MIxed Signal Test Systems
See Also: Mixed Signal, Mixed Signal ATE, Mixed Signal Oscilloscopes, Mixed-Signal Test, Mixed Signal Testers
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Product
Cobra Temperature Forcing System for ATE/SLT Test Applications
31000R
System
Cobra is the most advanced, compact,powerful temperature-forcing system on the market. Cobra is an adaptable solution to the ever-increasing thermal demands of post silicon validation and device characterization.
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Product
PXI Breadboard Module, 1-Slot, 37-Pin D-Type
40-220A-201
Signal Module
The 40-220A series of breadboard modules allow the user to construct their own circuit in situations where a suitable PXI module is not available. For example when it is required to integrate a non-switching function into a PXI chassis. Typical applications include: Creating custom circuitry that can be housed in on a 3U board, or to build special one-off switching modules.
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Product
PXIe-5665, Up to 14 GHz PXI Vector Signal Analyzer
781775-01
Signal Module
Up to 14 GHz PXI Vector Signal Analyzer - The PXIe‑5665 is a modular, three‑stage superheterodyne analyzer that you can use as either a spectrum analyzer or vector signal analyzer. It supports RF list mode, which increases multiband measurement speed with fast and deterministic changes in configuration. In addition, you can use the PXIe‑5665 with the Modulation Toolkit to analyze custom and standard modulation formats. The PXIe‑5665 can perform measurements for a broad range of communications standards such as GSM, EDGE, WCDMA, WiMAX, LTE, Bluetooth, WLAN, DVB‑C/H/T, ATSC, and MediaFLO. Because all measurements are software defined, you can reconfigure the measurements using standard-specific toolkits. With these toolkits, the PXIe‑5665 provides a low-cost solution to high-performance RF measurements.
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Product
Component Test Systems
Test System
These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
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Product
6TL36 Inline Handler
AM304
Test Handler
Test handler 6TL36 able to test DUTs inside Faraday ChamberDual line (bypass)
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Product
PXIe-5673E, 6.6 GHz PXI Vector Signal Generator
781262-02
Signal Module
6.6 GHz PXI Vector Signal Generator - The PXIe‑5673E is a wide-bandwidth module that, when combined with the appropriate software, can generate a variety of signals. With the Modulation Toolkit for LabVIEW, it can generate different waveforms including AM, FM, CPM, ASK, FSK, MSK, PSK, QAM (4‑, 16‑, 64‑, and 256‑QAM), multitone signals, arbitrary waveforms, and many others. In addition, you can combine these vector signal generators with standard-specific software to generate signals for GPS, GSM/ EDGE/WCDMA, WLAN, WiMAX, DVB‑C/H/C, ISDB‑T, ZigBee, and others. With PXIe‑5673E stream‑from‑disk capabilities, you can generate continuous waveforms that are up to several terabytes in length.
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Product
PXIe-5667, 3.6 GHz PXI Vector Signal Analyzer
782366-02
Signal Module
PXIe, 3.6 GHz PXI Vector Signal Analyzer - The PXIe‑5667 is optimized for spectrum monitoring applications such as radio monitoring, interference detection, spectrum regulation, and related applications in line with ITU recommendations. It features real-time signal analysis and advanced signal processing using the capabilities of the built-in FPGA. Additionally, the PXIe‑5667 includes options for various frequency ranges and instantaneous bandwidth.
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Product
Signal, Patchcord, ITA, 36", TriPaddle, 20 AWG White Teflon (7 Amps)
7-103920000-036
Signal Patchcord
Signal, ITA, 36", TriPaddle (7 Amps), 20 AWG White Teflon (7 Amps)
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Product
19” Rackmount Data Collection System
DCS-211
Data Acquisition System
- Intel Atom® x5-E3930 processor- Up to 8x DI and 6x DO with two 2A relays- 3x M12 GbE, 1x RJ-45 GbE, 2x isolated RS232/422/485, 2x USB and one lockable HDMI port- Up to 3x PCI Express mini slots with one USIM card slot each- Storage: up to 64GB eMMC 5.0, 1x 2.5” SATA drive bay
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Product
Signal, Patchcord, Receiver, 72", TriPaddle, USB 2.0 Wire, to USB Type A Plug (1.5 Amps)
7-104872596-072
Signal Patchcord
Signal, Patchcord, Receiver, 72", TriPaddle, USB 2.0 Wire, to USB Type A Plug (1.5 Amps).
