Measuring Microscopes
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Stereo Zoom Microscopes
Our product range includes a wide range of gemstar stereo zoom binocular microscope, gemstar stereomaster binocular stereo zoom microscopes, zoomstar iii trinocular stereo zoom microscopes, zoomstar ii trinocular stereo zoom microscopes, zoomstar vi trinocular stereo zoom microscopes and zoomstar v trinocular stereo zoom microscopes.
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Scanning Probe Microscopes
attoMICROSCOPY
The mission to create scientific impact has kept attocube at the frontier of cutting edge research instrumentation. Decades of combined experience in all relevant fields, an excellent team, and close cooperations with some of the world’s leading research institutes have evolved into a broad portfolio of high-end cryogenic scanning probe microscopes.
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Temperature Controlled Microscope Stage
Linkham Scientific Instruments
Specialists in temperature controlled microscopy, Linkam Scientific Instruments, announce the launch of their Optical DSC450 which enables simultaneous visualization of thermal processes for improved materials characterisation. The Optical DSC450 enables the user to measure glass transitions and melting behaviour of a wide range of substances whilst accurately controlling temperature from -196 °C to 450 °C. The atmosphere of the stage can also be purged with gas as required by the user. A new feature which will increase the characterisation capabilities of the DSC system is to combine it with imaging capability. The new LINK Digital Imaging module enables additional information to be obtained by correlating optical changes such as colour with temperature. The new TASC analysis tool takes this further. TASC (Thermal Analysis by Surface Characterisation) is a new image analysis capability which enables structural changes in samples to be tracked and quantified optically. It has the unique ability to measure local transition temperatures allowing different points on a sample to be identified. The new DSC system is great tool to use in research and quality control to measure quantitative values for glass transitions, melting peaks and sample purity and, when combined with TASC, even sample homogeneity.
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Balanced Measurements
The unbalanced interface of a VNA is not very well suited for measuring balanced circuits like antennas, transmission lines or chip impedances. In fact it is nearly impossible to get a decent calibration on a balanced 2-port measurement using coax cables.
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Gain-Compression Measurements
S97086B
The S97086A adds the software capabilities for the gain compression application (GCA).
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Temperature Controlled Microscope Stages
Your product descripThere are various version options for this stage, including pressure, vacuum, electrical sample measurement and sample holders to mount the stage vertically in IR or xray spectrometers.tion goes here.
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Gain-Compression Measurements
S95086B
The S95086B Gain-Compression Measurement (GCA) software provides fast and accurate input power, output power, gain, and phase at the compression point of an amplifier or frequency converter over a specified frequency and power range. With a simple setup, GCA reduces test times through an easy-to-use, fast, and accurate SMART Sweep. GCA also includes a guided calibration that corrects for absolute power levels, frequency response, and mismatch errors.
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Measuring Device
CAN-Bus Tester 2
The CAN-Bus Tester 2 is a widely used measuring device for control of bus parameters. The success story starts already in year 2002 with the first model. The hardware was completely redesigned in version 2. The corresponding software is still developed and has been enhanced with extensive updates.
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Spectroscopy Upgrade for Any Microscope
SMS
Get a simple upgrade to your existing microscope, or a turnkey microspectrophotometer system that works out-of-the-box.
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AFM (Atomic Force Microscope) Optical Platform
The AFM platform allows fully-integrated use of confocal Raman microscopy and AFM for Tip-Enhanced Optical Spectroscopies (such as Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL)), but also for truly co-localized AFM-Raman measurements.The myriad of AFM (Atomic Force Microscope) techniques that allow study of topographical, electrical and mechanical properties can be performed with any laser source available in Raman spectrometer, or with other external illumination (e.g., solar simulator or other tunable or continuum source). TERS and TEPL can provide nanoscale chemical and structural information, making the AFM-Raman platform a two-way road; where complimentary techniques provide novel and unique imaging capabilities to each other.
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X-ray Analytical Microscope (Micro-XRF)
XGT-9000
- <15µm probe size with ultra-high intensity without compromising sensitivity or spatial resolution. - High resolution cameras and multiple illumination modes to help capture images.- Dual types of detectors for transmission and fluorescent X-rays.- Detectable element range down to carbon with a light element detector.
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Atomic Force Microscope (AFM)
CombiScope
The CombiScope Atomic Force Microscope (AFM) is an advanced research instrument that provides the entry path for researchers in biology, spectroscopy and photonics. If you work with transparent samples either in air or in liquid towards nano-scale structures and (near-field) nano-optical properties investigation, the CombiScope is the right solution for you. It perfectly combines inverted optical and atomic force microscopies and unleash all the power of both techniques providing the instrument adjustment and measurement automation, high resolution and high speed. Plus it can be easily upgraded to our Raman spectrometers.
