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Stimulus
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RF Sources
Textron Systems’ commercial RF Sources (RFS 340, SSI) provide an unmatched combination of frequency coverage, power range, signal fidelity and switching speed in either a two-slot VXI, 1U LXI®, or VME Synthetic Stimulus Instruments (SSI) format.
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Signal Generator
Tektronix signal generators cover a wide range of applications, from replicating sensor signals to creating RF and the fastest high speed serial data signals. Each versatile signal generator can create a virtually unlimited number of signals - analog or digital, ideal or distorted, standard or custom. From the world's only direct synthesis of high-speed serial data waveforms for simplified receiver testing, to the world's most versatile arbitrary function generator for common stimulus signals, Tektronix has a signal generator to meet your debug challenge.
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200 MS/s Waveform Generator & Dual 50 MHz Pulse/ Timing Generator
3172
The Racal Instruments™ 3172, a 200 MS/s Waveform Generator and Dual 50 MHz Pulse and Timing Generator, combines multi-instrument density and highfrequency performance in a single-slot, C-sized VXIbus format.Waveform output in the range of 100 μHz to 30 MHz with 16-bit vertical resolution (12-bit vertical for 3171 emulation) and pulse output to 50 MHz make the 3172 a powerful solution to a variety of test stimulus requirements.
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Synchro To Digital & Digital To Synchro Converter
DP-cPCI-5031
DP-cPCI-5031 is a Resolver to Digital and Digital to Resolver converter module. This module has four S/R to Digital converters(measurement channels) and two Digital to S/R converter(stimulus channels). This module is programmable for simultaneous acquisition and generation of the Resolver signal.
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Stimulus Test Cell
HA7300
The Stimulus Test Cell HA7300 is a test cell which provides an environment for high-speed, highly accurate temperature and pressure test of differential pressure sensors, utilizing Advantest’s unique temperature control unit with simultaneous temperature control for 8 devices, as well as a newly developed 2Port pressure controller and pressure application nozzle.
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Stimulus Test Cell
HA7200
The HA7200 enables these improvements by providing high-speed, high-accuracy temperature and pressure test for automotive sensor R&D and production. Advantest’s proprietary temperature control technology delivers an optimized test solution for high-spec pressure sensors across a broad range of temperatures, in the automotive industry and beyond.
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Fault Diagnostics in Power-Off State
QT55
Qmax Test Technologies Pvt. Ltd.
Signature Method of Testing is also known as VI Trace Characteristics, is a proven fault diagnostics technique in Power-Off state while testing a board. By applying known wave from signal with desired Voltage, Source impedance and Frequency of the stimulus signals, depending upon the test node and its characteristics, a Voltage (V) vs Current (I) graph is plotted and studied.
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JTAG Boundary-Scan I/O Modules
SCANIO Family
The Corelis family of SCANIO™ modules turn any IEEE standard 1149.1 boundary-scan controller into a powerful digital boundary-scan tester. The SCANIO family of products use boundary-scan gate arrays to add control and visibility to connectors, traces, and logic that can not be tested using traditional boundary-scan techniques.The SCANIO products, when combined with a boundary-scan controller, operate as a traditional “bed-of-nails” tester except access to the stimulus and response I/O’s is achieved via boundary-scan.
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Arbitrary / Function Generators
Today's designs are often complex, demanding a variety of stimulus signals during test. With standard waveforms, arbitrary waveform capability and signal impairment options, a Tektronix Function Generator supports a wide range of application needs with one instrument. Best-in-class Function Generator performance from Tektronix AFGs ensures signals are accurately reproduced.
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Portable Functional Near-Infrared Spectroscopy System For Research
LIGHTNIRS
Shimadzu Portable functional Near-Infrared Spectroscopy (fNIRS) System for Research* Near infrared light, which readily diffuses easily through biological tissue, can be used to measure localized blood oxygenation levels of the brain to monitor where activity occurs in response to a task of stimulus. The portability of LIGHTNIRS allows visualizing brain function activity in real time in a more natural state than other methods. Consequently, it is being used in a wide range of applications including medical research, developmental psychology, education, cognitive science and engineering.
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Modular Power
RFP AC Power
AMETEK Programmable Power, Inc.
