voltage References
X60003
The X60003 FGA™ voltage references is a very high precision analog voltage reference fabricated in Renesas' proprietary Floating Gate Analog technology, which achieves superior levels of performance when compared to conventional band gap, buried zener or XFET™ technologies.
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Data Communications
Renesas' MIL-STD-883-compliant CMOS Manchester Encoder-Decoder (MED) is a high-speed, low power device manufactured using self-aligned silicon gate technology. The device is intended for use in serial data communication, and can be operated in either of two modes, a converter mode or repeater mode. This device is qualified to QML Class Q military standards.
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Saturable Reactor Inductors
Osborne Saturable Reactors are designed to provide a variable output voltage through the use of variable impedance connected in series with a constant impedance load. Each saturable reactor’s impedance is determined by the application of DC power to a control winding. As the level of power supplied to the control winding is increased, the saturable reactor becomes more saturated. This reduces the impedance of the AC gate winding, and increase the amount of the supply voltage that is transferred to the load. Conversely, as the power is reduced to the control winding, the reactor becomes less saturated, the gate winding has more impedance and less of the input voltage is provided to the output impedance. This approach provides excellent quality, reliability, and control when designed to match the requirements of a specific application.
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Rad Hard GaN FETs
Wide band gap semiconductor technologies such as Gallim Nitride Field Effect Transistors (GaN FETs) have been gaining interest for power management and conversion in space applications. These devices feature higher breakdown voltage, lower RDS(ON) and very low gate charge enabling power management systems to operate at higher switching frequencies while still achieving higher efficiency and a smaller solution footprint. There is an additional benefit from GaN devices that make them attractive to the space market. These devices are inherently immune to total ionizing dose radiation.
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Dual Gate LCU
Abaco Systems’ Dual Gate local control unit (LCU) provides an ideal user interface for the ADEPT line of automatic video trackers and can be used in a prototyping, development or production project phase.
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Precision Low Power FGA™ Voltage References
ISL60002
The ISL60002 FGA™ voltage references are very high precision analog voltage references fabricated on Renesas' proprietary Floating Gate Analog technology and feature low supply voltage operation at ultra-low 350nA operating current. Additionally, the ISL60002 family features guaranteed initial accuracy as low as ±1.0mV and 20ppm/°C temperature coefficient. The initial accuracy and temperature stability performance of the ISL60002 family, plus the low supply voltage and 350nA power consumption, eliminates the need to compromise thermal stability for reduced power consumption making it an ideal companion to high resolution, low power data conversion systems.
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Mechanical Bench-top Test Jigs
CGF Series
Advanced test jig, using a cam-operated, fully adjustable gate - self customisation.
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Bench-top Test Jigs
Robust, easily customised, standalone kits for testing a variety of PCB's. Basic hinged-top or cam operated pusher plate, advanced cam-operated gate with fully adjustable pusher-fingers.
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3U VPX FPGA Cards
Curtiss-Wright Defense Solutions
FPGAs have revolutionized the way digital signal processing (DSP) subsystems are configured. With a large number of gates, hardware multipliers, and high-speed serial interfaces, FPGAs enable sophisticated applications, including radar, signal intelligence, and image processing, which rely on repetitive processing that can be expressed in highly parallel form.
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MOSFET Drivers
The bridge driver products handle voltages up to 100V, with industry-leading gate rise and fall times and exceptional input-to-output propagation delay performance. Select parts are available in 4mm x 4mm and 3mm x 3mm DFN packages which meet IPC-2221 creepage and clearance specifications for high-voltage systems.
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SWIR InGaAs Camera Module For Short Exposures
XSW Gated Series
The XSW 320 Gated series is based on in-house developed, temperature stabilised InGaAs detector with a 320 x 256 pixel resolution. The XSW 320 Gated modules are able to provide maximum frame rates up to 400 Hz. The exposure time of the sensor is configurable from 100 ns up to 1 ms in steps of 100 ns, or from 1 ms to 40 ms.
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Compressors & Limiters
Applied Research and Technolgy
Take control of your dynamics with our range of compressors, limiters, expanders, and gates.
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Microprocessor Supervisors
ST’s microprocessor supervisors are more sophisticated devices that can include watchdog and early power-fail warnings (power-fail in/power-fail out (PFI/PFO)), push-button reset functions and battery monitoring. Microprocessor supervisors with a switchover function preserve SRAM data in the absence of system power by automatically switching to batter backup when power fails. A chip-enable gate automatically write-protects the SRAM when the Vcc begins to fall.
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FieldFox Handheld Microwave Spectrum Analyzer, 14 GHz
N9936A
100 kHz to 14 GHz frequency range Expand capabilities with optional tracking generator, interference analyzer, built-in power meter, and more Make accurate spectrum analyzer measurements ( 0.5 dB) without needing warm-up Locate interfering signals using the intuitive spectrogram display and recording capability Easily measure average and pulse power with a USB power sensor, pulse measurements with time gating Lightest microwave handheld spectrum analyzer at only 6.6 lb. (3.0 kg)
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JTAG Boundary-Scan I/O Modules
SCANIO Family
The Corelis family of SCANIO™ modules turn any IEEE standard 1149.1 boundary-scan controller into a powerful digital boundary-scan tester. The SCANIO family of products use boundary-scan gate arrays to add control and visibility to connectors, traces, and logic that can not be tested using traditional boundary-scan techniques.The SCANIO products, when combined with a boundary-scan controller, operate as a traditional “bed-of-nails” tester except access to the stimulus and response I/O’s is achieved via boundary-scan.
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Gated Integrator, 2 ns Minimum Gate Width
SR250
Stanford Research Systems, Inc.
The SR250 Gated Integrator is a versatile, high-speed, NIM module designed to recover fast analog signals from noisy backgrounds
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20MHz Pulse / Function Generator
Model 2019A
- Versatile Waveform Generation for a Wide Range of Testing Application- Wide Range of Frequencies from 0.0002Hz (i.e. 5000s) to 20MHz (i.e. 50ns)- Choice of Eight Selectable Waveforms- All Outputs can Drive 50 ohms Terminations- Trigger and Gate Modes with Adjustable Start/Stop Control
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High-Speed System Synchronization and Distribution Amplifier - 3U VPX
Model 5903
- Multi-board synchronization with Quartz RFSoC video- Synchronizes up to 64 channels across eight Quartz® boards- Synchronizes sampling and data acquisition for multichannel systems- Provides single sample accurate synchronization between multiple channels and multiple boards- Synchronizes gating and triggering functions
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Transistor Testing
Radiant is introducing an I2C digital-to-analog converter product that can be attached to the Precision Premier II and is controlled from Vision. The addition of this extra voltage source makes it possible for the Premier II to measure the performance of thin-ferroelectric-film gate transistors (TFFTs and MFSFETs). This document explains the theory for such testing and gives examples of such tests using Radiant's SFRAM transistors as examples.
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Atlas DCA Pro Advanced Semiconductor Analyser
DCA75
The DCA75 is a great instrument for identifying and testing a wide variety of semiconductor components. Just connect any way round! The DCA75 will perform the following:*Display component type (such as N-CH MOSFET, darlington transistor etc).*Display component pinout (such as drain, source, gate etc).*Display detailed parameter measurement.*Plot characteristics curves on your PC.
