Silicon
atomic number 14 tetravalent metalloid chemical element.
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Silicon Diodes
DT-670 Series
DT-670 Series silicon diodes offer better accuracy over a wider temperature range than any previously marketed silicon diodes. Conforming to the Curve DT-670 standard voltage versus temperature response curve, sensors within the DT-670 series are interchangeable and, for many applications, do not require individual calibration. DT-670 sensors in the SD package are available in four tolerance bands—three for general cryogenic use across the 1.4 K to 500 K temperature range and one that offers superior accuracy for applications from 30 K to room temperature. DT-670 sensors also come in a seventh tolerance band, B and E, which are available only as bare die. For applications requiring greater accuracy, DT-670-SD diodes are available with calibration across the full 1.4 K to 500 K temperature range.
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Pyranometer with Silicon Photodiode
LP471SILICONPYRA
Pyranometer with silicon photodiade for GLOBAL SOLAR IRRADIANCE measurement.
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Silicon Optical Power Head
81620C
The new 81620C optical power head provides a 5 mm detector area and allows flexible placement of the remote optical power meter, which is then connected to the N7749C. The 81620C accepts parallel beams with up to 4 mm diameter, standard SM fiber and MM fiber with max. 100 μm core diameter, NA ≤ 0.3. A wide choice of adapters allows input from popular fiber connector types, bare fibers or open beams. The magnetic D-shaped adapters allow rapid removal and replacement without twisting attached fibers.
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Silicon Oscillators
Analog Devices silicon oscillators are frequency programmable via pin-strapping, or through the resistor connection or serial interface (SPI or I2C). These solid-state clocks are well-suited for general-purpose usage, such as PGAs, ASICS, microprocessors, or UARTS, and they operate from 1 kHz to 170 MHz. Silicon oscillators are also ideal switching regulator clocks as they provide synchronization and EMI reduction (via spread spectrum).
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Silicon Carbide Diodes
In addition to ensuring compliance with today's most stringent energy efficiency regulations (Energy Star, 80Plus, and European Efficiency), ST's silicon-carbide diodes show four times better dynamic characteristics with 15% less forward voltage (VF) than standard silicon diodes. Silicon-carbide diodes belong to our STPOWER family.
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Silicon Resistivity, PN type & Alarm Tester
HS-PSRT
It use Four Probe to test the resistivity and P/N type of wafers、ingots and all type of silicon materials.It can be used by Solar and Semiconductor industry.
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X-Band Silicon Radar Quad Core IC
AWS-0101
The AWS-0101 is a highly integrated silicon quad core IC intended for radar and 5G phased array applications. The device supports four radiating elements, single beam transmit, and dual beam receive and includes all requisite beam steering controls for 6 bit phase and gain control. The device provides 21 dB gain during transmit mode, +15 dBm output power during transmit, and 3.4 dB NF during receive. Additional features include gain compensation over temperature, temperature reporting, and fast beam switching using eight on-chip beam weight storage registers. The device features ESD protection on all pins, operates from a +1.8V supply, and is packaged in a 56 lead 7x7 QFN for easy installation in planar phased array antennas.
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Endevco Miniature Piezoresistive Silicon Pressure Sensors
Accurate and Reliable Performance at Extreme Pressures.
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Super Silicon Resistivity and Type Tester
HS-3FC II
Super Silicon Resistivity and Type Tester is specially designed for silicon sorting，it can quickly test the silicon type, heavy-doped, resistivity and current, and can be widely used in all kinds of silicon sorting, like granular polysilicon material, break semiconduct silicon wafer, chunk material, top and tail material and so on. Furthermore, it integrates two probes, three probes and four probes. With the three probes, it could show type and heavy type simultaneously, strongly improved the sorting efficiency.
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Silicon Charged Particle Radiation Detectors
ORTEC introduced the first silicon surface barrier detectors for charged particle spectroscopy in the early 1960’s. Since then, ORTEC has expanded the product line with more than ten different options to choose from.
