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Automated Wafer Prober for Magnetic Devices and Sensors
Hprobe design and fabricate turnkey automated testing equipment (ATE) for electrical characterization and testing of integrated circuits under magnetic field such as MRAM (Magnetic Random Access Memory) and sensors. In each phase of the technology and product development as well as during mass manufacturing, a dedicated magnetic tester is available.
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Rugged Blade Processor W/ Dual Xeon E5
ATC126
The ATC126 is a high performance ATCA processor blade featuring dual 14-core Intel® Xeon® processor (E5-2658 v4, E5-2680 v4, E5-2648L, 2618L, 2620 or 2630 v4), with up to eight banks of 256 GB DDR4 memory with ECC. Versatile connectivity includes two 10/40GbE Fabric Interfaces, dual GbE Base Interfaces, dual front panel GbE egress Ports, front panel dual RS-232 and USB 3.0/2.0 Ports and front panel DVI-I connector.
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Metrology Solutions for Semiconductors
Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition. In applications ranging from C-S thin films materials characterization to wafer substrate analysis and defect detection, Bruker’s systems provide simulation analysis and fit. HRXRD, XRR, WA-XRD, and XRDI measurement types are fully supported, enabling researchers, production engineers, and process developers unparalleled capabilities. Whether you are a semi and C-S fabricator, R&D center or academy, or an industry materials research facility, Bruker has a specifically designed solution for your metrology needs.
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Flat-plate Thermal Conductivity Tester
TESTEX Testing Equipment Systems Ltd.
Flat-plate Thermal Conductivity Tester, to determine the thermal conductivity of various fabrics, quilting products, and other heat insulation materials.
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Schildknecht Flexing Tester
TESTEX Testing Equipment Systems Ltd.
Schildknecht Flexing Tester is designed to determine the resistance of coated fabrics to damage by flexing due to oscillation at 500 times per minute. Schildknecht Flexing Tester complies with ISO 7854, BS 3424, etc.
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AdvancedTCA® Carrier Blade with 4x Intel® Xeon® Processor E3-1515M v5 COM Express Modules and FM10420 Multi-Host Controller
aTCA-9400
- 4x COM Express Type 6 module slots supporting ADLINK Express-SL/SLE with Xeon® Processor E3-1515M v5 (45W)- Integrated Intel® GT4e GPU providing high-performance H.264/H.265 transcoding- COMe modules connected by Intel® Ethernet Multi-host Controller FM10420, supporting up to 25Gbps Ethernet bandwidth between CPUs- 2x 10G SFP+, 4x 1G RJ-45 Ethernet on front panel- 2x 10G to Fabric channels, 2x1G to Base channels
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4-Channel 200 MHz, 16-bit A/D with Virtex-6 FPGA - 3U VPX
Model 52660
- Complete radar and software radio interface solution- Supports Xilinx Virtex-6 LXT and SXT FPGAs- Supports gigabit serial fabrics including PCI Express, Serial RapidIO and Xilinx Aurora- Four 200 MHz 16-bit A/Ds- Up to 2 GB of DDR3 SDRAM or 32 MB of QDRII+ SRAM- Sample clock synchronization to an external system reference- LVPECL clock/sync bus for multiboard synchronization- Optional LVDS connections to the Virtex-6 FPGA for custom I/O- 3U VPX form factors provides a compact, rugged platform- Compatible with several VITA standards including: VITA-46, VITA-48 AND VITA-65 (OpenVPX™ System Specification)- Ruggedized and conduction-cooled versions available
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cPSB 2.16 6 slot - 5 w/cPCI, 1 FS
107PS11606-0157R
CompactPCI CPSB 2.16 6U 6 slot, 5 w/cPCI, 1 Fabric, fully compliant to the PICMG 2.16 Packet Switching Backplane specification.
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Thin Film Circuits
SemiGen offers build-to-print services for a wide range of materials and metallization schemes. We use our processing technology to fabricate circuits on As-Fired Alumina, Polished Alumina, Superstrate TPS, Aluminum Nitride, Beryllium Oxide, Fused Silica/Quartz, Sapphire, and Hi-K Dielectrics.
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Software Module with a Virtual Gage for Real-Time Inspection and Assembly
Verisurf Build
Verisurf BUILD is the industry-leading tool for real-time model-based inspection, tool fabrication, and computer-aided assembly.Inspect position and profile, set details and fabricate tools, jigs, and fixtures faster and at lower cost than any other process or software.Evolved and perfected from a large installed base at today’s modern aerospace, automotive, and industrial tooling manufacturers.
