MIxed Signal Test Systems
See Also: Mixed Signal, Mixed Signal ATE, Mixed Signal Oscilloscopes, Mixed-Signal Test, Mixed Signal Testers
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EV-DO Analysis Using NI PXI RF Test Instruments
NI-RFmx EV-DO
Highly optimized RF measurement experiencePerform physical layer analysis on EV-DO cellular signals including MODACC, ACPR, CHP, OBW, and SEMSimple access to advanced measurement parallelism
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12GHz Single Channel Signal Generator 19" 1U Rack Module
LS1291R
The LS1291R, 12GHz Single Channel RF Analog Signal Generator, offers industry leading performance, in a 1U, 19” rack-mounted box. The LS1291R features exceptionally fast switching speed, superior signal integrity and purity and all the necessary modulated signals for analog communication systems. The LS1291R was designed to offer excellent performance and abilities combined with an affordable price tag, needed from the R&D benches to the production lines.
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Wafer Chip Inspection System
7940
Chroma 7940 wafer chip inspection system is an automated inspection system for postdiced wafer chip inspection.
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3GHz Four Channel Signal Generator 19" 1U Rack Module
LS3084R
The LS3084R, 3GHz four channel RF Analog Signal Generator, offers industry leading performance, in a 1U, 19” space efficient, rack-mounted box. The LS3084R features four phase coherent channels, exceptionally fast switching speed, superior signal integrity and purity and all the necessary modulated signals for analog communication systems. The LS3084R was designed to offer excellent performance and abilities combined with an affordable price tag, needed from the R&D benches to the production lines.
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PXIe-5663E, 6.6 GHz PXI Vector Signal Analyzer
781339-02
6.6 GHz PXI Vector Signal Analyzer - The PXIe‑5663E offers wide instantaneous bandwidth and supports RF list mode, which increases multiband measurement speed with fast and deterministic changes in configuration. You can use a PXIe‑5663E as either a spectrum analyzer or vector signal analyzer, and you can use it with the Modulation Toolkit to analyze custom and standard modulation formats. The PXIe‑5663E can perform measurements for a broad range of communications standards such as GSM, EDGE, WCDMA, WiMAX, LTE, Bluetooth, WLAN, DVB‑C/H/T, ATSC, and MediaFLO. Because all measurements are software defined, you can reconfigure the measurements using standard-specific toolkits. With these toolkits, the PXIe‑5663E provides a low-cost solution to high-performance RF measurements.The PXIe-5663E comprises the following modules:• PXIe-5601 RF Signal Downconverter• PXIe-5622 IF Digitizer• PXIe-5652 RF Analog Signal GeneratorThere is no physical device named "PXIe-5663E".
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Automotive Ethernet Test Fixture
AE6941A
The AE6941A automotive Ethernet electrical test fixture provides easy access to automotive Ethernet electrical signals so you can perform conformance testing and device characterization quickly and easily.
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Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
Compact solution for testing Battery Packs with output power up to 110 kW and voltage range up to 1500 V
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Signal, Patchcord, Receiver, 72", QuadraPaddle, 22 AWG White, Twisted Pair ( 5 Amps)
7-124439000-072
Signal, Patchcord, Receiver, 72", QuadraPaddle, 22 AWG White, Twisted Pair ( 5 Amps)
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PXI Breadboard Module, 1-Slot, 96-Pin Micro-D
40-220A-001
The 40-220A series of breadboard modules allow the user to construct their own circuit in situations where a suitable PXI module is not available. For example when it is required to integrate a non-switching function into a PXI chassis. Typical applications include: Creating custom circuitry that can be housed in on a 3U board, or to build special one-off switching modules.
