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Process Monitoring
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Tool and Process Monitoring
BK MIKRO
BK Mikro is typically used as a broken tool detection system but can also be used for many other applications such as object inspection, position recognition and checking for part defects. The selection of the scanner and controller for broken tool detection systems is mainly application based. Follow the links below to explore specific models or contact us with application questions about our broken tool detection systems.
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Process Monitoring and Control Systems
ComoNeo and ComoScout
Consistent digitization increases product quality and cost-effectiveness in injection molding production. The ComoNeo and ComoScout process monitoring system ensure that both newcomers and experienced users can monitor and control their processes precisely and efficiently.
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Pharmaceutical Process Monitoring
Our pharmaceutical products target aseptic fill/finish manufacturing applications including manufacturing operations that utilize barrier isolators and lyophilization, often used to process the fastest growing segment of the pharmaceutical industry, biopharmaceuticals.
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Radiation And Process Monitoring Systems
ProTK
Monitoring of the main steam line for leakages in a PWR nuclear power plant with a wide-range gamma ionization chamber.
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Converter
156
The single channel 156 converter is designed for the control of an optek AF56 / AS56 optical sensor or probe for process monitoring. Range settings and configurable alarms add flexibility in the process control. Analogue signals can be passed e.g., to PLC.
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Firmware for High-speed Communication
OP-FW12GA
OP-FW12GA is the firmware to increase the speed of monitoring test of bit synchronous communication (such as HDLC/SDLC/X.25, or CC-Link communication), SPI communication, Profibus-DP (field bus known for high-speed communication), UART (asynchronous communication, which is commonly used). By processing great part of monitoring processes by FPGA, it unfailingly captures communication data with time stamps of a microsecond rate. The interface supports RS-232C/RS-422/RS-485/TTL.
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High-Resolution Thermographic Camera
Ceres T 640 Series
The Ceres T 640 series is based upon the Dione 640 OEM thermal imaging core with 640×480 pixels and 12 µm pixel pitch and NETD of less than 50 mK. The camera offers superior on-board thermographic performance (accuracy, stability) in the temperature range up to 400 °C.The Ceres T 640 camera outputs full frame images at 60 Hz via either a CameraLink or GigE Vision interface – all GenICam compliant.The compact size and excellent thermographic stability and accuracy, and GenICam compliant interfacing allow for easy integration in demanding industrial thermography applications.The camera offers one standard option of lens and thermal calibration pack.The compact Ceres T 640 series find application in process monitoring, medical and scientific and advanced research.Benefits & Features• Compact size and high-performance• Superior on-board thermographic performance (stability, accuracy)• GenICam compliant• Uncooled operation
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Condition Monitoring
Is the process of monitoring a parameter of condition in machinery (vibration, temperature etc.), in order to identify a significant change which is indicative of a developing fault.
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Process Improvement
Omron’s numerous software solutions for quality control, process improvement, defect monitoring and more are ideal for PCB manufacturers seeking to boost productivity.
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Construction Management Company In USA
The process of monitoring construction projects throughout the design, preconstruction, procurement, and owner-occupancy stages is building construction management. Ensured quality and cost-saving with minimized risk are offered by coordination among experienced engineers, construction managers, and BIM consultants. Tejjy Inc. is a construction management firm in USA that strategically plans, budgets (cost and material estimation), and organizes project optimization. Our design-build framework adopts the latest BIM automation trends in Construction for a greater transparency and collaborative approach to AEC services.
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Network Monitoring Tool
Motadata’s proactive network performance monitoring tool can be used to automatically discover network devices, interfaces, and applications. The network monitoring software in a multivendor IT environment ensures complete visibility of IT infrastructure. The unified view enables IT admins with a comprehensive picture of the overall IT health and also provides drill-down root-cause analysis, enabling them to resolve network issues even before they affect business processes. It facilitates monitoring of hybrid multi-vendor environment using 100+ pre-defined monitoring templates with immediate notifications on the set threshold values.
