Product

High-Dynamic-Range Polarimeters

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Thorlabs, Inc.

Thorlabs, Inc.

*Three Wavelength Ranges Available**400 nm - 700 nm**600 nm - 1080 nm**900 nm - 1700 nm*Rotating-Wave-Plate-Based Measurement*High Dynamic Range of 70 dB*Excellent Azimuth and Ellipticity Accuracy of ±0.25°*Sampling Rate up to 400 Samples/s*Beam Terminates Inside the Module*Ø3.0 mm Free-Space Beam Input or FC/PC Fiber Input *Fully Featured Software Includes Alignment Tool and Extinction Ratio Measurement Tool

Product

Input Adapter with 2 mm plug

PK007-022

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Teledyne LeCroy

PK007-022 - Teledyne LeCroy

Input Adapter with 2 mm plug.

Product

SlipFinder

YIS and SF Series

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RMS Vision Systems Inc

YIS and SF Series - RMS Vision Systems Inc

The YIS and SF Series metrology systems are designed for optical detection of wafer defects such as crystaldislocations, slip and other defects. The YIS-300HM (for 300 mm wafers) and YIS-200HM (for 200 mm wafers) utilizeMakyoh optics technology (Magic Mirror) and integrated robotic wafer handler provided by Hologenix.The SF300M and SF300N systems offer a low cost functionally equivalent alternative to the YIS series.

Product

ESD Discharge Simulator

Model 9910 PurePulse/PinScan

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Electro-Tech Systems, Inc.

Model 9910 PurePulse/PinScan - Electro-Tech Systems, Inc.

Model 9910 PurePulse / PinScan is used to determine the ESD susceptibility level of electronic devices up to ±4kV. PurePulse generates ESD pulses up to 4kV for testing electronic devices for susceptibility to Electrostatic Discharge (ESD) using HBM, MM and HMM models. PinScan provides automatic sequencing of ESD testing of up to 128 pin devices, applying a discharge, thenperforming a curve-trace test to identify a failure.

Product

Portable ORP Meter

YK-23RP

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MRC ltd.

YK-23RP - MRC ltd.

ORP meterElectrode included,Electrode dimensions: Dia 12.5mm height, 120mmBNC connectorMeasuring range -1.999mV to +1.999mVResolution: 1mVResistance: 10MohmDC 9 volts, 1mASize: (H*W*D)mm, (205*68*30)mm

Product

Rebound Hammer

Type N for concrete

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PASI srl

Type N for concrete - PASI srl

Rebound Hammer Type N :*Use for concrete> 10cm and hard rocks*Measuring range: 10-60N / mm 2 *Impact energy: 2.207Nm

Product

Near Field Microprobe E-field 7 MHz to 3 GHz

ICR E150

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Langer EMV-Technik GmbH

ICR E150 - Langer EMV-Technik GmbH

The near field microprobe is used to measure electric fields at extremely high resolution and sensitivity. The optimal distance to the object being measured is < 1 mm. Due to its small probe head dimension, the probe has to be moved by a manual or automatic positioning system, e.g. Langer-Scanner.

Product

Coaxial Waveguide Adapter, 1.85 mm (m), 50 to 67 GHz

V281B

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Keysight Technologies

V281B - Keysight Technologies

The Keysight V281B adapter transforms waveguide transmission line into 50-ohm coaxial line. Power can transmitted in either direction, and each adapter covers the full frequency range of its waveguide band with SWR less than 1.3.

Product

Optical Light Sources

FLS200 Series

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Shanghai Tarluz Telecom Tech Co., LTD

FLS200 Series - Shanghai Tarluz Telecom Tech Co., LTD

FLS200 Optical Light source could provide maximum 4 wavelengths in one unit, customer could select arbitrary four output wavelengths from 650nm, 850nm, 1300nm, 1310nm, 1490nm, 1550nm. The unit support Single mode and Multimode (50/125um or 62.5/125um MM fiber) optical cable in one unit. It could support FC, SC, ST, LC and 2.5mm universal optical connector.

Product

I/O Board With Two COM, Four USB 3.0, One Gigabit LAN, And HDMI For PICO880, PICO500, PICO300

AX93276

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Axiomtek Co., Ltd.

AX93276 - Axiomtek Co., Ltd.

*Specifications: 1 x RS-232/422/485, 1 x RS-232, 4 x USB 3.0, 1 x HDMI, 1 x Gigabit LAN, 1 x Power On, 1 x Reset, 2 x LED*Dimensions: 118 x 40 mm*Compliant products: PICO880, PICO500, PICO300

Product

Laser Scattering Particle Size Distribution Analyzer

Partica mini LA-350

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HORIBA, Ltd.

Partica mini LA-350 - HORIBA, Ltd.

HORIBA's new LA-350 Laser Diffraction Particle Size Distribution Analyzer is the ideal combination of performance, price, and packaging. The LA-350 excels in applications as diverse as slurries, minerals, and paper chemistry. Based on the advanced optical design of previous LA-series analyzers, the LA-350 strikes a harmonious balance between high-functionality, easy operation, low maintenance, and cost-effectiveness.Bench space is used efficiently due to the LA-350’s compact size (297 mm x 420 mm). The clever design and precision, high quality manufacturing ensure convenient, reliable operation and accurate results, now with a wider size range (0.1-1,000 µm).

Product

Portable Thermal Conductivity Meter

TLS-100

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Thermtest Instruments

TLS-100 - Thermtest Instruments

The TLS-100 is a portable thermal conductivity meter used to measure thermal conductivity and thermal resistivity at the push of a button. Each TLS-100 comes equipped with a 100 mm sensor for testing soil, polymers,  and other soft materials. An optional 50 mm sensor was designed for testing harder materials, like rock and concrete. The collected data is automatically analyzed, and results are displayed instantly.

Product

Super 3.90 (111.00) - 16.00 (454.00) High Performance Lead Free Probe

LFRE-25I15-16

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ECT

LFRE-25I15-16 - ECT

Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02

Product

MIC-780 Series I-Module With 1 X PCIex16

MIC-78M10

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Advantech Co. Ltd.

MIC-78M10 - Advantech Co. Ltd.

1 x PCIEx16Diemension with MIC-780 : 113 x 195 x 255 (mm)

Product

Vision Metrology System

NGS 3500Z

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RMS Vision Systems Inc

NGS 3500Z - RMS Vision Systems Inc

This bench top lower cost, yet high performance system is designed for applications where defect detection and precisionmeasurements on wafers and other parts (up to 200 mm) are required. It is well suited for use as a dedicated productiontool or as a versatile process development system. It features a powerful set of automated as well as semi-automaticoptical/ video tools optimized for high accuracy, production throughput, and ease of use.This automated and versatile platform features a standard Nikon/ Olympus bright/ dark field microscope with optionalNomarski, and precise part staging. This system offers significant and unique advantages for dual production/ engineeringuse, and provides the perfect solution when both defect detection and dimensional metrology are required.