Bias Test
-
Product
EV Power Components End of Line Test Platform
-
Test and Validate all EV Power Electronics with One Flexible and Scalable Solution
-
Product
Zero Bias Schottky Detectors
-
Fairview Microwave’s line of coaxial packaged zero bias Schottky detectors feature matched inputs for excellent VSWR, voltage sensitivity levels that range from 100 to 500 mV/mW for small signal detection, negative video output polarity, and can withstand maximum input power levels up to +20 dBm CW. Operating temperature range covers 0°C to +90°C and storage temperature of -65°C to +125°C. These zero bias Schottky detectors utilize compact cylindrical package outlines that are made of passivated stainless steel and offer a variety of popular input/output SMA and BNC connector configurations that make them ideal for use with precision test and measurement, instrumentation, and subsystems assemblies. Numerous applications include power measurement, leveling pulsed signal sources, AM noise measurements, radar or missile guidance systems, monitoring system level performance, and pulsed RF measurements.
-
Product
Sealed Beam Bulb Testing System
H710019SSL
-
EOL test for manufacturing of bulbs with LED for applications requiring to ensure watertightness: vehicles, marine, swimming pools, operating rooms, classified areas (Ex Zone), etc. The test system checks in a short time all the light and electrical characteristics of the bulb. A high precision Micro Leakage Meter also checks that there are no leaks between the environment and the inside of the bulb. The test results are recorded on the PC and can be printed on a quality control label attached to each unit.
-
-
Product
Tunnel Diode Zero Bias Detectors
-
A tunnel diode zero-bias detector is a device that converts microwave and millimeter-wave radio frequency (RF) signals into a DC voltage without requiring an external power source
-
Product
Flex Socket Test Module
JT 2127/Flex Socket Test Module
-
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
-
Product
Low Input Bias Current Amplifiers (<100 pA)
-
Low input bias current op amps are required whenever the difference of currents or voltage is small and needs to be measured accurately. These op amps are used so that the signal is not loaded down by the input of the op amps. Low input bias current op amps are critical for interfacing sensors in applications from photodiodes, pH meters, or other electrometer related functions to downstream electronics. Analog Devices has many precision op amps that fit the definition and range of these applications.
-
Product
CPE Design Verification System
Jupiter 310
-
Jupiter is the industry standard for automated DOCSIS physical (PHY) layer testing. It provides the most comprehensive test coverage and accurate results on the market for DOCSIS 3.1 devices.
-
Product
Advanced SoC/Analog Test System
3650-EX
-
Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
-
Product
EBIRST 50-pin D-type To 25-pin D-type Adapter
93-005-414
-
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
-
Product
High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
-
Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
-
Product
Bias Tee's
-
A bias "T" consists of a feed inductor to deliver DC to a connector on the device side and a blocking capacitor to keep DC from passing through to the receiver.
-
Product
Scienlab Battery Test System – Module Level
SL1001A Series
-
The SL1001A and SL1006A Battery Test Systems – Module Level Series help you emulate sink and source for battery modules for automotive and industrial applications.
-
Product
Wireless Device Test
-
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
-
Product
OLED Lifetime Test System
58131
-
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
-
Product
Test Sets For Diagnostic Testing
-
Test Sets For Diagnostic Testing are designed to test Oil Resistivity, Tan Delta, High Voltage Surge Comparison, etc. These test sets are automated instruments used to measure electrical features to insulate transformer oil, liquids and varied other insulating materials. They are ideal for revealing different localized problems and varied weak spots in the insulation. These modern testing sets are designed to provide high accuracy in results. In addition to this, they are easy to maintain testing sets available to ensure accurate readings.
-
Product
Microwave Testing
1100B
-
The Model 1100B Picoprobe sets new standards in microwave probing performance. Benefiting from coaxial techniques, which have inherent low loss and low dispersion characteristics.
-
Product
Test Samples
-
Performance testing of metal detection equipment is a crucial part of a food safety and quality management system. Confirming the correct performance of your detector at regular intervals ensures your system is compliant with programs like FSMA, SQF, GFS, BRC and other relevant auditing schemes.
