Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Product
Automotive EMC Test System
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The specific EMC requirements in automotive tests take continuously, so that the test waveforms are becoming increasingly complex. As a manufacturer of EMC test simulators and due to the participation in international standardization bodies Hilo test knows the current and future requirements of the automotive industry exactly. The following automotive products are specifically geared to the current EMC requirements in modern automobile, and described in the standards ISO 7637 and ISO 16750.
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Product
Display Test System
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PIMACS provides the broadest range of display optical performance measurement system for optical testing of various samples including flat panel displays. We are specialized in testing all sizes of display modules and panels ranging from various field.
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Product
Load Cell Measurement
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Designed specifically as a single-board solution for material testing system (MTS) applications, the PCI-9524 combines a high 24-bit resolution with 1/200,000 count accuracy to provide the most precise load cell measurement PCI board available in the market today.
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Product
Analog Hipot & Insulation Tester
KT-5000Pi
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This is a Hipot(Puncture) Tester combined with Insulation Tester in a set.It tests 2 kinds of test continuously in sequence, and any of both hipot or insulation test can be set to test first in other by the selection switch.Hipot Tester has the leakage current meter, so the operator can check the leakage value while testing. And the preset procedure of the Insulation Tester is very easy. Both tester judge the product to be good or bad automatically in a short time.This tester has many I/O ports to connect extra test system. Price : 2,550 (USD)
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Product
Software
S!MPATI®
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You reach all important functions quickly and easily via the clearly structured S!MPATI® menu with intuitive operation. In addition, a floor plan of your laboratory can be uploaded and the layout of all testing systems visualised for optimal handling. This means, you can control and program all test cabinets conveniently from one computer as well as evaluating their data. This effectively increases the efficiency of your systems and also provides protection against downtime.
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Product
Slip Ring Test System
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This is a high specification tester that will measure many cable parameters. It measures cable resistance very accurately using the Kelvin 4-wire method. It also tests for shorts between pins at a low voltage. The next test is to measure insulation between connections at a higher voltage. This is carried out at up to 1500 Volts DC with resistances of 10 to 500 Meg ohms.
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Product
Substrate Inspection Apparatus
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The test system of the printed circuit board (mounting board) called the flying probe tester developed ahead of the world received high evaluation at the electronics manufacturing factory around the world, securing the top share of the industry and "Takaya of the board tester" We have established a firm position that.
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Product
Material Testing Software
MS100
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Sinowon Innovation Metrology Manufacture Ltd.
MS100 is professional software for material testing in windows system, it is able to conduct tensile, compression, bending, shearing, bonding strength, peeling, tearing and other tests for rubber, plastic, leather, metal, nylon line, fabric, paper, aviation, packaging, construction, petrifaction, electrician, vehicle and other materials.
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Product
PXI Fault Insertion (Fault Injection) Modules
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PXI Fault Insertion Units (FIU), also known as Fault Injection switch products, are designed specifically for safety-critical applications where the response of a control system is required to be evaluated when sensor connections behave in unexpected ways. These modules are scalable solutions that can be used to switch signals between simulations and real-life devices in a multitude of hardware-in-the-loop (HIL) simulation and test systems. The fault insertion unit can significantly simplify and accelerate the testing, diagnosis and integration work in HIL applications.
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Product
Melt Flow Testers
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nstron®'s CEAST Melt Flow Testers are specifically designed for easy and accurate measuring of the Melt Flow Rate (MFR) and the Melt Volume Rate (MVR). CEAST Melt Flow Testers range from systems that perform a simple manual test procedure to semi-automated testing systems performing multiple weight tests. Our testers meet ASTM and ISO standards.
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Product
CombiVolt™ 1 Voltage/Continuity Tester
DL6780
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Testing of AC/ DC voltages from 12 to 690 V AC/DC Continuity testing with optical and acoustic indication Automatic switching between voltage and continuity Phase rotation test system Single pole phase indication Fully compliant with GS38 Fully operational voltage indication even when batteries are discharged Will not trip any RCD when testing across Live and Earth Single pole detection when L2 probe connected above 100V
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Product
Discrete Devices High-speed Testing System
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QT-6000 discrete device high-speed testing machine is suitable for testing small and medium-power diodes, transistors, field effect transistors and other products and wafers. It can expand built-in capacitance testing (DC+CAP), EAS, VC, pA modules, as well as external LCR (ultra high precision capacitance testing), Scanbox, etc. The machine can be used for FT mass production testing or laboratory testing.
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Product
PCIe® Gen5 NVMe SBExpress Test System
SBExpress-RM5
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The SANBlaze SBExpress-RM5 is a complete turnkey PCIe® Gen5 NVMe SSD Drive validation test system. The SBExpress-RM5 feature set provides unique functions applicable to all aspects of a product lifecycle, from development and QA, to design validation and manufacturing test cycles. The ability to drive Gen5 NVMe SSDs with a wide range of configurable attributes provides engineers with a flexible, multi-controller supported validation test platform. Development, qualification, and certification test cycles can be highly automated, thus reducing overall test time, and rapidly surfacing errors and non-conformance.The SANBlaze SBExpress-RM5 hardware provides a rackmount chassis with sixteen dual or single port front-accessible drives.
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Product
eBIRST™ – Switching System Test Tools
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Switching systems are an important part of many test systems, however, the switching system is in a vulnerable place. When accidents happen that can cause a faulty device, you need a way to get the system up and running again with a minimum of effort and operator skills.
