Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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PXI 5W Programmable Resistor Module, 1-Channel, 3Ω to 2.97MΩ
40-252-051
The 40-252-051 is a programmable resistor module with 1 channel which can be set between 3Ω and 2.97MΩ with 0.25Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Regenerative Battery Pack Test System
17020
Chroma's 17020 is a high precision system specifically designed for secondary battery modules and pack tests. Accurate sources and measurements ensure the test quality that is suitable to perform repetitive and reliable tests that are crucial for battery modules / packs, for both incoming or outgoing inspections as well as capacity, performance, production and qualification testing. Chroma's 17020 system architecture offers regenerative discharge designed to recycle the electric energy sourced by the battery module ei ther back to the channel s in the sys tem performing a charging function or to the utility mains in the most energy efficient manner. This feature saves electricity, reduces the facilities thermal foot print and provides a green solution by reducing the environmental impact on our planet. Chroma's 17020 system is equipped with multiple independent channels to support dedicated charge / discharge tests, on multiple battery modules / packs, each with discrete test characteristics. The channels can easily be paralleled to support higher current requirements. This feature provides the ultimate flexibility between high channel count and high current testing.
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Software Drivers and Application Software Packages
In test system development, the best hardware is only usable if its software control environment is robust and easy-to-use. If you are a test system developer, you need to look at both the hardware and software aspects of your vendors of choice.
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Services
WinSoft services utilizes the latest technologies such as FlexRIO FPGA, LabView real time and PXI RF modules to design reliable test systems with a minimal cost. In those cases that COST products are not available, we will work with your engineers on cost effective custom made solutions.
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VLF test system
BAUR PHG 80 portable
BAUR Prüf- und Messtechnik GmbH
Portable, high performance test generator with VLF truesinus technology. The BAUR PHG 70/80 portable VLF test systems are used for cable and cable sheath testing of medium-voltage cables of up to 50 kV and electrical equipment.* 3 voltage shapes in one device: VLF truesinus, VLF square wave and DC voltage* For medium-voltage cables of up to 50 kV operating voltage* Cable testing, fault conditioning, cable sheath testing
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Test Database Software Module
The relational test database is the pivotal point of the software structure. On one hand, this is where the test applications and test systems used for productive testing are stored; on the other hand, it provides the storage space for all DUT-related test data. Depending on customer requirements, the test database may either be hosted locally on the test system or centrally on a server, supporting several test systems. The database performance is sufficient for a high-volume production environment with many test systems which access the central database in parallel. LXinstruments prefers to implement the database as a license-free MySQL database; it is however also possible to realize a version based on Microsoft SQL.
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Test Cell System
qCf FC50/125
qCf: Our revolutionary test cell system for the professional characterization of fuel cells.
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MIPI Receiver Test Solution
M8085A
The M8085A is a software plug-in for M8070A Bit Error Ratio Test system software within the M8000 series of BER test solutions. The M8085A software plug-in controls either the M8190A or the M8195A Arbitrary Waveform Generators to create C-PHY or D-PHY standard compliant test signals. In addition it provides routines for calibration of all signal parameters and for all tests specified in the applicable Conformance Test Suite. Together with the additional available DUT control interface it is possible to read the BER of the receiver under test from the M8070A software and display the BER dependency from test parameters within the M8070A user interface.
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Electronic Load
* Fully programmable, self-contained, air-cooled solid state load.* Patented design is optimized to provide ultra-low impedance operation for fuel cell testing.* Load is compatible with AC impedance or frequency response analyzers.* Interchangeable shunts for precise operation over a wide dynamic range.* Ten built-in cell voltage monitoring inputs optional. Additional voltage monitoring inputs available.* Ethernet Interface for simple configuration and expansion!* Combine with additional Fideris™ Innovator Series™ modules to create a fully-integrated,fully-automated, customized test system.* System-wide control of all Fideris™ Test System Components using FCPower™ Software,LabviewTM, or other programming language.* Integrated hardwired Run/Standby signal.
