Infrared Microscopes
observe, measure and analyze, sample magnified, IR view.
See Also: Microscopes, Acoustic Microscopes, Atomic Force Microscopes
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Digital Microscopes
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TAGARNO digital microscopes give you unique and easy to use magnification equipment to use in a variety of quality control processes as well as R&D efforts or in your repair and rework in an endless range of segments. The digital microscopy camera technology enables you to see any small object in ultra sharp magnification and to document your work with just a single click. It also allows multiple viewers at the same time and thereby greatly improves collaboration.
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Far Infrared Systems
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Far-Infrared and terahertz (THz) radiation is the spectral region at the long wavelength end of the infrared and the short end of the microwave region, also known as the sub-millimeter wavelength spectral region. Recently, there has been an explosion of interest in THz applications as the radiation generated can penetrate various materials. THz light is commonly used in materials science, security, pharmaceutical com- pound analysis, biomedical imaging, superconducting materials, astronomy, and particle physics research.
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Digital Infrared Thermometer
IR-710
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Shenzhen Calibeur Industries Co., Ltd..
'- Non-Contact Infrared Thermometer With Laser Targeting '- Range: -38° C to +520° C/-36.4° F to +968° F'- Accuracy : < 0°C： ±3% or ± 3°C ≥0°C： ±2% or ±2°C'- Distance spot ratio (D:S) : 8:1'- ℃/℉ exchange,'- Size: 180x80x40mm'- Weight: 120g'- Power: AAA1.5V 2pcs (not included)
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High Quality Digital Benchtop Microscope
D SCOPE
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This unique microscope combines high quality optics with a modern and ergonomic design ideally suited to fiber optic applications. Until the D Scope, most microscopes were suffering from poor illumination quality yielding variable and non-reproducible image quality even amongst scopes of the same kind.
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Infrared Thermometers
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Two specifications tell you nearly everything you need to know about any infrared (laser) thermometer: its measurement range and its distance-to-spot (D:S) ratio. The wider the range and the higher the D:S number (a measure of its optical resolution), the better the instrument. Infrared Thermometers (IRTs) with lower numbers are perfectly adequate for simple tasks like spot-checking food temperatures and energy auditing such as the IRT207 Non-Contact Infrared Thermometer. Higher-priced infrared thermometers intended for industrial users may have a SKU that ends in "K" such as the IRT850K Ultra-Wide-Range Infrared Thermometer with K Port and Adjustable Emissivity. The "K" indicates that it can accept inputs from a "K" type thermocouple probe used to measure temperature on-contact.
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Pyrgeometer for Far Infrared Radiation
LPPIRG01
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The pyrgeometer LPPIRG01 is used to measure the far infrared radiation (FIR).
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Digital Vision Microscopes
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Sinowon Innovation Metrology Manufacture Ltd.
Video Microscope is widely used in the inspection of electronic industry production line, printed circuit board, weld detects ( such as wrong printing, edge collapse,etc)during printed circuit component, PC Board, VFD, and the identification of printing grid and painting, etc. It can display the zoom out image on the screen and save, magnify and print.
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Scanning Electron Microscope (SEM)
Prisma E
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Prisma E scanning electron microscope (SEM) combines a wide array of imaging and analytical modalities with new advanced automation to offer the most complete solution of any instrument in its class. It is ideal for industrial R&D, quality control, and failure analysis applications that require high resolution, sample flexibility and an easy-to-use operator interface. Prisma E succeeds the highly successful Quanta SEM.
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Temperature Controlled Microscope Stage
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Linkham Scientific Instruments
Specialists in temperature controlled microscopy, Linkam Scientific Instruments, announce the launch of their Optical DSC450 which enables simultaneous visualization of thermal processes for improved materials characterisation. The Optical DSC450 enables the user to measure glass transitions and melting behaviour of a wide range of substances whilst accurately controlling temperature from -196 °C to 450 °C. The atmosphere of the stage can also be purged with gas as required by the user. A new feature which will increase the characterisation capabilities of the DSC system is to combine it with imaging capability. The new LINK Digital Imaging module enables additional information to be obtained by correlating optical changes such as colour with temperature. The new TASC analysis tool takes this further. TASC (Thermal Analysis by Surface Characterisation) is a new image analysis capability which enables structural changes in samples to be tracked and quantified optically. It has the unique ability to measure local transition temperatures allowing different points on a sample to be identified. The new DSC system is great tool to use in research and quality control to measure quantitative values for glass transitions, melting peaks and sample purity and, when combined with TASC, even sample homogeneity.
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Microscope Cameras
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In contrast to digital cameras for normal photography, microscope cameras are built to meet the demands of high-end science- and research applications. For maximum light sensitivity they use large CCD or CMOS sensors for image acquisition. Color reproduction is often critical, why features like Microscanning or Color-Co-Site Sampling ensure optimal image quality. Due to the lack of a light absorbing color filter monochrome microscope cameras for fluorescence imaging are even more sensitive.
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Ultraschallmikroskop And Scanning Acoustic Microscopes
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Microtronic Microelectronic Vertriebs GmbH
mage quality. Speed. Uptime. They’re all crucial. Getting all three at the same time in a nondestructive testing (NDT) solution for package inspection is the challenge. It takes continuous innovation, advancing the state of the art to keep pace with the semiconductor industry’s own exponential progress.Sonix has been the innovation leader since 1986. Today, the ECHO line of scanning acoustic microscopes sets the standard for package inspection speed and image quality, to help you keep pace with new packaging materials and difficult form factors. The ECHO platform will remain at the forefront as we continue to add features and enhance performance for years to come.
