In-circuit Test Systems
See Also: In-circuit, Incircuit, In-Circuit Debuggers, In-circuit Emulators, In-circuit Probes, In-Circuit Test, In-circuit Testers
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Modular Battery Test System
This modular battery test system provides for manufacturers versatile testing possibilities. Due to modularity it allows easy configuration of battery testers for a wide range of different power levels.
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RF Systems
With our detailed, end-to-end knowledge of beam generation systems and the way platforms operate in the field, we deliver state-of-the-art radio-frequency and x-ray systems. These integrated and effective systems are built with optimised components and interfaces to achieve the performance, reliability and ease-of-use expected by platform designers, manufacturers and end-users.
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Portable System for High-Voltage Solid Dielectrics Testing
HVT-70/50
Portable system HVT-70/50 is designed for carrying out high-voltage withstand testing of cable insulation and other solid dielectrics with DC (rectified) voltage up to 70 kV and AC voltage up to 50 kV RMS at industrial frequency (f = 50 Hz).
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Flying Probe Test System
A8a
The A8a test system provides the flexibility of flying probe testers while delivering high throughput testing for bare board printed circuit boards (PCBs). The target market for the A8a is the electrical test of tablet and PC motherboards and high density interconnect (HDI) products for smart phones. The A8a is designed for high productivity, reliability and test accuracy. To achieve high throughput the key feature of the A8a is a new dual shuttle system, which reduces the product exchange time to zero seconds in automation mode. In combination with the fast test speed of up to 140 measurements/second the A8a will give customers a competitive test solution for batches up to 5000 boards. A typical cycle time of a 4-up smart phone board is about 2 minutes.
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Modular Test System
IMU-MGE
Modular test system with colour touch screen and intuitive software. An integrated help with graphics guide the user through fast and efficient setup and operation. The system is used for CE mark testing in the European Union. Each system can be individually configured and easily extended.
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Pressure Decay Test Systems
Pressure decay leak testing technology has become a mainstay in the arena of high volume production testing. Pressure decay testing methods offer the world's manufacturers a cost-effective and easily applicable solution to the leak testing challenges they encounter on a given day. Fundamentally, pressure decay testing is a straightforward measurement technique; Cincinnati Test Systems (CTS) pioneers new and innovative ways to integrate our technology into custom turnkey systems that exceed the industry standards for reliability and repeatability. CTS' 30+ years of experience goes way beyond the pressure test unit by offering our customers comprehensive, custom turnkey solutions to the most challenging leak testing problems.
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Monitoring System
Sensaphone WSG30
The Sensaphone WSG30 Monitoring System offers a flexible monitoring solution when hard-wiring sensors is not a cost-effective or viable option. It also functions as a data logger to demonstrate compliance. The WSG30 is encased in a stylish, wall-mountable enclosure with an easy-to-read, 80-character LCD display.
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Test System
LPDDR4 and LPDDR3
Testing LPDDR4, LPDDR3 devices is made fast and simple with the "Lower Power" LPDDR4/3 TCE-3200LP IC test system. It can be configured up to 32 sites in parallel and integrated with the customer's selected handler.The TCIII-3200LP system can be used as a production tool as well as an engineering tool. To assist manufacturers and integrators, TurboCATS has developed a heat chamber that can be integrated with the TCE-3200LP, LPDDR4 and LPDDR3 test system. This allows the devices to be tested while being exposed to heat conditions.
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Measurement System
MS-500 series
The MS series is suitable for pre-processing analog signals.The plug-in units of filters, differential amplifiers, isolation amplifiers, etc. can be installed into their frames.(16 channels at maximum/the JIS rack size)
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Shaker Systems
Vibration Research Corporation
Small force vibration testing equipment and shakers for product and modal analysis testing. Each system consists of a shaker and a matching linear direct-coupled power amplifier. Additional components may be added to the basic system to tailor it to your specific needs.
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Battery Charge And Discharge Test System
9841
*Easy user interface*Measure Voltage, Current, Power, KWH, AH, Temperature, Reference Voltage*Accuracy Measure Time*Easy to see now test progress*Can cycle test*Provide Charge, Discharge, Suspend, FOR, LOOP Mode Select*When Charging, set the stop current to stop charging when fully charged so as to avoid overcharging that will damage the battery. When Discharge, set the stop voltage to stop discharge when discharging to lowest so as to avoid over-discharging that will damage the battery. *The test result will be stored to ACCESS data
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IT Battery Test System
Shenzhen Sinexcel RE Equipment CO., Ltd
IT battery test system support for multiple charging mode (such as CC, CV, CP, pulse, etc.) and discharge mode, to ensure that the battery performance and safety in the practical application. IT battery test system is designed to be modular, easy to maintain, and with anti-reverse connection, data loss and other protection functions
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Motion Simulator For Test Systems
Metis
METIS is a motion simulator for sensor and end system level testing. Configurable design allows you to create system you need! - 1-axis rate table for gyro testing - 2-axis unit for 6DOF accelerometer and gyroscope testing - 3-axis Gimbal system for simultaneus Yaw, Pitch and Roll stimulus.
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Computing Systems
Curtiss-Wright Defense Solutions
Mission computers are the heart of every platform. To ensure your mission success, our embedded computing systems are backed by decades of experience developing C5ISR, vetronics, and program-specific system solutions.