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DFT Validation And Silicon Debug Platform
NEBULA Silicon Debugger
NEBULA provides advanced features for performing early validation of DFT infrastructure and ATPG patterns in first silicon. The NEBULA solution directly imports test pattern formats and DFT information from leading EDA vendor tools, such as Synopsys' TetraMAX and Cadence's Encounter Test.
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Ka-Band Silicon 5G Quad Core IC
AWMF-0108
The AWMF-0108 is a highly integrated silicon quad core IC intended for 5G phased array applications. The device supports four Tx/Rx radiating elements, includes 5 bit phase and 5 bit gain control for analog RF beam steering, and operates in half duplex fashion to enable a single antenna to support both Tx and Rx operation. The device provides 26 dB gain and +9 dBm output power during transmit mode and 28 dB coherent gain, 5.0 dB NF, and -28 dBm IIP3 during receive mode. Additional features include gain compensation over temperature, temperature reporting, Tx power telemetry, and fast beam switching using eight on-chip beam weight storage registers. The device features ESD protection on all pins, operates from a +1.8 V supply, and is packaged in a 48 lead 6x6 mm QFN for easy installation in planar phased array antennas.
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Silicon heavy-doped Tweezer Tester
HS-MRTT
Mini resistivity tweezer tester is used to check heavy-dope silicon. adaptable for little granular material, little broken IC Wafer and other little silicon material. When the resistivity is lower than the set value, it will make alarm.
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X-Band Silicon Radar Quad Core IC
AWS-0105
The AWS-0105 is a highly integrated silicon quad core IC intended for radar and 5G phased array applications. The device supports four radiating elements, single beam transmit, and single beam receive and includes all requisite beam steering controls for 6 bit phase and gain control. The device provides 21 dB gain and +15 dBm output power during transmit mode and 7 dB gain and +7 dBm IIP3 during receive mode. Additional features include gain compensation over temperature, temperature reporting, and fast beam switching using eight on-chip beam weight storage registers. The device features ESD protection on all pins, operates from a +1.8 V supply, and is packaged in a 56 lead 7x7 mm QFN for easy installation in planar phased array antennas.
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Silicon Nails Feature Development And Runtime, GTE 10.00p
K8228B
The Silicon Nails test development tool also allows users to define the vectors that they would like to execute on the non-compliant boundary scan device. The test development tool will generate the boundary scan test to output or input at the relevant interconnecting pin, thus generating the test consistently.
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Silicon Inspection System
NIR-01
The NIR-01 imaging system is made of CNC engineered Aluminium alloy. The suruface protection is powder painting and electrolitic oxidation on pure aluminium surfaces. The frame of the system is a high quality industrial design. All components are designed for long term heavy usage with minimal maintenance needs. Electrical components are also selected for stability and durability. The block like electronics gives the advantage of easy and quick repair.
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Silicon SPDT Switch Reflective, 100 MHz to 44 GHz
ADRF5024
The ADRF5024 is a reflective, single-pole double-throw (SPDT) switch manufactured in the silicon process. This switch operates from 100 MHz to 44 GHz with better than 1.7 dB of insertion loss and 35 dB of isolation. The ADRF5024 has an radio frequency (RF) input power handling capability of 27 dBm for both the through path and hot switching.
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Silicon Pyranometer
LPSILICON-PYRA04
Pyranometer with silicon photodiode for measuring the GLOBAL SOLAR IRRADIANCE, diffuser for cosine correction. Spectral range 400…1100 nm.
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Silicon Steel Sheet Iron Loss Tester
DX-30SST
DX-30SST Silicon Steel Sheet Iron Loss Meter adopts SCM technique and analog electronics technique, the magnetic circuit of permeameter adopts low loss silicon steel iron core, it is a small tester for measuring the characteristics of silicon steel sheet, met the requirements of tracing the brand of silicon steel sheet.