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Carbon Compound Instruments
Teledyne Advanced Pollution Instrumentation
Teledyne API's Carbon compound analyzers utilize Gas Filter Correlation combined with reliable NDIR (non-dispersed infrared) technology to produce very stable and accurate gas measurements. All T Series instruments offer two front-panel USB ports, an advanced touch screen full color display, customizable user interface with predictive maintenance alerts, one-touch real-time graphing, and multiple language support. All of our instruments are designed meet the rigorous demands of ambient air quality, stack, or industrial process gas monitoring.
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NIR Systems
NIR spectroscopy is a proven analytical method guaranteeing reliable and efficient process monitoring and control in a wide range of process applications.
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Metrology
KLA’s metrology systems address a range of chip and substrate manufacturing applications, including verification of design manufacturability, new process characterization and high volume manufacturing process monitoring. By providing precise measurement of pattern dimensions, film thicknesses, layer-to-layer alignment, pattern placement, surface topography and electro-optical properties, our comprehensive set of metrology systems allows chip manufacturers to maintain tight control of their processes for improved device performance and yield.
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PTI/PMAC/USB Sensor System Examples
*System for any strain gage based sensor*Compatible with every sensor is this catalog*Process monitoring*Process control*Portable datalogging*Portable, compact, and lightweight
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Software
MOS C-V Measurement and Analysis
Materials Development Corporation
MOS capacitance-voltage measurement is one of the most common process monitoring diagnostics employed in device manufacturing. A vast amount of information can be derived from this simple test.
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Process And Chamber Monitoring Software & Systems
MKS process and monitoring solutions feature real-time, web-enabled, hardware, software, and systems to support a variety of tools and processes. These solutions improve performance and yield while reducing tool damage and false alarms.
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Pneumatic Transmitter
Indicating pneumatic transmitter assists in the coordination of key functional areas within facilities. Transmitting data efficiently and accurately, it ensures operating economies and safety. A good product for process control and monitoring.
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Substrate Manufacturing
KLA’s substrate manufacturing portfolio includes defect inspection and review, metrology and data management systems that help substrate manufacturers manage quality throughout the wafer fabrication process. Specialized wafer inspection and review tools assess wafer surface quality and detect, count and bin defects during production and as a critical part of outgoing wafer qualification. Wafer geometry systems ensure the wafer shape is extremely flat and uniform in thickness, with precisely controlled wafer shape topography. Data analysis and management systems proactively identify substrate fabrication process excursions that can lead to yield loss. KLA’s substrate manufacturing systems support process development, production monitoring and final quality check of a broad range of substrate types and sizes including silicon, prime silicon, SOI, sapphire, glass, GaAs, SiC, GaN, InP, GaSb, Ge, LiTaO3, LiNBO3, and epitaxial wafers.
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Process Monitoring, DAQ & Software
sigPOD
sigPOD is Sciemetric’s out-of-the-box solution for monitoring test and assembly processes that standardizes part test and process monitoring onto a single platform for manufacturers. With sigPOD, process signature verification can be deployed across the production line on virtually any manufacturing process. Gain the data-driven insight you need to compete in an Industry 4.0 world.
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Process Automation Controllers
As innovators in programmable control, communication protocols, embedded analytics, and gateway technology, MKS has the critical building blocks and experience to deliver the latest technologies for distributed automation control and process monitoring to our customers, personalized for their exact requirements. We offer a complete Automation Platform solution along with a suite of Automation Control hardware and software configurable modules that allow semiconductor and other industrial manufacturing customers to better automate their processes through computer-controlled automation and seamlessly integrate with existing MKS products to provide a complete solution. Our expertise in control technology enables manufacturers worldwide to operate with greater productivity and streamlined efficiency. MKS works closely with our customers to provide proven, real time solutions that save time and money, reduce inefficiencies and enable faster implementation.
