Measuring Microscopes
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PXIe Short SMU
52403P
Chroma's 52403P is a PXI Express Short Pulse SMU (Source/Measure Unit) designed for fast, precise and reliable sourcing and measurement of thermo-sensitive devices such as high-power laser diodes (LD). Integrating a high-speed pulser, a high precision SMU and a DAQ module into a single PXIe SMU, the 52403P can measure both the LIV and the low-level leakage current of a high-power LDs.
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Industrial Microscope Solutions
Industrial microscopes are a vital tool used for measuring, quality control, inspection, and in soldering and manufacturing. Each industrial microscope we offer uses complex designs that provide unique solutions for the inspection process and aim to improve resolution and sample contrast.
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Inverted Microscope Systems
Below you can see examples types for an inverted microscope system created using our components. Typically these examples are for life science applications, however they can be used for industrial or material applications. Many other automated microscopy systems are possible using our components.
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Microscope Software
Only with the right microscope software you can unleash all features of your imaging station. Our modular software platforms are easy to learn and enable you to acquire, process and analyze images in multiple dimensions and over various timepoints. Non-destructive image handling and file formats developed specially for microscopy are just two benefits that guarantee reproducible results for your experiments.
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Optical Fiber Microscope
Connector-end face contamination is a problem that shouldn’t be ignored when it comes to fiber optic cables and patch cords. Allowing contamination to take place or fester will lead to network issues and down-time which you don’t need. For any fiber optic cable network, a high quality fiber microscope is a necessary tool to identify where contamination may be presenting.
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Digital Vision Microscopes
Sinowon Innovation Metrology Manufacture Ltd.
Video Microscope is widely used in the inspection of electronic industry production line, printed circuit board, weld detects ( such as wrong printing, edge collapse,etc)during printed circuit component, PC Board, VFD, and the identification of printing grid and painting, etc. It can display the zoom out image on the screen and save, magnify and print.
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Portable Video Microscope
Cl-1000
Video microscope system ideal for installation site. Enables the user to inspect mounted connector endface from the other side of adapter.
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PXI-4132, 100 V, 2 W Precision PXI Source Measure Unit
780558-01
±100 V, 10 pA Precision PXI Source Measure Unit—The PXI-4132 is a programmable, high-precision source measure unit (SMU). It has a single isolated SMU channel that offers a four-quadrant output that incorporates remote (4-wire) sense as well as external guarding. With its high measurement resolution integrated guarding, the PXI-4132 is ideal for high-accuracy leakage measurements on integrated circuits, discrete components, PCBs, and cables. You can also perform high-speed I-V measurements on a variety of components including diodes and organic LEDs using the onboard hardware sequencing engine. In addition, you can synchronize multiple PXI-4132 modules using the PXI backplane to provide high-speed I-V measurements on transistors and more complex devices.
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Digital Video Microscope
BVM-20102
High-resolution CCD sensor, built-in analog/digital converter, analog and digital signal directly display on the screen, can also simultaneously display on TV and computer through corresponding interfaces; taking photo and video through software; easy operation, reducing user's fatigue and injury.
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Scanning Electron Microscope
Verios G4 XHR SEM
The Thermo Scientific™ Verios G4 scanning electron microscope (SEM) provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).
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PXIe-4138, 60 V, 3 A System PXI Source Measure Unit
782856-01
±60 V, 3 A System PXI Source Measure Unit—The PXIe‑4138 system source measure unit (SMU) delivers high power, precision, and speed. It is ideal for a broad range of applications including manufacturing test; board-level test; lab characterization with devices such as integrated circuits (ICs), power management integrated circuits (PMICs), and radio frequency integrated circuits (RFICs); and discrete devices including LEDs and optical transceivers. The PXIe‑4138 features 4-quadrant operation. The PXIe‑4138 is a hardware-timed instrument with a high-speed sequencing engine for synchronizing acquisitions between multiple SMUs. The module supports direct DMA streaming between the host PC and SMU, so you can stream large waveforms and measurement data at the full update rate and sample rate of the instrument.
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Digital Microscopes
Our range of products include digi classic digital lcd microscope, digi monozoom i lcd microscope, digi monozoom ii digital microscope, digi zoomstar iii lcd microscope, digi zoomstar iv digital microscope and monozoom e digital microscope.
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Widefield Microscopes
Widefield microscopes are available in different versions. Choose an upright microscope if your task is to analyze zebrafish embryos, stained tissue selections or brain slices. For tissue culture and quick assessments in routine research, the inverted microscope might be the better choice.
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Digital Inverted Microscopes
WELDinspect
High-resolution, ergonomic optical inspection systems designed for weld bead analysis and measurement. 4K or Full HD inverted imaging system with motorised zoom, auto-focus, built-in large aperture illumination, and dedicated software for weld bead measurements, analysis, documentation, and reporting.
