Focused Ion Beam
A scanning electron microscope with the electron source replaced by a gallium ion gun. Used for fault analysis and modification of modern microchips and semiconductor devices. (http://www.empa.ch)
See Also: Beam
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Product
Focused Ion Beam Scanning Electron Microscopes
FIB-SEMs
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Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB).
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Product
Microscopy Software/Hardware
ZEISS Atlas 5
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Atlas 5 is your powerful hardware and software package that extends the capacity of your ZEISS scanning electron microscopes (SEM) and ZEISS focused ion beam SEMs (FIB-SEM). Use its efficient navigation and correlation of images from any source, e.g. light- and X-ray microscopes. Take full advantage of high throughput and automated large area imaging. Unique workflows help you to gain a deeper understanding of your sample.
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Sputtering Systems
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Known for precision and cleanliness, Veeco Ion Beam Sputtering (IBS) systems are ideal when engineers need tight control over film thickness, composition, and optical performance. Using a focused ion beam, IBS dislodges atoms from a target, depositing them onto a surface in smooth, ultra-uniform layers.
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Product
Etch System
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When it comes to clean etches, Veeco’s Ion Beam Etch (IBE) systems deliver with sharp control and minimal disruption. Using a focused argon ion beam, this subtractive technique etches nanoscale features with precision, making it a go-to for pattern transfer, layer removal, and surface refinement where edge definition matters most.
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Product
TEM Lamella Preparation And Volume Imaging Under Cryogenic Conditions
ZEISS Correlative Cryo Workflow
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ZEISS Correlative Cryo Workflow connects widefield, laser scanning, and focused ion beam scanning electron microscopy in a seamless and easy-to-use procedure. The solution provides hardware and software optimized for the needs of correlative cryogenic workflows, from localization of fluorescent macromolecules to high-contrast volume imaging and on-grid lamella thinning for cryo electron tomography.
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Product
Beam Bender
10707A
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The Keysight 10707A bends the incoming beam at a 90-degree angle and is designed for beam diameters of 6 mm or less . Includes a housing for standard mounting.
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Product
Beam Bender BK7, Fixed Horizontal-Bend Mount
E1834M
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The E1834M is a beam bender that bends the incoming beam at a 90-degree angle and is designed for beam diameters of 9 mm or less. This referenced optics uses high performance horizontal mount to deliver laser beam throughout a measurement system. The 8 flexure feet are designed for stable beam pointing.
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Product
50% Beam Splitter
10725A
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The 10725A 50% beam splitter, designed for beam diameters of 9 mm or less, divides the beam into equal parts. It transmits one part straight through, and bends the other part at a 90-degree angle. This optic is without housing and requires a user-supplied mount.
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Product
Beam Bender BK7, Fixed Vertical-Bend Mount
E1834Z
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The E1834Z is a beam bender that bends the incoming beam at a 90-degree angle and is designed for beam diameters of 9 mm or less. This referenced optics uses high performance vertical mount to deliver laser beam throughout a measurement system. The 8 flexure feet are designed for stable beam pointing.
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Product
Beam Bender
10726A
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The Keysight 10726A bends the incoming beam at a 90-degree angle and is designed for beam diameters of 9 mm or less. This bare optic requires a user-supplied mount.
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Product
15% Beam Splitter
10725C
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The 10725C 15% beam splitter, designed for beam diameters of 9 mm or less, reflects 15% of the total incoming laser beam and transmits 85% straight through. This optic is without housing and requires a user-supplied mount.
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Product
33% Beam Splitter - BK7, fixed horizontal-bend mount
E1834E
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The E1834E is a 33% beam splitter in a high performance horizontal mount that offer the high pointing stability for Keysight laser interferometer measurement system. The 8 flexure feet are designed for stable beam pointing.
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Product
50% Beam Splitter BK7, Fixed Horizontal-Bend Mount
E1834G
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The E1834G is a 50% beam splitter in a high performance horizontal mount that offer the high pointing stability for Keysight laser interferometer measurement system. The 8 flexure feet are designed for stable beam pointing.
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Product
67% Beam Splitter BK7, Fixed Horizontal-Bend Mount
E1834J
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The E1834J is a 67% beam splitter in a high performance horizontal mount that offer the high pointing stability for Keysight laser interferometer measurement system. The 8 flexure feet are designed for stable beam pointing.
