Memory Test Systems
-
Product
Spring Clip Fixture
16092A
-
Use this test fixture with parallel electrodes for impedance evaluation of both lead and SMD components.
-
Product
Test Handler
M6242
-
Optimal Test Handler for Mass-Production DRAM, with Double the Throughput.
-
Product
W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
-
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
-
Product
Lower-Cost Small Footprint In-Circuit Test System
TestStation LHS
-
The TestStation LHS in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne’s popular, award winning TestStation product family. Compatible with existing TestStation LH fixtures.TestStation LH features the voltage accuracy and backdrive current measurement embedded in Teradyne’s SafeTest protection technology for accurate, reliable and safe powered-up testing of new low-voltage software.
-
Product
16G R-DDR4-3200 1GX8 1.2V Samsung Chip -40~85C
AQD-D4U16R32-SEW
-
Registered DIMM, 30u" Gold Plating Thickness, Anti-sulfurization resistance. 1.2V power consumption, Samsung original chip, wide temperatures from -40° to 85°C.
-
Product
TD-SCDMA Analysis Using NI PXI RF Test Instruments
NI-RFmx TD-SCDMA
-
The NI-RFmx TD-SCDMA personality is a highly optimized API for performing physical layer measurements on TD-SCDMA cellular standard signals. NI-RFmx TD-SCDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
-
Product
Massively Parallel Parametric Test System
P9001A
-
The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
-
Product
Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
-
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
-
Product
Ethernet and Fibre Channel Test Platform
SierraNet M648
-
The SierraNet M648 Ethernet and Fibre Channel test platform provides best in class analysis, jamming and generation for traffic capture and manipulation for testing application and link characteristics. SierraNet M648 is the latest in the line of industry leading test and measurement tools from Teledyne LeCroy, designed for today’s high-speed storage and communications fabrics. SierraNet M648 supports examination and modification of Ethernet and Fibre Channel links utilizing both Pulse Amplitude Modulation 4 (PAM4) and legacy Non-Return to Zero (NRZ) technologies.
-
Product
Imperial Test Executive
ITE
-
The Imperial Test Executive (iTE) is a UI shell that sits on top of National Instruments TestStand. It provides a simple but elegant interface to execute your NI TestStand sequences. The iTE software was designed to allow general operators to execute ATE testing software without requiring any knowledge of NI TestStand. Training an operator to use this system typically takes less then 5-minutes.
-
Product
Digital Test Instruments
-
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.
-
Product
16GB SO-DDR4-3200 1GbX8 1.2V ECC Samsung Chip
AQD-SD4U16GE32-SE
-
16GB, Speed 3200MHz, 30u" Gold Plating Thickness, Anti-sulfurization resistance, ECC.
-
Product
In-Circuit Test Systems For Sale
-
Forwessun offers a comprehensive range of global services for a variety of Test Systems. We provide refurbished systems that have undergone rigorous testing, giving you reliable performance at a fraction of the cost of new equipment. Whether you’re looking for a long-term solution to enhance your testing capabilities or a temporary setup to meet increased production demands, we have flexible options to suit your needs. - HP3070- Agilent - Keysight- GenRad- Teradyne Our bespoke rental agreements make it easy to scale up without permanent investment—simply return the system when it’s no longer required. For ongoing support, we offer calibration, repair, and maintenance services through convenient service contracts. If you’re looking to retire any outdated or non-functional In-Circuit Test (ICT) systems, we’ll offer fair market prices, helping you maximise value on any surplus equipment.
-
Product
Mezzanine System
5089
-
The 5089 provides eight channels of 12 bit A/D conversion using the Analog Devices AD7328, and is suitable for medium resolution medium speed applications.
-
Product
Headlamp Test Platform
-
Leverage 25+ years of automotive test experience, with the specialized design and manufacturing of automotive lighting testers. Using specialized know-how in this field, including photometric, electro-mechanical equipment and software solutions, accelerate your time to market with a higher quality product.
-
Product
NI's Electrical Functional Test Solution
-
PXI instrumentation ensures complete and accurate test coverage with a modular architecture mounted in ultra-reliable PXI chassis.TestStand and LabVIEW software provide rapid development of complex test steps and sequences. PXI systems conserve floorspace because of their small, light form factor. Order them preassembled and installed using NI ATE Core Configurations.SystemLink™ software deploys updates and democratizes data insights to optimize operational efficiency.