-
Product
Acoustic Testing
-
Our acoustic testing experience includes acoustic qualification and evaluating sound pressure levels. We utilize microphones, pressure trans-ducers, and an acoustic intensity meter to record acoustic measurements.
-
Product
Test Solution
Novus, Novus-M, & Novus-R 100/25GE Load Modules
-
Keysight Network Applications and Security
Novus, Novus-M, and Novus-R are Ixia’s next-generation architecture and test solutions that satisfy the test needs of both high-density, multi-rate switch/router makers and the organizations implementing the network equipment. Supporting eight native QSFP28 100GE ports and up to 32-ports for 25GE per load module, Novus load modules enable interoperability and functional testing, as well as high-port count performance testing.
-
Product
Loop Testing
-
Megger loop testers offer both traditional measuring techniques and state of the art “non-RCD Tripping” technology. Use these products to determine the prospective earth fault current, which is the maximum current able to flow in a phase-earth fault in an installation, and also to indicate the prospective short circuit current which is the maximum current able to flow in the event of a phase-neutral fault.
-
Product
Environmental Testing
-
D.L.S. Electronic Systems, Inc
D.L.S. Conformity Assessment provides testing services for environmental tests under its accredited ANAB/ACLASS ISO 17025 program. This globally accepted accreditation covers environmental and mechanical testing that include vibration and shock, temperature extremes , sand and dust, fluid and chemical resistance, altitude, humidity, salt spray, ingress protection, icing, flammability and other related testing services.
-
Product
Test System
ETS788XL
-
The 50/100 MHz ETS788XL system is the compact protable version of our ETS788. Made with the new high-performance precision components of our Griffin series, this portable powerhouse offers an optional tough road case and ready to go to any test site needed. Just pop off the covers and get started. Whether it's research, Failure Analysis, or single-event effects testing, his powerful member of the HiLevel family takes advantage of all of the tried and true features that have served users so successfully to date.
-
Product
Material Testing
-
Materials testing, measurement of the characteristics and behavior of such substances as metals, ceramics, or plastics under various conditions. The data thus obtained can be used in specifying the suitability of materials for various applications, building or aircraft construction, machinery, packaging etc.
-
Product
Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1P-7
-
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
-
Product
Nondestructive Testing
-
BMP Testing and Calibration Services Inc.
Achievement is a construct, or rather a phenomenon, which everyone wishes to be a part of. Everyone seeks success to be the best, well-known, and well settled in life. This is why we want to excel in our lives by choosing a promising career for our future.
-
Product
Bias Tees From 0.03 MHz To 85 GHz
-
Pulsar offers a large variety of bias tees that cover frequencies from DC to in both surface mount and connectorized packages. Many models are available with voltages up to 100 volts and currents up to 8 amps and custom requirements are welcomed. Options include higher voltage and current, higher RF input power and a choice of either an RF connector or a feedthrough connection for the DC input port.
-
Product
Functional Testing
-
To verify the functionalities of your software, to check for the quality of your product, and to see that the applicationis working against business requirements, opt for Functional Testing.
-
Product
DC Bias Current Power Supply
TH1775
-
Shenzhen Chuangxin Instruments Co., Ltd.
TH1775 is a DC Bias Current Source (or DC Magnetization Current Source) used for inductance measurement of inductors and transformer windings with DC bias current. Except for constant current output, low additional error and wide frequency response range are important for bias current inductance measurement. High frequency LCR meter could be used, when the frequency response range is wide enough. MPU controlled auto current balance technology is adopted to realize AC+DC current overlap and constant current output from 0 to ±20A. Two TH1775 can be paralleled to supply a maximum current up to 40A.TH1775 permits high frequency measurement up to 1 MHz and can be directly controlled by TH2816A, TH2817A, TH2818 and TH2819. TH1773/TH1775 with its low additional error, wide frequency response range and sweep output function is widely used in DC biased inductance measurement. TH1775 also provides a perfect solution for magnetic material analysis.
-
Product
Test System
LB301
-
Computer Gesteuerte Systeme GmbH
The system is pin and software compatible to the larger test systems LB302 / 303. Due to the fewer needed I/Os, the tester features the compact G6 receiver (Virginia Panel Cooperation) compared to the larger G12 of the other tester versions. The LB301 is equipped with a 2kW power supply and can control one load box.
