Electron Spectroscopy for Chemical Analysis
determine the atomic composition of a surface.
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Real-Time X-Ray Imaging and Variable Pressure Scanning Electron Microscope
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Trialon has the equipment and experienced staff to operate this highly technical piece of laboratory equipment. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
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92 Electronics Applications
Electronics Engineering Apps. PRO.
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Electronics Engineering Apps. PRO.
The Electronics Engineering ToolKit is a universal App. It is designed for both iPhone and iPad.
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Saluki SEL7 Series Programmable DC Electronic Load (up to 6kW)
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The new SEL7 series programmable DC electronic load is a new generation product designed by Saluki Technology. Incorporating high-performance chips, the SEL7 series delivers high speed and high accuracy with a resolution of 0.1mV and 0.01mA (basic accuracy is 0.03% and basic current rise speed is 2.5 A/μs).SEL7 series have wide application from production lines for cell phone chargers, cell phone batteries, electronic vehicle batteries, switching power supplies, linear power supplies, and LED drivers, to research institute, automotive electronic, aeronautic and astronautic, maritime, solar cell and fuel cell etc. test and measurement applications.
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Chemical Calibration
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Trescal provides full Chemical Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Chemical Calibration services can be delivered at your site or at our lab. Accreditations for our chemical calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Noise & Vibration Analysis
DATS Software
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DATS is a comprehensive package of data acquisition, signal processing and reporting tools. It is used mainly for noise and vibration analysis, but can be used for a wide range of engineering and general signal processing tasks.
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IC Side Channel Analysis
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These probes allow you to couple fast, transient magnetic field, E-field, and current pulses into ICs.
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Joint Services Electronic Combat Systems Tester
JSECST™
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The Joint Services Electronic Combat Systems Tester (JSECST) is part of the family of testers, supporting the U.S. Air Force, Navy, Army, and over 23 allied nation platforms. JSECST performs full end-to-end diagnostic tests of installed systems including radar warning receivers (RWRs), jamming systems, communication systems, and navigation systems. Our JSECST delivers confidence for flight crews and the technicians who support them. It quickly and accurately tests and fault-isolates electronic combat and avionics systems for today's most advanced combat aircraft.
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Electronic Load Board 3U CPCI-S (air cooled)
056-377
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The 3U load boards are designed to simulate the power consumption of a single board computer and other boards on the backplane.
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500 Watt Electronic Load Module
N3305A
Load Module
The Keysight N3305A is a 500 W (0-60A, 0-150V) electronic load module for use in either the N3300A or N3301A electronic load mainframe in system applications. The N3305A load module is fast and accurate, for programming in constant current, constant voltage, or constant resistance modes, or for making voltage, current or power measurements. The N3305A can also digitize waveforms.
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Scanning Electron Microscopy
SEM
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Materials Evaluation and Engineering
JEOL JSM-6610 LV LaboratoryScanning electron microscopy (SEM) uses electrons for imaging to obtain higher magnifications and greater depth of field than light microscopes. The instruments at MEE are capable of variable-pressure, or low vacuum, SEM (VPSEM), as well as traditional high-vacuum conditions for sample observation. VPSEM is a specialized method using a variable-pressure sample chamber that allows direct evaluation of samples that are not readily examined with a traditional high-vacuum SEM. Nonconductive or vacuum sensitive samples that would typically require additional sample preparation can be directly analyzed in VPSEM without the need for additional sample preparation, such as carbon or metallic conductive coatings. This reduces both sample preparation time and distractions in microanalysis. Our laboratory also has a field emission SEM (FESEM) for critical high-magnification work and low-voltage (LVSEM) applications. Each instrument has a spacious sample chamber that can accommodate large and irregularly-shaped specimens and accessories for feature dimensional analysis and chemical microanalysis.
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Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM Analysis)
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Rocky Mountain Laboratories, Inc.
Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM Analysis), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measuredand many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.
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PoE LLDP Emulation (PD) & Analysis for 802.3at & 802.3bt
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The optional LLDP Emulation feature allows a PSA-3000, PSL-3424L, or PSL-3000 test port to behave just like an 802.3at or 802.3bt PD that uses LLDP to convey its power demands. 802.3 PoE LLDP is a special variant of LLDP protocol that involves handshakes and protocol timing between a PSE and a PD.
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Electronic Inspection Systems
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Intego's knowhow even makes it possible to identify challenging defects that may be located under the surface. One system is the inspection of chips by means of lock-in thermography, which visually represents the IR radiation intensity signal of electronics. Special lasers and flash lamps generate a very short heat impulse (10 ms) on the chip, which generates a measurable heat flow. In most cases, a resolution of < 1 μm can be achieved.
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Analysis Software for FLIM, PLIM
SPCImage
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*Analysis of Single-Decay, FLIM and PLIM Data*Analysis by Iterative Convolution and Fit Procedure or by First Moment of Photon Distribution*Calculations of Decay Parameters and Lifetimes by Various Decay Models*Calculation of FRET Efficiencies*Display of Lifetime and FRET Images*Display of Lifetimes, Amplitudes, Intensities or Ratios*Export of Lifetime Data and Images
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Spectroscopy
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Spectrometers are used to measure the properties of light for a variety of applications including environmental or chemical analysis, fluorescence, or Raman. Spectrometers are optical instruments that can detect spectral lines and measure their wavelength or intensity. Spectrometers are ideal for determining compositional makeup for detecting weak light signals. Spectrometers can also be used to test the efficiency of an optical filter in order to determine whether a filter has properly blocked or transmitted specific wavelengths.