-
Product
USB2.0 Module With 2 CAN Bus Nodes ARINC825 Compliant For Testing & Simulation of Avionic ARINC825/CAN Bus Systems
APU825-2
-
USB2.0 module with 2 CAN bus nodes ARINC825 compliant for testing and simulation of Avionic ARINC825/CAN bus systems.
-
Product
EBIRST 50-pin D-type To 2x8-pin Power D-type Adapter
93-005-236
-
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
-
Product
ARINC-708 Module
M4K708
-
The M4K708 module is an ARINC-708 / 453 2-channel test and simulation module for the Weather Radar Display Databus. The M4K708 supports two ARINC-708 / 453 channels, each selectable as transmit or receive.
-
Product
NI Vehicle Radar Test System
-
VRTS provides automated radar measurement and obstacle simulation capabilities for 76 to 81 GHz automotive radar systems. With VRTS, you can perform precision RF measurements and simulate a wide range of test scenarios for radar hardware and software subsystems, including sensors, advanced driver assistance systems (ADAS), and embedded software. Use VRTS for all phases, from design to manufacturing, of ADAS and radar system test.
-
Product
3-Axis Non-Robotic Automated Testing System
AT3
-
The Instron AT3 is a space-efficient, highly adaptable 3-axis mechanical testing platform designed for automated execution of tensile, compression, flexural, and lap shear tests. Built to comply with a broad spectrum of ASTM and ISO standards, it’s well-suited for evaluating materials such as plastics, elastomers, thin films, foils, and metals. The system streamlines the entire testing workflow from specimen measurement and handling to strain measurement and specimen disposal—enabling users to load up to 160 samples and let the AT3 take care of the rest. Boost productivity, reduce manual intervention, and achieve consistent, dependable results with every test cycle.
-
Product
32G SO-DDR5-5600 2GX8 1.1V SAM -20~85℃
AQD-SD5V32GN56-SBH
-
SAM Original Chip, Industrial Design for Improved Reliability, PCB: 30μ gold finger. Anti-sulfuration, Semi Wide-temp Support -20~85℃.
-
Product
Micron 8G DDR4 3200 288PIN 1GbX8 REG 1.2V
96D4-8G3200ER-MI
-
DDR4-3200 Registered ECC DIMM, 1.2V power consumption, Supports ECC error detection and correction. Data bus inversion (DBI) for data bus, Low-power auto self refresh (LPASR).
-
Product
In-Line RF Test Platform
AR925
-
This functional and RF test platform combines outstanding productivity with substantial equipment savings. The Faraday chamber of the fixture comes with an interchangeable cassette to minimize the testing cost of each new product
-
Product
RF Testing Platform for ATx05
AT118
-
The functional test of modern devices with wireless connectivity always requires RF isolated cameras, as the only way to have the parameters controlled and to guarantee operation under the specified conditions.
-
Product
Image Sensor Testing
IP750Ex-HD Family
-
The IP750EX-HD has been the test platform that has enabled the industry to manufacture high quality CCD and CMOS image sensors, and it is the most economical platform to meet the needs of newer technologies such as Time of Flight (ToF) sensors. When you use a smartphone, high performance digital still camera, or in-home security and surveillance system, these applications have image sensors most likely tested by Teradyne’s IP750ExHD.
-
Product
True Concurrent Test
TestStation Duo
-
The TestStation Duo is a true concurrent test system with independent test modules providing fast in-circuit test throughput and lowering high-volume production costs.It effectively doubles the test throughput of conventional in-circuit test systems, without doubling capital equipment costs or increasing manufacturing floor space, by combining two complete and independent test modules inside a single tester frame.
-
Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196A
-
The 16196A surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
-
Product
Memory Test System
T5833/T5833ES
-
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
-
Product
Active Alignment Assembly & Test Platform
-
Quickly deliver flawless camera & LiDAR modules, MEMS devices, die based sensors, LED and laser-based headlights and other high-end products with a supremely accurate standardized platform.
