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Accessories: Test Hardware
Copernicus Technology supply test hardware accessories to support Intermittent Fault Detection testing using VIFD™ and IFDIS™ test equipment, such as Interface Test Adapters (ITA). We also supply and repair general purpose and customer-spec test hardware accessories: ITAs, Break-Out Boxes (shown below) and Mobile Vibration Systems. The Mobile Vibration System can be quickly set up in repair bays for applying environmental stimulus to components and wiring harnesses during testing.
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200 MS/s Waveform Generator & Dual 50 MHz Pulse/ Timing Generator
3172
The Racal Instruments™ 3172, a 200 MS/s Waveform Generator and Dual 50 MHz Pulse and Timing Generator, combines multi-instrument density and highfrequency performance in a single-slot, C-sized VXIbus format.Waveform output in the range of 100 μHz to 30 MHz with 16-bit vertical resolution (12-bit vertical for 3171 emulation) and pulse output to 50 MHz make the 3172 a powerful solution to a variety of test stimulus requirements.
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Thermal Sensitivity Tester
NTE-2A
The NTE-2A Thermal Probe is a sophisticated, non-invasive device for the clinical evaluation of neuropathy and the assessment of short fiber neurological function. Individual thresholds are compared to normals to statistical normals. These results provide an accurate means of tracking chronic changes in small fiber nerve function. It can be used for pain studies and in any application were a variable, accurately-controlled temperature stimulus is required. The NTE-2A is often used in conjunction with the Vibratron II to assess peripheral neuropathies.
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Benchtop Wiring Analyzer
2115
The Model 2115's compact size makes it the ideal choice for many benchtop or portable test applications. The small size does not mean you sacrifice any functionality. The 2115 delivers a full 1500 volt isolation and 2 amp continuity test stimulus. With the optional AC breakdown test providing 1000 VAC test stimulus, you will meet all test requirements.
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Battery Analyzers
BA6010 Series
The BA6010 Series battery analyzers measure voltage and resistance of modern battery technologies with high accuracy, resolution, and speed. Additionally, these instruments provide auxiliary measurement parameters inductance, capacitance, dissipation factor, impedance, quality factor, reactance, and phase angle in degrees and radians. The BA6010 Series is suitable for characterizing battery chemistries that are responsive to a 1 kHz AC stimulus signal including lead acid, lithium and alkaline type batteries used in consumer products, electric vehicles, power backup, security, and fire alarm systems.
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PMC Bus Analyzer / Exerciser
PMC650
The PMC650 analyzer provides a multitude of functions to help you analyze your system.- Capturing bus activity using sequential triggers and filters- Exerciser to perform memory, I\O and configuration cycles- Stimulus generation for hardware simulation and fault generation- Anomaly detection of protocol and timing violations- Performance analysis of utilization, transfer rates, latency, statistics
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Arbitrary / Function Generators
Today's designs are often complex, demanding a variety of stimulus signals during test. With standard waveforms, arbitrary waveform capability and signal impairment options, a Tektronix Function Generator supports a wide range of application needs with one instrument. Best-in-class Function Generator performance from Tektronix AFGs ensures signals are accurately reproduced.
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OLED Lifetime Test System
58131
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Protocol Analyzer and Exerciser
Keysight's protocol test solutions for each technology typically consists of both protocol analyzer application as well as a stimulus solution, such as an exerciser or traffic generator. Keysight's protocol test solutions combine multi-protocol analysis, traffic generation, performance and conformance verification to debug, validate and optimize your designs using high speed protocol standards.
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CXA Signal Analyzer, Multi-touch, 9 kHz to 26.5 GHz
N9000B
Master the essentials in signal characterization with the leading low-cost tool in signal analysis Perform cost-effective stimulus response measurements with the optional built-in tracking generator Add crucial functionality with X-Series measurement applications Enhance theory with practical skills when used with a training kit in your RF & microwave education lab
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CompactPCI & CompactPCI-X Bus Analyzer / Exerciser
CPCI850
The CPCI850 analyzer provides a multitude of functions to help analyze your system.- Capturing bus activity using sequential triggers and filters- Exerciser to perform memory, I\O and configuration cycles- Stimulus generation for hardware simulation- Target memory with addressable windows- Anomaly detection of protocol and timing violations- Performance analysis of utilization, transfer rates, latency, statistics- Compliance testing
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Engineering/Development System
ULTRA L
The ULTRA L is a high performance “Lab” system that provides thermal conditioning, mechanical stimulus and an electrical ATE signal path for testing Micro-Electro-Mechanical Systems (MEMS) Accelerometers and Gyroscopes.
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Characterization Platform
This standalone integral software and hardware platform is capable of functioning as an independent single-channel or virtual multi-channel characterization test subsystem. The platform is USB controlled to provide temperature, RF-signal and bias-control to a device-under-test (DUT) for semiconductor performance measurement. When used in conjunction with Accel-RF's embedded Pulser-Card Assembly, the test device is capable of pulsed DC and RF stimulus.
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True-Mode Stimulus
S95460B
S95460B provides mismatch-corrected true-mode stimulus and enables accurate balanced measurements on M980xA PXI vector network analyzers.
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Modulation Distortion For E5081A Up To 44 GHz
S960707B
The S960707B modulation distortion software application provides nonlinear DUT behavior tests (EVM, NPR, and ACPR) under modulated stimulus conditions.
