Fixtures
orient and afix UUT.
See Also: Fixturing, Test Fixtures, Mechanical Fixtures, Vacuum Fixtures, Jigs
-
Product
Functional Fixtures
-
Joule''s strength is in the design and manufacture of functional test fixtures. Using 3D modeling software to create the fixtures allows us to actuate pneumatics, open and close overclamps, actuate side access units - all before a single part has been machined for the fixture.
-
Product
SHC68-C68-D4, 68-Pin, Male VHDCI to 68-Pin, Male VHDCI, 50 Ω, Shielded Digital Cable - 1m
196275-01
-
The SHC68-C68-D4, 1m, Digital Cable connects NI 6535/6/7, 654x, 655x, and 657x digital instruments with other NI accessories like the CB-2162 Connector Block or SMB-2163 Terminal Block. You can also use it with certain Digital I/O Adapter Modules for FlexRIO, Digitizer Adapter Modules for FlexRIO, Signal Generator Adapter Modules for FlexRIO, and high-speed serial instruments. It is flexible and easily fits around custom test fixtures and other equipment. It is a shielded, 50 Ω cable and is offered in different lengths.
-
Product
Programmable Parametric Tester For Discrete Semiconductors
IST-8800
-
IST Information Scan Technology, Inc.
The IST-8800 is a fully programmable, low cost tester that provides parameter measurements or parametric GO/NO GO test for transistors, diodes, MOS-FETs, Regulators, Triacs, Zeners, SCRs, and J-FETs. These devices can be tested up to 5 amps or 1200 volts with a measurement range down to the nano amp range. Only four universal test fixtures are required which can test the device across a wide range of packages.
-
Product
Adjustable Clamshell Bed of Nails Testers
AdjustaBON Family
-
Designed for quick test development. This fixture can be configured to probe almost any circuit board in just a few hours. Once the perfect test is developed, move this light weight fixture out to the production floor to evaluate your production line test strategy prior to buying permanently drilled test fixtures, or while waiting for your drilled fixtures to be delivered. The AdjustaBON competes with the Flying Prober. There are many advantages over the flying prober. Setup is simple and intuitive and can be much quicker than programming a flying prober. Small size provides versatile bench top operation right where you need it. Maintenance costs are insignificant in comparison. The total cost of this fixture is in many cases less than the yearly maintenance cost of a flying prober. It would be possible to buy one of these fixtures every year for the price paid just to maintain one flying prober and it is about 1/20th the purchase price
-
Product
Wind Power Solution
ECO GE
-
The ECO GE is custom-made with firmware and fixtures designed specifically for GE 1.5x and 2.5x. These precisely designed fixtures make generator-to-gearbox alignment easy inside any nacelle – safeguarding reliability and optimizing the energy efficiency of the wind turbine.
-
Product
Triaxial Test Set
-
Two measuring methods are used for measurement of screening efficiency - Transfer impedance, Screening attenuation. EC (European Cabling) Group of DELTA has during the last years supplied many customers with test fixtures for measurement of transfer impedance. The use of the fixture has now been extended to comprise screening attenuation measurement according to the triaxial method.
-
Product
Wind Power Solution
ECO VESTAS
-
These precisely designed fixtures make generator-to-gearbox alignment easy inside any nacelle – safeguarding reliability and optimizing the energy efficiency of the wind turbine.
-
Product
Qualification Hardware & Sockets
-
Reltech Limited holds over 35 years’ experience in the design and manufacture of all types of qualification test hardware. Our advanced technology products include: HTOL Boards (Mother and Daughter cards) Burn-In Boards HAST Boards THB (humidity) Boards Burn-In Modules and frames Dynamic Driver cards (Digital, Analogue and Mixed signal) Back Planes Voltage regulator cards Custom electro-mechanical assemblies DUT Cassettes and test Fixtures
-
Product
Manual Fixture Kit
230376 – CMCSK-07-01
-
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
-
Product
Automated XY Stage
AT2
-
The Instron AT2 is a compact automated XY stage that streamlines compression, tensile, and flexural testing for both batches of specimens and single components with multiple test points. Designed for seamless integration with 6800 Series universal testing systems, the AT2 features standard bolt patterns for custom fixturing and accommodates a wide range of specimen geometries. Fully integrated with Bluehill® Universal software, it enables operators to quickly define and execute test sequences using grid, diamond, or custom layouts—boosting throughput, consistency, and testing efficiency.
-
Product
Enhanced Time-Domain Analysis With TDR
S95011B
-
This application enables the analyzer to perform enhanced time domain analysis for high-speed data applications. All functionality of the S95010B are included (TDR/TDT mode). In addition, the S95011B enables more detailed measurements and evaluations, such as eye-diagram / mask modes, without adding PLTS software. Jitter and emphasis / equalization capabilities enable simulation of real-world signals and environment. The S95011B covers up to 53 GHz bandwidth. Full calibration is available and the automatic deskew ensures easy removal of fixture and probe effects. To get the best accuracy, mechanical calibration kits or ECal with DC option (i.e., N469xD or N4433D with Option 0DC) are recommended.