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Product
33% Beam Splitter
10700A
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The Keysight 10700A beam splitter is designed for beam diameters of 6 mm or less. It reflects one third of the total incoming laser beam, and transmits two thirds. It includes a housing for standard mounting.
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Product
Ion Beam Milling Systems
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When material specimen surfaces are prepared for SEM or incident light microscopy, the specimen usually undergoes multiple processes until the layer or surface to be analyzed is machined with precision. Leica Microsystems’ workflow solutions for solid state technology cover all steps required for demanding high-quality sample preparation.
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Product
Ion Chromatography
IC Software- MagIC Net
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MagIC Net is the software to control your Metrohm ion chromatograph and any modules for liquid handling, sample preparation, and automation connected. Intuitive operation, comprehensive system monitoring, and straightforward data management make MagIC Net, what it is: the preferred software for state-of-the art ion chromatography.
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Product
Ion Chromatograph Systems
HIC-ESP
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The HIC-ESP is a new anion suppressor ion chromatograph with built-in electrodialytic suppressor, boasting the same low carryover and excellent injection precision characteristic of Shimadzu HPLCs to bring you highly-reliable results. The newly developed anion suppressor prevents peak spreading and achieves high sensitivity, providing stable functionality even over long periods of use. The HIC-ESP is suitable for applications in a wide range of fields including environmental science, medicine, chemistry and food science.
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Technology that Focuses on Measurable Safety
Foretify™
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A Measurable Scenario Description Language (M-SDL) used to describe both scenarios and coverage goals at a very high level (soon to be made open) to enable a ‘measurable safety’ ecosystem
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Product
Ion Source Packages
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RBD Instruments provides a wide range of sputter ion sources used for sample cleaning, and depth profiling. No matter what the application, RBD provides the highest performance at the lowest price.
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Product
50% Beam Splitter
10701A
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The Keysight 10701A beam splitter is designed for beam diameters of 6 mm or less. It reflects one half of the total incoming laser beam, and transmits one half. The Keysight 10701A optic includes a housing for standard mounting.
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Product
Ion & Electron Detection
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Photonis is the global leader in the development and manufacturing of detectors and optical components to detect ions and electrons. These detectors and components have been designed for a wide range of scientific instruments used in space and research projects but also in cells and material analysis in lifescience or non destructive testing.
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ION Meters
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GAOTek offers a wide selection of ion meters for precise calculation of number of ions in various kinds of solutions. These devices determine whether the solutions have positive or negative ion charge. A solution of known concentration is accurately prepared, and its mV value is plotted on a graph of mV vs. concentration to determine the corresponding unknown concentration. These devices are durable and easy to use portable field instruments.
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Gridless End-Hall Ion Sources
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Veeco's Gridless End Hall Ion Sources provide high beam current for vacuum coating processes.
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Waterproof pH/mV/Ion Meter
CyberScan pH 620
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Measures pH and Ion with up to 0.001 Resolution.Cal-Due Alarm Prevents Out-dated Calibrations, while Set-Point Alarms warns when readings are outside set-point limits.
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Beam Profiling System
BeamCheck
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BeamCheck is an integrated laser measurement system designed to measure critical laser beam parameters for laser-based additive manufacturing systems BeamCheck includes a CCD camera for spatial measurements and a NIST-traceable power sensor that will provide a complete analysis of the laser power density profile.
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Deep Reactive Ion Etch (DRIE
Syndion Product Family
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Deep silicon etch refers to plasma-based processes that remove silicon, creating features that can be many orders of magnitude larger than those in advanced transistors and memory cells.
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Beam Probes
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The CO2 Laser Beam Probes are hand-held plates designed to simplify the alignment of IR optical systems. They display the laser beam as a dark image on a fluorescent background using the same UV-excited, thermal-sensitive surfaces developed for Macken Instruments'' Thermal Image Plates.
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Benchtop Ion Meters
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Benchtop Ion Meters for Cl (chloride), F (fluoride), Na (sodium), Ca (calcium), Br, (bromide), NH4 (ammonium), NH3 (ammonia), Cn (cyanide), Ag (silver), K (potassium), S (sulphide), Pb (lead), I (iodide), Cu (copper), Cd (cadmium)
