Debugging
fixes identified bugs.
See Also: Debuggers, In-Circuit Debuggers, Code Debuggers, JTAG Debuggers, Source Debugers
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Product
Custom Bench Test
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TestEdge provides customized bench test. If your device has specialized test requirements, it may be necessary to test your device using specialized bench equipment rather than traditional ATE. In other situations, both ATE and a custom bench setup may be required to fully characterize the device and provide necessary correlation. Finally, it may be useful to create a custom bench setup to facilitate device debug.
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Product
Caraya Unit Tester
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Caraya is a new experimental open source assertion and unit testing framework for LabVIEW. It takes a whole new approach to unit testing; your VI is your test. Caraya allows you to convert your manual test VIs you use for debugging into unit test cases with nearly no effort. Even running the tests is easy, just run the test case VI. Caraya significantly lowers the barrier for developers to write unit tests leading into improved overall code quality in real-world projects where developers don’t always have the luxury to write unit test cases first.
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Product
TestExec SL Software
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This off-the-shelf test executive empowers test developers with a fully customizable operator interface, open architecture for multiple instrument integration, flexible test sequencing, easy debugging tools and provisions for line integration in most manufacturing test environments.
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Product
Logic Analyzer Probe
FS2600A
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The FS2600A is our newest and fastest logic analyzer probe used to test DDR5 RDIMM and LRDIMM memory. It is designed to work exclusively with 4 Keysight U4164A logic analysis modules operating in either Quad Sample State or Quarter Channel 10GHz timing modes. This gives the user an extremely effective tool for debugging, testing and verifying DDR5 RDIMM/LRDIMMs and DDR5 Memory Channels.
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Product
DH Series Tip - CrossSync PHY PCIe5 CEM x16
DH-CSPHY-PCIE5-CEMX16
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Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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Product
Software Abstraction for Easy Control of DC Power Supplies
Konrad DCPower
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It consists of three modules:- A windows driver which is responsible for the communication and device abstraction- A DLL with NI TestStand Test Steps which allows easy integration in automated production environments- A standalone executable which simplifies debugging and setup of test sequencesThis architecture allows to open a communication channel from multiple instances to the same device. This is important when for example two channels of a power supply are used in two independent applications.
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Product
Mid Bus Probes
MBP850
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The PCIE850 provides a complete test and debug solution for PCI Express Bus. Interposers and probes connect to the PCIE850 providing access to PCI Card, AMX, XMC and VPX systems.
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Product
Logic Analyzer Probe
FS2521
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The FS2521 is a logic analyzer probe used to test DDR4 SO-DIMM memory. When used with the triggering and analysis capabilities of Keysight’s U4164A logic analyzer modules, it gives the user an extremely effective tool for debugging, testing and verifying DDR4 SO-DIMMs. Now qualified at 3200MT/s
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Product
Universal, Production In-System Programmer
FlashRunner Series
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FlashRunner is a universal, production In-System Programmer.It is the result of many years of experience in developing programmingand debugging solutions for microcontrollers.
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Product
Test & Measurement Equipment And RF Components
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Is necessary for the design, test, manufacture, and debug of radio frequency devices.
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Product
Digital Load Cell Simulator
Model EL41
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Xiamen Elane Electronics Company, Ltd
Detection and debugging of all kinds of weighing instruments - "must have" for any scale service technician - fully RS232 controllable for testing of electronics for scale installation and manufacturing.
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Product
Bus Analyzer, Monitor, Debugger & Programmer
BusPro-I™
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The BusPro-I has all the power, flexibility, and features you need to monitor and debug the I2C bus circuitry on your board. The BusPro I2C can be used to monitor and log I2C bus traffic in real-time, generate I2C transactions to communicate with peripheral components on the bus, and in-system program I2C compatible EEPROMs.