ReFlex Power™ is a high density, modular programmable power system providing DC, AC and electronic load assets all under control of a single controller. It provides a reconfigurable, flexible platform ideal for ATE and production test environments where RFP™ can provide programmable stimulus and bias power as well as programmable loads for the device(s) under test. The EIA 4U high RFP™ mainframe can hold up to 12 single-slot modules or combinations of single, dual and triple slot wide modules to configure (or reconfigure) the system for the particular requirements at hand. The mainframe can support up to 6 kW of output power.
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Carbon Monoxide Detector Tester
Solo C3
Many multi-sensor fire detectors detect carbon monoxide (CO) as well as smoke and / or heat. Under international codes and standards the CO cell needs to be functionally tested with a CO stimulus from the protected area through the detector vents to the sensor.
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Pulse Generators
Keysight Technologies offers the most comprehensive portfolio of stimulus solutions for the generation of digital and analog waveforms and data signals. The Keysight instruments cover a frequency range from 1 μHz to 56 Gb/s and an output amplitude range from 50 mV to 20V.
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Wide FOV Target Projector
The Model 13792 is a broadband portable target projector used for characterizing the performance of a wide variety of infrared sensor systems. The system incorporates SBIR standard components to provide accurate and precise stimulus to sensors under test in laboratory, depot and production line environments. Testing can be automated with the use of IRWindows™ test system controller that reduces test times and cost, while improving the consistency and accuracy of test results.
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Modulation Distortion Up To 53 GHz
S95070B
S95070B software enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 53 GHz. The wide dynamic range and vector error correction of the PXI VNA results in an extremely low residual EVM from the test setup, giving you a complete picture of your device’s performance without test system interference. S95070B software measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals through spectral correlation between the input and output spectrum, without doing demodulation. Integration with the PXI VNA’s measurement flexibility enables you to do quick modulation distortion measurements along with traditional VNA tests.
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Frequency Response Analyser
DP-cPCI-7554
DP-cPCI-7554 is a cPCI module capable of analyzing the phase and gain characteristics of a system. The system under test is stimulated by the user defined waveform. The obtained response is correlated with the applied stimulus by the on-board DSP processor to determine the phase difference and the gain.Gain and the face analysis is carried out only at sine waveform.
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Compact PCI Bus Analyzer / Exerciser
CPCI650
The CPCI650 analyzer provides a multitude of functions to help you analyze your system.- Capturing bus activity using sequential triggers and filters- Exerciser to perform memory, I\O and configuration cycles- Stimulus generation for hardware simulation and fault generation- Anomaly detection of protocol and timing violations- Performance analysis of utilization, transfer rates, latency, statistics
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Modular Power
RFP Controller
AMETEK Programmable Power, Inc.
ReFlex Power™ is a high density, modular programmable power system providing DC, AC and electronic load assets all under control of a single controller. It provides a reconfigurable, flexible platform ideal for ATE and production test environments where RFP™ can provide programmable stimulus and bias power as well as programmable loads for the device(s) under test. The EIA 4U high RFP™ mainframe can hold up to 12 single-slot modules or combinations of single, dual and triple slot wide modules to configure (or reconfigure) the system for the particular requirements at hand. The mainframe can support up to 6 kW of output power.
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PCI and PCI-X Bus Analyzer / Exerciser
PCI850
The PCI850 analyzer provides a multitude of functions to help analyze your system.- Capturing bus activity using sequential triggers and filters- Exerciser to perform memory, I\O and configuration cycles- Stimulus generation for hardware simulation- Target memory with addressable windows- Anomaly detection of protocol and timing violations- Performance analysis of utilization, transfer rates, latency, statistics- Compliance testing
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DC Bias and RF Stimulus Control Module
Quantum SMART Fixture
Accel-RF Corporation, the world leader in turnkey RF automated reliability test instruments, has "unplugged" the industry-leading RF SMART Fixture from their automated test platform and made it available for benchtop test. The NEW Quantum SMART Fixture is a programmable self-contained DC bias and RF stimulus control module capable of synchronizing sequenced independent pulsed-bias and pulsed-RF signals to a DUT or remote fixture. The signals are controlled from a user interface compatible with Accel-RF's LIFETEST software. The Quantum SMART fixture is capable of "active" temperature control and monitoring of a remote DUT through embedded firmware in the microprocessor
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Stimulus Induced Fault Testing
SIFT
SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.