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Nonwoven Thickness Gauge
DRK141P-II
Shandong Drick Instruments Co., Ltd.
It is used to determine the thickness of bulky non-woven fabrics with a thickness of ≤ 20mm and the thickness of large-compression non-woven fabrics.
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Chassis 8 Slot
PXIe 4U/ 42HP
As PXI has evolved into high-speed serial fabric technology, so has the Hartmann Electronic product line with the addition of its PXIe solutions. More power, more bandwidth, more functionality.
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Tensile Test Chambers
Tensile strength tests are an integral part of material development. Materials that require this test include various metals, plastics, paper, fabrics, fibers, composites, and films for many industries. ESPEC tensile test chambers are designed to work with any tension apparatus and can be customized to meet unique application needs.
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Ceramic Process Carrier Pallets
Ceramic engineering specializing in Silicon Carbide, Boron Carbide, Alumina, Zirconia and Lead Zirconate Titanate (PZT) based ceramics, composites and thin films for High Strength, high temperature, semiconductive ceramic designed for use in wafer fabrication or hybrid circuits in vapor deposite ovens. Test Electronics will precision drill and customize pallets for your circuit board. Click on the Quote tab on the left then click on the Carrier Pallets tab to get an instant quotation on your process carrier pallets.
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Ball-bursting Strength Tester
TF003
TESTEX Testing Equipment Systems Ltd.
Ball-bursting Strength Tester, used for testing the ball-bursting strength and expansion rate of cotton fabrics, elastic fabrics, sock and glove products.
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Multi-purpose Textile Flammability Tester
TF319
TESTEX Testing Equipment Systems Ltd.
Its vertical test frame with changeable specimen holders and burner covers offers a wide range of vertical oriented textile fabrics. This machine meet almost all the BS, EN, ISO and other similar standards which defined a test method that a vertical oriented fabric subject to a small flame.
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FEA and Strain Gauge Testing
Circuit Check began Strain Gauge Testing in 1999 when BGA/SMT technology started replacing PTH components, reducing strain levels was a reactive post fixture fabrication process. We quickly recognized that the “reactionary” process was neither efficient nor were we capable on knowing the lowest achievable strain levels. Our engineering team came up with visual tools utilized during design to easily identify areas of excessive probe force, though still not enough data was generated to identify the lowest possible strain. Finite Element Analysis software models the PCBA and test fixture and applies the pressures from test probes and board supports and indicates the micro strain level applied to the PCBA. Using the FEA software during our design process allows our engineers to modify fixture designs to attain the lowest possible micro strain before fabrication begins.
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Multi-purpose Textile Flammability Tester
TESTEX Testing Equipment Systems Ltd.
Multi-purpose Textile Flammability Tester, to determine the flammability resistance of textile fabrics and for the flammability test of toys and toy material. Multi-purpose Textile Flammability Tester complies with ISO 6940 (1995&2004) / 6941 (1995&2003), ISO 15025, EN71-2, etc. Please contact us for more information about flammability test method.
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Heating Resistance Tester
TF329
TESTEX Testing Equipment Systems Ltd.
Heating Protection Tester, to determine the heating resistance and insulation performance of protective clothing and fabrics when exposed to the heat source of radiation and convection The heat source and radiator can be manually adjusted, easy to operate equipped with the heat calibration calibrator ensures the accuracy of the test results
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Controlled Environment Chamber
STME-CEC
Statclean Technology (S) Pte Ltd
The Controlled Environment Chamber is made from 0.25" clear and white acrylic with internal volume of 9 cu. ft. The equipment is designed to provide a controlled environment for conditioning, research, testing, fabrication and storage.
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2-Ch 500 MHz A/D with DDC & 2-Ch 800 MHz D/A with DUC, Kintex UltraScale - XMC
Model 71851
- Jade Xilinx Kintex UltraScale FPGA Products and Navigator Design Suite Software Video- Jade Xilinx Kintex UltraScale FPGA Family Brochure- Complete radar and software radio interface solution- Supports Xilinx Kintex Ultrascale FPGAs- Supports VITA-49.2 VITA Radio Transport standard- Two 500 MHz 12-bit A/Ds- Two multiband DDCs (digital downconverters)- One DUC (digital upconverter)- Two 800 MHz 16-bit D/As- 5 GB of DDR4 SDRAM- Sample clock synchronization to an external system reference- LVPECL clock/sync bus for multimodule synchronization- PCI Express (Gen. 1, 2 & 3) interface up to x8- VITA 42.0 XMC compatible with switched fabric interfaces- Optional LVDS and gigabit serial connections to the Kintex - Ultrascale FPGA for custom I/O- Optional 400 MHz 14-bit A/Ds- Ruggedized and conduction-cooled versions available- Synchronize up to eight modules with Model 7893 System Synchronization and Distribution Amplifier - PCIe
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Hydrostatic Head Tester
TF163
TESTEX Testing Equipment Systems Ltd.
