In-circuit Test Systems
See Also: In-circuit, Incircuit, In-Circuit Debuggers, In-circuit Emulators, In-circuit Probes, In-Circuit Test, In-circuit Testers
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Memory Test System
T5851/T5851ES
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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Solenoid Test Systems
The production solenoid test systems are designed to check a high volume of parts each shift, verifying all important parameters of the solenoid.
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Production Test System
G3 Hybrid
The G3 Hybrid is a state of the art system for fast Production test throughput in DC test applications. The system combines the most versatile offerings of features in a single system, at the lowest cost. For devices requiring DC and Continuity test capability only, G3H is a very flexible cost-effective Production Test solution. This approach provides a DC test system with the capability to add logic resources (AC/SCAN) as well as analog resources for Mixed Signal. The HILEVEL G3H embraces low cost while supporting SCAN, giving you the ability to toggle every node in your chip.
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Video Quality Testing and Monitoring System
Net-Mozaic
The Net-MOZAIC can be used as a stand alone product or an integral part of our Net-xTVMS system. The Net-MOZAIC is normally located at the Head End with access to unencrypted TV channels. Customers define groups of 16 channels at the time. They are then decoded and analyzed for picture quality. Hundreds of channels can be analyzed this way on the round robbin.
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PXI - Test System
We provide a complete PXI test system made by PXI individual components: 19'' rack, Measuring and stimuli cards, Relay cards, Power Supplies, Integration additional protocol cards such as CAN and CANopen, Boundary Scan, Integration of additional test hardware
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LT-300A Aging-Life Test System For LED Luminaires
Hangzhou Everfine Photo-E-Info Co., LTD
LT-300A system is widely used for normal /accelerated aging, lumen maintenance measuring, chromaticity shift measuring, lifetime evaluation and temperature characteristic testing for LED luminaires, arrays, and modules. The extrapolation of lifetime by programmable models is also available to estimate the lifetime of LED luminaires.
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BMS Test System
6020
High Extensibility: for multi-string battery cell, 4 cells per channel, expandable from 1 to 16 cells per strings
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Advanced Burn-in and Test System for packaged parts
ABTS-Li
High power logic individual temperature control
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Conformance Test Systems
With an established market leadership position in GCF and PTCRB approvals for LTE-Advanced and all leading-edge technologies, Anritsu continues expanding its number of test case validations in GCF and PTCRB for Protocol, RF and RRM conformance testing. With increasing complexity of wireless technologies, Anritsu Conformance Test systems provide easy-to-use control software to maximize testing efficiency.
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Brake Test Systems
GIANT Evo
The GIANT Evo is an extension of the well-proven GIANT product portfolio and has been developed to suit the growing demands and needs of the current and future brake markets. Covering the market segments from mini and compact cars to medium sized SUVs as well as large vehicles, this brake testing machine forms the base of HORIBA’s inertia brake dynamometers portfolio. All components are specifically tailored to the needs of the passenger car market segment.
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Test Program Execution for High-Volume Production Systems
ScanExpress Runner Gang
Electronic manufacturing test systems must be fast and efficient. Schedules today are shorter, products are more complex, and the market demands higher speed—the product needs to be built and shipped yesterday.ScanExpress Runner Gang Edition is a concurrent boundary-scan and in-system programming test executive designed specifically for high volume production. Unlike traditional test systems which execute sequentially on a single unit under test (UUT) at a time, ScanExpress Runner Gang Edition provides concurrent (gang) testing on up to 8 UUTs for improved test and programming times.
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Test System Robotics
With the ever increasing need to provide a fast return on investment of your test solution investment, robot's are becoming more widely accepted as a means of reducing your testing costs. Not only can they be programmed for fast product test, they don't have the normal issues associated with human capital.
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In-Circuit Tester
Sigma MTS300
The system is designed for high throughput; with up to 1,000 analog measurements per second it is one of the fastest test systems available on the market. Sigma test systems provide analog and digital In-Circuit Test capabilities, Vectorless Testing, Functional Test, Boundary Scan and On-Board Programming.
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Memory Test System
T5835
The new T5835 has full testing functionality, from package testing to high-speed wafer testing, for any memory ICs with operating speeds up to 5.4 Gbps, including all next-generation memories from NAND flash devices to DDR-DRAM and LPDDR-DRAM. It can handle 768 devices simultaneously for final package-level testing. It additionally features functions such as an enhanced programmable power supply (PPS) for advanced mobile memories, and a real-time DQS vs. DQ function to improve yield.
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Advanced Test Systems
ATS
The commercial version of the RTS-503, this one is not built with the rugged qualifications of the RTS-503. The case is plastic and fuses are used. Otherwise, the internal components and software capabilities are very similar.
