Process Monitoring
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Product
Mass Spectrometers Gas Analyzers
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Our real-time Extrel quadrupole mass spectrometers are built for the demands of the gas and ion analysis for industrial and high purity process control, environmental monitoring, and cutting-edge laboratory research. Our mass spectrometers offer high sensitivity and a wide dynamic measurement range (ppb to %) for full, speciated composition. Our fast and powerful, quadrupole mass spectrometer performs precision quantitative analysis on every component in a gas or vapor mixture. It can easily be fully automated for sampling of multiple gas channels. For decades we have collaborated with research, academic, and industrial customers to deliver, design, integrate validate, and support these unique turnkey solutions.
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Product
100 amu CIS Analyzer
CIS300
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Stanford Research Systems, Inc.
With better than 1 ppm detection limit, direct sampling at mTorr pressure, and a user-friendly Windows software package, the CIS systems will satisfy your most demanding applications. On-line process monitoring and control, verification of process gas purity at the point of use, high-vacuum residual gas analysis, and process equipment leak checking are some of the areas where these systems will prove indispensable
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Product
Process Controllers
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Orbit Controls process controllers are designed for direct connection to virtually all industrial sensors and signal sources. They can be used as process monitors to display the process variables to be measured or as process controllers to monitor processes. In addition to the digital display, the devices also have data interfaces, analog outputs and set point outputs. Simple process monitors are optimized in the factory for the desired measuring range and function at the customer's request. The programmable controllers can be parameterized on site via the keyboard or the data interface.
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Product
PMAC 3000 Process Monitor and Control instrument
90424
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The PMAC 3000 is a multi-functional Process Monitor and Control instrument, designed to operate with Sensor Developments Inc. Auto-ID sensors. Model 90424 has been enhanced to support quadrature encoders. This functionality is supported via Auto-ID and third party sensor programming. For easy verification, the encoder version will show the extension “E” when the software version number is displayed at power up.
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Product
Universal Converter
C8000
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Multi channel converter for all optek photometric and conductivity sensors and electrochemical pH electrodes. Flexible configuration of sensors, measuring ranges, units and product specific setups make the C8000 converter series a powerful device in process monitoring in both conventional and single-use systems.
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Product
ESD Event Detector
Novx MiniPulse
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Simco-Ion's Novx MiniPulse ESD Event Detector is designed for tool and process monitoring. This affordable, small footprint embeddable monitor has been developed to warn of product damage risks at the point of electrostatic discharge. The MiniPulse uses time domain and threshold discrimination to detect pulse electromagnetic energy. Through the use of specific antenna configurations and placement, the MiniPulse can provide ESD event detection for well-defined small areas.
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Product
Area/process radiation monitoring
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Monitors gamma and beta rays/ neutron with high accuracy and reliability. *Each monitor is controlled with central control system and alarm is given when the measurement exceeds alarm level. Area monitors and dust monitors.
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Product
Differential Pressure Gauges
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Differential pressure gauge is an economical means for measuring pressure between two independent pressure sources. Used on process monitoring or control, the unit's system design permits a small volume of media migration; intended for air, hydraulic oil and non-corrosive applications. A good choice for satisfying challenging pressure requirements.
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Product
Endurance® High Temperature Infrared Pyrometers
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The Endurance® Series of infrared pyrometers features rugged and flexible instruments designed to meet the demands of harsh industrial environments and provides continuous visual process monitoring in a wide range of applications and temperatures ranging from 50 to 3200°C (122 to 5692°F).
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Product
Process Visualization
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LaserLinc offers a variety of software interfaces for enhanced process monitoring, display, control, and reporting.
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Product
Software
MOS C-V Measurement and Analysis
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Materials Development Corporation
MOS capacitance-voltage measurement is one of the most common process monitoring diagnostics employed in device manufacturing. A vast amount of information can be derived from this simple test.
