Unit Under Test
assures a constituent's interoperability in a system.
See Also: UUT, EUT, System Under Test, Device Under Test
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Test Program Execution for High-Volume Production Systems
ScanExpress Runner Gang
Electronic manufacturing test systems must be fast and efficient. Schedules today are shorter, products are more complex, and the market demands higher speed—the product needs to be built and shipped yesterday.ScanExpress Runner Gang Edition is a concurrent boundary-scan and in-system programming test executive designed specifically for high volume production. Unlike traditional test systems which execute sequentially on a single unit under test (UUT) at a time, ScanExpress Runner Gang Edition provides concurrent (gang) testing on up to 8 UUTs for improved test and programming times.
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RF Microwave Switch Matrices
RF Microwave Switch Matrices provide automatic routing of RF microwave signals between test instrumentation and the unit under test (UUT). They provide consistent signal paths, enable automation of tests, and often include signal conditioning.
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AC Fuel Flow Signal Generator
TA-100
The TA-100 signal generator was designed to facilitate testing of aircraft fuel flow indicators that require two input signals designated as “Drum” and “Impeller”. This generator provides both signals so as to provide a direct interface to the fuel flow indicator under test. The generator also provides switched power out to the unit under test as well as a 5v source for testing the bezel lighting. The original design was built around the requirements for the AMETEK series indicators (pn: 10171 series). This generator simulates a reference and a time delayed signal of appropriate amplitude for an indication of up to 1200pph for the indicator under test. The “PPH Select” switch provides fixed signal delays representing 0, 200, 400, 800, 1000 and 1200pph flow rates respectively, this provides the mechanic with an expedient check of the indicators accuracy. The “PPH Adjust” control allows the mechanic to vary the signal delay throughout the full range and serves as a good method for checking of pointer smoothness from stop to stop. The unit’s front panel also provides test jacks to monitor the “FDR Output” as well as the drum and impeller signals. The TA-100 requires only 28Vdc to operate. This generator provides a very economical approach to any repair facility or flight department as it becomes an alternative to purchasing two bench top signal generators. The TA-100 generator at the very least can provide a simple functional test and eliminate the high cost of exchanging an indicator as a function of troubleshooting the aircraft system.
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Automated Bench Test Equipment
The Automated Bench Test Equipment (BTE) provides a combination of automatically sequenced and manually selected electrical or electro-mechcanical stimulation to an electronic or electro-mechanical unit under test. The system simulates the normal and threshold operational ranges of each of the inputs and communication channels of the unit under test.
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SWB-2812, 16x9, 1 A, Reed Matrix Module for SwitchBlock
781421-12
16x9, 1 A, Reed Matrix Module for SwitchBlock - The SWB‑2812 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Display Color Analyzer
Model 7123
Luminance and chromaticity measurement of Color Display0.005 cd/m2low luminance measurement (A712301)Wide luminance range: 0.0001 to 25,000 cd/m2 (A712301) 0.01 to 200,000 cd/m2 (A712302)High accuracy measurementMaximum 9 display modes: xyY, TΔuvY, u’ v’ Y, RGB, XYZ, Contrast, ProgramAble to control Video Pattern Generator and UUT (Unit Under Test)Built-in contrast measurement function to calculate the contrast ratio directlyEquipped with programmable test items that can complete the planned tests with one single buttonSupport USB flash disk that can copy the test procedures to other station for useJudgment function embedded to judge the test result automatically with one single buttonCalibration period setting and reminding functionMemory for storing 100 channels of standard color data and calibration dataBuilt-in flat display calibration data LCD-D65 & LED-D65* to be applied for chromaticity measurement instantlyOptional display white balance alignment system can be used to integrate all optical test stations to one single station
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Temperature & Humidity Testing
DATASYST Engineering & Testing Services, Inc.
DATASYST can simulate both high and low temperature with humidity conditions. Cycle rates are dependent upon individual chamber capabilities and whether or not a unit under test is powered or not. DATASYST provides humidity testing for a range of industry specifications and can work with you on your customized testing requirements.
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Intermittent Fault Detection & Isolation System
IFDIS
The IFDIS™ uses patented Intermittent Fault Detector technology that simultaneously and continuously monitors every circuit path within a Unit Under Test (UUT) - such as a Line Replaceable Unit (LRU) chassis' interconnects - for intermittent continuity failures that occur for as short as 50 nanoseconds. This state of the art technology is combined with an environmental chamber and vibration table, which simulate the UUT’s operational environment and cause intermittent faults to manifest, creating a system that is unsurpassed in intermittent fault detection.
