Bias Test
-
Product
HV Test System up to 20000 Volt
Test System
Insulated test booth with large space for test items. 2 banana sockets for AC connection and 4 banana sockets for the DC connection of the DUTs. IC’s are tested in a long-term test. These are checked in an oil bath so that there are no air gaps to reduce the insulation. Maximum voltage 20 kV. Therefore, insulation tests must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
-
Product
Spring Clip Fixture
16092A
Test Fixture
Use this test fixture with parallel electrodes for impedance evaluation of both lead and SMD components.
-
Product
Dielectric Test Fixture
16451B
Test Fixture
The 16451B is used to evaluate the dielectric constant of solid dielectric materials accurately, and complies with ASTM D150. The 16451B employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixture.
-
Product
Zero Bias Schottky Detectors
-
KRYTAR Zero Bias Schottky Detectors are specifically designed for use in today's high-performance microwave instrumentation and systems. KRYTAR detectors are designed for such applications as power measurements, analyzing radar performance, leveling pulsed signal sources, AM noise measurements, system monitoring and pulsed RF measurements in ultra-broadband and mm-Wave applications.
-
Product
Test System Replication/Build-to-Print
Test System
Need to manufacture test stations? For more than 15 years we have sourced, assembled, tested and shipped fleets of robust, cost-effective solutions. We produce them at our high-volume facilities and deploy them around the world.
-
Product
Bias Tee's
-
A bias "T" consists of a feed inductor to deliver DC to a connector on the device side and a blocking capacitor to keep DC from passing through to the receiver.
-
Product
6TL60 Rotary Test Handler
H79006010
Test Platform
6TL60 has been designed according to the 6TL philosophy, following the concepts of flexibility, modularity and scalability, and with the aim of improving production efficiency as well as increase production capacity and reduce costs.The 6TL60 is the best production solution to automate test processes to reduce the cycle time and the footprint used in the manufacturing plan
-
Product
DC BIAS CURRENT UNIT
3265B SERIES
-
To evaluate components at currents up to 125 A the 3265B DC Bias Units are used with either the Wayne Kerr 3255B series of Inductance Analyzers or the 3260B Precision Magnetics Analyzer. When one 3265B/25A or 3265BQ/25A DC Bias Unit is connected to an instrument up to 25 A of DC bias current can be set in steps of 25 mA with one unit. Additional DC Bias Units can be added such that with five units connected in parallel it is possible to set DC bias currents up to a maximum of 125 A DC.
-
Product
LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Test Instrument
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
-
Product
Low Input Bias Current Amplifiers (<100 pA)
-
Low input bias current op amps are required whenever the difference of currents or voltage is small and needs to be measured accurately. These op amps are used so that the signal is not loaded down by the input of the op amps. Low input bias current op amps are critical for interfacing sensors in applications from photodiodes, pH meters, or other electrometer related functions to downstream electronics. Analog Devices has many precision op amps that fit the definition and range of these applications.
-
Product
Test Fixture
16047E
Test Fixture
Perform impedance evaluation of lead type devices of up to 120 MHz; includes a guard and a shorting plate
-
Product
DC Bias Current Power Supply
TH1775
-
Shenzhen Chuangxin Instruments Co., Ltd.
TH1775 is a DC Bias Current Source (or DC Magnetization Current Source) used for inductance measurement of inductors and transformer windings with DC bias current. Except for constant current output, low additional error and wide frequency response range are important for bias current inductance measurement. High frequency LCR meter could be used, when the frequency response range is wide enough. MPU controlled auto current balance technology is adopted to realize AC+DC current overlap and constant current output from 0 to ±20A. Two TH1775 can be paralleled to supply a maximum current up to 40A.TH1775 permits high frequency measurement up to 1 MHz and can be directly controlled by TH2816A, TH2817A, TH2818 and TH2819. TH1773/TH1775 with its low additional error, wide frequency response range and sweep output function is widely used in DC biased inductance measurement. TH1775 also provides a perfect solution for magnetic material analysis.
-
Product
120 GHz Frequency Extender, Pulsed DC Bias
N5295AX02
Frequency Extender
The N5295AX02 is a compact and broadband frequency extender with built-in pulsed bias-tee and provides 10 MHz to 120 GHz single-sweep measurements with N5292A test set controller systemized with a PNA/PNA-X B vector network analyzer.