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Product
File Import Tool For Importing And Converting STIL, WGL, VCD/EVCD, ATP Vectors
GtDio6x-FIT
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Marvin Test Solutions' GtDio6x-FIT option offers test engineers a software tool set for importing and converting STIL, WGL, VDC/EVCD and ATP files to a Marvin Test Solutions' digital instrument file format. GtDio6x-FIT works in conjunction with Marvin Test Solutions' GtDio6x function library software which provides an efficient tool set for developing, debugging, and executing digital test vectors for MTS' GX5296 digital instrument.
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Product
Test Research
TRI
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REBOUNDER test kits feature two separate "Co-Active Seals", "Quick Twist" Locking Guide Pins, and boards constructed of fine weave G10/FR4, increasing testing reliability and accuracy while simplifying finishing, debugging, and maintenance. All H+W products are backed-up with our "Test-Assured" one year warranty, in writing, and SAME DAY SHIPMENTS
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Product
PCI Smart Bus Extenders
PCIEXT-64UB - Live Insertion PCI Bus Extender
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The Ultraview PCIEXT64 extender series offers excellent PCI signal integrity, due to high speed trace layout, including high impedance signal traces and minimal ground inductance, as well as active bus isolation, to ensure minimal effect on the board-under-test. Power monitoring and current limiting features allow a robust debug and test environment.
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Product
Boundary-Scan Interactive Analyzer & Toolkit
ScanExpress JTAG Debugger
Analyzer
Test probe access is a luxury—modern electronic system design techniques such as blind and buried vias or ball-grid-array (BGA) devices guarantee limited signal access. Test points quickly reduce precious board real-estate and can even degrade performance. ScanExpress JTAG Debugger overcomes these limitations to provide the control and visibility necessary to quickly debug and test hardware, using a simple JTAG port to interface with IEEE-1149.1 compliant devices.Whether debugging prototype hardware, enhancing production tests with boundary-scan control, or diagnosing a faulty board in the field, ScanExpress Debugger’s easy-to-use and versatile interface helps engineers test and debug systems faster and more efficiently.
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Product
Systems Integration (SIL) Lab Data Acquisition
System
Bloomy’s SIL data system allows testing and simulation of every system component on the aircraft. The functionality of these complex integrated systems are fully tested, debugged, and verified safely in the lab prior to flight testing. This reduces cost and schedule for new aircraft. Bloomy has applied its expertise to multiple SILs.
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Product
PCI Express 4 U.2 Receiver Test Automation
N5991PU4A
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The N5991PU4A is the receiver test automation software for bit error ratio testers, allowing you to test, debug and characterize PCI Express U.2 devices and hosts at 8 GT/s.
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Product
Manufacturing Test Only System
MTO
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The MTO restricts access to test development and test files, yet enables users to run any predeveloped onTAP boundary scan / JTAG tests, including memory cluster tests and Flash programming, when activated. The MTO also provides access to ProScan, the graphical debugging environment for onTAP. Users have access to accurate pin-level diagnostics and debug features, such as the netlist browser, test reports, and low-level pin access for toggling pins, to speed up the manufacturing process and ensure accuracy.
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Product
PXI Digital Pattern Instrument
Digital Pattern
The PXI Digital Pattern Instrument is designed for semiconductor characterization and production test. It provides 32 channels, a voltage range of -2 V to 6 V, a PPMU force voltage range of -2 V to 7 V, up to a 200 Mb/s data rate, and a clock generation rate up to 160 MHz. The module includes Digital Pattern Editor software as well as debugging tools like shmoo, digital scope, viewers for history RAM, pin states, and system status.
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Product
Embedded Engineer
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Embedded Engineer combines automated source code generation with model-level debugging. The plug-and-play product provides optimized generation of ANSI C code from UML structures, state machines and activity models as well as the generation of C ++ source code. Embedded Engineer also guarantees the traceability of requirements to the code and back again.
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Product
PCI Express 5.0 Transmitter Electrical Performance Validation and Compliance Software
D9050PCIC
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Use the PCIe 5.0 Tx compliance software to test, debug and characterize your PCIe Gen5 designs quickly and easily. It automatically configures the oscilloscope for each test and generates an informative HTML report upon test completion. The application compares the results with the specification test limit and includes margin analysis which indicates how closely the device passes or fails each test. With the option InfiniiSim Waveform Transformation Toolset, the software supports integrated de-embedding of the breakout channel of the test fixture.
