Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Product
PXI 10W Programmable Resistor Module, 2-Channel, 1Ω to 122Ω
40-253-012
Programmable Resistor Module
The 40-253-012 is a programmable resistor module with 2 channels which can be set between 1Ω and 122Ω with 0.5Ω resolution The 40-253 range provides a simple solution for applications requiring up to 10W of power handling per channel. The 40-253 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
PCI High Density Pecision Resistor Card, 9-Channel, 2.5Ω To 3.55kΩ
50-298-023
Programmable Resistor Module
The 50-298-023 is a high density programmable resistor card with 9 channels which can be set between 2.5Ω and 3.55kΩ with 1Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Test Management Tools
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Manage, Execute & conclude from your tests with speed! Host on cloud or host yourself. A web-based, fastest & simplest test case management system.
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Product
PXI Precision Resistor Module 3-Channel, 3 to 22.3M
40-297-154
Programmable Resistor Module
This PXI Precision Resistor module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Product
Power Transformer Automatic Test Device
XD71
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Hangzhou Xihu Electronic Institute
The device is used for power transformer power outage routine test items to do automated testing.Which is characterized by dielectric loss, insulation resistance, DC resistance, tap-changer switching characteristics, short circuit impedance and variable ratio of six test items are concentrated in an instrument,so that the instrument function, test power and test lead height fusion.Field test, just start wiring once, at the end of unplugging wiring once,the middle process by the test personnel in the computer terminal to send command control,the test system automatically completes all or part of the above test items.
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Product
Ferroelectric Tester
Premier II
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The Precision Premier II, is one of Radiant's most advanced test systems. The Premier II has the large envelope in terms of frequency response, voltage range, and accuracy of any ferroelectric tester in the world. Vision Software is provided with the Premier II Test System. Vision uniquely allows the user to construct complex or simple programs with any number of tests to characterize all aspects of the sample in one execution while keeping track of the measurement results and the history of the sample being tested. Tasks such as Hysteresis, I/V, C/V, PUND, Waveform, Magnetoelectrics, Piezoelectrics are just a few features to choice from.
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Resistance Measurement
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PROMET 100 / 200 / 600 high-accuracy, precision ohm meters deliver an adjustable test current up to 600 A which is independent of the supply voltage. They utilize the four-wire resistance measurement method, enabling them to meet extremely stringent accuracy requirements when determining resistance values in the micro-ohm range.State-of-the-art power electronics coupled with a robust design guarantee maximum reliability, even when used as portable devices in switching stations or industrial environments.The modern operating concept, an interface to the test systems of the ACTAS product line and an optional remote control unit make these micro-ohm meters flexible and versatile.
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Product
Saluki S8723X Series USB CW Power Sensor (9kHz - 40GHz)
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S8723X series is a diode detector USB power sensor based on a USB 2.0 full-speed/high-speed adaptive interface. It has a wide frequency range and large power dynamic range. It can be connected to a computer or other electronic measuring instruments, easy to set up a power test system, particularly useful for field and other low-cost production line testing and power testing.
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Product
MEMS Handler
4664-IH
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The ULTRA P is a high performance production handler that provides thermal conditioning, full 6 DOF mechanical stimulus and an electrical ATE signal path for testing Micro-Electro-Mechanical Systems (MEMS) Accelerometers and Gyroscopes.
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Product
Satellite ATE
MS 1123
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Configurable Automatic Test Equipment (ATE) MKII is a customized tester, built to carry out card level testing for satellite systems (12 different types of boards). The purpose of ATE is to provide a user-friendly environment to test the boards for their functionality, perform specific tests of each card. The card level testing facilitates troubleshooting down to a faulty signal flow path. Both hardware and software designed such a way that each Input / Output is configurable and user can dynamically script the test procedure using standard ‘C’ Language.