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Desktop Fluorescence Microscope
Nanoimager
The complete package for super-resolution microscopy
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Scanning Acoustic Microscope
Pulse2
This industry-leading scanning acoustic microscope provides a universal inspection tool for packaged semiconductor development, production and failure analysis. With the ability to detect air defects as thin 0.05 micron and spatially resolve defects down to 10 microns, the ECHO is perfect for bump detection, stacked die (3D packaging) inspection, complex flip chip inspection and more traditional plastic packages.
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Stereo Microscope
Stemi 508
Thanks to apochromatic optics you acquire high contrast images with color accuracy. With the 8:1 zoom you bring up smallest details. Stemi 508 offers an ergonomic viewing angle of 35° - stay relaxed even after hours of work.
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Light Microscopes
Compound light microscopes from Leica Microsystems meet the highest demands whatever the application – from routine laboratory work to the research of multi-dimensional dynamic processes in living cells.
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Atomic Force Microscope
XE-PTR
Park Systems' PTR Series is a fully automatic industrial in-line AFM solution for, but not limited to, automatic Pole Tip Recession measurements on Rowbar-level, individual Slider-level, and HGA-level sliders. With sub-nano scale accuracy, repeatability, and throughput, the PTR Series is the metrology tool of choice for Slider manufacturers to improve their overall production yield.
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PXI FPGA & Measurement Accelerator
Keysight PXI FPGA & measurement accelerator provide digital-pre-distortion (DPD) and envelope tracking (ET) measurements that are embedded in high performance FPGA processing cards.
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Measurement
Phasemeter
Phasemeter is used for measuring the phase difference of two signals coming to the input channels of FFT spectrum analyzers. The upper line of the indicator displays the current phase difference value in degrees, the lower line – phase difference value in radians. It is possible to change the averaging of the displayed value (0.1 or 1 s) and to select necessary FFT spectrum analyzer channels.
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Toolmakers Microscope
Sinowon Innovation Metrology Manufacture Ltd.
It is widely used in mechanical, meter, electronic and light industry; university, Institute and metrology department. The measuring profile projector can detect the contour dimension and surface shape of variety complex workpiece, such as templates, punching pieces, cams, threads, gears, molding milling cutters.
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Ultrafast Nearfield Optical Microscope
Femtosecond NSOM
Near-field Scanning Optical Microscope (NSOM) is a versatile tool for nano-characterization and nano-manufacturing.
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Upright Microscopes
ACCU-SCOPE upright microscopes deliver top quality optics for bright, crisp images. Sometimes referred to as compound microscopes, our upright microscopes are favorites across a wide range of laboratories including clinical, veterinary, pharmaceutical, research, university, and education. Some of the disciplines utilizing our upright microscopes include pathology, hematology, microbiology, cytology and histology. ACCU-SCOPE upright microscopes offer a selection of magnifications from ultra-low (e.g. 2X) to high power oil immersion (e.g. 100X). Our microscopes have a variety of options and accessories to perfectly fit your application including ergonomic viewing heads, trinocular heads for camera attachment, and an assortment of objectives. Common contrast methods used with our microscopes include brightfield, phase contrast, darkfield, Differential Interference Contrast (DIC) and fluorescence.
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Laser Scanning FLIM Microscopes
DCS-120 laser scanner: Compact - Flexible - Precise. As technology leader in equipment and techniques for single photon counting, Becker & Hickl offers the DCS-120 systems that are complete laser scanning microscopes for fluorescence lifetime imaging (FLIM) since 2007. The systems use bh’s multi-dimensional TCSPC FLIM technology in combination with fast laser scanning and confocal detection or multi-photon excitation.
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Fiber Optic Inspection Microscope
80760
The Miller 200x Microscope helps inspect fiber optic connectors quickly and easily. Its ergonomic design and built-in features make it ideal for field and lab use. The microscope features a pressure-activated on/off switch, focusing wheel, eyepiece, auxiliary white LED light source rated for 100,000 hours, adapter tip for inserting ferrule and battery compartment.
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Stereo & Pocket Microscope
A small microscope which is designed to be easily portable. In some cases, the microscope may literally fit in a pocket, while in other cases it may be more comfortably carried in a field bag or small carrying case.
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Source Measurement Unit
DPS16
The DPS16 offers high voltage DPS in a compact, 3U PXI form factor. The DPS16 supports 0V to +4V 0.3A or 0V to 12V 25.6mA with FVMI, FVMV, FIMV, FIMI modes. 16 channel can be ganged to support high current driving.
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Near-field Scanning Optical Microscope
NSOM
Near-field Scanning Optical Microscope (NSOM) is a versatile tool for nano-characterization and nanomanufacturing.Conventional microscopes have fundamentally limited resolution due to diffraction, but there is no such restriction for near-field interactions, that is why near-field microscopy is becoming one of the most important techniques for nano-science.
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Atomic Force Microscope
LensAFM
The Nanosurf LensAFM is an atomic force microscope that continues where optical microscopes and profilometers reach their resolution limits. It is mounted like a normal objective lens, thus extending the resolution and measuring capabilities of these instruments.