-
Product
PXI 12x8 RF Matrix 300MHz 50 SMB
40-726A-511
-
The 40-726A is a 12x8 RF Matrix Module suitable for switching frequencies up to 300MHz (50Ω version). The 40-726A is available in either 50Ω or 75Ω versions with a choice of coaxial connectors. The module is designed to provide a simple and scalable bidirectional matrix for RF frequencies. Isolation Switches are located on all coaxial connectors, these disconnect the matrix from the external test fixture. This maximizes isolation and RF performance.
-
Product
Test Lead, BNC Connector To BNC Connector Board
16048A
-
Extend the measurement port with a four-terminal-pair configuration that enables the attachment of user-fabricated test fixtures.
-
Product
Test Engineering & Manufacturing
-
Whether you require just a test fixture, a complete automated test solution or a build to print service, we will work with you to ensure you get the best return on investment possible. We have highlighted our three key services for you below. Our hardware engineers are regularly trained and certified to ensure best practice. All of our software engineers have certified developer accreditation which means the code we produce is concise, easy to maintain and scalable.
-
Product
Custom Fixtures
-
The shock and vibration fixture model BW-SV-3X3X3 is designed to accept up to 24 each of the TO-3 packages on each of the 6 axes and mount to the vibration shaker model BW-100C and Shock Tester model BW-E5000. The fixture is made of white derlin and measures 3”x3”x3”and weighs approximately 13 ounces. The fixture includes a white derlin cube with a 2 ¼” bolt circle and 4 10-32 x 3” cap screws.
-
Product
Pulse generator
9355-1
-
Solar Model 9355-1 Pulse Generator is designed to provide impulse excitation by means of an injection probe placed around interconnecting cables or power wires. The unit uses a charged transmission line (50 ohms) to generate a pulse with less than 2 nanoseconds rise and fall time, and duration of approximately 30 nS, calibrated in a 50 ohm fixture to deliver up to 5 amperes at a rate of 30 p.p.s. for one minute as required by MIL-STD-461D/E, test method CS115.
-
Product
DDC (Dual DIMM Carrier) DIOS Adaptor
JT 2702/DDC
-
The JT2702 Digital 256 channel JTAG I/O module. JT2702/DDC (Dual DIMM Carrier) is a DIMM DIOS accessory product. It is typically used in custom test adapters or fixtures where a large number of digital I/O channels are required with a minimum space overhead.
-
Product
PCB Test Fixture Kits And Customized Fixtures
-
Mirotech manufactures portable benchtop PCB test fixture kits and provides customized test fixture solutions for the electronics industry. Our innovative, streamlined designs are compact in size and feature a linear collapsing system, interchangeable and reusable plate design, top and bottom probing, and are affordably priced. All fixtures are built using high quality hardware and materials and manufactured using the DATRON M8Cube, known for its precision and accuracy. Each of our custom designs are unique to our customer’s particular project requirements. Fixture kits come pre-assembled, and include blank plates ready for you to drill your test pattern.
-
Product
Integrating Spheres
IS-*M
-
• Diameter: IS-0.3M (φ0.3m)、IS-0.5M (φ0.5m)、IS-1.0M (φ1.0m)、IS-1.5M (φ1.5m)、IS-1.75M (φ1.75m)、IS-2.0M (φ2.0m). Other sizes can be designed according to the customer’s request. • The painting of integrating spheres is according to CIE Pub.No.84 (1989) • Material: Pure barium soleplate (BaSO4) • BaSO4 coating: ρ(λ)≥0.96 (450nm~800nm) and ρ(λ) ≥0.92 (380nm~450nm) • Fine diffuse reflection: Reflectanceρ≈0.8 and accuracy of ρ (λ) <1.5% • Build-in lighting holder position: The vertical is for E40, E27 and so on. The horizontal is for T5/T8/T12 tubes. The side assistant opening is for lighting fixtures • Auxiliary lamp position has been built-in. Auxiliary lamp and Auxiliary lamp device are optional • Power cable and socket has been build-in, it is convenient to power the testing lamp • Two photo detector ports, one optical fiber port and temperature sensor hole are built-in • The traditional integrating sphere is assembled by several pieces, Lisun Group developed A Molding Technology to produce the integrating sphere. A molding integrating sphere will be more round and the test results will be more accurate than the traditional integrating sphere
-
Product
Clamshell Type Mechanical Fixtures
-
Known in the ATE Industry as “Clamshell” type Test Fixtures, Semco’s Mechanical Test Fixture line is a cost-effective solution to test Printed Circuit Boards and Assemblies. This Test Fixture line is also available with the most widely used interfaces in the test industry.
