Focused Ion Beam
A scanning electron microscope with the electron source replaced by a gallium ion gun. Used for fault analysis and modification of modern microchips and semiconductor devices. (http://www.empa.ch)
See Also: Beam
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Product
TEM Lamella Preparation And Volume Imaging Under Cryogenic Conditions
ZEISS Correlative Cryo Workflow
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ZEISS Correlative Cryo Workflow connects widefield, laser scanning, and focused ion beam scanning electron microscopy in a seamless and easy-to-use procedure. The solution provides hardware and software optimized for the needs of correlative cryogenic workflows, from localization of fluorescent macromolecules to high-contrast volume imaging and on-grid lamella thinning for cryo electron tomography.
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Microscopy Software/Hardware
ZEISS Atlas 5
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Atlas 5 is your powerful hardware and software package that extends the capacity of your ZEISS scanning electron microscopes (SEM) and ZEISS focused ion beam SEMs (FIB-SEM). Use its efficient navigation and correlation of images from any source, e.g. light- and X-ray microscopes. Take full advantage of high throughput and automated large area imaging. Unique workflows help you to gain a deeper understanding of your sample.
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Etch System
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When it comes to clean etches, Veeco’s Ion Beam Etch (IBE) systems deliver with sharp control and minimal disruption. Using a focused argon ion beam, this subtractive technique etches nanoscale features with precision, making it a go-to for pattern transfer, layer removal, and surface refinement where edge definition matters most.
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Focused Ion Beam Scanning Electron Microscopes
FIB-SEMs
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Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB).
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Sputtering Systems
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Known for precision and cleanliness, Veeco Ion Beam Sputtering (IBS) systems are ideal when engineers need tight control over film thickness, composition, and optical performance. Using a focused ion beam, IBS dislodges atoms from a target, depositing them onto a surface in smooth, ultra-uniform layers.
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Product
Beam Bender
10726A
Beam Bender
The Keysight 10726A bends the incoming beam at a 90-degree angle and is designed for beam diameters of 9 mm or less. This bare optic requires a user-supplied mount.
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Product
33% Beam Splitter
10700A
Beam Splitter
The Keysight 10700A beam splitter is designed for beam diameters of 6 mm or less. It reflects one third of the total incoming laser beam, and transmits two thirds. It includes a housing for standard mounting.
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Product
50% Beam Splitter
10701A
Beam Splitter
The Keysight 10701A beam splitter is designed for beam diameters of 6 mm or less. It reflects one half of the total incoming laser beam, and transmits one half. The Keysight 10701A optic includes a housing for standard mounting.
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Product
Beam Bender BK7, Fixed Horizontal-Bend Mount
E1834M
Beam Bender
The E1834M is a beam bender that bends the incoming beam at a 90-degree angle and is designed for beam diameters of 9 mm or less. This referenced optics uses high performance horizontal mount to deliver laser beam throughout a measurement system. The 8 flexure feet are designed for stable beam pointing.
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Product
Beam Bender
10707A
Beam Bender
The Keysight 10707A bends the incoming beam at a 90-degree angle and is designed for beam diameters of 6 mm or less . Includes a housing for standard mounting.
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Product
50% Beam Splitter BK7, Fixed Horizontal-Bend Mount
E1834G
Beam Splitter
The E1834G is a 50% beam splitter in a high performance horizontal mount that offer the high pointing stability for Keysight laser interferometer measurement system. The 8 flexure feet are designed for stable beam pointing.
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Product
Beam Bender BK7, Fixed Vertical-Bend Mount
E1834Z
Beam Bender
The E1834Z is a beam bender that bends the incoming beam at a 90-degree angle and is designed for beam diameters of 9 mm or less. This referenced optics uses high performance vertical mount to deliver laser beam throughout a measurement system. The 8 flexure feet are designed for stable beam pointing.
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Product
15% Beam Splitter
10725C
Beam Splitter
The 10725C 15% beam splitter, designed for beam diameters of 9 mm or less, reflects 15% of the total incoming laser beam and transmits 85% straight through. This optic is without housing and requires a user-supplied mount.
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Product
Ion Chromatography
IC Software- MagIC Net
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MagIC Net is the software to control your Metrohm ion chromatograph and any modules for liquid handling, sample preparation, and automation connected. Intuitive operation, comprehensive system monitoring, and straightforward data management make MagIC Net, what it is: the preferred software for state-of-the art ion chromatography.
