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Product
JTAG Functional Test
JFT
Functional Test
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
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Product
High Voltage DC Cable Test Systems
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We can offer from ±18kVdc to ±30kVdc units which all have automatic earthing for discharging capacitive loads. They are designed to perform tests on installed cables and jointing systems.
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Product
Armature Test Systems
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Automation Technology's ATS-3800 is at the top of the class when it comes to Armature Test Systems. The ATS-3800 is packed with standard features and like all of ATI's 3800 Series Test Systems; it is backed by ATI's industry leading two-year limited warranty. The ATS-3800 offers the most comprehensive testing of armatures available.
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Product
Fuel Cell Test Accessories
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Scribner extends its groundbreaking line of tabletop fuel cell testing equipment with the 885 Fuel Cell Potentiostat.
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Product
ATCA Test Extender with Zone 3
114EXT8040-0XXX
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The ATCA extender board extends both the power and IPMB signals. It is designed for the full populated fabric slot (5 ZD connectors, P20 thru P24) and the power connector J10.
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Product
Lithium Battery Test Chambers
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Dongguan Amade Instruments Technology Co., Ltd
Lithium battery test chambers are used to simulate various extreme conditions such as crush, impact, penetration, overcharge etc the lithium ion cells and batteries are subjected to during use, transportation, storage and disposal to determine the safety performances, tests including altitude simulation test, thermal test, vibration test, shock test, external short circuit test, impact/crush test, overcharge test, discharge test etc based on UN38.3, IEC62133, UL1642 standards. Applicable to communication products, computer products, consumer electronics, automobile power supplies and so on.
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Product
System Test
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Testing a complete system is very different from unit and integration test. It starts with the V model that defines the system requirements, and this needs an effective system test capability that includes both the system and the environment around it. If the system has interfaces to the outside world, communications links or human control, these interfaces have to be tested.
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Product
Diagnostic Test Tool
BIRST™ (Built-In Relay Self-Test)
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Verification and diagnosis of complex switching operation in a test system has always been an issue. BIRST (Built-In-Relay-Self-Test) diagnostic test tool provides a quick and simple way of finding relay failures available on some of our LXI and PXI switch matrices.
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Product
Tweezers Contacts Test Fixture
16334A
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Perform impedance evaluation on a minimum SMD size of 1.6(L) x 0.8(W) [mm]
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Product
Small Drop Test System
KRD41 series
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KRD41 series small drop tester is suitable for free-fall test of small consumer electronics and components such as mobile phones, walkie-talkies, electronic dictionaries, CD / MD / MP3 and so on, applicable standards JISC 0044 and IEC 60068-2-32. Through standard tests on electronic products (surface drop, corner drop, edge drop, etc.) and collecting data, it simulates the vertical drop impact of electronic products during transportation and handling. It provides a basis for the design of the product's buffer and vibration damping and the selection of structural materials.
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Product
Conformance Test Solutions 3GPP / Regulatory (CTIA / RED)
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Only conformance test sytems from Rohde & Schwarz cover all relevant digital mobile device generations.The key to success is comprehensive access to RF, RRM, LBS and PCT test cases as defined e.g. for 5G NR in 3GPP TS 38.521-1 to -4 (5G NR RF), 38.533 (5G NR RRM), 38.523-1 (5G NR PCT), 37.571 (LBS).The Rohde & Schwarz conformance test solution portfolio consists of approved test platforms for device certification by GCF and PTCRB that support both TDD and FDD and all relevant 5G NR bands in both sub-8GHz (FR1) and mmWave (FR2) frequencies, as well as all frequency bands for LTE, WCDMA and GSM.
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Product
Test Cells
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Our test cells are built using a modular system. This means that the usable space size and shape can be specifically adapted to the required conditions.
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Product
Test Sets For Transformer Industries
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Contemporary Test Sets For Transformer Industries are developed to recognize the potentially disastrous current transformer errors. They prevent the primary current from overpowering insulation and short circuits. They are used for developing a testing and maintenance plan for addressing the errors before any failure to save money and time. With these powerful test sets, they are sure to perform saturation testing to test the knee point of a signal by comparing primary and secondary windings.
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Product
Reach-In Test Chambers
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A compact, self-contained environmental unit designed to precisely control temperature, humidity, and, in some cases, lighting or atmosphere, for testing, storing, or growing samples.
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Product
Production Test System
G3 Hybrid
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The G3 Hybrid is a state of the art system for fast Production test throughput in DC test applications. The system combines the most versatile offerings of features in a single system, at the lowest cost. For devices requiring DC and Continuity test capability only, G3H is a very flexible cost-effective Production Test solution. This approach provides a DC test system with the capability to add logic resources (AC/SCAN) as well as analog resources for Mixed Signal. The HILEVEL G3H embraces low cost while supporting SCAN, giving you the ability to toggle every node in your chip.
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Product
Universal High Speed Bench Test Automation Framework
KayaQ™ (GRL-KAYAQ-FW)
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GRL’s Universal High Speed Bench Test Automation Framework ‘KayaQ™ ’ is an enterprise-quality, Windows 7 PC-based, ready-to-use automation environment for labs overcoming the next generation challenges of bench testing. The world’s leading provider of high speed interface PVT characterization test services, GRL developed KayaQ™ to address the gaps in available tools for high speed interface characterization. KayaQ™ provides a ready-to-deploy automated test solution for testing of high speed interfaces, tailored for the needs of volume bench-level IC PVT characterization.
