Scanning Electron Microscopes
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopy, SEM
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Product
Electron Sources
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SPECS Surface Nano Analysis GmbH
To our customers in research and industry we offer a variety of sources for deposition, excitation and charge neutralization as well as analyzers and monochromators. Most of our sources originate from product lines which we have taken over from Leybold AG, Cologne, and from VSI GmbH. The X-ray monochromator Focus 500 and the UV monochromator TMM 302 are original developments by SPECS.Compliance with industry standards, a good price-performance ratio, stability, and longevity are the guidelines for our product development. We focus on standardized easy handling, user-friendliness, standardized software interfaces and safety.
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Product
Auditor Universal Electronic Testers
AUET-DC Series
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The Auditor Universal Electronic Testers (AUET) have a broad range of features to accommodate most requirements. These instruments are designed to be bench top mounted and are available in several configurations and various single or multiple torque ranges. They are also available with file capability (DC) models. The DC models require PC software Auditor Tool Manager (ATM).
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Product
Complex of Visualization and Image Recording for a Video Microscope
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To develop a complex for visual inspection of electronic components (other micro-objects) in order to identify visual defects, record the resulting image and transfer information for processing.
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Product
Electronic Calibration Module (ECal), 18 GHz, Type-N, 50 Ohm, 2-port
N4690D
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The Keysight N4690D microwave electronic calibration (ECal) module makes calibration of Keysight vector network analyzers fast, easy and accurate. The N4690D is a precision 2-port ECal module that supports 50-ohm type-N connectors up to 18 GHz. Select either female-female, male-male, or female-male connectors. The plastic storage case for the N4690D is included for securing your ECal module and accessories.
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Product
DIOS (Digital I/O Scan Module)
JT 2122/MPV
Digital I/O
The JT 2122/MPV DIOS (digital I/O scan module) increases the coverage and improves the diagnostic resolution of boundary-scan testing by extending test access to connectors and/or test points. JT 2122/MPV DIOS provides bi-directional parallel-scan access to up to 128 or 133 I/Os in a standard DIMM-168 module.
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Product
Electronic Magnet Pole Finder
MPF-120
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The hand-held electronic magnetic pole finder / magnetic pole detector that instantly provides a positive reading of N or S polarity. Simple, push-button operation. Just point and read RED indicates NORTH, GREEN indicates SOUTH.
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Product
Electronic Resistance Stores
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Is designed to reproduce the values of resistance to direct current through channels independent and galvanically isolated from each other and from the case.
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Product
DC Electronic Load
63600 series
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Chroma's 63600 series DC electronic loads are designed for testing multi-output AC/DC power supplies, DC/DC converters, chargers, batteries, server power supplies, and power electronic components. They are excellent for research, development, produc t ion, and incoming inspection applications. The 63600's state of the art design uses DSP technology to simulate non-linear loads using a unique CZ operation mode allowing realistic loading behavior. The 63600 series can draw its rated current under very low voltage (0.4V typical). This unique feature guarantees the best loading performance for modern Point-of-Load conditions and fuel cells.
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Product
Electronic Component Counter
ZE 300
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REINHARDT System- und Messelectronic GmbH
Instead of the widely used photoelectric barrier technology a new measuring technology is used in the new electronic component counter ZE 300: The laser technology offers a measuring beam with higher energy density and therefore more precise counting and faster counting speed. The ZE 300 component counter is microprocessor-controlled.
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Product
Fluorescence Microscopes
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PicoQuant offers different solutions for time-resolved confocal microscopy. The available systems include single molecule sensitive microscopes with picosecond temporal resolution and super-resolution imaging capabilities as well as upgrade kits for laser scanning microscopes of all major manufacturers that enable time-resolved applications.
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Product
Brinell Optical Scanning System
B.O.S.S.
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Newage Testing Instruments, Inc.
The B.O.S.S. brinell optical scanning system measures your brinell impressions faster, more accurately and more consistently. And it improves your quality control with advanced data acquisition and analysis capabilities, including the ability to save your high-resolution image of our impression to file.
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Product
Electronic DC Load, 80V, 80A, 400W With/without Remote Interfaces
LD400 Series
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Versatile solution for testing dc power sourcesConstant current, resistance, conductance, voltage and power modesWide voltage and current range, 0 to 80V and 0 to 80A400 watts continuous dissipation at 28°C (360W at 40°C)600 watts short-term dissipation (up to 60 seconds)Low minimum operating voltage of <1V at 40AHigh resolution and accuracy for level settingBuilt-in transient generator with variable slewCurrent monitor output for waveform viewingVariable drop-out voltage for battery testingHigh resolution backlit graphic LCD with soft key controlAnalogue remote control of levels and TTL control of on/off and transient switchingFront and rear input terminals (front terminals 30A max.)Full bus control via USB, RS232 and LXI compliant LAN interfaces (LD400P)GPIB option (LD400P only)
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Product
Electronic Test And Measurement Systems
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Summaries, information, & tutorials about electronics test and measurement equipment & techniques.
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Product
PDS Motion Scan
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Allows a 3D Scanning sonar user to collect motion compensated 3D point clouds from a moving platformTeledyne PDS MotionScan system allows a 3D Scanning sonar user to collect motion compensated 3D point clouds from a moving platform. The MotionScan system is comprised of: an RTK capable dual antenna GPS with precision heading output, a heave, pitch and roll sensor, a topside control console. In combination with a BlueView 3D Multibeam Scanning Sonar this creates a full survey package.