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ITA, G12, Front Mount, 12 Module With Protective Cover
410104322
The G12 ITA can be used with all G12 Receivers. The ITA can be used in a number of applications to accomplish the required connection to the Unit Under Test (UUT). You can mount a VPC Enclosure or customize your own fixture to be attached to the ITA. These are front mounted for ease of installation. A wide range of ITA modules are available separately for user configuration.
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MESA Vibration Control
MESA tests are specifically required when the unit under test is too heavy or too big and exceeds the capabilities of a single shaker. In a MESA application, multiple shakers provide excitation to the test specimen in a single axis. Different relations like same magnitude and phase for drives, different phase for drives, different magnitude and phase for drives, can be set for this MESA test.
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Second Level Protection Product Range
RO-1000
Rovsing has developed a range of Second Level Protection (SLP) products to ensure that the electric subsystem of the unit under test is not inadvertently damaged by the test equipment. Our SLP solutions are separated into High and Low current variants.
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SWB-2810, 4x43, 1 A, No Row Access, Reed Relay Matrix Module for SwitchBlock
781421-10
4x43, 1 A, No Row Access, Reed Matrix Module for SwitchBlock - The SWB‑2810 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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SWB-2811, 8x21, 1 A, Reed Relay Matrix Module for SwitchBlock
781420-11
8x21, 1 A, Reed Matrix Module for SwitchBlock - The SWB‑2811 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Torque Measuring and Monitoring System
WISER 4000
TECAT Performance Systems, LLC
The WISER 4000 system is the latest release of TECAT’s low-cost, ultra-low power and extremely accurate torque sensor. The wireless system has the optional ability to measure 3-axis acceleration, barometric pressure and ambient temperature, all within the same incredibly small footprint. The 4000 includes on-board data logging without PC or DAQ connectivity, and remote flash capability, which enables firmware upgrades without removing the system from the unit under test. Featuring shunt calibration, TECAT’s latest WISER system is designed to simplify instrumentation verification for users, while allowing them to check calibration of the system in the field. In addition, the WISER 4000 has been enhanced with two additional outputs, a higher-speed recording, and is available with custom-built remote enclosures to protect the system’s remote unit and battery from damage due to debris.
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Customized Test Fixtures
Test fixture is a device designed to mount a device under test (DUT), equipment under test (EUT) and unit under test (UUT) in place and allow it to be tested by being subjected to controlled electronic test signals and procedures.
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SWB-2834, 8x34, 2 A, Electromechanical Relay Matrix Module for SwitchBlock
781421-34
8x34, 2 A, Electromechanical Relay Matrix Module for SwitchBlock - The SWB‑2834 is an electromechanical relay matrix card for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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DIELECTRIC and CONTINUITY TESTERS ( HI-POTS )
AV-25V-GC1-05
This tester is designed for testing equipment wiht a line cord which can be plugged directly to the tester. The continuity test is to determine whether the ground wire of the line-cord is well connected to the metal frame of the unit under test.
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Multiple Output Bidirectional PSU
LAB-MOBI
Electronic Test & Power Systems
The LAB-MOBI is a series of multi channel High Power Bidirectional PSUs. Each system is able to operate as either a DC Source or a DC Electronic Load. This integrated approach features high dynamics enabling the user to switch seamlessly between quadrants. When sinking energy from the unit under test the LAB-MOBI automatically inverts the DC to AC and synchronises this output to the grid. Dedicated application modes are available for battery cycling and emulation, which can be used to implement specific test routines. Other common applications the LAB-MOBI is used for include testing electric motors, fuel cells, super capacitors and solar panels. Max. Volt. Output 1000V,Min. Power 60kW, Max. Power 500kW.
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PCI Express Gen 3 Test Backplane
SKU-015-01-PCIe
PCI Express Backplane was designed to support a variety of modern PCI Express board’s production testing and debugging. The backplane expands the Host computer into four x16 PCI Express slots via 10 ft. CAT7 data and 10-pin flat Power control cables. PCI Express Backplane and UUTs (unit under test – add-in PCI Express board) are powered by a standard ATX power supply connected to the backplane via 24 and 8 pin power connectors located on the backplane.