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Visual Analysis Tool for GNSS Receiver Data
Panorama
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Panorama is the flagship tool when it comes to analyzing receiver data. When engineers use Panorama they spend more time looking at plots and making decisions, instead of making plots and writing reports. Panorama takes receiver data (.csv files) from PANACEA and RxStudio (other ODS products) and turns it into over 60 engineering plots ready to view at the click of your mouse. These plots give engineers and analysts the ability to view summary level data, head to head comparisons, receiver specific results, and 3D LLA replays using STK.
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Power System Analysis Software
DSATools
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DSATools™ is a suite of leading-edge power system analysis tools that provides the capabilities for a complete assessment of system security, including all forms of stability. DSATools™ offers a complete toolset for power system planning and operational studies. In addition to rich modeling capabilities and advanced computational methods, the software is packed with useful study tools that enable significant productivity improvements.
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Destructive Physical Analysis (DPA)
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Is the process of disassembling, testing, and inspecting a component for the purpose of determining conformance with applicable design and process requirements. This process of sample testing is used to ensure that a high reliability component or device is fabricated to the required standards. Destructive Physical Analysis is also used effectively to discover process defects for troublesome production lot problems.
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Transient Stability Analysis
I*SIM
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PTW I*SIM is a program for transient stability analysis. It is designed to simulate system response during and after transient disturbances such as faults, load changes, switching, motor starting, loss of utility, loss of generation, loss of excitation, and blocked governor events. I*SIM is designed to study today's most challenging simulation problems in one convenient and easy-to-use program.
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Electronic Flow Meters
5050
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Parker Conflow’s Code 5050 is an electronic flowmeter that has a user-friendly display and is used for measuring and outputting flow rate, pressure and temperature
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Wi-Fi Site Surveys, Analysis, Troubleshooting App
Netspot
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NetSpot is the only professional app for wireless site surveys, Wi-Fi analysis, and troubleshooting on Mac OS X. It''s a FREE Wi-Fi analyzer. No need to be a network expert to improve your home or office Wi-Fi today! All you need is your MacBook running Mac OS X 10.6+ and NetSpot which works over any 802.11 network.
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Electronic DC Load, 500V, 16A, 400W
LDH400 Series
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Versatile solution for direct testing of dc power sources and PFCsConstant current, resistance, conductance and power modesWide voltage and current range, 10 to 500V and 0 to 16A400 watts continuous dissipation at 28°C (360W at 40°C)High resolution and accuracy for level settingBuilt-in transient generator with variable slewCurrent monitor output for waveform viewingVariable drop-out voltage for battery testingHigh resolution backlit graphic LCD with soft key controlAnalogue remote control of levels and TTL control of on/off and transient switchingFront and rear input terminalsLoad inputs rated to CAT II (300V)Full bus control via USB, RS232 and LXI compliant LAN interfacesGPIB Option
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Shock Response Spectrum (SRS) Analysis Solution
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Shock Response Spectrum (SRS) Analysis SolutionMechanical shock pulses are often analyzed in terms of the shock response spectrum. The shock response spectrum assumes that the shock pulse is applied as a base input to an array of independent single-degree-of-freedom systems. SDOF system assumes that each system hat its own natural frequency.
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Spectrum Analysis For E5081A Up To 20 GHz
S960904B
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The Keysight S960904 spectrum analyzer (SA) software application adds high-performance spectrum analysis to the E5081A ENA-X up to 20 GHz. With fast-stepped FFT sweeps resulting from optimized data processing, the SA software application provides quick spurious searches over broad frequency ranges. The application enables simultaneous spectrum measurements using test and reference receivers. The multichannel SA pairs with the internal swept-signal generators for efficient measurements of spurious signals emanating from mixers and frequency converters. The SA application uses source-power and receiver-response calibration and fixture de-embedding, providing highly accurate in-fixture and on-wafer spectrum measurements.
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Particle Size Analysis Systems
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The Aggregates Sizer aggregation analysis system enables the quantitative evaluation of particle amounts in the 0.1 µm to 10 µm range as a concentration (units: µg/mL or particles/mL).
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Electronics Testing Solutions
Test System
Don’t cut corners when it comes to developing high-quality electronics functional testing solutions. Ball Systems helps you ensure you deliver the quality your customers expect by providing open and reliable advanced technical testing solutions.
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WDS Analysis System
Lambda
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The Lambda™ Wavelength Dispersive Spectrometry (WDS) Analysis System combines the EDAX WDS software with state-of-the-art spectrometers for improved accuracy and precision, guaranteeing the best results for your materials analysis.
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Spectroscopy Applications
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Anadis Instruments Benelux b.v.
Spectroscopy has become a powerful tool leading to a broad range of applications, as can be seen in the map below. From the lesser known FT-IR analysis of lipid structures in skin (of interest when applying medicines to the skin as well as in studying the effects of skin aging) to the widely used measurement of additives and the octane number (RON, MON) in fuels. Using spectroscopic techniques has many advantages. The technique is non-destructive; almost any sample can be studied in virtually any state. The techniques are applicable off-line, in-line, at-line or on-line. Identification als well as quantification is possible. Check the map with applications, it will be regularly updated and expanded.
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Spectrum Analysis For P50xxB Up To 6.5 GHz
S970901B
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Add spectrum analysis to your P50xxB Streamline series vector network analyzer
