Radio Test Sets
See Also: TPS
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Product
Radio Frequency, Communications, & Navigation Test Systems
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Reduce testing time and costs with the Astronics radio test sets for use in military, avionics, and civil security industries.Available in commercial and military grades, these integrated test systems make it easy to develop test program sets and leverage them securely and instantly across all deployed testers at the factory, depot, and operational levels.
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Product
Radio Test Set
CMA180
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With its frequency range from 100 kHz to 3 GHz, the R&S®CMA180 is ideal for testing all common analog and digital radio systems. Input levels up to 150 W are no problem for the R&S®CMA180. The flexible internal switching capabilities for the audio and RF paths make the R&S®CMA180 suitable for a wide range of test requirements. Users can configure the internal generators, external audio sources, filters and measurements according to the given application. In the predefined test scenarios for receiver, transmitter and duplex tests, the RF and audio paths are preconfigured. This saves time and eliminates configuration errors for standard test cases.
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Universal Radio Test Set for FM and AM Radio Stations of the VHF Band
RST-430
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RST - 430 Radio-Communication Service Tester is designed for maintenance and repair of FM and AM radio stations operating in the HF and VHF bands. It is a multipurpose radio measuring device for maintenance of communication equipment in indoor and field conditions.
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Tactical Radio Test Set
CTS-6100
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The CTS-6100 brings an entire test bench to your front lines. Enable your technicians to detect equipment faults and verify operational capabilities at the I- and O-levels, saving valuable diagnostic time and cost.
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5G Radio Test Set
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Operating from 20 to 40 GHz, two radios may be connected to the system allowing full duplex operation. Each radio may operates over identical Air Interface with uni or bi-directional multipath. The delays between radios may be varied from 0 to 1 mile in 5 foot steps with propagation loss control. The 2040+ creates a variable test range right in your lab. It can be used as a design aid and as a test tool for new modulation and encryption schemes prior to expensive and time consuming field testing.
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Product
Radio Test Set
CTS-6000 Series
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Bring your radio test function into the modern age with the new CTS-6000 Series radio test set. Combining nineinstruments into one, this tester offers fault detection and operational verification of your radio communicationssystem whether in the factory, at the depot, or deployed in the field.
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Product
Universal Test Set
UTS
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The Universal Test Set (UTS) is a portable, battery-powered, programmable, ruggedized radio frequency test set designed to validate improvised explosive device (IED) jamming equipment. Our unit is intended to provide an in-field confidence testing for warfighters employing IED jammers prior to departure.
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Product
USRP-2920, 20 MHz Bandwidth, 50 MHz to 2.2 GHz USRP Software Defined Radio Device
781906-01
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20 MHz Bandwidth, 50 MHz to 2.2 GHz USRP Software Defined Radio Device - The USRP‑2920 is a tunable RF transceiver with a high-speed analog‑to‑digital converter and digital‑to‑analog converter for streaming baseband I and Q signals to a host PC over 1 Gigabit Ethernet. You can also use the USRP‑2920 for the following applications: white space; broadcast FM; public safety; land-mobile, low-power unlicensed devices on industrial, scientific, and medical (ISM) bands; sensor networks; cell phone; amateur radio; or GPS.
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Product
USRP Software Defined Radio Device
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The USRP Software Defined Radio Device is a reconfigurable RF device that includes a combination of host-based processors, FPGAs, and RF front ends. The USRP Software Defined Radio Device include options that range from lower cost options with fixed FPGA personalities to high-end radios with a large, open FPGAs and wide instantaneous bandwidth. These devices can be used for applications such as multiple input, multiple output (MIMO) and LTE/WiFi testbeds, SIGINT, and radar systems.
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Product
Test Management Software
ActivATE™
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Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Product
Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
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Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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Product
W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
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The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
Semiconductors Testing
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Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
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Product
HTOL Test Systems
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Our IOL & Power-Cycling systems increase measurement quality & throughput while simultaneously reducing the Total Cost of Test (TCoT) of an open platform. We focus on complete monitoring and precise temperature control for each device under test.
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Product
Functional Test
UTS
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The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
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Automotive Electronics Functional Test System
TS-5020
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The Keysight TS-5020 Automotive Functional Test System is a low cost, scalable test system designed with “just-enough-test” concept for medium complexity electronic control modules, such TPMS, RKE and body electronic modules
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Product
Terotest iTest
iTest
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iTest is primarily a Functional Test platform which is easily configured to test PCB's, complete assemblies or individual devices. In addition, iTest's MDA capability offers the user the opportunity to perform low cost In- Circuit (MDA) testing as well as Combinational testing. Easy integration of 3U & 6U PXI modules, LXI, USB, GPIB and more.
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Product
Liquid Test Fixture
16452A
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The 16452A provides accurate dielectric constant and impedance measurements of liquid materials. The 16452A employs the parallel plate method, which sandwiches the liquid material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixure.
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Product
High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
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Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
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Product
NI Real-Time Test Cell Reference System
778820-35
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DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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Product
Wireless Test Standards Software
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Generate and analyze signals for cellular and connectivity standards with NI PXI RF instrumentationPerform advanced automated test with the easy-to-use NI-RFmx software APISave on all NI RF wireless test software under a single license
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Product
Test System
BMS HIL
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The BMS Hardware-in-the-Loop (HIL) Test System is a high performance platform providing all necessary input signals used for battery pack simulation. A real-time operating system executes complex cell and pack models commonly used for BMS algorithm development and firmware regression testing.
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Product
Faraday Chamber for RF w/Exchangeable Cassettes 340x350mm RCV 9025 for 6TL36
AN133
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The Faraday Chamber is an add-on for the 6TL36 test handler. This kit is installed into the 6TL36 in the same way a normal test fixture would be installed, being the only difference the fact that different products to be tested will, from that moment on, only need an additional exchangeable cassettes to be tested.
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In-Circuit Test
TestStation LH
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The TestStation LH in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne's popular, award winning TestStation product family. TestStation LH features SafeTest protection technologies for accurate, reliable, and safe testing of the latest low-voltage technologies.
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Dielectric Material Test Fixture
16453A
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The 16453A is designed for accurate dielectric constant and loss tangent measurements on the E4991A/4291A/B. It employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. The E4991A/4291A/B measures the capacitance created from the fixure, and option 002 firmware calculates the relative complex permittivity as described in the 16451B. Adjustment to insure parallel electrodes is required when using the 16451B. This adjustment is not required with the 16453A because the fixure has a flexible electrode that adjusts automatically to the material surface.
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Product
Functional Test
cUTS
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Get the essentials of measurement automation to power tests of simpler PCBAs and subassemblies. compactUTS (cUTS) is a cost-effective platform for automating manual tests of devices with fewer than fifty cable-accessible test points in manufacturing environments with moderate production volume. DUT-specific electrically keyed cables make changeover quick and easy.
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Product
LitePoint RF Test System
J750
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The option of adding LitePoint instrumentation to the J750 system delivers a cost-effective, complete production test solution covering global wireless connectivity standards.
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Product
Functional Test System Optimized For Real-Time Digital Bus Test
Spectrum HS
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Spectrum HS is Teradyne’s fully integrated functional test system. Optimized for real-time test of low latency buses, it’s a high-performance system delivering excellent test coverage of current and future products.
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Product
Semiconductor Test System
TS-960e
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The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