-
Product
Receiver, 9025TR, 25 Module, with 20" Platform
310104435
-
Runners along the platform provide a smooth-sliding action, ideal when using fixtures up to 180 pounds. The 9025TR can be adapted to accommodate vacuum or mechanical fixturing. VPC modules can be intermixed to establish flexible custom interfaces which are ideal for functional and system testing applications. The 9025TR uses all standard VPC 90 series modules and contacts, includes a microswitch and is available with optional table legs and keyboard tray kit. Slide kit required, but not included.
-
Product
Non-Linear Junction Detector
ORION™ HGO-4000
-
The ORION HGO-4000 is REI’s original high gain Non-Linear Junction Detector for special applications. The ORION HGO-4000 can locate listening devices and semiconductors in walls floors, ceilings, fixtures, furniture or containers and provides a user the capability to detect hidden electronic devices, regardless of whether the device is radiating, hard wired, or even turned off.
-
Product
PCI Express 5.0 Transmitter Electrical Performance Validation and Compliance Software
D9050PCIC
-
Use the PCIe 5.0 Tx compliance software to test, debug and characterize your PCIe Gen5 designs quickly and easily. It automatically configures the oscilloscope for each test and generates an informative HTML report upon test completion. The application compares the results with the specification test limit and includes margin analysis which indicates how closely the device passes or fails each test. With the option InfiniiSim Waveform Transformation Toolset, the software supports integrated de-embedding of the breakout channel of the test fixture.
-
Product
Device Parameter Analysis
-
bsw TestSystems & Consulting AG
The complexity of DC Parametric Characterisations has significantly increased with the level of miniaturisation in the semiconductor industry. The demand is not only on the precision of the measurements. New measurement methods have emerged to gain insight into phenomena previously unknown or only of marginal relevance. One example is "Pulsed IV" which is now widely in use. The modular concept of the Keysight B1500A allows users to tailor their instrument exactly to their needs. Flexible upgrades ensure the investment for many years. Together with bsw AG you will get an optimum solution for your application. Our experts provide not only support for the instrument itself but have also working knowledge of all the solutions surrounding it. This includes Cabeling and Adapters, Fixturing for packaged Parts and of course Wafer Probing. We help customers from replacements of broken or worn-out parts to planning and deployment of turn-key-systems.
-
Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196B
-
The 16196B surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results, reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement. Now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
-
Product
Automated DC Parametric Curve Tracer
MultiTrace
-
MultiTrace curve tracer is a mid-sized benchtop model supporting pin counts from 216-625 pins and includes the PGA-625 fixture as a standard interface. MultiTrace supports a wide range of test applications: Failure analysis, Reliability testing, Counterfeit device analysis, Nondestructive electrical counterfeit test, Opens, shorts leakage testing (OSL), Post decap electrical inspection, Optical fault localization, ESD testing, Latch-up testing, Supply current measurements, and more!
-
Product
HDMI
-
SCHILLER AUTOMATION GmbH & Co. KG
HDMI test adapters and test fixture kits facilitate Source and Sink compliance testing and HDMI cable testing. Our products are used in Certification Testing to CEA 1.3b, 1.4a, 2.0 and 2.1 standards. 1080p and 4K formats are supported. We offer A and D style plug and receptacle connectors, male and female SMA leads, with and without HEAC channels.
-
Product
CAM/GATE Test Kits
-
The Camgate ™ series test fixtures provide ‘Z’ axis motion and, with the optional floating top plate, makes this series ideal for top side probing. The floating push plate is accurately registered with two tooling/guide pins. The top plate mounting frame is adjustable in .500″ (12.7mm) increments to accommodate top side probing in the lower position, or clearance for PCA’s with tall components in the middle or top position, without the need for riser blocks. Camgate fixtures are available with the most widely used interfaces in the test industry.
-
Product
2-kbit 12C EEPROM for Fixture Coding
FXA-101 I2C EEPROM
-
The FXA-101 is a 2-kbit serial I²C bus EEPROM used for identification of systems components. With it’s DIP switch it’s easily addressable. The FXA-101 may be glued directly to the appropriate component or inserted into a UMK housing from Phoenix Contact and installed on a DIN rail.
-
Product
Wireless In-Circuit Test Fixtures
-
Higher density more complex circuit boards complicate testing requirements while smaller more tightly spaced test pads create a wiring challenge for the fixture fabricators, test engineers and maintenance personnel. Wireless fixtures solve the challenges associated with the nest of wires found in standard long wire fixtures. Wireless fixtures replace the “nest” of wires with copper traces on a multilayered printed circuit board called a Translator Board or T-Board®. Circuit Check’s wireless fixture technologies reduce test program debug and maintenance times while easing the ECO process. Thus allowing for the higher level of test performance, the ability to probe smaller denser targets and achieve ultra-high node counts.





