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Product
JTAG/Boundary-scan Digital I/O Module
ScanIO-300LV
Digital I/O
The ScanIO-300LV JTAG/boundary-scan digital I/O module turns an IEEE-1149.1 boundary-scan controller (such as the Corelis PCI-1149.1/Turbo or NetUSB-1149.1) into a powerful digital interconnect and functional tester.
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Product
High Power DC Electronic Load
33500F Series（2.4KW~14.4KW）
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33500F Series has its own control and display panel, CC / CR / CV / CP / Dynamic modes, 150 sets Store/Recall memory which provides load set-up more efficiently, also can be remote controlled via GPIB、RS232、USB and LAN interface. SHORT time setting and SHORT_VH, SHORT_VL setting function, also can measure Short Voltage and Current.
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Product
EQE/Photon-Electron Conversion Testing
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Enlitech offers different solutions for incident photon-electron conversion testing systems. The available systems include IPCE, PV External quantum efficiency (PV-EQE), Internal Quantum Efficiency, Spectral Response (SR), Highly-sensitive EL-EQE. There are over 1,000 SCI papers cited Enlitech‘s systems to provide reliable experimental data for significant scientific publication. The Highest PV-EQE sensitivity and EL-EQE both reach 10-5 % (7 orders). They can be utilized to PV conversion efficiency, HJT/ PERC/TOP-CON current-loss analysis, Organic PV charge-transfer-state and Perovskite PV trap state measuring, and Organic PV and Perovskite PV Voc loss analysis.
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Product
Electronic Brake Meter for Forklift Trucks
BrakeCheck FLT
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The BrakeCheck FLT is our portable brake tester designed specifically for forklift trucks.The Bowmonk BrakeCheck FLT is a fully self-contained, user-friendly, portable brake tester, which has been developed with a leading forklift truck manufacturer to take account of the slow speed and tilt of forklift truck vehicles. The instrument records the braking efficiency and percentage of braking imbalance in a matter of minutes.
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Product
Wide Range Medium Power DC Electronic Load
N6200 Series
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Next Generation Instrumental (Shanghai) T&C Tech. Co., Ltd.
N6200 series is developed based on NGI's years of experience in testing for power supply and battery. It is with high accuracy, high reliability and high cost-effective. N6200 series is with high power density and elegant appearance, which is available for benchtop use or installation in 19 inch cabinet.
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Product
Sensitive Terahertz Detectors: Cooled Terahertz Detectors Based On Hot Electron Bolometer (HEB) And Room Temperature Terahertz Detectors Based On Golay Cell.
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Insight Product Company offers Cooled and Room Temperature Terahertz (THz) Detectors
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Product
Stereo Microscopes
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Sometimes called dissecting microscopes, stereo microscopes provide comfortable 3-dimensional viewing of a sample in which each optical path (eye) sees the sample from a slightly different angle. Stereo microscopes are used to observe and manipulate samples in disciplines such as research, assembly and manufacturing, gemology and jewelry making, sample preparation and, of course, dissection. ACCU-SCOPE stereo microscopes can be found across a wide range of industries and institutions including biology labs, universities, research institutions, government facilities, biopharmaceuticals, manufacturing facilities, and more. Stereo microscopes are also available on a variety of stands and with a variety of illumination sources, offering features that may be particularly suited for your application.
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Product
X-ray Analytical Microscope (Micro-XRF)
XGT-9000
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- <15µm probe size with ultra-high intensity without compromising sensitivity or spatial resolution. - High resolution cameras and multiple illumination modes to help capture images.- Dual types of detectors for transmission and fluorescent X-rays.- Detectable element range down to carbon with a light element detector.
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Product
Electronic Tearing Strength Tester
DRK108B
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Shandong Drick Instruments Co., Ltd.
DRK108B Electronic Tearing Strength Tester is the special instrument for tearing strength test. In paper making industry, packaging industry, science and research industry and supervision and inspection industry, it is necessary.
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Product
Microscope
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Shanghai Selon Scientific Instrument Co. Ltd.
An optical instrument used for viewing very small objects, such as mineral samples or animal or plant cells, typically magnified several hundred times.
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Product
Industrial Microscope for Materials Science & Industrial Applications
BX53M
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Designed with modularity in mind, the BX3M series provide versatility for a wide variety of materials science and industrial applications. With improved integration with OLYMPUS Stream software, the BX3M provides a seamless workflow for standard microscopy and digital imaging users from observation to report creation.
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Product
Electron Probe Microanalyzer
EPMA
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JEOL commercialized the world's first FE-EPMA, the JXA-8500F in 2003. This highly regarded FE-EPMA has long been used in various fields, such as: metals, materials and geology in both industry and academia. The JXA-8530FPlus is a third-generation FE-EPMA that comes with enhanced analytical and imaging capabilities. The In-Lens Schottky field emission electron gun combined with new software provides higher throughput while maintaining high stability, thus allowing a wider range of EPMA applications to be achieved with higher resolution.
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Product
Modular DC Electronic Load
63600
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Chroma Systems Solutions, Inc.
Chroma’s 63600 Modular DC Electronic Load is designed for testing multi-output AC/DC power supplies, DC/DC converters, chargers, batteries, adapters, and power electronic components. They are excellent for use in research, development, production, and incoming inspection applications. The 63600’s state-of-the-art design uses DSP technology to simulate non-linear loads using an unique CZ operation mode allowing realistic loading behavior.
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Product
kSA Scanning Pyro
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For use on Veeco K465i and EPIK700 MOCVD reactors, the kSA Scanning Pyro performs automated temperature mapping in order to measure temperature variations across wafer carriers and wafers. Use it to tune heater zones and optimize process and hardware to achieve higher yields, wafer uniformity and device performance.