-
Product
110 GHz Frequency Extender, Pulsed DC Bias
N5293AX02
Frequency Extender
The N5293AX02 is a compact and broadband frequency extender with built-in pulsed bias-tee and provides 10 MHz to 110 GHz single-sweep measurements with N5292A test set controller systemized with a PNA/PNA-X B vector network analyzer.
-
Product
6TL29 Semi-Automated Test Platform
AQ377
Test Platform
- Compact, transportable and modular test platform.- Ready for ICT, FCT, Boundary Scan, HiPot, Vision or any combination of the previous technologies.- Mass interconnect 9025 Receiver from Virginia Panel.- 100% Compatibility with Inline Test Fixtures (P/N: AT799, AN133 and EB773).- Free available rack space: 47U height- Multi-stage pressure at 3 levels.- FastATE Technology & YAV Modules compatible.- Phi6 Dispatcher Interface.- CE Compliant.
-
Product
Functional Testing and Test Engineering
-
Customer-supplied or developed in-house• Ruggedization of existing (lab-built) fixtures• Co-develop hardware/software• Deployment, implementation, and training• Engineering evaluation tools• Design verification• Medical device evaluation• Manufacturing test systems• Verification test systems• Go/No-go tests• Serialization, recordkeeping, and datalogging• Troubleshooting failed units with other test platforms
-
Product
CPE Design Verification System
Jupiter 310
Test System
Jupiter is the industry standard for automated DOCSIS physical (PHY) layer testing. It provides the most comprehensive test coverage and accurate results on the market for DOCSIS 3.1 devices.
-
Product
NI Semiconductor Test Systems
Test System
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
-
Product
Testing
-
Underwriters Laboratories Inc.
Our independent, rigorous testing process helps ensure that your products align with applicable requirements and expectations. We deliver innovative, customized options that aim to streamline testing processes, reduce costs and help speed products to market around the world. And our global team’s knowledge helps you stay ahead of the curve on evolving requirements, materials and technologies.
-
Product
Compression/Tensile Testing
-
For testing of strength in tension, compression, bending, shearing, rapture and etc.It can be used for various raw materials, semi-finished and finished products which are essential to manufacturers performing quality control & academic organizations for studying the physical properties of raw materials
-
Product
Test & Measurement
-
NIF (Dutch Instrument Factory, later Nieaf-Smitt) started in 1900 as one of the first organizations in the world with the design and production of instruments for electrical values. The portfolio of test tools, digital multimeters, current clamps, device testers, installation testers and power analyzers is characterized by quality and reliability.
-
-
Product
Product Testing
-
Verification of advertising promotional material in relation to operating, electrical, mechanical, or pneumatic performance; ease of assembly, type of material furnished, general capabilities, and overall safety. Detailed internal and external inspections conducted. Extensive facilities for furniture testing.
-
Product
ATE Test Systems
-
Introducing the Procyon ATE System! When it comes to ATE Test Systems for a for low- to high-volume production, Intepro has the testing power you require to be successful. For more than three decades, Intepro Systems has designed, built and integrated power supply test equipment for the world’s largest and smallest power supply manufacturers.
-
-
Product
Cloud Testing
-
Cloud-based platforms are increasing enterprises’ ability to reduce time-to-market drastically along with eliminating upfront costs. This has led to increased interest in the adoption of cloud-based solutions. However, it brings unique challenges related to data security, privacy, integration, and application performance. These require comprehensive cloud-based testing to ensure your cloud implementations are successful and you realize complete benefits from the cloud solution.
-
Product
Localization Testing
-
Localization testing is a method that ensures that an application can be used in a specific area or region. It involves testing the application to verify the accuracy, behavior, and suitability in a specific geographical area.
-
Product
Test Connectors
-
A wide range of standard test Connectors that can fit many of your applications and services. We offer a ideal solution for your testing needs in automatic or manual mode.
-
Product
Automatic Bias Controller
MATRIQ-IQABC
Controller
Optimizing DC bias points of an IQ modulator is no trivial task. There are six different Mach-Zehnder structures inside one dual polarization IQ modulator, all simultaneously influencing the properties of a single optical signal. Trying to optimize bias points using just the intensity measurement of the optical signal is time consuming, inaccurate and it requires a lot of knowledge and experience.
-
Product
Semiconductor Test
Ismeca NY32
-
32-position turret platform for semiconductor test, inspection and packaging, providing the highest process integration capabilities. Integrating innovative hardware and software technology such as Intelligent Features that enables extended autonomous operation and productivity.