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Digital Interconnect Test System, Reference Solution
Test System
When you need to measure advanced S-parameters with a fast, low-cost and easy-to-use test solution, the Digital Interconnect Test System gives you a significant edge. It provides a full 32-port vector network analyzer (VNA) configured within a single PXI chassis – ideal for high-speed cable testing. And lets you test any linear passive interconnect faster and easier, including backplanes, connectors and PCBs. Sharpen your edge with Keysight’s Digital Interconnect Test System that enables signal integrity characterization of multiport interconnect products.
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Product
Hybrid & Electric Vehicle Dynamometer Testing
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SAKOR Technologies Hybrid/Electric Vehicle Powertrain Dynamometer Test System (HEViDyne), winner of the SAE 2008 Technical Award for Hybrid/Electric Vehicle Testing Technology, is a comprehensive solution for performance, efficiency, and durability testing of all types of hybrid and electric vehicle drivetrains, including:*Hybrid assist (parallel hybrid)*Gasoline or diesel/electric (serial hybrid)*Fully electric vehicles
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Memory Test System
T5833/T5833ES
Test System
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Product
PXI 2.5W Programmable Resistor Module, 2-Channel, 2.5Ω to 201kΩ
40-251-041
Programmable Resistor Module
The 40-251-041 is a programmable resistor module with 2 channels which can be set between 2.5Ω and 201kΩ with 0.25Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Product
Exchangeable Test Fixture
MA 2111/D/H/S-5/HG
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 10,70 kg
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Product
PXI Versatile Multiplexer, Solid State, 250mA, 40V
40-682A-002
Multiplexer Module
The 40-682A-002 is a very high-density versatile PXI Multiplexer module featuring a wide range of selectable switching configurations with 250mA current and 40V voltage handling. The 40-682A is especially useful where a high-density MUX array is required that can adapt to different test configurations for different test targets, or where a test system may have to be reconfigured in the future.
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PXIe-4051 - PXIe, 1-Channel, 60 V, 40 A PXI Electronic Load Module
788179-01
Load Module
The PXIe-4051 provides programmable load capable of sinking DC power for characterization, design validation, and manufacturing test. This module helps you sink current and absorb power out of a power source up to 300 W with programmable constant voltage, current, resistance, and power levels. You can use the PXIe-4051 to streamline the task of designing automated test systems for a wide range of applications—from aerospace and defense to automotive and semiconductor component test—by eliminating the need to mix multiple instrumentation form factors in a given test system and simplifying synchronization.
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Ground Threat Emitter Sensor System
GTESS
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The Ground Threat Emitter Sensor System (GTESS) is a modular test and training system capable of stimulating multi-spectral aircraft electro-optic sensor suites at long range. The GTESS system integrates Textron Systems’ ultraviolet (Mallina™), infrared (Phoenix) and/or laser (Phantom™) ranged stimulators with an automated tracking system to facilitate fast-moving test, training and evaluation exercises. A fully integrated camera system for effective after action review. GTESS can also work in conjunction with Textron’s radio frequency (RF) range stimulator systems (PRTS™ & HPRTS) for complete multi-spectral testing.
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Computer Based Audio Component Test System
DATS V3
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Rugged aluminum housing with detachable test leads and built-in precision calibration resistorTighter tolerances on internal components for more precise measurementsIncreased output capability means greater separation from the noise floor, resulting in more accurate measurementsDATS Linearity Test for comparing parameters and impedance plots at multiple drive levelsOptional under desk mounting brackets included to save desk spaceOnly 1" H x 2-1/2" W x 4-1/8" D for easy portability
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Intraocular Lens Optical Test System
OptiSpheric® IOL R&D
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The OptiSpheric® IOL R&D is specially designed for the analysis of single intraocular lenses in research and development. With the OptiSpheric® IOL R&D, important parameters of all types of lenses (monofocal, multifocal, trifocal, toric, aspheric and those with extended depth of focus (EDOF) – whether diffractive, refractive or sectors) can be measured and tested in air or in situ in accordance with ISO 11979.