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PXIe-2515, 35-Channel, 0.25 A PXI Signal Insertion Switch Module
780587-15
PXIe, 35-Channel, 0.25 A PXI Signal Insertion Switch Module—The PXIe‑2515 is a multiplexer switch module that enables connectivity by routing high-speed digital I/O (DIO) signals between a device under test (DUT) and an NI high-speed DIO device or a parametric measurement device. You can use modules such as PXI Source Measure Units (SMUs) and PXI Digital Multimeters (DMMs) with high-speed digital devices. With the PXIe‑2515, you can perform parametric tests on digital pins without external connectivity or impedance mismatch challenges.
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Modular Functional Test Platform
LX-OTP2
The OTP² system platform has recently been available in both the PXI and LXI versions. The OTP2 system platform enables the cost-effective and fast implementation of function test systems based on defined modules and function blocks. Thanks to the open system interfaces, customer-specific adjustments can be made at any time without any problems. When considering options for your next generation functional test system, it is important to assess the entire life cycle of the system and the associated costs and efforts. Use OTP² to accelerate development cycles and reduce the development effort for new functional test systems.
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Off-Line Seat Operation Base Test Platform
6TL23
The 6TL23 is a bare rack for creating Off-Line, modular, flexible, and reliable Base test platforms. The overall rack capacity is 18U (580mm depth). The rack is ideal for sit-down operation since there’s space for the operator’s legs under the fixture receiver.
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AT-1120, 14-Bit, 2 GS/s, 2-Channel Signal Generator Adapter Module for FlexRIO
782248-01
The AT-1120 provides simultaneously sampled analog output channels for signal generation. It also features single-ended, DC-coupled inputs. The AT-1120 is ideal for generating complex signals like digital modulations and RF stimuli for functional and performance tests. Each channel has a user-configurable sample rate, and data is written directly from the FPGA. To use the AT-1120, you must pair it with a compatible PXI FPGA Module for FlexRIO.
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Multi-Functional Optical Profiling system
7505-01
Chroma 7505-01 is the newest multi-function optical inspection system that equips with the capability of measuring 1D, 2D and 3D at the same time. Penetrating reflection measurement is used for 1D film thickness measurement to measure the non-destructive film thickness on transparent and translucent material.
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Mini LED Backlight Module Automatic Optical Test System
7661-K003
Chroma 7661-K003 Mini LED Backlight Module Automatic Optical Test System contains a 71803-2 2D color analyzer to measure chromaticity and brightness
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RF & Microwave Signal Generator
SMA100B
The R&S®SMA100B RF and microwave signal generator delivers uncompromising maximum performance. It provides the purest output signals while maintaining the highest output power levels with the lowest harmonics, far outpacing the competition. As the world's leading signal generator, it can handle the most demanding module and system T&M tasks in the RF semiconductor, wireless communications, aerospace and defense industries.
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PXI Integration Platform
ATS-3100
The new ATS-3100 enables you to rise above the module level and shift your focus to the sophisticated test solution you’re actually building. Simply add your instruments, software, and customization to create a complete solution. Or, if you're short on time or resources, ask Astronics Test Systems to do the finishing work for you.
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PXI Breadboard Module, 2-Slot, 15-Pin D-Type
40-220A-602
Versatile PXI Breadboard with 65 sq cm (10 sq in) of Prototype Area, fitted with 15-pin D-type connector, dual PXI slot width.
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MXG X-Series RF Analog Signal Generator, 9 kHz to 6 GHz
N5181B
Take your devices & designs to their limit with outstanding hardware performance, including unmatched phase noise & spurious characteristicsDrive power amplifiers & characterize nonlinear behavior with industry-leading output powerThoroughly test receiver performance by simulating complex analog modulation scenarios with multi-function generator capabilityLower your cost of ownership with 3-year cal cycles & comprehensive solutions for self-maintenance
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Mezzanine System
5081
The 5081 provides four channels of 12 bit digital to analog voltage output, with multiple single ended output ranges. Each channel is software selectable for 0 to +5V, 0 to +10V, +/-2.5V, +/-5V, +/-10V or -2.5 to 7.5V ranges. The outputs reset to 0.0 volts on power up.