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SSD Test Systems
MPT3000HVM / MPT3000HVM2
As the SSD market continues to grow, device manufacturers need a low-cost way to test their expanding product portfolios. The MPT3000HVM and MPT3000HVM2 testers provide broad capabilities to handle virtually any SSD, from the highest performing enterprise drives to the most cost-effective client devices. This unmatched functionality presents a major advantage in the rapidly changing SSD market.
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Function Test and In-Circuit Test
CT350
ICT test points: max 2736 CAD Data import Automatic program generator Powerful debugging tools Test coverage analysis Paperless repair station Logging- and statistic functions Full graphical functions Panel and multisite tests Fast adapter exchange High Pin Count-Interface On table optional usable shelf part.
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LabVIEW Full Development System
LabVIEW is engineering software designed specifically for test, measurement, and control applications that require rapid access to hardware and data insights. The LabVIEW Full Development System is recommended to customize your engineering application with advanced inline analysis and control algorithms. For applications that require software engineering tools to develop, debug, and deploy professional applications, consider LabVIEW Professional Development System.
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TestStation LH
The TestStation LH in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne’s popular, award-winning TestStation product family.
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Servo-Pneumatic Asphalt Testing System
All signal conditioning, as well as high-speed data acquisition and control functions are done by the unit and graphically interfaced through CATS, windows based software running on a standard PC. The system is capable of performing the full spectrum of HMA tests: dynamic complex modulus, flow number, flow time, indirect tension, beam flexural fatigue and resilient modulus. These tests are done with the appropriate testing modules. The different testing modules can be obtained after the initial system acquisition at the same discounted price. In addition, guarantees system upgrades in order to meet future standards .
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Impulse Current Test Systems
Fivestar HV Testing Equipment Co., Ltd.
Impulse current test systems are mainly used for testing transmission and distribution systems against the effects of direct or indirect lightning strokes or against electromagnetic interference effects. Primary application of impulse current test systems is the testing of surge arresters, nowadays mainly of the metal-oxide type (MOA) and surge protection devices (SPD). Now they are also widely used to test vehicles, aircrafts, and military applications.
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Integrated I-V Test Systems
The OAI Integrated I-V Test System is perfect for R&D as well as production, the OAI Integrated I-V Test System delivers extremely accurate solar cell performance measurement. OAI’s advanced fully Integrated I-V Test System is designed to overcome the limitations of flash testing by providing a highly optimized pulse width and voltage sweep rate to match any type of solar cell’s high capacitance and slow dielectric response speed. As a result, the system produces extremely accurate measurements of solar cell I-V parameters and efficiency while leading to the most accurate test results.
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Development System
FE-51RD2
* Emulates Atmel AT89C51RD2, AT89C51ED2 and others * 60K Code Memory * Real-Time Emulation * Frequency up to 20MHz/3V, 33MHz/5V * ISP and X2 Mode Support * MS-Windows Debugger For C And Assembler * Emulation Headers and Signal Testpoints * Target Board and Programmer Included * Serially Linked to IBM PC at 115Kbaud
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Collaboration Systems
Solutions for small meeting, huddle, or collaboration spaces that foster group sharing using technology.
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Transformer Test System
Transformer testing instrument, can be used as a stand-alone device and has the highest efficiency. Can be used in power transformers, network communication transformers, etc.
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Battery Module (60v-300v) Test System
Shenzhen Sinexcel RE Equipment CO., Ltd
The module test equipment adopts sinexcel advanced high frequency isolation scheme, and the detection process supports multi-gear switching. The equipment integrates voltage, temperature, pressure and other auxiliary channels, and can also integrate temperature box, water cooler and other equipment, 20ms high-speed working condition simulation and other practical innovative functions to meet all aspects of battery electrical performance testing.
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Low-Tc Systems
With our long year experiences in SQUID electronics, SQUID sensors, and SQUID systems, we can offer exactly the system you need. No matter if you need a small 5 litres LHe dewar with just a single channel or a 100 litres multichannel system, we cooperate with excellent dewar manufacturers to guarantee the best possible performance for the overall system.
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System Management
Renesas CPU supervisors combine popular functions such as power-on reset control, watchdog timer, supply voltage supervision, and block lock protect serial EEPROM memory in one package, lowering system cost, reducing board space requirements and increasing reliability.
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Goniophotometer Test System For Led Lamp
LCG-1680B
Shenzhen Chuangxin Instruments Co., Ltd.
Design according to IEC61341the test method of central luminous intensity and beam angle for reflecting light, this instrument can be used to test the cross section luminous intensity distribution curve, central luminous intensity and effective beam angle of LED assembled luminaries and LED lens system with diameter less than 180mm.
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GPC Systems
GPC System
The Nexera GPC System provides highly reliable and highly extensible performance in a wide variety of applications. Hardware that provides rapid instrument stabilization and excellent reproducibility of analytical results, and software that includes analytical workow automation and overlap injection functions and features a user-friendly analysis screen view contribute to improving productivity. In addition, Analytical Intelligence functionality based on state-of-the-art digital technology provides highly reliable analytical results by preventing potential problems and ensuring the instrument is always in a stable state, regardless of the skill, knowledge, or experience level of the analyst.





