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Product
Transformer Bench Tester
KVBT
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KV Hipot Power Test Equipment Co.,Ltd
Transformer Test System is applied for ex-work and maintenance detecting on various transformers.
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Product
Universal Testing Systems (Up to 600 kN)
5980 Series
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Instron 5980 Series floor model testing systems are universal, static testing systems that perform tensile and compression testing; and also perform shear, flexure, peel, tear, cyclic, and bend tests. The 5900 Series are engineered for precision, built for durability, and offer the flexibility for changing requirements. They are designed with standard and optional features that increase testing efficiency and improve the testing experience for the operator. 5980 Series floor models are robust, heavy-duty frames commonly used for testing high-strength metals and alloys, advanced composites, aerospace and automotive structures, bolts, fasteners, and plate steels. Frames are available in load capacities of 400 and 600 kN.
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PCI High Density Pecision Resistor Card, 6-Channel, 3.5Ω To 201kΩ
50-298-041
Programmable Resistor Module
The 50-298-041 is a high density programmable resistor card with 6 channels which can be set between 3.5Ω and 201kΩ with 0.25Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Product
Linear DC Power Supply
MPS-4 Series
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Four-channel programmable DC power supply is a new generation of high-quality programmable linear DC power supply. All four channels can independently adjust voltage and current. This series of products is equipped with RS232 communication interface, which has the characteristics of desktop and system type, and can be arbitrarily matched with other instruments, integrated into a test system with special functions to meet the measurement requirements in different occasions, and the host computer program can be edited through the communication protocol, which brings great convenience to the user's use. It is a replacement product of ordinarily programmable power supplies. Price-performance advantage.
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Product
4-Quadrant General-Purpose Source/Measure Unit, ±20 V, ±1 A Or ±6 V, ±3 A, 20 W
N6784A
Source Measure Unit
The Keysight N6784A is a source/measure unit (SMU) designed for general-purpose precision sourcing and measurement. General-purpose applications can span many different industries and many different devices under test (DUTs). The N6784A SMU is a versatile tool designed to tackle many of these general-purpose applications. Its glitch-free operation ensures safe usage with the DUT during output and measurement range changes, even with capacitances of up to 150 µF. Its 4-quadrant operation enables it to act as a bipolar power supply or a bipolar electronic load, for added versatility. When using the N6784A SMU, engineers can be confident that they have an all-around general-purpose tool for their test systems or lab bench.
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24-Bit Precision Load Cell Input Card
PCI-9524
Analog Input Module
The PCI-9524 is a robust, multi-purpose module designed for turnkey material test systems (MTS). Equipped with four strain gauge-based transducer input channels, four general purpose analog input channels, and a 3-axis motion controller, the PCI-9524 delivers a complete hardware solution for MTS manufacturers. The PCI-9524 easily integrates physical quantity measurement and implements strategy of close-loop control in a single module package. For transducer measurement, the PCI-9524 supports sensitivity from 1.0 mV/V to 4.0 mV/V and provides a 1/200000 accuracy of measurement of full scale. These features make the PCI-9524 suitable for precise measurement in large-scale transducers.
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Test system for Electronic Device
PCB
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The main focus of the test system is validation and functional testing of electronic devices. The tests include electrical parameters and logical functions of the firmware. Device groups can be stimulated externally and output signals can be acquired by the test points on the board. Limits and ranges of the acquired signals can be monitored and stored for verification.
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Product
PXI 2.5W Programmable Resistor Module, 4-Channel, 1.5Ω to 1.81kΩ
40-251-022
Programmable Resistor Module
The 40-251-022 is a programmable resistor module with 4 channels which can be set between 1.5Ω and 1.81kΩ with 0.5Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Test System
Series 201
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The 201.net is fully programmable to electrically test and ensure the integrity of discrete semiconductor devices. The system is modular in design with each stimulus module individually addressable for specific test requirements.