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6TL24 Combinational Base Test Platform
H71002400
The 6TL24 is the Base platform ideal for Combinational test (ICT+FCT) in low to mid volume, high-mix electronics productions. A dual-stage pushing mechanism will allow performing both, the FCT and the ICT test, without the need of changing the test platform and with a low cost fixturing technology. To do so, the exchangeable cassette fixture must be designed with two-level probes. IN the 6TL24, the second level is reached thanks to a pneumatic actuator.
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Signal, Contact, Receiver, QuadraPaddle, 5 Amp, 22-28 AWG, Crimp, 30µ" Au
610138216
*Please note: The difference between this p/n and 610138116 is the amount of gold plating. See below.P/n 610138116- 50µ" AuP/n 610138216- 30µ" AuPrimary mating contact 610138109. (May mate with other ITA contacts, as well.)Specifications Operating Voltage & Current 5 Amps Max. Continuous; 600 volt Max. use of wire Mil-W-16878/4Contact Resistance 25 mOhms Max.Measured at 50 mV @ 100 mADielectric WithstandingVoltage (DWV) 1500 VDC Min.Insulation Resistance 5000 MOhms Min.Contact Body BeCuContact Plating 30µ" Au over 100µ" NiContact Termination CrimpCycle Life 20,000 CyclesRoHS Directive 2011/65/EU Status CompliantREACH Article 33 Status CompliantECHA Article 59 of Reach Regulation CompliantAVG Mating Force(lbs) 0.24
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PXA Signal Analyzer, Multi-touch, 3 Hz to 50 GHz
N9030B
Accelerate innovation in demanding applications with measurement options that range from excellent to exceptionalExtend frequency up to 110 GHz with Keysight smart mixersCapture transient or intermittent signals with real-time spectrum analysisSimplify application-specific testing with X-Series appsPerform deeper troubleshooting with the 89600 VSA software
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CXA-m PXIe Signal Analyzer
M9290A
Deploy a smaller microwave footprint, no trade-off in precision: Rely on fully specified performance up to 26.5 GHz in 4 slots Optimize your balance between speed, sensitivity and accuracy with the choice to operate in swept or FFT modes Perform fast calibrated stimulus response measurement with full-band tracking generator Smooth the transition between R&D, manufacturing, and maintenance: CXA-m is code compatible with benchtop X-Series signal analyzers and ESA spectrum analyzers
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Image Sensor Test System
IP750
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Signal, Patchcord, Receiver, 36", QuadraPaddle, 68-Pin Male SCSI
7-124883666-036
Signal, Patchcord, Receiver, 36", QuadraPaddle, 68-Pin Male SCSI.
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In-Circuit Test System Calibrations
Regular calibration is essential to ensure accuracy and reliability in testing. Forwessun offers precise calibration services tailored to your test systems, verifying that all components meet industry standards. Our calibration services maintain peak accuracy and compliance, so you can be confident in your system’s performance for any testing application. Choose from one-off calibrations or scheduled service contracts to meet your needs.- HP3070 - Agilent- Keysight - GenRad- Teradyne
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Configurable Data-Logging System
NI CompactDAQ
This NI CompactDAQ configurable data-logging system includes an NI CompactDAQ controller or chassis, C Series I/O modules, and Chameleon software. It is designed for structural test and monitoring applications with the NI CompactDAQ controller, which includes built-in processing and nonvolatile storage for running Chameleon software and logging data locally. Alternatively, you can choose a USB or Ethernet chassis for a lower cost system that requires an external PC. This system accepts a variety of C Series I/O modules, so you can mix and match microphones, accelerometers, and temperature and bridge-based sensors.
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Signal, Patchcord, Receiver, 36", QuadraPaddle, 22 AWG White, Twisted Pair ( 5 Amps)
7-124439000-036
Signal, Patchcord, Receiver, 36", QuadraPaddle, 22 AWG White, Twisted Pair ( 5 Amps).
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Parametric Test Fixture
U2941A
The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