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High Voltage Surge Current Monitors
HVSCM
Designed to be used with the Model HVST High Voltage Surge tester. The Surge Current Monitor allows simultaneously surge testing 20 units. The Surge Current Monitor monitors the current going through each unit under test at the time of the surge. If a unit under test breaks down or leaks, the Surge Current Monitor will identify the bad unit by lighting the corresponding LED. The most important features of the surge tester are its ability to test the entire winding insulation system. A high voltage surge generates turn to turn, coil to coil, and phase to phase voltage stress, as well as ground insulation stress. When used as a dielectric test, accurate voltage readings are essential. The HV Surge Tester monitors the voltage directly across the winding under test. In production testing we expect that most of the time the devices will pass. In the event that one should fail, the failed device would be removed and then all the parts would have ot undergo another surge test. Since most devices pass most of the time, simultaneous surge testing can be a real time saver.
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Press Down Rods Bed of Nails Testers
Prober Press Rods Family
Production volume test fixture with swappable test plates, front and rear panel inlays, and multi-testing compatibility with process carrier pallets. Swappable test plates provide the ability for one fixture base to support a variety of units under test. Interchangeable front and rear panel inserts provide further customization. Interoperability with process carrier pallets provide multiple board testing capabilities, panelized testing, and flex circuit testing. A selection of interfaces to general testing equipment provide for a wide selection of customized testing features.
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In-Circuit Tester Integration
The benefits of boundary-scan are noticed in all phases of a product life cycle. By coupling the power of Corelis boundary-scan tools with an In-Circuit Tester (ICT), a complete, integrated solution is available that offers the best advantages of both technologies.Boundary-scan operates as the perfect companion to ICT. Boundary-scan is capable of testing areas of printed circuit board assemblies that are difficult to access due to physical space constraints and loss of physical access, which is often due to fine pitch components such as Ball Grid Array (BGA) devices. Conversely, the ICT is able to check the non-boundary-scan compatible portion of the unit under test (UUT) such as analog.
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ITA, G12x, Front Mount, 18 Module
410104474
The G12x ITA can be used with all G12x Receivers. The ITA can be used in a number of applications to accomplish the required connection to the Unit Under Test (UUT). You can mount a VPC Enclosure or customize your own fixture to be attached to the ITA. These are front mounted for ease of installation. A wide range of ITA modules are available separately for user configuration.
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SWB-2833, 4x71, 2 A, Electromechanical Relay Matrix Module for SwitchBlock
781421-33
4x71, 2 A, Electromechanical Relay Matrix Module for SwitchBlock - The SWB‑2833 is an electromechanical relay matrix card for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Universal Breakout Test Fixture
CA-323
The CA-323 Universal Breakout test fixture was designed to provide, as the name suggests, a universal test solution for aircraft trouble-shooting. The unit gives the technician the ability to monitor (100) different conductors or open an individual conductor for simulation or measurement. Any avionics component can be extended and in many cases with only a voltmeter and oscilloscope the operation in question of the Unit Under Test can be determined.
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Flex Socket Test Module
JT 2127/Flex Socket Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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96 Channel DPST Relay And Control PXI Carrier Card
GX6196
The GX6196 is a 6U PXI switch and control board that can be used to create custom switching, signal conditioning, or specific UUT control interfaces. The board provides 96, 2 pole, form A relays, 8 digital I/O lines, and a serial digital interface. All of these resources are available via (5) inter-board connectors which interface to the user defined daughter / mezzanine board. The mezzanine board provides all connections to the unit under test (UUT) via two 78 pin D-sub connectors. The GX6196 is supplied with a front panel which accepts (2) 78 pin D-sub connectors.
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Multiple Channel Burn In Power Supply
MCPS
The most important features of this burn in power supply is its ability to hold a constant output for each channel even in the event that a unit under test on one channel may short and fail. Since each channel has it''s own transformer, no glitches or voltage spikes can get into any of the other channels. This image shows the results as the second channel from the left is shorted with a small wire and the circuit breaker pops out. Used for burn-in testing and other timed testing where power isolation is required. Very basic simple circuit, see schematic below. Cleans and frees up benchtops, burn in racks and work space clutter. Available in benchtop or rackmount.
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Adjustable Press Plate Bed of Nails Testers
Prober Adjustable Family
Production volume test fixture with swappable test plates, front and rear panel inlays, and multi-testing compatibility with process carrier pallets. Swappable test plates provide the ability for one fixture base to support a variety of units under test. Interchangeable front and rear panel inserts provide further customization. Interoperability with process carrier pallets provide multiple board testing capabilities, panelized testing, and flex circuit testing. A selection of interfaces to general testing equipment provide for a wide selection of customized testing features.
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Averna LAUNCH
Are you optimizing your time managing your smart data? Averna Launch consolidates all test data from your smart factories and delivers results in both real-time and user-friendly reports. By automatically detecting the unit under test (UUT) Launch runs all required test sequences, predetermined by you.