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Precision LCR Meter
1693
The GenRad 1693 LCR Meter Bridge gives you the best combination of features, in an LCR meter, to meet your most demanding testing requirements. It's a versatile, flexible instrument with a full range of programmable test frequencies, speeds, and voltages. An easy to understand display show both primary and secondary measurement parameters. The Digibridge is an excellent choice for metrology applications requiring accurate and repeatable measurements. The 1693 is also widely used in production testing, incoming inspection, component design and evaluation, process monitoring or dielectric measurement applications.
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Defect Inspection and Review
KLA’s defect inspection and review systems cover the full range of yield applications within the chip and wafer manufacturing environments, including incoming process tool qualification, wafer qualification, research and development, and tool, process and line monitoring. Patterned and unpatterned wafer defect inspection and review systems find, identify and classify particles and pattern defects on the front surface, back surface and edge of the wafer. This information allows engineers to detect, resolve and monitor critical yield excursions, resulting in faster yield ramp and higher production yield.
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Precision Impedance Meter
1689
The GenRad 1689 Precision Impedance Meter gives you the best performance for your most demanding applications whether they be production test, incoming inspection, component design and evaluation, process monitoring or dielectric measurement. It is a versatile, full function microprocessor-based passive component tester that's available in a rack mountable, (1689M) model.
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Industrial High Temp Thermal Camera
FLIR TG297
The FLIR TG297 is a one-of-a-kind industrial diagnostic tool that combines accurate temperature measurement with the ability to image up to 1030°C (1886°F). Patented FLIR MSX® (Multi-Spectral Dynamic Imaging) enhancement improves image clarity by embossing visual scene details on full thermal images. The TG297 is ideal for high-temperature industrial uses such as measuring the heat of glass furnaces, kilns, and forges as well as manufacturing applications, allowing you to accurately target potential faults, troubleshoot repairs, and monitor processes. Record images to assure your team that machinery and systems are functioning safely and at peak efficiency.
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Nuclear Power Radiation Monitoring Systems
From continuous area monitors, radiation detectors, process monitors and remote indicators and alarms, featuring industry-standard technology, Victoreen instruments are the trusted source for radiation monitoring systems and quality assurance for nuclear power professionals. With a wide range of solutions for maintaining Code of Federal Regulations-compliant facilities, Victoreen delivers the safety, reliability and quality needed to guarantee top performance for the global atomic energy community.
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Ultra-compact thermal imaging core
Dione S 1024 CAM Series
The Dione S 1024 CAM series is based upon the Dione 1024 OEM thermal imaging core with 1024×768 pixels and 12 μm pixel pitch. The NETD is less than 40 mK (available upon request) or 50 mK. The maximum frame rate is 80 Hz.Dione S 1024 CAM is a LWIR uncooled thermal imaging SWaP module with housing supporting M34/M45 lens (optional).Dione S 1024 CAM series benefit from Xenics image enhancement for advanced image processing while keeping power consumption low. Moreover, GenICam compliance and the availability of multiple lenses provide a high level of tunability for optimal integration into many systems.The compact Dione S 1024 CAM series find applications in safety and security, transportation and industrial process monitoring.
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100 amu CIS Analyzer
CIS300
Stanford Research Systems, Inc.
With better than 1 ppm detection limit, direct sampling at mTorr pressure, and a user-friendly Windows software package, the CIS systems will satisfy your most demanding applications. On-line process monitoring and control, verification of process gas purity at the point of use, high-vacuum residual gas analysis, and process equipment leak checking are some of the areas where these systems will prove indispensable
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Residual Gas Analyzers, Mass Spectrometers
the market-leading Residual Gas Analyzer (RGA) process monitoring system in the semiconductor industry for over a decade. Now Transpector CPM 3 provides industry leading measurement speed and sensitivity through a field proven pumping and inlet system integrated with a new sensor and electronics. Transpector CPM 3 is the ideal RGA process monitor for new and established semiconductor processes such as ALD, CVD, PVD, and Etch.
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Process Visualization
LaserLinc offers a variety of software interfaces for enhanced process monitoring, display, control, and reporting.