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System Instruments
bsw TestSystems & Consulting AG
Many tasks in the area of semiconductor characterization as well as in the testing of electronic assemblies are routine tasks. Test series of new building elements or samples from production are routinely measured in a large number of electrical parameters. For this, you do not need a measuring device with a complex graphical user interface. A simple interface for remote control with a PC is sufficient. The evaluation and visualization of the results is also carried out on the PC. With the Keysight E5270B and its "little brother" the E5260A two powerful modular SMU units are available for the purpose of the integration into automatic test systems.
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Power Module And Device Testing System
Dynamic and static test system Meet the power IPM module dynamic and static electrical parameters test
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OLED Lifetime Test System
58131
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Flying Probe Testers
Flying probe test systems require no test fixturing, have few restrictions on board access, and can test boards with virtually unlimited number of nets. These systems also allow developers to complete test programs in a short time.
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Battery Test Software
Landt Battery Test Systems use different programs for data acquiring and data process. The acquiring software comes with a very user-friendly interface, which allows new users to operate with minimal training. Data process software shows different kinds of plots (Voltage vs. Capacity, Capacity vs. Cycle Number, Efficiency, etc.), which can be easily exported.
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Test Management Software
ActivATE™
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Hydraulic Data Logger
HPM7000
The HPM7000 series, is a highly versatile portable hydraulic data logger and the evolution of the HPM6000. It is ideal for diagnostic testing of hydraulic systems, use on hydraulic test benches, pre-dispatch inspection or for Research and Development (R&D). There are a variety of different data logging modes with the ability to data log up to 16 million measured values per test at a variable interval from 1 ms, with a total possible storage size of 12GB (approx. 250 measurements).
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PXI 2.5W Programmable Resistor Module, 8-Channel, 1Ω to 31.5Ω
40-251-010
The 40-251-010 is a programmable resistor module with 8 channels which can be set between 1Ω and 31.5Ω with 0.125Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. Each channel is able to simulate short or open circuit conditions that can be experienced in a system caused by faulty wiring or sensors.
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Bypass Diode Thermal Test System
King Design Industrial Co., Ltd.
* Power: the heating board control panel uses 220V single-phase power.* Power consumption: 1.0KVA, 1000W(Max)* Volt: 220VAC* Current: 4.5A* Heating board: one controller per board* Power rate: room temperature raise to 75°C± 5°C within one minute.* Heating board dimension: 500mm x 1,000mm* 6-sheet electrical heating boards test: used to test the 2,200mm x 2,600mm module. It can be customer-designed.* The length of board power cable and thermal sensor cable shall exceed 3,000mm.* To get uniform heating effect, the electrical board is sandwiched by 2mm aluminum sheets at both sides of board.
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PXI 40Amp 14Volt 2xSPST Automotive Relay
40-180-001
Models 40-180/181 are High Power Relay Modules available with 2 SPST, 4 SPST or 2 SPDT contacts. They are capable of switching inductive/capacitive loads up to 40A at 14VDC or 20A at 28VDCThe 40-180/181 High Power Relay Modules are suitable for switching heavy loads or for slaving large external relays, contactors and solenoids. In particular these relay modules are designed for automotive test applications requiring the switching of D.C. voltage at high current. The 28V version is suitable for truck system test applications.
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Hydrostatic Testers
Hydraulic Technology Inc. has been manufacturing hydrostatic test equipment to the U.S. Military, aerospace and industrial sectors for over 30 years. These hydrostatic test systems are used for both high pressure proof testing and burst hydrostatic testing. By simply connecting one of our hydrostatic test systems to a shop air supply, safe high pressure testing can be accomplished with hydrostatic test output pressures available up to 15,000 psi. Among other specifications, our hydrostatic testers meet the requirements of MIL-T-25456, A-A-52687 AND PD02LEEE07. In addition to U.S. Military stock listed hydrostatic testers, we manufacture both standard and custom hose proof test stands, portable hydrostatic testers, hydrostatic test chambers and ancillary equipment to fit individual customers’ needs as required. We can typically ship standard units within 24-72 hours, sooner if required.
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HPx-310 Radar Signal Output Card
The HPx-310 Radar Signal Output card is a replacement for the HPx-300, form, fit, and function. It generates representative radar signals for system testing, simulation, training or radar video streaming. Under software control, the card generates radar video, trigger and azimuth signals similar to those generated by real radars.