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Product
DH Series High-Temperature Solder-In Tip, 16 GHz BW, 3.5 Vpp Range
DH-HITEMP
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Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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Product
In-depth Execution Time Analysis For Critical Software
RapiTime
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*Timing analysis (inc. WCET) for Ada, C & C++ on-target & host**Identify code to optimize for worst-case behavior*Debug rare timing events*Simplify verification through integration with your CI tool*Produce evidence for DO-178 and ISO 26262 certification
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Product
cRIO-9048, 1.30 GHz Dual-Core CPU, 2 GB DRAM, 8 GB Storage, -40 °C to 70 °C, Kintex-7 160T FPGA, 8-Slot CompactRIO Controller
785619-01
Embedded Controller
1.30 GHz Dual-Core CPU, 2 GB DRAM, 8 GB Storage, -40 °C to 70 °C, Kintex-7 160T FPGA, 8-Slot CompactRIO Controller - The cRIO-9048 is a rugged, high-performance, customizable embedded controller that offers Intel Atom dual-core processing, NI-DAQmx support, and an SD card slot for data-logging, embedded monitoring, and control. It includes a Kintex-7 160T FPGA with LabVIEW FPGA Module support for advanced control and coprocessing. The controller provides precise, synchronized timing and deterministic communications using Time Sensitive Networking (TSN), which is ideal for highly distributed measurements. This controller offers several connectivity ports, including Gigabit Ethernet, USB 3.1, USB 2.0, RS232, and RS485 ports. You can use the USB 3.1 ports to add a local human machine interface and program, deploy, and debug software, which simplifies application development.
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Product
UTP Software Suite
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Increasing customer requirements, shorter product cycles and higher time to market demands dramatically influence the long-term goals in software development. With the Universal Test Platform Software Suite (UTP Suite), we introduce a robust standard that features a great set of tools for configuring, developing, analyzing, debugging and executing test sequences.
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Product
Software
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Our software is based on open systems architectures and operating systems. This open system middleware approach enables easier hardware tech refreshes and is supported with off-the-shelf and optimized libraries, debugging and diagnostic tools, development kits and software accelerators.
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Product
Wireless Functional Test Fixtures
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Circuit Check’s wireless fixture technologies reduce debug time, simplify ECO’s and reduce maintenance. This allows for the highest test performance, ability to probe denser smaller targets and achieve ultra-high node counts. Higher density more complex circuit boards complicate testing requirements. Smaller more tightly spaced test pads create a wiring challenge for the fixture fabricators, test engineers and maintenance personnel. Wireless fixtures solve the challenges associated with the nest of wires found in long wire fixtures. Wireless fixtures replace the “nest” of wires with copper traces on a multilayered printed circuit board called a Translator Board (T-Board).
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Product
Thermal Testing And Analysis
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Response Dynamics Vibration Engineering, Inc.
We have consulted on thermal issues ranging from conduction issues in TECs, thermal radiation modeling, and countless air cooled system issues relating to system performance, vibration, and acoustics noise. We use a wide array of thermocouple instrumentation, thermal imaging, flow measurements, as well as finite element analysis and analytic modeling to measure, design, and debug thermal and related issues. We often work on customer products in our Response Dynamics lab where we characterize the system, engineer solution options, and prototype solutions. We then work with the customer to work the winning solution into their quality control and manufacturing process.
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Product
JTAGulator 24-Channel Hardware Hacking Tool
32115
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On-chip debug (OCD) interfaces can provide chip-level control of a target device and are a primary vector used by engineers, researchers, and hackers to extract program code or data, modify memory contents, or affect device operation on-the-fly. JTAGulator is an open source hardware tool that assists in identifying OCD connections from test points, vias, or component pads on a target device.