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X-Band Silicon Radar Quad Core IC
AWS-0104
The AWS-0104 is a highly integrated silicon quad core IC intended for radar and 5G phased array applications. The device supports four radiating elements, single beam transmit, and single beam receive and includes all requisite beam steering controls for 6 bit phase and gain control. The device provides 21 dB gain during transmit mode, 21dB gain in receive mode, +15 dBm output power during transmit, and 3.4 dB NF during receive. Additional features include gain compensation over temperature, temperature reporting, and fast beam switching using eight on-chip beam weight storage registers. The device features ESD protection on all pins, operates from a +1.8V supply, and is packaged in a 56 lead 7x7 QFN for easy installation in planar phased array antennas.
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Silicon & Compound Wafers
Compound semiconductors are undergoing a major expansion addressing many new applications and using various materials such as SiC, GaN, GaAs and others, to improve the performance of new devices in several segments such as Power and Face Recognition.
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Fully Automatic 4 Point Probe System for Silicon Wafer
WS-8800
*Measurement of resistivity, thickness, conductivity(P/N) and temperature*Tester self-test function, wide measuring range*Thickness, measurement position and temperature correction function for silicon resistivity*Number of cassette station can be changed by customers request*Host (CIM) communication and SMIF or FOUP compatible
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Silicon Test & Yield Analysis Solutions
Tessent®
The Tessent product suite combines features of deterministic scan testing, embedded pattern compression, built-in self-test, specialized embedded memory test and repair, and boundary scan, as well as board and system-level test technologies. This comprehensive silicon test and yield analysis solution is built on the foundation of the best-in-class solutions for each test discipline
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MINIATURE SILICON DIODE TEMPERATURE SENSOR, 2 To 600 Degress Kelvin
Insight Product Company offers SILICON DIODE TEMPERATURE SENSORS CAN BE USED FOR TEMPERATURE Â MEASUREMENTS IN DIFFERENT FIELDS OF CRYOGENIC ENGINEERING AND EXPERIMENTAL PHYSICS. THEY ARE MINIATURE AND OPERATE IN THE TEMPERATURE RANGE FROM 2 TO 600 K.
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330 System
NSX
With a combination of inspection plus metrology, NSX 330 System measures multiple applications including wafer-level metrology for micro bumps, RDL, kerf, overlay, and through silicon via (TSV) in a single wafer load.
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Preset Torque Screwdrivers
FG
Engineered and assembled in the Silicon Valley, the Mountz FG line of preset precision torque screwdrivers are the most advanced hand tools in the world.
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Precision Integrated Analog Front End, Controller, & PWM for Battery Test & Formation Systems
The AD8452 combines a precision analog front-end controller and switch mode power supply (SMPS), pulse-width modulator (PWM) driver into a single silicon platform for high volume battery testing and formation manufacturing. A precision instrumentation amplifier (in-amp) measures the battery charge/discharge current to better than ±0.1% accuracy, while an equally accurate difference amplifier measures the battery voltage. Internal laser trimmed resistor networks establish the in-amp and difference amplifier gains (66 V/V and 0.4 V/V, respectively), and stabilize the AD8452 performance across the rated operating temperature range.
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High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
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Wide Measurement Range Model Of Semi-automatic 4 Point Probe Sheet Resistance/resistivity Measurement
RT-3000/RG-2000 (RG-3000)
*User programable measurement pattern & programmable measuring pattern*Tester self-test function, wide measuring range*Thickness, edge, temperature correction for silicon wafer*Film thickness conversion function from sheet resistance*2 types measuring tester (S version: Standard type, H version: High range resistivity measurement type)
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4-20mA Input A/D Converters
Analog Devices range of 4-20mA Input A/D Converters deliver accuracy, robustness and flexibility for Industrial Control applications. As the world’s leading supplier of data converters, Analog Devices is constantly introducing new A/D converters (ADCs) that drive system level architectures. Our portfolio of leading industrial 4-20mA Input A/D Converters offer considerable integration including, sense resistor, signal conditioning circuitry and advanced on-chip diagnostics to maximize performance and provide an integrated system level solution, all based upon robust silicon processes.