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MEMS Inertial Test
Cohu´s inertial solutions enable high precise Gyroscope and Accelerometer test with best-in-class cost of test due to high parallelism and package flexibility. All Cohu stimulus modules guarantee high precision and velocity stability as well as high temperature accuracy. With use of our high efficient handler portfolio we can offer the ideal solution with optimized cost of test.
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VXI Single/Dual Channel Arbitrary Waveform Generator
3100M
The Astronics Test Systems 3100M Waveform Synthesizer Series combines 300 MS/s waveform generation performance, versatility, and compact size into a single-slot VXIbus format.The 3100M is a greatly improved version of a field-proven instrument ideal for VXI test stimulus generation. It replaces one or two of the popular 3152A Precision PLL Waveform Synthesizers, which are standard on many military and commercial test platforms.
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Benchtop Wiring Analyzer
2115
The Model 2115's compact size makes it the ideal choice for many benchtop or portable test applications. The small size does not mean you sacrifice any functionality. The 2115 delivers a full 1500 volt isolation and 2 amp continuity test stimulus. With the optional AC breakdown test providing 1000 VAC test stimulus, you will meet all test requirements.
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64-Channel 1MSa/s USB Modular Multifunction Data Acquisition
U2331A
The U2331A offers multifunction capabilities in a module. It can be used like a digital multimeter in polling mode. It can be transformed to be a simple scope using the continuous mode with simple triggering capabilities. No matter if it is used as a standalone module or when plugged into a U2781A USB modular instrument chassis, the synchronization and triggering capabilities allow great flexibility in making the desired measurements. With the analog output being able to send out predefined or arbitrary waveforms make this a good tool when closed loop feedback or stimulus is required. The digital IO channels allows for closed loop control through connections to switches, relays and solenoids. The burst mode enables the U2331A to simulate simultaneous analog input acquisition.
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Modulation Distortion Up To 13.5 GHz
S930701B
S930701B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 13.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930701B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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USB Controlled Multi-Function DAQ for ATE
GT98901
The GXT98901 Demo board is a USB controlled, cost-effective, multi-function PCB assembly. The module is completely self-contained and includes an LCD display, measurement and stimulus resources, digital I/O, relays, and switches – all which can be accessed and monitored via the USB port using a SCPI command set via a USBTMC interface which supports the USB488 protocol.
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64-Channel 250kSa/s USB Modular Multifunction Data Acquisition
U2355A
The U2355A offers multifunction capabilities in a module. It can be used like a digital multimeter in polling mode. It can be transformed to be a simple scope using the continuous mode with simple triggering capabilities. No matter if it is used as a standalone module or when plugged into a U2781A USB modular instrument chassis, the synchronization and triggering capabilities allow great flexibility in making the desired measurements. With the analog output being able to send out predefined or arbitrary waveforms make this a good tool when closed loop feedback or stimulus is required. The digital IO channels allows for closed loop control through connections to switches, relays and solenoids. The burst mode enables the U2351A to simulate simultaneous analog input acquisition.
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Sensors Test Cells
Integrated MEMS
The best technical performance, cost optimization, one-shot factory integration.A single unit integrates the modules for the handling, contacting and complete testing of MEMS devices, including the physical stimulus for functional test, and the tri-temp thermal conditioning.
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Digital Wideband Transceiver Analysis
S94610B
Digital Wideband Transceiver Analysis is an add-on software to Device Measurement eXpert (DMX) that adds cross-domain stimulus response measurements for digital/RF mixed-signal device characterization. Included Waveform Creator helps define digital IQ test stimulus waveforms that are used in the RF signal generators for receiver tests or downloaded to the digital-to-analog converters for transmitter tests. The DUT control is customizable to accommodate various data converters and transceiver types by defining device operation settings, transmit/receive switching, reading and writing digital IQ waveform from and to DUTs. Acquired RF or digital data is processed in the VNA’s applications for faster, accurate measurements and analysis.