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Inverted Microscope Systems
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Below you can see examples types for an inverted microscope system created using our components. Typically these examples are for life science applications, however they can be used for industrial or material applications. Many other automated microscopy systems are possible using our components.
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USHIO Infrared Laser Diodes (705nm - 852nm)
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The Optoelectronics Company Ltd
USHIO OPTO's new 705nm, 40mW laser diodes, HL7001MG and HL7002MG are the first ever 705nm semiconductor lasers and are suitable for biomedical light sources. For more information, see HL7001MG/7002MG overview.
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Sapphire 3D Microscope
WDI-2000
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The Sapphire 3D Microscope: HS-WDI-2000 was designed with high quality lighting parts and a good optical system design,can get a very clear image.with the digital camera,it can provide the image in time, widely used in LED,Solar,SEMI…
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Thermal Microscope Stage For Large Petri Dish
TS-4LMP
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Thermal Microscope Stage For Large Petri Dish
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Near-field Scanning Optical Microscope
NSOM
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Near-field Scanning Optical Microscope (NSOM) is a versatile tool for nano-characterization and nanomanufacturing.Conventional microscopes have fundamentally limited resolution due to diffraction, but there is no such restriction for near-field interactions, that is why near-field microscopy is becoming one of the most important techniques for nano-science.
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Infrared Thermometer
6571
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Peaceful Thriving Enterprise Co Ltd
*Low Battery indicator.*Distance to spot ratio is 10:1.*Laser Indicator and Background-light.*Changeable between ℃ and ℉.*Emissivity Range: 0.85/0.90/0.95.*Temperature range: -20-500℃ (-4-932°F).
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Industrial Microscope Systems
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Below you can see two industrial microscope systems which can be created using our components. Many other automated microscopy systems are possible using our components.
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Scanning Electron Microscopes
SEM
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Scanning Electron Microscopes (SEM) scan a sample with a focused electron beam and obtain images with information about the samples’ topography and composition.
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Digital Automated Interferometer and Microscope for Surface Inspection
DAISI-V3
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The ultimate production interferometer for measuring end-face geometry on single-fiber connectors, equipped with a revolutionary «no-exterior-moving-parts» mechanical design.
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Scanning Electrochemical Microscope
VS-SECM (DC And AC)
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The SECM integrates a positioning system, a bipotentiostat, and an ultramicroelectrode probe or tip. The positioning system moves the probe close to the surface of the sample, within the local imaging zone. The bipotentiostat can polarize the probe only (feedback mode) or the sample and the probe independently (generator-collector mode), while measuring the resulting current(s). The probe is specially designed to have a specific tapered polish (per the RG ratio) and active radius below 100 microns. The positioning system scans the probe and charts position with measured electrochemical parameters, creating a data map of local current.
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Single- Multielement Customized Infrared Detectors
LEPTON uncooled detector
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Single element uncooled VPD PbSe detector, in 2 standard sizes: 1×1 mm2, 2×2 mm2, packaged in SMD or TO-5 (with cap, hermetic) with sapphire window
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High Frequency Infrared Carbon and Sulfur Analyzer
CS-8820
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Wuxi Jinyibo Instrument Technology Co., Ltd.
Infrared detector with low noise, high sensitivity and high stability. The modular design of the whole machine improves the reliability of the instrument. The electronic balance is automatically connected. WINDOWS full Chinese operation interface, easy to operate, easy to master. Dynamic display of various data and carbon in the analysis process. Measuring linear range is wide, and can be expanded. High-frequency circuit design is reasonable, high-frequency furnace power is adjustable, suitable for different material sample analysis requirements. The automatic cleaning device of the burner can reduce the influence of dust on the analysis results. The burner heating device makes the conversion rate of sulfur tend to be consistent, which improves the stability of sulfur determination. Measuring linear range is wide, and can be expanded. The software is fully functional, providing more than forty functions such as file help, system monitoring, channel selection, mathematical statistics, result correction, breakpoint correction, and system diagnosis.
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Benchtop Near Infrared Analyzer
SupNIR-2700
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Radiation in the wavelength range 780–2500 nm (12820 to 4000 cm−1).
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Microscope
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Instrument that produces enlarged images of small objects, allowing the observer an exceedingly close view of minute structures at a scale convenient for examination and analysis.
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Scanning Electron Microscope
Verios G4 XHR SEM
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The Thermo Scientific™ Verios G4 scanning electron microscope (SEM) provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).
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Autofocus Optical Fiber Microscope - AFM-700
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Shanghai Fibretool Technology Co.,Ltd.
The AFM-700 is an autofocusing optical fiber microscope.
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Infrared Camera System
FlareSpection
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The FlareSpection™ system provides extremely clear and reliable flare image and pilot flame monitoring of multiple flare tips. FlareSpection optimizes plant operations, improves safety, and ensures regulatory compliance. It enables you to remotely and automatically confirm flare operation and detect differences in flare stack heat signatures.
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Atomic Force Microscope
XE-PTR
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Park Systems' PTR Series is a fully automatic industrial in-line AFM solution for, but not limited to, automatic Pole Tip Recession measurements on Rowbar-level, individual Slider-level, and HGA-level sliders. With sub-nano scale accuracy, repeatability, and throughput, the PTR Series is the metrology tool of choice for Slider manufacturers to improve their overall production yield.