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Benchtop with Drop-In Test System
600 Series Compact ATE Platform
The Circuit Check 600 Series Compact ATE Platform with built-in professional fixturing solves the uncertainty of repeatable results that are common with bench testing. With the 600 Series Compact ATE, test procedures can become automatic, with test steps and go/no-go limits easily programmable. Hand-probing is eliminated, replaced with accurate, repeatable tooling and reliable spring-loaded test probe fixturing.
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Portable Ruggedized Test System
BADGER
Badger systems utilize NI's CompactRIO (cRIO), Single Board RIO (sbRIO), and/or CompactDAQ (cDAQ) hardware. The Badger product line offers high speed data acquisition/control and flexibility in an industrial package. Badger chassis and instrumentation have a 50 g shock ratings and a wide -40 to 70 °C operating temperature. These systems are ideal for automotive, industrial automation, remote monitoring, field service, and advanced control applications.
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Keypad Test system
Mistral
Engineering Solutions Inc. (ESi)
The Mistral Keypad Test System has been designed to be the least expensive, easiest to use full featured tester for membrane switch assemblies. The idea is to combine a small, smart "pod" with a PC running software that makes full use of the Windows® graphical interface. Make it as easy to set up and use as possible yet include all the features you need.
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EMI Test System
EMI-9KA
EMI-9KA is an automatic EMI receiver. It is a main test system for EMI (Electro Magnetic Interference) testing. The EMI-9KA is produced by the full closure structure and strong electro-conductibility material, which has high shielding effect. Due to the new technology for the EMI Test System, it solved the instrument self-EMI problem. The test results are according to the international format test report. The EMI Test System EMI-9KA fully meets CISPRl6-1, GB17743, FCC, EN55015 and EN55022.
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Hydraulic Pulse Fatigue Testing System
PFT-500
Jinan Testing Equipment IE Corporation
PFT-500 hydraulic pulse fatigue testing machine is mainly applicableto large size parts such as bridges, trusses, automotive chassis, front and rear axels, locomotive frames, chassis and various concrete structures for static compression test and dynamic unidirectional pulse fatigue tests. The Fatigue Testing System for Rail has significant characteristics of reliable design, simple operation, energy conservation, and low operation cost etc.
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Automatic Electrical Protective Equipment Test Systems
CBC-50С (CBC-100C)
Automatic systems CBC-C-series are designed for high-voltage withstand testing of electrical protective equipment and insulated hand tools. The tests are carried out with AC voltage (CBC-50C: UAC ≤ 50 kVRMS; CBC-100C: UAC ≤ 100 kVRMS) at industrial frequency (f = 50 Hz).
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Phase Noise Test System
N5511A
The Keysight N5511A phase noise test system (PNTS) lets you measure at the limits of physics with readings down to kT (-177 dBm/Hz). The N5511A PNTS is a replacement for the gold-standard Keysight E5500 phase noise measurement system and is designed to meet the needs of phase noise power users.
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EST-200 Emission Safety Test System For Toys
Hangzhou Everfine Photo-E-Info Co., LTD
The system can test the radiation intensity, irradiance, light color expansion angle, peak wavelength, dominant wavelength, bandwidth, etc. of various toy light emitting devices. The measurement conditions meet the CIE127 standard, and the test report meets the ENIEC62115:2020 standa
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MMIs for Test and System Integration
Laying out a custom PCB is too time consuming and costly for most rush projects. Pulse Research Lab has developed Mini Modular Instruments ™ to provide cost effective solutions to the most common engineering challenges.
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Systems
Our systems use an open and flexible architecture to create a platform allowing integration of technology and modules with short system set-up times which result in a reduction of costs.
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CRPA Test System
The Spirent CRPA Test System is a development of Spirent’s GSS9000 Series platform for testing Controlled Reception Pattern Antenna (CRPA) systems with a separate RF output per antenna element. The CRPA Test System generates both GNSS and interference signals. Users can control multiple antenna elements. Null-steering and space/time adaptive CRPA testing are both supported by this comprehensive wavefront approach.
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Low Voltage Burn-in and Test System
Max 450
For burning-in and testing DUTs such as microprocessors, DSPs and logic devices, which require low voltage. Output monitoring gives functional test results for every device during burn-in
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Data Acquisition and Control System
DAQ 7000
data acquisition and control system that provides connectivity, signal conditioning and modular I/O for variety of sensors or signals, and it is an ideal DAQ for field deployment.
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PIM Test Systems
AWT's Portable PIM testers are powerful yet compact tools for testing and analyzing telecommunications network infrastructure. These testers are ruggedized and can withstand harsh environmental conditions. they are accurate, reliable and easy to operate and they provide a wealth of features ideal for work in the field. Built-in Distance-to-PIM option.