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Product
67% Beam Splitter BK7, Fixed Horizontal-Bend Mount
E1834J
Beam Splitter
The E1834J is a 67% beam splitter in a high performance horizontal mount that offer the high pointing stability for Keysight laser interferometer measurement system. The 8 flexure feet are designed for stable beam pointing.
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Beam Diagnostics
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We offer camera-based devices with wavelength ranges from UV to IR. All are cameras are USB3.0, for the fastest data transfer rates.
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Beam Profiler
WinCamD series
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CW & Pulsed laser profiling. Wavelength Range: 190 nm- 15 m*. Resolution: 5.0 m*. Smallest Beam: 42 m*.
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Beam Probes
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The CO2 Laser Beam Probes are hand-held plates designed to simplify the alignment of IR optical systems. They display the laser beam as a dark image on a fluorescent background using the same UV-excited, thermal-sensitive surfaces developed for Macken Instruments'' Thermal Image Plates.
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Product
Beam Load Cell
EST-70
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Technopark Automation & Control
The EST-70 Shear Beam Load Cell is commonly used on platform, hopper weighing and pallet weighing applications. It is low cost and available in capacities from 500 kg to 2000 kg.
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Product
Single Beam Interferometer
10705A
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The Keysight 10705A Single Beam Interferometer, the smallest linear interferometer, is designed for making low mass or limited space single axis measurements. It is ideal for use in disk drive and other confined space applications. The single beam interferometer is called that because the outgoing and returning beams are superimposed on each other, giving the appearance of only one beam traveling between the interferometer and the retroreflector.
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Ion & Electron Detection
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Photonis is the global leader in the development and manufacturing of detectors and optical components to detect ions and electrons. These detectors and components have been designed for a wide range of scientific instruments used in space and research projects but also in cells and material analysis in lifescience or non destructive testing.
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*High Power Laser Beam Dumps & Low Power Beam Traps
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Laser beam dumps for high power laser processing, laser measurement and other applications, and low power beam traps
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*High-Power Beam Profiling
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Beam analysis of high-powered industrial lasers have always proved to be difficult because of the power levels (affecting the power densities) that these lasers operate at. Yet, the measurement of these lasers are critical for their success because of thermal effects which are more of a factor at these higher powers. These high-power performance measurement products have proven to be solutions for laser users who operate and maintain these high-powered lasers
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Product
33% Beam Splitter - BK7, fixed horizontal-bend mount
E1834E
Beam Splitter
The E1834E is a 33% beam splitter in a high performance horizontal mount that offer the high pointing stability for Keysight laser interferometer measurement system. The 8 flexure feet are designed for stable beam pointing.
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Product
High Power Beam Analysis
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The advantages of fiber lasers are their high power, mechanical stability and good beam quality; however beam quality and beam profile has to be periodically checked. In general, there are many difficulties in checking beam quality especially at the focal point, where densities will exceed 50KWatt per square cm. On one hand those energies are capable of melting and destroying most known materials, while on the other hand measuring a focused profile is the most significant measurement.
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Ion Sensor
984v2
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The Meech Model 984v2 Ion Sensor is an easy-to-use device for checking the performance of both AC and DC powered static eliminator bars.
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Ion Blower Guns
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For manual cleaning tasks, we combine the advantages of Eltex nozzle technology with the variability of a hand-held air gun. Thus, a wide variety of shapes can be cleaned efficiently. For use in hazardous areas, we offer a special version of the ion blower guns.
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X-Ray Beam Monitors
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When standard products just aren’t good enough—or the measurement technology does not yet exist—Sydor Technologies develops technology to enable these complex imaging measurements. Just as we’ve developed next-generation streak cameras and x-ray detectors to meet novel, emerging requirements in national laboratories, we’re doing the same with x-ray beam monitors.
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Headlight Beam Testers
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VLT offers a wide range of professional headlight beam testers. From simple manually operated models up to fullly automated robot type machines for use in integrated test lanes.
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ION Meters
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GAOTek offers a wide selection of ion meters for precise calculation of number of ions in various kinds of solutions. These devices determine whether the solutions have positive or negative ion charge. A solution of known concentration is accurately prepared, and its mV value is plotted on a graph of mV vs. concentration to determine the corresponding unknown concentration. These devices are durable and easy to use portable field instruments.