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Product
PTI/PMAC/USB Sensor System Examples
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*System for any strain gage based sensor*Compatible with every sensor is this catalog*Process monitoring*Process control*Portable datalogging*Portable, compact, and lightweight
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Product
Thermal Machine Vision Camera
FLIR A615
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The FLIR A615 is an easy-to-control, affordable, and compact thermal imaging camera for condition monitoring, process control/quality assurance, and fire prevention. This camera can be fully controlled by a PC, and is Plug and Play with third-party machine vision software such as National Instruments, Cognex, Matrox, MVtec, and Stemmer Imaging.
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Product
Process Monitoring, DAQ & Software
sigPOD
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sigPOD is Sciemetric’s out-of-the-box solution for monitoring test and assembly processes that standardizes part test and process monitoring onto a single platform for manufacturers. With sigPOD, process signature verification can be deployed across the production line on virtually any manufacturing process. Gain the data-driven insight you need to compete in an Industry 4.0 world.
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Product
Advanced IR Gas Analyzer For Process Monitoring
T-Series
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T-Series Inline Gas Analyzer improves gas measurement accuracy over the traditional non-dispersive infrared (NDIR) analyzers using Tunable Filter Spectroscopy (TFS™), a spectroscopic scanning technique capable of generating slices of spectra in the infrared region. Each scan produces an absorption spectrum which is used to identify compounds and provide concentration values. TFS technology improves gas identification accuracy and selectivity by subtracting out spectra from interferent gases within the same infrared regions. This spectral processing capability also provides multi-component measurement.
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Product
Defect Inspection and Review
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KLA’s defect inspection and review systems cover the full range of yield applications within the chip and wafer manufacturing environments, including incoming process tool qualification, wafer qualification, research and development, and tool, process and line monitoring. Patterned and unpatterned wafer defect inspection and review systems find, identify and classify particles and pattern defects on the front surface, back surface and edge of the wafer. This information allows engineers to detect, resolve and monitor critical yield excursions, resulting in faster yield ramp and higher production yield.
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Product
Analog Input Products
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Analog input boards are useful for measuring variably changing conditions in the real world. When we want to measure these variably changing conditions, we need analog inputs to convert these changing real world conditions to changing electrical quantities. For example, monitoring the temperature inside a wood kiln, or the water pressure on the output of a pump, or the heart rate of a medical patient. In each of these cases, you can use one of our analog input devices to convert the electrical data from a sensor or transducer into binary data that can then be used by your computer. The device that converts this data is known as an analog to digital converter (abbreviated ADC, A/D, or A to D). An analog input is a measurable electrical signal with a defined range. The analog input changes continuously in a definable manner in relation to the measured property. This data is very useful for process monitoring, process control, or simple monitoring / data collection and acquisition. ACCES' analog input boards amplify and multiplex input signals from thermocouples, strain gauges, accelerometers, photo sensors, flowmeters, RTDs, thermistors, voltage sources, millivolt sources, and current sources, just to name a few.
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Product
Industrial High Temp Thermal Camera
FLIR TG297
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The FLIR TG297 is a one-of-a-kind industrial diagnostic tool that combines accurate temperature measurement with the ability to image up to 1030°C (1886°F). Patented FLIR MSX® (Multi-Spectral Dynamic Imaging) enhancement improves image clarity by embossing visual scene details on full thermal images. The TG297 is ideal for high-temperature industrial uses such as measuring the heat of glass furnaces, kilns, and forges as well as manufacturing applications, allowing you to accurately target potential faults, troubleshoot repairs, and monitor processes. Record images to assure your team that machinery and systems are functioning safely and at peak efficiency.
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Product
Scarabaeus® Software
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Organize testing by compounds across multiple instruments. RPA, MDR, Mooney, Hardness and Density test plans and results are seamlessly integrated into one database. The Process Monitor software guides the operator, selects the appropriate test for the compound, and automatically indicates if the sample is within specification.
