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Product
Torpedo Digital Level
DL136
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Advance Plus Trading Co., Ltd.
Model Number: DL136 Key Specifications/Special Features: Torpedo Digital Level with level bubbles,LED technology for the brightest display, IP65 standards 1. 25.4cm 10 inch level with 2 bubbles, 254*28*58.8mm（L*W*H）;2. Resolution: 0.01° at 0° and 90°, 0.05° at the rest°;3. Horizontal level measuring range: 0 to 360°;4. Accuracy: ±0.1° at 0° and 90°: ±0.2° at the rest;5. Measures angle in degrees, IN/FT, % slope or pitch;6. Audible tone at level, plump and setting angle;7. Automatic shut-off after 3 minutes;8. Backlight LCD;9. Self checking accuracy;10. Self calibration;11. Hold-function to freeze the measurement;12. Memory recall (9 measurements);13. With magnets in the bottom;14. With scales at the front bottom alumimum side;15. Operated by DC 3V (2*LR03 AAA 1.5V batteries, not included); 16. IP65 waterproof & dusyproof industrial standard.
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Product
Modular Breakout System 160-Pin Plugin Module
95-190B-003
Modular Breakout System
The 95-190B-003 Plugin Breakout Module is designed to be fitted to a PXI 40-190B Fault Insertion Switch as part of the Pickering MBoS. The Modular Breakout System is designed to Simplify HILS (Hardware In the Loop Simulation) Applications.
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Product
Vibration Testing System
F Series
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Suited to durability tests for all industrial products such as aeronautical, automobile, electronic and precision equipment.
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Product
Modular Breakout System 8-Pin Power D-type Plugin Module
95-191-002
Modular Breakout System
The 95-191-002 Plugin Breakout Module is designed to be fitted to a PXI 40-191 Fault Insertion Switch as part of the Pickering MBoS. The Modular Breakout System is designed to Simplify HILS (Hardware In the Loop Simulation) Applications.
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Product
Vehicle Test Systems
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What counts in development processes is the speed at which new vehicles and new technologies are made ready to go into production. For vehicle testing, this means that complex test problems must be solved. HORIBA develops vehicle test stands that simulate the realities of driving in the most varied situations both precisely and economically.
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Product
Test Systems
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In-Circuit Test (ICT) tests populated circuit boards by means of electronic measurements through thin needles on test fixtures. We offer in-circuit testers for various testing strategies – from the flexible 19“ rack to the ergonomic high-performance tester. And all of our in-circuit testers are also available in the Lambda edition for true parallel testing. The flying probe test checks your printed circuit boards using four movable test heads. This requires no fixtures and allows for flexible test program generation. That makes our flying probe test systems ideal for a high mix of printed circuit boards and small to medium test volumes, such as for prototype testing.
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Product
Electronic Equipment Testing System
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The task set forth the need to create a special universal software core, the main tasks of which are the provision of measurement and control processes, as well as the interaction of software components intended for collection, visualization, mathematical processing and documenting of data. For each stand, specific program modules were additionally developed according to test methods specific products. The overall modular architecture of the system makes it easy to supplement and correct test algorithms.
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Product
Optics Test Systems
Contract Measurements And Services
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Optik Elektronik Gerätetechnik GmbH
Thanks to our very good laboratory equipment, we offer contract measurements for numerous measuring tasks. In the field of optics, measurement and testing technology, these are, for example, the parameters MTF, focal length, radius, contact dimension, focal length, geometric and optical parameters of cylindrical lenses. Others on request.
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Product
Fixture Self-Test Controller and Calibration Check
AQ818
Test Fixture
The module AQ818 includes all the electronic blocks required to perform an effective test platform self-test. Thanks to this module, a chain of tests can be performed, which will end up not only with a report of the defective instruments or switch modules, but also with the relay contacts live expectancy report.
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Product
Phase Noise Test System
N5511A
Phase Noise Analyzer
The Keysight N5511A phase noise test system (PNTS) lets you measure at the limits of physics with readings down to kT (-177 dBm/Hz). The N5511A PNTS is a replacement for the gold-standard Keysight E5500 phase noise measurement system and is designed to meet the needs of phase noise power users.
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Product
Electro-Stimulation Equipment Testing System
STIMU-600
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Test device for functional testing of electrical stimulation devices.
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Product
Application Software for Electronic Test & Instrumentation
test
Application software provides configuration-based workflows for electronic test and instrumentation applications. Application software is part of the NI software portfolio.
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Product
IK Level Tester
IK07-10
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IK ratings are defined as IKXX, where “XX” is a number from 00 to 10 indicating the degrees of protection provided by enclosures (including luminaires) against external mechanical impacts. The different IK ratings relate to the ability of an enclosure to resist impact energy levels measured in joules (J). IEC 62262 specifies how the enclosure must be mounted for testing, the atmospheric conditions required, the quantity and distribution of the test impacts and the impact hammer to be used for each level of IK rating. The IK test applicate on lighting luminaires test according to IEC60598 (GB7000) and IEC60068-2-75 (GB2423.55).