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Measurement
Field Uniformity
The purpose of our measurement is to characterise the properties (uniform field area, UFA) of the anechoic room according to IEC 61000-4-3 Ed. 3.1 b or EN 61000 4 3.
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Level Measurement
Omega provides contact and non-contact instruments for liquids, and non-contact instruments for solids. Choose from continious measurement or point level measurement with one of our level switches.
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Measurement & Simulation
Highland Technology offers a wide array of tools for measurement, simulation, and control. Tachometers, thermocouples, RTDs, precision voltages, current loops, strain gauges, and more can be measured or simulated by Highland's products.
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STM Microscope
NaioSTM
The first scanning tunneling microscope (STM) was developed in 1981 by Gerd Binnig and Heinrich Rohrer at the IBM Research Laboratory in Rüschlikon, Switzerland, for the first time making individual atoms directly visible to a small group of specialists. They were awarded the Nobel Prize in physics in 1986. In 1997, Nanosurf went one step further and brought single atoms to the classroom!
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Calibration And Measurement
Ectron has a long tradition dating back to 1964 in being the industry leader in supplying super high precision, highly reliable and accurate Metrology, Simulators/Calibrators products.
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Measurement
Torsiograph
Torsiograph is used for measuring the rotation non-uniformity in rotating parts of various mechanisms. Torsiograph generates virtual channels for displacement and displacement velocity. These channels are available for further analysis by ZETLAB programs, e.g. for displaying on the oscillograph.
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Digital Automated Interferometer and Microscope for Surface Inspection
DAISI-V3
The ultimate production interferometer for measuring end-face geometry on single-fiber connectors, equipped with a revolutionary «no-exterior-moving-parts» mechanical design.
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Ultrasound Measurements
Is sound waves with frequencies higher than the upper audible limit of human hearing. Ultrasound is no different from 'normal' (audible) sound in its physical properties, except in that humans cannot hear it. Ultrasound devices operate with frequencies from 20 kHz up to several gigahertz.Ultrasonic devices are used to detect objects and measure distances. Ultrasound imaging or sonography is often used in medicine. In the nondestructive testing of products and structures, ultrasound is used to detect invisible flaws.
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Scanning Near Field Optical Microscope
SNOM
SNOM microscopes employ SPMs precision of piezoelectric raster-scanning together with sharp probes to obtain light optical images at rather better than the usual wavelength-limited resolution. The possibility to go beyond the Abbe diffraction limit has been achieved with the Near-field light optical microscopes (SNOM or NSOM).
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On-Wafer Measurements
Accurate DC/CV (and RF) statistical modeling of semiconductor devices requires collecting a significant amount of measured data from different wafers across several temperatures. Keysight Technologies recommends IC-CAP WaferPro as a turn-key DC/CV and RF automated characterization solution to help modeling and device engineers achieve more efficient on-wafer measurements across temperature. This new breakthrough solution is based on IC-CAP modeling software and efficiently controls DC/CV analyzers, network analyzers, probers, switching matrixes, and temperature chucks, as well as the powerful 407x and 408x Series of Keysight parametric testers.
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Pressure Measurement
A wide variety of pressure sensors with an option for nearly every pressure measurement application. Pressure transducers, pressure gauges, pressure switches manometers, calibrators, and regulators.
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Level Measurement
As a market leader in level detection with the largest selection of agency approved level switch technologies, the K-TEK level products line has the proven technology to provide solutions for the most difficult liquids and solids level applications.
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Scanning Electro-chemical Microscope
920D
The scanning electrochemical microscope (SECM) was introduced in 19891 as an instrument that could examine chemistry at high resolution near interfaces. By detecting reactions that occur at a small electrode (the tip) as it is scanned in close proximity to a surface, the SECM can be employed to obtain chemical reactivity images of surfaces and quantitative measurements of reaction rates.
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Measuring Arms
Among the highly ergonomic and portable scanning and probing solutions that QFP offers are the KREON arms , a range of tools capable of operating on different working volumes (approximately from 2 meters with the ACE 6-20 model to 4.5 meters with the ACE 6-45 model) applicable in different sectors.
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Spectroradiometers For LED/Laser Measurements
Spectroradiometers for measuring white light and color LEDs, UV LEDs and NIR LEDs in CW and pulse mode. Measurement of Laser and VCSEL. Portable and fixed installation instruments for photometric, radiometric, colorimetric and flicker measurements.
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Stress Hysteresis Measurement
500 Series
Stress Hysteresis Measurement up to 500C for thermal property and stability tests of thin films in air.Non-Contact Laser Scanning Technology.
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Non-contact Diameter Measurement
Precision measurement is our focus. Our laser and ultrasonic-based technologies provide non-contact diameter measurements for a wide range of materials. Our accurate suite of tools cover outside diameter (OD), ovality (eccentricity), wall thickness (coating thickness/material thickness), concentricity, inside diameter (ID), and more.
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