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Product
Wireless Sensor Tags & Interfaces
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NFC and UHF RFID sensor tags offer a highly integrated solution for remote sensor data logging. The tags conform to the specifications of the NFC/ISO15693 as well as the UHF RFID standards. Featuring on-chip temperature sensing and the exclusive cool-Log™ technology, these sensor tags enable innovative and cost-sensitive solutions in food and pharmaceutical cold-chain management, industrial process control, remote monitoring and healthcare applications. NFiC™ ICs from ams lower the barriers to NFC integration in electronic devices thanks to their small footprint, high data rate, flexible data transfer modes, fully passive NFC tag emulation and advanced energy harvesting. NFC/HF interface tags are best suited to demanding consumer and industrial applications such as zero-power device configuration and set-up, feature-rich contactless cards for payment and authentication, smart toys and connected cars.
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Product
Visual Inspection Software
AdVISE
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R&S®AdVISE visual inspection software automates the process of visually monitoring an equipment under test (EUT) during a test sequence. This eliminates human inattention, ensures reproducible results and simplifies the test documentation. A typical application is EMS testing with R&S®EMC32 and R&S®ELEKTRA test software.
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Product
100 amu CIS Analyzer
CIS100
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Stanford Research Systems, Inc.
With better than 1 ppm detection limit, direct sampling at mTorr pressure, and a user-friendly Windows software package, the CIS systems will satisfy your most demanding applications. On-line process monitoring and control, verification of process gas purity at the point of use, high-vacuum residual gas analysis, and process equipment leak checking are some of the areas where these systems will prove indispensable
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Product
Substrate Manufacturing
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KLA’s substrate manufacturing portfolio includes defect inspection and review, metrology and data management systems that help substrate manufacturers manage quality throughout the wafer fabrication process. Specialized wafer inspection and review tools assess wafer surface quality and detect, count and bin defects during production and as a critical part of outgoing wafer qualification. Wafer geometry systems ensure the wafer shape is extremely flat and uniform in thickness, with precisely controlled wafer shape topography. Data analysis and management systems proactively identify substrate fabrication process excursions that can lead to yield loss. KLA’s substrate manufacturing systems support process development, production monitoring and final quality check of a broad range of substrate types and sizes including silicon, prime silicon, SOI, sapphire, glass, GaAs, SiC, GaN, InP, GaSb, Ge, LiTaO3, LiNBO3, and epitaxial wafers.
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Product
NIR Systems
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NIR spectroscopy is a proven analytical method guaranteeing reliable and efficient process monitoring and control in a wide range of process applications.
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Product
OCT
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Optical coherence tomography (OCT), as an optical measurement method, is ideally suited for combination with scanner-based laser welding processes. OCT monitoring enables precise and highly dynamic information acquisition in all process zones, thus creating the basis for an optimized process flow with consistently optimal results.
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Product
Process Improvement
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Omron’s numerous software solutions for quality control, process improvement, defect monitoring and more are ideal for PCB manufacturers seeking to boost productivity.
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Product
Sulfur Compounds Analyzers
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TML's Sulfur compound analyzers utilize familiar UV Fluorescence technology to produce reliable and accurate gas measurements. All T Series analyzers offer two front-panel USB ports, an advanced touch screen full color display, customizable user interface with predictive maintenance alerts, one-touch real-time graphing, and multiple language support. All of our analyzers are designed meet the rigorous demands of ambient air quality, stack, or industrial process gas monitoring.
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Product
Computrac® MAX®
4000XL
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The Computrac MAX® 4000XL provides quick, reliable and accurate results. This improves the ability to adjust or monitor processes, ensuring quality products while minimizing waste, energy requirements and man-hours. Ease of use and durability, along with superior service and support make the Computrac® MAX® 4000XL an ideal choice for research, manufacturing and laboratory environments.
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Product
IPS BEACON
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The Flowserve IPS Beacon is a data acquisition, logging and visual alert device that monitors process pump health. Mounted atop the pump bearing housing, the intrinsically safe Beacon checks power-end vibration (x-y-z axis) and temperature against pre-set limits, logging this data with a time and date stamp when an alert situation occurs.
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Product
Seismic Impact Control System
ZET 048
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Seismic impact control system is used to control ground surface shifts caused by earthquakes, explosions and other natural or technology-related factors. Seismic control system is used to obtain actual information of the seismic environment as well as for process facilities state monitoring (in particular, for petroleum industry pipelines systems control).
