Probing
See Also: Probers, Probing Stations, Nano Probes
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Product
EPA-3 General Purpose Probe
General Purpose Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Thermocouple Thermometer 1 Input
HD2108.1
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Thermocouple thermometer with one input for K, J, T, R, N, S, B, E type probes with miniature connector.
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Product
Rakes and Probes
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AEI offers industry leading aerothermal rake and probe design and manufacuring. Aerodyn's unique combination of extensive in-house capabilities and close-knit structure allows challenging and time pressured rake and probe jobs to be handled. AEI welcomes anything from simple make-to-print jobs to elaborate design/fabricate/proof test projects.
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Product
Test Probe Leads, With 19-mm Tips And 4-mm Tips
U1169A
Accessory Kit
The U1169A consists of one pair (red and black) of insulated test leads, one pair of test probes with 19-mm tips and another pair of test probes with 4-mm tips. Recommended for use with Keysight handheld digital multimeters. Rated at CAT III 1000V, CAT IV 600V, 15A.
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Product
Current Probe
PA-699
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*High sensitivity: 1mA, High frequency: 1.5MHz. They are all 10 multiple calculation. Calculation is not making mistakes.*Max measuring current: +/- 40A DC / 80 Ap-p*Max sensitivity: ≧1mA*Bandwidth: DC ~ 1.5 MHz*Rising Time: 0.23 uS*Overload indicator*1V/A, 0.1V/A 2 ranges selectors*Input power switching (priority circuit) and battery available*Dispatching design, high durability
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Product
Test Fingers & Probes
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Test Fingers and Probes are used in most standards to check accessibility to moving parts or hazardous live parts. They comes in many forms, such as test fingers, test rods, test balls etc.
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Product
Humidity and Temperature Transmitter
T3111Ex
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Relative humidity, temperature sensors at probe on the cable. Measured values are also converted to other humidity interpretation: dew point temperature, absolute humidity, specific humidity, mixing ratio, specific enthalpy.
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Product
Super 3.90 (111.00) - 16.00 (454.00) High Performance Lead Free Probe
LFRE-25I-16
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Universal Radiometer
Rm-3700
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The Rm-3700 Single Channel Universal Radiometer, when used with the correct probe, can measure cw and average power (in Watts), as well as the energy (in Joules) of individual pulses up to 2 kHz, over a wide range of intensities and wavelengths. A high-speed Rs-232 computer interface, full statistical analysis of pulse sets, battery/AC power, and audible tuning are just some of the standard features. This tremendous versatility makes it the ideal instrument for research labs, universities, hospitals, and other facilities with multiple light sources and applications.
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Product
Passive Probe
PP011-1
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Passive probes are the standard probe provided with most oscilloscopes. Typical passive probes provide a 10:1 attenuation and feature a high input resistance of 10 MΩ. This high input resistance means that passive probes are the ideal tool for low frequency signals since circuit loading at these frequencies is minimized. Passive probes are designed to handle voltages of at least 400V, some as high as 600V. Teledyne LeCroy passive probes feature an attenuation sense pin which tells the oscilloscope to scale the waveforms automatically requiring no user input.Each passive probe is recommended for a certain oscilloscope, using the right passive probe with the right oscilloscope means that the probe will be properly compensated across the entire bandwidth. Using probes with a different oscilloscope will only let you compensate for low frequencies.
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Product
Infrared Thermometer
DL7105
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The DL7105 Infrared thermometer offers rapid and accurate temperature measurements.This is the ideal tool for measuring those hard to reach surfaces, moving parts and where it is not practical to use a surface contact probe.
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Product
Probes With Industrial Heads
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Used in industrial applications for process temperature measurement, these probes come in a variety of protection head styles for easy connection wiring to your extension cable
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Product
Beam Probes
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The CO2 Laser Beam Probes are hand-held plates designed to simplify the alignment of IR optical systems. They display the laser beam as a dark image on a fluorescent background using the same UV-excited, thermal-sensitive surfaces developed for Macken Instruments'' Thermal Image Plates.
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Product
Accessibility Test Probes
TF-24 Series
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Accessibility Test Probes are designed to perform tests specified in many standards to determine compliance with safety requirements.
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Product
Ultra High 1.77 (50.00) - 10.00 (283.00) High Performance Lead Free Probe
LFRE-25T-10
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Supported Test Systems
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TTCI is a leading solutions provider of application development for test systems from Seica, Keysight, Teradyne, Digitaltest, and XJTAG. We offer a wide variety of testers and test solutions to meet your needs. Our Seica Pilot and Digitaltest Condor flying probe systems can handle all of your low- to mid-volume production, prototypes, and PC boards with accessibility issues. The Keysight 3070 and Teradyne TestStation can address your larger production runs and fixture requirements. In addition, we can also address your functional and boundary scan needs.
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Product
SPP-25 Solar Panel Probe
SPP-25
General Purpose Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.0
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Product
Standard 0.79 (23.40) - 1.75 (49.60) General Purpose Probe
HPA-40A
General Purpose Probe
Current Rating (Amps): 2Average Probe Resistance (mOhm): 35Test Center (mil): 39Test Center (mm): 1.00Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 660Overall Length (mm): 16.76
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Product
Amp Clamp
PPDCM80
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The Power Probe Digital Clamp Meter is an 80amp, auto-ranging clamp meter designed specifically for the automotive technician. This meter is rated CAT III 600V and can measure Volts, Amps, Ohms, Frequency and Temperature, necessary for automotive electrical testing. This meter’s diagnostic applications include (but are not limited to) Parasitic Draw, Crank Current testing and HVAC Temperature testing.