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Product
PXI/PXIe MEMS RF Multiplexer, Dual 4-Channel, 4GHz, 50Ω, MCX
42-878-222
Multiplexer Module
The module is based on the latest micro-electromechanical system (MEMS) switching technology and has low insertion loss and VSWR. In addition, MEMS devices have a long operational life of >3 billion operations and benefit from an operating time of <20 μs allowing greater test system throughput. The multiplexers have excellent and repeatable RF characteristics beyond 4 GHz with each path having a nominally equal insertion loss.
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Product
Display Driver Test System
T6391
Test System
High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
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Product
GPIB To Ethernet Instrument Interface
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*ICS's 4865B GPIB to Ethernet Instrument Interface adapts instruments with Ethernet interfaces to GPIB test systems.*ICS's 4865B provides a VXI-11 compliant interface for instruments that support the VXI-11 protocol and a smart, user-configurable, raw socket protocol that accommodates most instruments that use raw sockets. The 4865B replaces our earlier Model 4865 and is 2x to 5x faster than the original Model 4865. Click here for the original 4865 webpage.
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Product
In-Line Debug Press
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Use for DEBUG without having an In-Line TesterUse Standard 3070 Test System for DebugSupport In-Line Tester on current 3070Verify Form and FitSlides in and Out like on an actual In-Line System
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Product
Software Package
System Software 3
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The BAUR system software is a cable testing, cable diagnostics and cable fault location package. It enables efficient monitoring of the condition of cable networks in combination with BAUR cable fault location, testing and diagnostics systems.
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Product
Test System
LB303
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Computer Gesteuerte Systeme GmbH
The test system features the durable G12 receiver from the Virginia Panel Cooperation for the adapter interface. The LB303 is equipped with a power supply of max. 6 kW and can control up to 2 load boxes (in an external rack).
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Product
Automated Test Equipment
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Viewpoint Systems offers design verification and manufacturing quality inspection systems to help customers reduce human error in repetitive tests, increase testing speeds, and ultimately get products to market faster at a lower cost. Viewpoint Transforms Test from Design to End-of-Line. Our R&D test systems are designed with the flexibility to validate ever-changing prototypes while accelerating your development schedule.
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Product
Drop Testers
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This process is vital for ensuring that products travel to customers safely and securely, eventually arriving damage free. In turn, drop test systems help companies save money and maintain positive brand-owner reputations by helping to design packaged products that will deliver products with their intended inherent quality intact. Lansmont Drop Test Systems are the gold standard for accurate and repeatable drop testing. Every drop tester we manufacture is factory-tested to ensure it meets flatness-of-drop requirements and exceeds industry specifications.
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Product
RADAR Stability Testing
PN9002
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Radar component and system testing usually evokes images of complex, expensive measurement systems occupying multiple equipment racks. In some cases, radar equipment designers have even used entire radar systems as a proving ground for their new components and modules. With the introduction of the PN9002 pulse-to-pulse radar stability test set from Noise eXtended Technologies , radar testing has become significantly less complex and costly. The modular PN9002 system provides outstanding dynamic range at frequencies from 2 to 18 GHz and optionally from 0.4 to 18 GHz.
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High Efficiency, Low-Cost Test for Less Complex Signal Devices
J750Ex-HD Family
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Microcontroller Units (MCUs) are used in automobiles, mobile electronics and robotics. As you go through your day, dozens of MCUs are in your electronic devices working to provide unique features and Teradyne’s J750 family most likely tested them. With a growing installed base of over 6,000 test systems and widely available at more than 50 Outsourced Assembly and Test (OSAT) locations, Teradyne’s J750 is the industry standard for high volume test of low-cost devices.
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Product
PXI-2541, 300 MHz, 8x12 PXI RF Matrix Switch Module
778572-41
Matrix Switch Module
300 MHz, 8x12 PXI RF Matrix Switch Module—The PXI‑2541 is an RF signal switching matrix. With its non-blocking design, you can simultaneously connect any row or column within the switching matrix and maximize the flexibility of your test system. Isolation relays on the module disconnect unused parts of the switching matrix to maintain RF performance and high isolation. The density and bandwidth of the PXI‑2541 is ideal for routing signals between digitizers, function generators, and other RF generators and analyzers. For higher channel count applications, you can connect multiple PXI‑2541 modules together to create switching matrices of 8x24, 8x36, and larger.
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Product
Miniature Electrodynamic Shakers
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Miniature electrodynamic shakers are small, portable units designed to simplify your vibration testing needs. From the SmartShaker™ with an integrated amplifier, to an Inertial Shaker System for testing in hard-to-reach areas, mini shakers offer flexibility when testing. Miniature shaker systems range from 2 lbf (9 N) to 7 lbf (31 N) sine peak force excitation.
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Product
RSP-2T Test System Interface Probe
RSP-2T
ICT/FCT Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 167Full Travel (mm): 4.24Recommended Travel (mil): 79Recommended Travel (mm): 2.00
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Product
Custom Power On Option
U8002A-AUT
DC Power Supply
This option helps users to eliminate manual intervention on instrument control when they use U8000 series power supplies in a test system. The behavior of this option and standard units are the same after power up, where the "Output ON/OFF" button is still accessible throughout the supply operations.
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Product
Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications
ETS-88RF
Test System
Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
