Gate
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test measurement unit
ITC59100 Rg/Qg
The ITC59100 Test Measurement Unit (TMU), which plugs into the ITC59000 Test Platform, performs gate charge (Qg) measurements that conform to MIL-STD-750C, Notice 2, Method 3471 and JEDEC Standard JESD24-2. In addition the ITC59100 TMU performs an internal gate resistance (Rg) test method that conforms to JEDEC Standard JESD24-11.
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Analyze RTL
ASICs and FPGA routinely have millions of gates with memories, transceivers, third party IP and processor cores. Problems can be time consuming and complex to debug in the lab and through simulations. Designers need verification tools that can identify problems quickly to reduce their verification and debug time before simulation, before synthesis, and definitely before burning chips in the lab.
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FieldFox Handheld Microwave Spectrum Analyzer, 44 GHz
N9961A
5 kHz to 44 GHz frequency range Expand capabilities with optional tracking generator, interference analyzer, built-in power meter, and more Make accurate spectrum analyzer measurements ( 0.5 dB) without needing warm-up Locate interfering signals using the intuitive spectrogram display and recording capability Easily measure average and pulse power with a USB power sensor, pulse measurements with time gating Lightest microwave handheld spectrum analyzer at only 7.1 lb. (3.2 kg)
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FieldFox Handheld Microwave Spectrum Analyzer, 32 GHz
N9960A
5 kHz to 32 GHz frequency range Expand capabilities with optional tracking generator, interference analyzer, built-in power meter, and more Make accurate spectrum analyzer measurements ( 0.5 dB) without needing warm-up Locate interfering signals using the intuitive spectrogram display and recording capability Easily measure average and pulse power with a USB power sensor, pulse measurements with time gating Lightest microwave handheld spectrum analyzer at only 7.1 lb. (3.2 kg)
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High-Speed System Sync and Distribution Amplifier - SOSA Aligned 3U VPX
Model 5503
- Supports Xilinx® Zynq® UltraScale+™ RFSoC FPGAs- Synchronizes up to 32 channels across four Quartz boards- Synchronizes sampling and data acquisition for multichannel systems- Provides single sample accurate synchronization between multiple channels and multiple boards- Synchronizes gating and triggering functions- Optional VITA 67.3D optical interface for backplane gigabit serial communication
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Frequency-Resolved Optical Gating Pulse Analyzer
IQFROG
The IQFROG measures pulse intensity and phase in both spectral and temporal domains, yielding a complete pulse characterization. With its long delay arm and high resolution spectrometer, it measures chirped pulses up to 50 ps wide, or up to 10 ps wide if the pulse is transform limited. The IQFROG is available in 1.0 and 1.5 micron wavelengths.
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Frequency Counter Products
53200 Series
The Keysight 53200 Series of 350 MHz universal and RF frequency counter/timers serve all of your frequency and time interval measurement needs. 3 available models offer resolution capabilities up to 12 digits/sec single-shot frequency resolution on a one second gate. Single-shot time interval measurements can be resolved down to 20 psec. All models in 53200 series offer new built-in analysis and graphing capabilities to maximize the insight and information you receive. Use the connectivity of your choice: LXI-C/Ethernet, USB, GPIB. Additionally, an optional battery is available to increase portability and maintain time base accuracy.
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SWIR Cameras
SenS HiPe SWIR Camera
Our new SenS series TE cooled SWIR InGaAs cameras provide superb VGA image quality low light to bright scenes requiring wide dynamic range. Our new HiPe model supports exposure times > 30 seconds with low dark charge. Now available with USB3, GigE-Vision, and CameraLink. Fast gating (50 nsec) option.
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Single Photon Detector System For Near-Infrared (1.3 - 1.6 Um Wavelength) Waves With Liquid Helium (LHe) Cryostat
Insight Product Company is proud to offer Single Photon Detector System for Near-Infrared (1.3-1.6 um wavelength) with Liquid Helium (LHe) Cryostat. Insight Product Co. offers superconducting single photon detectors and ultra-low noise registration systems for the near infrared range. All systems operate in continuous mode, no gating required.
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Software
Gate Oxide Integrity Option
Materials Development Corporation
Oxide integrity of MOS devices can be evaluated by various techniques such as Time Dependent DielectricBreakdown, Charge to Breakdown, or ramped voltage. When used with a prober, map distribution of breakdown fields. Output the data using histograms, cumulativefailure, or Weibull plots.
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Universal Test Fixture
CAM/GATE
The Low Cost Solution for Accurate and Dependable Universal Functional TestThe CAM/GATE ® Universal Test Fixture System is your afforable, efficient solution for functional test. No need to have multiple fixtures in your test area...