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Measurement and Analytics Solutions
Based on our OTP² system platform, we were able to implement a family of scalable test systems which is based on a common systems architecture, e. g. for products in the area of chemical analytics measurement. We not only implemented a universal, extremely comprehensive test system, but also a series of compact systems for benchtop placement which are fully compatible with the larger, universal system. Our specialized self-test adapters and test software enable fast verification of the test systems as well as partly automated calibration by the customer.Our systems are also used in electrical measurement applications, e. g. for calibrating analog input assemblies for PLC technology. For this purpose, specialized calibrators are integrated into the system; they provide traceable calibration of the relevant stimulus signals.
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Chroma LCR Meters
Chroma Systems Solutions, Inc.
Some of the key features to look for in an LCR meter (also known as an impedance meter) are: accuracy, test frequency, measured parameters, test voltage and test current. Additionally, an easy to understand display of test results and the ability to access and use these results has become increasingly important. Component testing often requires much more than simply a resistance, capacitance or inductance value at a given test frequency and stimulus voltage. An LCR meter or impedance meter must have the flexibility to provide multi-parameters over wide frequency and voltage ranges.
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MEMS Handler
4664-IH
The ULTRA P is a high performance production handler that provides thermal conditioning, full 6 DOF mechanical stimulus and an electrical ATE signal path for testing Micro-Electro-Mechanical Systems (MEMS) Accelerometers and Gyroscopes.
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VXI 12-Channel, 3-Wire LVDT/RVDT Simulation
65DL2
NAI’s 65DL2 is a 12-channel, 3-wire, LVDT/RVDT Simulation Instrument on a VXI board. This single-slot, message-based board features up to 12 stimulus channels of 3-wire LVDT/RVDT, wraparound self-test, and onboard programmable excitation supply. The board is uniquely versatile, as each excitation input and output voltage is programmable. In addition, each channel can be programmed to be controlled by an external DC voltage. A replacement for the 5410C-83, the 65DL2 is ideally suited for defense, commercial aerospace, and industrial applications.
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True-Mode Stimulus
S93460B
The S93460B provides mismatch-corrected true-mode stimulus and enables accurate balanced measurements on 4-port PNA or PNA-X network analyzers.
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ARINC HSI / ADI Test Fixture
TA-2000
The TA-2000 test fixture is a combination panel that incorporates all the standard capabilities of the legacy CTS-11(ADI) and CTS-12(HSI) panels and much more. This panel is married to our model TA-1001 dual synchro transmitter/API panel thus allowing for local stimulus and alignment of the instruments synchros and resolvers. The panel provides for testing of both superflag(28v) and low level meters through a matrix of switching that will allow testing of all meters simultaneously or just individually. The low level meter drive circuit also incorporates an automatic mode that will continuously oscillate the L/R and Up/Dn pointers.
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HV AC Hipot
The HV AC Hipot package is a hardware and software upgrade available for select Eclypse Analyzers. This package adds a High Voltage AC stimulus source CCA to the analyzer chassis and the HV AC Stimulus utility provides the software drives for ELITE to integrate AC Hipot into test programs.
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Digital Stimulus Response PXI Card
GX5152 Series
The GX5152 Series are high speed, 6U PXI, digital I/O instruments. The GX5152 master controller has 32 I/O channels that supports test rates up to 50 MHz and vector depths up to 128 Mb per pin. The GX5153 slave offers the same timing characteristics and multiple I/O level configurations when used in conjunction with the GX5152. The GX5152 can control up to 15 GX5153 boards using the same timing and sequencer.
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Signal Generator
Tektronix signal generators cover a wide range of applications, from replicating sensor signals to creating RF and the fastest high speed serial data signals. Each versatile signal generator can create a virtually unlimited number of signals - analog or digital, ideal or distorted, standard or custom. From the world's only direct synthesis of high-speed serial data waveforms for simplified receiver testing, to the world's most versatile arbitrary function generator for common stimulus signals, Tektronix has a signal generator to meet your debug challenge.
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Stimulus Test Cell
HA7300
The Stimulus Test Cell HA7300 is a test cell which provides an environment for high-speed, highly accurate temperature and pressure test of differential pressure sensors, utilizing Advantest’s unique temperature control unit with simultaneous temperature control for 8 devices, as well as a newly developed 2Port pressure controller and pressure application nozzle.
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PXI 8/16-Channel Isolated D/A Converter
M9185A
The M9185A is a fully independent, isolated D/A converter that is capable of supplying high voltage levels in parallel of up to eight or sixteen channels. Each channel is able to output up to 16V as stimulus signals to Device Under Tests (DUTs).
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Bus Analyzer / Exerciser
PCF850
The PCF850 analyzer provides a multitude of functions to help you analyze your system.- Capturing bus activity using sequential triggers and filters- Exerciser to perform memory, I\O and configuration cycles- Stimulus generation for hardware simulation- Target memory with addressable windows- Anomaly detection of protocol and timing violations- Performance analysis of utilization, transfer rates, latency, statistics- Compliance testing
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Manufacturing Defects Analyzer
406A
The 406A is designed to target the highest number of assembly failures for the least amount of capital equipment cost, programming time, and maintenance costs. The precision Stimulus Measurement Unit provides AC/DC analog measurements that are accurate, stable, repeatable, and reliable.
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Stimulus Induced Fault Testing
SIFT
SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.
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Bus Analyzer / Exerciser
PCF650
The PCF650 analyzer provides a multitude of functions to help you analyze your system.- Capturing bus activity using sequential triggers and filters- Exerciser to perform memory, I\O and configuration cycles- Stimulus generation for hardware simulation and fault generation- Anomaly detection of protocol and timing violations- Performance analysis of utilization, transfer rates, latency, statistics