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Product
PXI Breadboard Module, 2-Slot, 96-Pin Micro-D
40-220A-002
Signal Module
The 40-220A series of breadboard modules allow the user to construct their own circuit in situations where a suitable PXI module is not available. For example when it is required to integrate a non-switching function into a PXI chassis. Typical applications include: Creating custom circuitry that can be housed in on a 3U board, or to build special one-off switching modules.
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Product
PXIe-5663E, 6.6 GHz PXI Vector Signal Analyzer
781339-02
Signal Module
6.6 GHz PXI Vector Signal Analyzer - The PXIe‑5663E offers wide instantaneous bandwidth and supports RF list mode, which increases multiband measurement speed with fast and deterministic changes in configuration. You can use a PXIe‑5663E as either a spectrum analyzer or vector signal analyzer, and you can use it with the Modulation Toolkit to analyze custom and standard modulation formats. The PXIe‑5663E can perform measurements for a broad range of communications standards such as GSM, EDGE, WCDMA, WiMAX, LTE, Bluetooth, WLAN, DVB‑C/H/T, ATSC, and MediaFLO. Because all measurements are software defined, you can reconfigure the measurements using standard-specific toolkits. With these toolkits, the PXIe‑5663E provides a low-cost solution to high-performance RF measurements.The PXIe-5663E comprises the following modules:• PXIe-5601 RF Signal Downconverter• PXIe-5622 IF Digitizer• PXIe-5652 RF Analog Signal GeneratorThere is no physical device named "PXIe-5663E".
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Product
6TL60 Rotary Test Handler
H79006010
Test Platform
6TL60 has been designed according to the 6TL philosophy, following the concepts of flexibility, modularity and scalability, and with the aim of improving production efficiency as well as increase production capacity and reduce costs.The 6TL60 is the best production solution to automate test processes to reduce the cycle time and the footprint used in the manufacturing plan
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Product
Signal Patchcord, ITA, Mini Power, 50u Gold, 36", 14 AWG White Teflon, Single Ended, (40 Amps)
7-239912000-036
Signal Patchcord
Signal Patchcord, ITA, Mini Power, 50u Gold, 36", 14 AWG White Teflon, Single Ended, (40 Amps)
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Product
High Speed Test Bench
AT444
Test Platform
AC motor with mechanical multiplying gearbox test benches allow precise programming of all drive parameters required for accurate rotating devices test.The use of special high-speed bearings, mechanical components and parts wear resistant leads to a large life. The supply includes the electronic drive and control as well as the entire oil cooling unit.
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Product
In-Circuit Test System Rentals
Test System
Forwessun offers flexible test system rental options to meet short-term or seasonal testing demands. Our rental systems are rigorously tested for reliability and performance, giving you access to high-quality equipment without the need for a full purchase commitment. Customised rental agreements allow you to return the equipment when it’s no longer required, providing an ideal solution for scaling up production or filling in during periods of high demand.
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Product
USB2.0 Module With 2 CAN Bus Nodes ARINC825 Compliant For Testing & Simulation of Avionic ARINC825/CAN Bus Systems
APU825-2
System
USB2.0 module with 2 CAN bus nodes ARINC825 compliant for testing and simulation of Avionic ARINC825/CAN bus systems.
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Product
At-Speed Non-Intrusive Functional Testing
ScanExpress JET
Functional Test
Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.
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Product
Modular Breakout System 37-Pin D-type Plugin Module for 40-293
95-293-001
Modular Breakout System
The 95-293-001 Plugin Breakout Module is designed to be fitted to a PXI 40-293 Programmable Resistor Module as part of the Pickering MBoS. The Modular Breakout System is designed to Simplify HILS (Hardware In the Loop Simulation) Applications.