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Product
Remote Speed Test, Wi-Fi
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Measure Wi-Fi performance — at key locations, 24×7. Remote Speed Test automatically runs network and app performance tests all day, every day. Just connect the Remote Speed Test sensor to your Wi-Fi and we’ll do the rest! Performance results collected by all your sensors are delivered conveniently to your smartphone. 802.11 b/g/n/ac 2.4 and 5.0 GHz
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Product
LED Optical Aging Test Instrument
LEDLM-80PL
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LEDLM-80PL LED Lumen Maintenance and Aging Life Test System is designed according to standards of IES-LM-80, IES-LM-82, TM-21 and GB2312-80, and the software is developed base on Arrhenius model. LED has the features of long life, but with the different working condition and drive current, its life will be different, but generally the life will be around 50K hours. Differ from the traditional lightsource, LED light will decay gradually rather than extinguish instantly, so in the standard of LM-80, it introduces L70, L50 and etc.
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Product
Test Equipment
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Concentric Technology Solutions, Inc.
If you are looking for a Bluetooth, RFID, or DMB/DAB test equipment, Concentric Technology Solutions, Inc. (CTS) have the right tester for your testing needs. Our testers give our clients all the right features you need – whether it’s full compliance testing or just to test functionality. CTS has the solution to meet your needs.
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Product
Walk in Chamber for Altitude Simulated Test
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Guangdong Bell Experiment Equipment Co.,Ltd
Walk in Chamber for Altitude Simulated Test Relative Standard test requirementsTest Object: battery pack and systemTest Conditions: Altitude 4000m or the equate air pressure condition, atroom temperature.The test objects stay in the test condition as Item 2 for 5 hours.Subject the test object to 1C(no more than 400A) constant current discharge until reaching the cutoff condition.After testing, observe for 2h under the room temperature.
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Product
Semiconductor Test
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Smiths Interconnect’s test socket and probe card solutions utilize IDI contact technology to ensure superior quality and reliability in semiconductor test applications. Our best-in-class engineering, development and technical expertise ensure support of automated, system level and development test platforms.
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Product
Mixed Signal Battery Test System
Test System
The Mixed-Signal Battery-Test System is an automated test platform designed to meet today’s advanced battery test requirements. The platform is ideal for testing a range of battery cells and packs, and can be used in applications such as research and design, quality control, and end-of-line manufacturing. Its distributed architecture provides a scalable solution with configurable system components to accommodate specific applications.
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Product
High Voltage Clip for Test Leads
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- The new Parrot clips are high voltage gripping clips for test leads and probes. High Voltage Parrot clips replace insulated alligator clips, plastic coated miniature alligator clips, small crocodile clips or large alligator clips.- Parrot Clips have a design with a new metal tube tip which is connected directly to the lead.- The tip, the hooked rod and the spring are housed in a plastic support.
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Product
Optical Fiber Test Platform
Fiber Lab 3200
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Fiber Lab 3200 from M2 Optics Inc. is a must-have solution for anyone developing or testing fiber optic products and systems. Available in two types of rack-mount chassis with up to 300km per unit, it offers the most professional approach for using fiber in the laboratory or network. In addition, it provides maximum protection against potential fiber and connector damage.
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Product
Custom Test Design
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Materials Evaluation and Engineering
Some problems require solutions beyond the standard test methods and procedures routinely performed at MEE. Replicating the suspected cause of failure on an exemplar part can provide valuable information about the likelihood of that failure case. Likewise, intentionally causing component failures in a variety of ways can provide insight into possible failure scenarios. Wondering how (or if) a design or part can be tested? Give us a call – the engineers and technicians at MEE enjoy the hands-on experience of designing customized testing plans for your unique challenges.
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Product
Test and Analysis
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ESDEMC Technology will calibrate; the Contact Mode ESD current waveform and tip voltage to 4 GHz and 30 kV, the frequency response of ESD Target & Adapter Line to 4 GHz, and the DC Resistance
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Product
Memory Test System
T5851/T5851ES
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The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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Product
Test Management Software
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Easy to use to minimal training. Our Test Management Software is powerful enough to accommodate all of your electrical and function testing requirements, whether testing a cable harness or fully equipped vehicle or aircraft.
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Product
TDK Test Services
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TDK Test Services offers testing to domestic and international EMC test regulations, including IEC, ISO, CISPR, and SAE. Test services are offered in our 3m semi-anechoic chamber, 3m fully-anechoic chamber, 10-meter open area test site, and our shielded conducted test chamber.
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Product
Boundary-Scan Test Coverage Analysis Tool
ScanExpress DFT Analyzer
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Test coverage statistics provide engineers and managers valuable information to make critical decisions in product development and manufacturing.ScanExpress DFT Analyzer is an automatic test coverage analysis tool for printed circuit boards and systems that include a mix of boundary-scan and non-boundary-scan devices. The tool assists design and test engineers to increase fault coverage and reduce boundary-scan test procedure development times. Using ScanExpress DFT Analyzer results in better informed test decisions.