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Product
Non-Contact Level Transmitters
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Three operate at 24 GHz and three more at 80 GHz which complement the existing 6 GHz and 10 GHz devices. They will appeal to a wide range of industries from chemical and petrochemical to mining, minerals and metals processing and cover liquid and solid applications.
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Product
6 MHz Level Test Set ET 92
ET 92
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100 Hz to 6 MHz selective/wideband Level Meter & Generator, with Spectrum Analyser
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Product
Transformer Test System
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Transformer testing instrument, can be used as a stand-alone device and has the highest efficiency. Can be used in power transformers, network communication transformers, etc.
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Product
LTE RRM Test System
T4010S
Test System
The T4020S LTE RRM tester is the Keysight platform for LTE RRM conformance testing of LTE UEs. T4020S belongs to the Keysight LTE product family and, as the other LTE T4000S test platforms, is based on the T2010A LTE Wireless Communications Test Set.
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Product
Nanomechanical Test Systems
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Bruker’s nanomechanical test systems deliver the highest degree of performance, accuracy, reliability, and versatility for quantitative mechanical and tribological characterization at the nanoscale and microscale. Utilizing multiple patented and proprietary technologies, the Hysitron product line of standalone nanomechanical test systems enable quantitative characterization at length scales unreachable by others. Combined with the most comprehensive suite of hybrid characterization techniques, the TI 990 TriboIndenter, TI 980 TriboIndenter, TI Premier Series, and TS 77 Select nanoindenters will keep your materials development at the forefront of technology.
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Product
Integrated I-V Test Systems
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The OAI Integrated I-V Test System is perfect for R&D as well as production, the OAI Integrated I-V Test System delivers extremely accurate solar cell performance measurement. OAI’s advanced fully Integrated I-V Test System is designed to overcome the limitations of flash testing by providing a highly optimized pulse width and voltage sweep rate to match any type of solar cell’s high capacitance and slow dielectric response speed. As a result, the system produces extremely accurate measurements of solar cell I-V parameters and efficiency while leading to the most accurate test results.
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Product
Test System
MFTS500
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Computer Gesteuerte Systeme GmbH
The MFTS500-System is specially designed for the testing of electronic control units (ECUs). It can be configured to be used as a development or as a production tester. Every effort has been made during development and design to ensure that the system is flexible and cost effective.
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Product
Battery and DC System Testing
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HAOMAI Electric Test Equipment Co., Ltd.
Testing for battery and DC power systems.
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Product
Test System
ITC57300
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The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
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Product
Automated Test System
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Automated Test System is a production-ready solution that combines test software and various hardware for validation test in both manufacturing and R&D. The solution provides a high performance and cost-effective system based on National Instruments technology.
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Product
D-Mic Testing System
BK3012V2
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Easy to use and faster than human testers can load, the new BK3012V2 is the upgrade of our popular BK3012 D-Mic tester. Setup is even easier than for the BK3012 and you can enter specifications and be ready for testing in a few minutes. As well as testing, the BK3012V2 can be connected to a computer, so you can keep your results and analyze them for current quality and trends over time.
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Product
Sound Level Meters
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Cirrus Research offers a comprehensive range of Class 1 and Class 2 handheld sound level meters, ideal for all noise measurement applications from basic noise assessments to detailed acoustic analysis. IOur range of noise level meters spans simple instruments that provide the measurement of sound pressure level, integrating-averaging instruments that provide Leq and occupational noise functions, as well as precision data logging noise meters with 1:1 & 1:3 real time octave band filters and in-measurement audio recording. Trusted by professionals, our sound level meters deliver accurate, reliable results for workplace noise monitoring, environmental noise surveys, and industrial noise assessments.
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Product
Electrodynamic Vibration Test Systems
i-series
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Vibration tests have become diversified and specifications have become increasingly strict.i-series offer a user-friendly lineup with enhanced performance and durability.
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Product
Mixed Signal Test Systems
MTS1000i
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The MTS-1000i is lowest cost platform available in the MTS series of ATE. It has a reduced platform size compared to the MTS-2010i & MTS-1020i, reduced power supplies, and 4 slots. It is mainly intended for single site testing. Like the other testers in the MTS family it is a highly cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process
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Product
Test system for Electronic Device
PCB
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The main focus of the test system is validation and functional testing of electronic devices. The tests include electrical parameters and logical functions of the firmware. Device groups can be stimulated externally and output signals can be acquired by the test points on the board. Limits and ranges of the acquired signals can be monitored and stored for verification.
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Product
LED Test Production System
Lumere-LC
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Evolusys Technologies Sdn. Bhd.
Lumere LC is a LED test and measurement system for various parameters of LED light. It is economical, its geometry conforms with CIE-Publication 127, and the test program is easy to configure and adjust. Main application is in the production of LEDs.
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Product
JTAG Functional Test
JFT
Functional Test
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