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Product
EBIRST 78-pin D-type To 68-pin Male SCSI Adapter
93-006-401
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
test
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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Product
Lens Module Test Platform
Test Platform
The Lens Module Test Platform is a flexible solution to deliver the quality that is expected from your brand for all types of lenses and cameras. The system can be configured to measure objective, eyepiece or camera lenses. As the platform can efficiently measure lenses as small as 2 mm3, it is perfect for the critically precise applications of life sciences, consumer electronics, automotive and other industries. With 25+ years of quality experience, the Lens Module Test Platform ensures that all products shipped to market work as intended.
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Product
Wireless Device Functional Test Reference Solution
Functional Test
The Keysight S8890A Wireless Device Functional Test Reference Solution provides an automation environment which is both simple to use, yet comprehensive and powerful. Based on the Test Automation Platform www.keysight.com/find/TAP, S8890A provides optional instrument driver/plug-ins offering simplified logically grouped control steps. These steps can be sequenced, looped and swept to provide powerful individual test cases or comprehensive sequences. Each driver/plug-in is provided with extensive starter sample test cases which can be modified by Keysight or the end user the UE to be tested. Plug-in options:
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Product
SSD Test Systems
MPT3000ES / MPT3000ES2
Test System
Using the same high-performance electronics and powerful software as all products in the MPT3000 family, the MPT3000ES and MPT3000ES2 engineering stations feature a small footprint configured to test up to eight SSDs in parallel. The system's small size and ability to plug into a standard AC outlet enable users to conduct program development and interactive device debugging in either office or lab settings.
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Product
Seno-Con Test System
PANTHER 2K QST
Test System
Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
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Product
PXI Breadboard Module, 1-Slot, 9-Pin D-Type
40-220A-701
Signal Module
The 40-220A series of breadboard modules allow the user to construct their own circuit in situations where a suitable PXI module is not available. For example when it is required to integrate a non-switching function into a PXI chassis. Typical applications include: Creating custom circuitry that can be housed in on a 3U board, or to build special one-off switching modules.
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Product
PSG Analog Signal Generator, 100 kHz to 67 GHz
E8257D
Signal Generator
Address your toughest requirements with metrology-grade frequency & level accuracy with excellent distortion & spurious characteristicsTest high-power devices & overcome test system losses with 1 W output powerAddress the demanding needs of Doppler radar, ADC & receiver-blocking tests with the PSG's extremely low phase noiseCharacterize devices & circuits by adding AM, FM, PM & pulse modulation to your signalMeet test system needs up to 1.1 THz with frequency extender modules
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Product
PXI-5651, 3.3 GHz RF Signal Generator
779670-01
Signal Generator
3.3 GHz PXI RF Analog Signal Generator—The PXI‑5651 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXI‑5651 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
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Product
PXIe-5665, Up to 14 GHz PXI Vector Signal Analyzer
781774-03
Signal Module
Up to 14 GHz PXI Vector Signal Analyzer - The PXIe‑5665 is a modular, three‑stage superheterodyne analyzer that you can use as either a spectrum analyzer or vector signal analyzer. It supports RF list mode, which increases multiband measurement speed with fast and deterministic changes in configuration. In addition, you can use the PXIe‑5665 with the Modulation Toolkit to analyze custom and standard modulation formats. The PXIe‑5665 can perform measurements for a broad range of communications standards such as GSM, EDGE, WCDMA, WiMAX, LTE, Bluetooth, WLAN, DVB‑C/H/T, ATSC, and MediaFLO. Because all measurements are software defined, you can reconfigure the measurements using standard-specific toolkits. With these toolkits, the PXIe‑5665 provides a low-cost solution to high-performance RF measurements.
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Product
Wafer-Level Parametric Test
test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.





