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Product
VelociCalc Air Velocity Meter
9545-A
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The VelociCalc® Air Velocity Meter 9545-A is like having multiple meters for the price of one. This meter simultaneously measures and data logs several ventilation parameters using a single probe with multiple sensors.
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Product
Needle Microprobe
MT-29/3HT
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Fast-response 29 gauge needle probe, (needle length is 3 cm) for instant readings in tissue, semisolids, liquids. Also for very small specimens, powders and materials. Needle tip is sealed to ensure only stainless steel contacts specimen. Max. temp. 200°C. 5 ft. lead. Smallest microprobes give fastest reading. Short probes are easier to insert and last longer. Type #'s indicate needle gauge and needle length in cm.
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Product
Open Source Logic Analyzer
Logic Pirate
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8 channels 256,000 Samples recording size 20 MHz sampling speed, can potentially be overclocked to 60 MHz No compromise on sample size when combining different speeds or number of channels Simple configurable edge detection triggers on all inputs (simple OR trigger) Configurable ratio of samples from before and after the trigger (rolling sample buffer) 5 V tolerant inputs (LOW-level voltage < 0.8 V, HIGH-level voltage > 2.0 V) About 500 kB/s transfer speed to the PC (256 kSamples take about 0.5 seconds) Data capturing can be stopped from the host software anytime Cross platform host software for Windows, OS X, and Linux DIY-friendly 0603 parts and SOIC packages used on a 2-layer board On board 3.3 V regulator can supply up to 400 mA to an external circuit Tiny 3cm x 3cm PCB Firmware updates via built-in USB bootloader Probe cables and acrylic case available from Seeed Studio Open source PCB (EAGLE) and firmware files
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Product
Current Probe
PA-677
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*Max. 70ADC/140Ap-p*Sensitivity: ≧2mA*Bandwidth: DC~1MHz*Rise Time: 0.35μS*Over Range Function*50mV/A, 500mV/A Range*Adaptor/Battery Input*Separating Design,Convenient Durable
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Product
General Purpose Probe
HT-2
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HT-2 ''Workhorse'' General Purpose Probe - designed for temperature measurement of liquids, gases and semi-solids. Plastic handle with straight 9'' stainless shaft. Not good for surface temperatures. Maximum temperature 400°C, Time constant 0.5 Seconds. 5 foot lead. Not isolated.
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Product
Premium Wireless Vacuum Gauge Probe for use with HUB8 or HUB6
WVG2
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UEi Test & Measurement Instruments
Premium Wireless Vacuum Gauge Probe
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Product
Semiconductor Metrology Systems
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MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
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Product
Standard 1.32 (37.40) - 4.50 (128.00) Battery Probe
CP-2TB-6
Battery Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 50Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 69Full Travel (mm): 1.75Recommended Travel (mil): 59Recommended Travel (mm): 1.50Overall Length (mil): 236Overall Length (mm): 6.00Overall Length Remark: Overall length does not include tail.Recommended Drill Size: #53 or 1.51 mmRec. Mounting Hole Size (mil): 61Rec. Mounting Hole Size (mm): 1.55
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Product
Flue Oxygen Analyzer
GNL-IN191
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Shanghai ChangAi Electronic Science & Technology Co.,Ltd
It is combined by gauge outfit and probe, the gauge outfit is based on microprocessor, the probe adopts frequency conversion oxygen analyzer as the measuring unit. The analyzer measure most accurate in 0~25.00% nitrogen- oxygen mixed gases. - See more at: http://en.ci-ele.com/79b7fcd3-aee7-30a4-9cf8-76748ef33dcc/9b6425da-e68d-50a8-067e-40b84f9bd2f8.shtml#sthash.Vh7PRsZP.dpuf
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Product
30A, 50 MHz High Sensitivity Current Probe - AC/DC, 30 A rms, 50 A Peak Pulse, 1.5 meter cable
CP030B
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Teledyne LeCroy current probes are available in a variety of models for a wide range of applications. The full range of Teledyne LeCroy current probes includes models with bandwidths up to 100 MHz, peak currents up to 700 A and sensitivities to 1 mA/div. Teledyne LeCroy current probes are often used in applications such as the design and test of switching power supplies, motor drives, electric vehicles, and uninterruptible power supplies.
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Product
High-Frequency Probe, 300 kHz to 3 GHz
85024A
ICT/FCT Probe
85024A high-frequency probe makes it easy to perform in-circuit measurements. An input capacitance of only 0.7 pF shunted by 1 megohm of resistance permits high frequency probing without adversely loading the circuit under test. Excellent frequency response and unity gain guarantee high accuracy in swept measurements with this probe. High probe sensitivity and low distortion levels allow measurements to be made while taking advantage of the full dynamic range of RF analyzers.





