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Bench top Dielectric Withstand tester
HYPOT III
RS-232 Interface available for automated controlPatented SmartGFI® functionPatented CAL-ALERT® functionComes complete with a test box for products terminated in a line cordPatented VERI-CHEK® functionStorage of up to 10 setups with 3 steps per setupBuilt-in security settingsDigitally controlled arc detection systemNo load setup of trip current and output voltageElectronic ramping (up & down)Built-in adjustable continuity testInterconnection to HYAMP® III to form complete test system
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LT-300A Aging-Life Test System For LED Luminaires
Hangzhou Everfine Photo-E-Info Co., LTD
LT-300A system is widely used for normal /accelerated aging, lumen maintenance measuring, chromaticity shift measuring, lifetime evaluation and temperature characteristic testing for LED luminaires, arrays, and modules. The extrapolation of lifetime by programmable models is also available to estimate the lifetime of LED luminaires.
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Test Systems
Computer Gesteuerte Systeme GmbH
The system is pin and software compatible to the larger test systems LB302 / 303. Due to the fewer needed I/Os, the tester features the compact G6 receiver (Virginia Panel Cooperation) compared to the larger G12 of the other tester versions. The LB301 is equipped with a 2kW power supply and can control one load box.
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Automatic Transformer Test System
TH2840AX
Changzhou Tonghui Electronic Co., Ltd.
■ The test speed is as high as 1000 times/s (>10kHz), without relay action time ■ Test level up to 20Vrms ■ The bias voltage is built-in ±40V/±100mA/2A ■ Up to 288 test pins (only TH2840NX) ■ Industry-friendly user experience: Linux bottom layer, built-in help file
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PXI Very High Density Versatile 2 A Multiplexer
40-612B-002
The 40-612B (PXI) and 42-612B (PXIe) Very High Density Versatile Multiplexer module features a wide range of software selectable switching configurations. It is especially useful where a number of high density multiplexers are required with the option of easily altering the channel count as a test system evolves.
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Services
Being a system developer as well as a system integrator we offer an entire service portfolio. Wherever you have a problem - we have the specialist in our team. We gladly make a feasibility study for a new product, write test specifications or later test applications.Our colleagues are happy to check or calibrate your test system, expand or optimize your test specification, manage the move to another site or train new personnel. In case you plan to build a new factory, our experience might be helpful tp plan of the new test field.
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Wafer Probe Test System
STI3000
The STI3000 is a wafer-level MEMS and mixed signal ASIC probe test system that combines several functional STI test equipment blocks for testing gyros, accelerometers, pressure sensors, microphones, resonators, and mixed signal ASICs.
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GPIB-ENET/1000, Ethernet GPIB Instrument Control Device
781630-07
Ethernet GPIB Instrument Control Device - The GPIB‑ENET/1000 is an IEEE 488 controller device for computers with an Ethernet port. You can use this device to share a single GPIB system among many networked users or to control several test systems from a single networked host. The GPIB‑ENET/1000 features a password-protected web interface for easy configuration. It can also control IEEE 488 devices from anywhere on an Ethernet‑based (LAN) TCP/IP network (Gigabit, 100BASE‑TX, 10BASE‑T). Each device interfaces to and shares up to 14 GPIB devices from several network hosts, and you can control up to 100 GPIB‑ENET/1000 interfaces with a single computer. The device includes a license for the NI‑488.2 driver software, providing maximum reliability for connecting to third-party instruments with GPIB.
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Multi Channel Optical Fibre Verification
The multi-channel optical fibre test system is used in the development and qualification of single mode optical fibres. The fibres are exposed to environmental influences in a climatic chamber in order to analyse the data on insertion loss and reflection. In addition, the current temperature in the climatic chamber is documented. Insertion loss measurement is performed with the help of an optical power meter, laser sources and optical switches. An Optical Time Domain Reflectometer (OTDR) from Exfo is used for the reflection measurements. The system was designed for the simultaneous characterization of 15 sample fibres and one reference fibre.