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Semiconductor Tester
5000E
Current Ranges:Standard: 2.0nA – 50AUp to 100A with Mainframe ExtensionVoltage Ranges:Standard (anode): 10mV – 1000V2000V with 2kV Anode OptionStandard (gate): 10mv – 20V80V with 80V Gate Option
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CompuScope GPU CUDA Processing
Performing real-time digital signal processing (DSP) routines such as Fast Fourier Transform (FFT), Signal Averaging, Finite Impulse Response (FIR) Filtering, Digital Down Conversion (DDC) and more have traditionally required the use of dedicated DSP processors, Field Programmable Gate Arrays (FPGAs), or Application Specific Integrated Circuits (ASICs).
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Power MOSFETs
ST's power MOSFET portfolio offers a broad range of breakdown voltages from –100 to 1700 V, with low gate charge and low on-resistance, combined with state-of-the art packaging. ST's process technology for both high-voltage power MOSFETs (MDmesh™) and low-voltage power MOSFETs (STripFET) ensures an enhanced power handling capability, resulting in high-efficiency solutions. Power MOSFETs belong to the STPOWER family.
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ICT/FCT-Fixtures, Max UUT 250 × 180 mm (wxd)
CK-1 Small (Hold-Down Gate) / 230154
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Isolation and Power Solutions
Silicon Labs' innovative digital isolation and power product portfolio includes CMOS digital isolators, isolated gate drivers, isolated current sensors, isolated system products and Power over Ethernet (PoE) families. These mixed-signal IC solutions leverage Silicon Labs' superior isolation and high voltage expertise to enhance power system performance, flexibility and reliability while reducing system size and cost. The entire isolation portfolio supports isolation voltages up to 5 kV.
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VXI Register Interface Board
VXI-5524A
*VXI Register Interface mates with user's PCB to form a B or C-size module.* 48 Digital IO Lines - Three 16-bit registers set as latched outputs or gated inputs.* 16 line bi-directional expansion bus for driving external logic.* Digital IO and VXIbus lines are 3.3V logic levels and are 5 V tolerant for compatibility with 3.3V logic and 5V VXIbus signals.* User selectable 3.3 and 5 Vdc puliup voltage on the digital IO lines for sensing switches etc.* The VXI-5524A board is a complete VXI-1 Rev 1.4 and VXI-2 compliant register-based interface.* User configurable model number, manufacturer ID, version and serial numbers.* Two companion component boards available for prototyping IC or RF assemblies.* Companion hardware kits available for building 1, 2 or 3-slot wide modules.
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Brushless DC Drivers (BLDC)
Covering a wide range of power systems, our integrated MOSFET and gate driver ICs thrive in automotive, industrial, and consumer applications, ranging from 3.5 to 100 V operating voltage.
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ICT/FCT-Fixtures, Max UUT 370 × 300 mm (wxd)
CK-2 Medium (Hold Down Gate) / 230156
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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RF Amplifiers Bias Controllers
RF amplifier bias controllers generate a regulated drain voltage and actively adjusts the gate voltage of an external amplifier to achieve constant bias current. It can be used to bias any enhancement and depletion type amplifier operating in Class-A regime with drain voltages (VDRAIN) as specified. These devices achieve excellent bias stability over supply, temperature and process variations, and eliminates the required calibration procedures used to prevent RF performance degradation due to such variations.
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Duty Cycle Meter
Displays ON or OFF period as a percentage of total period over a programmed gate time from 10 ms to 199.99 s. A resolution of 1%, 0.1% or 0.01% is user-selectable. Applications include monitoring modulated proportional control systems and pulse-modulated systems, such as radar, lasers or packet radio.
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Alchitry Cu FPGA Development Board (Lattice ICE40 HX)
If you are not needing a lot of power to start your FPGA adventure, or are looking for a more economical option, the Alchitry Cu FPGA Development Board might be the perfect option for you! The Alchitry Cu is a "lighter" FPGA version than the Alchitry Au but still offers something completely unique. FPGAs, or Field-Programmable Gate Arrays, are an advanced development board type for engineers and hobbyists alike to experience the next step in programming with electronics.
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ICT/FCT-Fixtures Max UUT 370 × 300 mm (wxd)
CK-2 Large (Hold-Down Gate) / 230158
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Netlist Analyzer
GateVision
GateVision PRO is the third generation of graphical netlist analyzers from Concept Engineering. Completely rewritten to run on modern 32/64bit platforms, GateVision PRO provides the designer of even the largest chips with intuitive design navigation, schematic viewing, logic cone extraction and interactive logic cone viewing for debug support and design documentation.