Hydrostatic Head Tester, used for determining the resistance of fabrics (canvas, coated fabrics, cover cloth, rainproof clothing fabrics, and geotextile materials) and films to water penetration under pressure while firmly clamped in the test rig of standard area.
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20 x GB ETH Switch
SL4-TUBA
SL4-TUBA is a peripheral slot card for CompactPCI® Serial systems. The board is equipped with a modular Gigabit Ethernet switch fabric up to 20 ports.
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Uncooled Microbolometer
384 x 288 FPA
Drawing on its extensive experience in microbolometric detector design, fabrication, and characterization, as well as in detector-to-ROIC (Read-Out Integrated Circuit) monolithic integration, INO is proud to offer its 384 x 288 pixel microbolometer FPA (Focal Plane Array) in short series.
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40 Gigabit Ethernet AdvancedTCA® Fabric Interface Switch Blade
aTCA-3710
The aTCA-3710 is a high performance, high bandwidth, 40G Fabric switch blade for AdvancedTCA® platforms. This product is ideal for bandwidth intensive telecom applications such as wireless access controller, DPI/security network, IPTV, IP multimedia subsystem, RNC/BSC, broadband access/bearer network, data center, and LTE/4G network applications. The aTCA-3710 provides 40GbE hub-to-node connectivity and integrated switch silicon that supports load balancing, priority queues, packet classification, and flow control to enable strict bandwidth management for implemented applications.
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Material Testing Software
MS100
Sinowon Innovation Metrology Manufacture Ltd.
MS100 is professional software for material testing in windows system, it is able to conduct tensile, compression, bending, shearing, bonding strength, peeling, tearing and other tests for rubber, plastic, leather, metal, nylon line, fabric, paper, aviation, packaging, construction, petrifaction, electrician, vehicle and other materials.
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PXIe Chassis: 10-slot, 3U, 24 GB/s, Gen 3
M9010A
The M9010A PXIe 10-slot Gen 3 chassis delivers flexibility, compatibility, and performance in a smaller form-factor ideal for bench-top applications. With 8 PXIe hybrid slots, it gives the system designer flexibility to mix and match the number and location of PXIe and hybrid-compatible modules. The maximum performance, PCIe switch fabric can operate up to Gen 3 providing up to 24 GB/s of system data bandwidth. The new cooling design provides exceptional per-slot cooling while at the same time producing much less fan noise than the typical PXI chassis. It is also designed for easy maintenance and has features for combining multiple chassis together or integrating with other non-PXI instrumentation.
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Thickness Measurement
Thickness Tester is a high precision mechanical contact method thickness tester, which can be used to thickness measurement of films, sheeting, paper, corrugated paperboard, textiles, non-woven fabrics, and solid insulation materials, etc.
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Spray Rating Tester
TF160
TESTEX Testing Equipment Systems Ltd.
Spray Rating Tester, to determine the surface wetting resistance of fabrics, which may or may not have been given a water-resistant or water-repellent finish.
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L-Band RF Tuner and 2-Channel 200 MHz A/D with Virtex-6 FPGA - XMC
Model 71690
- Accepts RF Signals from 925 MHz to 2175 MHz- Programmable LNA boosts LNB (low noise block) antenna signal - levels with up to 60 dB gain- Programmable analog downconverter to I + Q baseband signals - 4 to 40 MHz bandwidth- Two 200 MHz 16-bit A/Ds digitize the I + Q signals synchronously- Supports Xilinx Virtex-6 LXT and SXT FPGA- 2 GB DDR3 SDRAM or 32 MB of QDRII+ SRAM- Sample clock synchronization to an external system reference- PCI Express (Gen. 1 & 2) interface, up to x8- Clock/sync bus for multimodule synchronization- VITA 42.0 XMC compatible with switched fabric interfaces- Optional user-configurable gigabit serial interface- Optional LVDS connections to the Virtex-6 FPGA for custom I/O- Synchronize up to eight modules with Model 7893 System Synchronization and Distribution Amplifier - PCIe





























