Test Cards
See Also: Cards, Extender Cards, Probe Cards, POST Cards
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Product
Test Workflow Pro
test
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Product
Wireless Test Standards Software
test
Generate and analyze signals for cellular and connectivity standards with NI PXI RF instrumentationPerform advanced automated test with the easy-to-use NI-RFmx software APISave on all NI RF wireless test software under a single license
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Product
Scalable Tester System for Functional Testing
UTP6010
Functional Test
The UTP6010 is a scalable tester system for functional testing, comprising an integrated main switching unit, a keyboard drawer and a swivelling monitor. It is the reliable, modular, low priced UTP starter kit. The system is suitable for tester applications, where space-saving devices are required, because its construction height is only 12 HU (excluding keyboard drawer and main switching unit).
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Product
High Speed Test Bench
AT444
Test Platform
AC motor with mechanical multiplying gearbox test benches allow precise programming of all drive parameters required for accurate rotating devices test.The use of special high-speed bearings, mechanical components and parts wear resistant leads to a large life. The supply includes the electronic drive and control as well as the entire oil cooling unit.
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Product
Lens Module Test Platform
Test Platform
The Lens Module Test Platform is a flexible solution to deliver the quality that is expected from your brand for all types of lenses and cameras. The system can be configured to measure objective, eyepiece or camera lenses. As the platform can efficiently measure lenses as small as 2 mm3, it is perfect for the critically precise applications of life sciences, consumer electronics, automotive and other industries. With 25+ years of quality experience, the Lens Module Test Platform ensures that all products shipped to market work as intended.
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Product
Military Communications Test
Test Platform
Astronics testers for military radios and wireless communications systems help you keep your most critical communications up and running smoothly. Write test program sets once and deploy them instantaneously everywhere – whether your test set is in the factory, at the depot, or in operation.
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Product
Disk Drive Test System
Saturn
Test System
The Saturn HD is the industry leader in 3.5” Near-Line Hard Disk Drive (HDD) testing. It provides maximum throughput while minimizing factory floor space and power consumption. The system is designed to perform single insertion of SSW, BDSW and Burn-In as well as drive configuration. Using Saturn HD on the production floor will reduce drive build times, enable greater responsiveness to data center demands and lower test costs per HDD unit.
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Product
Mini PCI Express Interface Card
MPCIE-1553
Interface Card
The MPCIE-1553 is a mini PCI Express Full-Mini Type 2 Interface Card for MIL-STD-1553 networks. Coupled with AltaAPI Represents the Latest MIL-STD-1553 32-bit FPGA Protocol Engine Technology with Multi-Layer Software - in an amazingly small package.
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Product
2-Quadrant Source/Measure Unit for Functional Test, 20 V, 1 A or 6 V, 3 A, 20 W
N6782A
Functional Test
The Keysight N6782A is a source/measure unit (SMU) designed specifically for advanced functional testing of a device. The ability to modulate the output up to 100 kHz along with capability to source and sink current (2-quadrant operation) makes the N6782A a perfect fit for advanced functional test of a variety of devices such as DC/DC converters, power management units, power amplifiers, and power management ICs. The input stage of the DUT can be stimulated by the fast sourcing and waveform capabilities. While the output stage can be loaded down and measured with the electronic load capabilities, providing a total test solution.
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Product
Fully-Automated CTIA-Compliant OTA Test System
TS8991
Test System
The R&S®TS8991 OTA performance test system measures the spatial radiation and sensitivity characteristic as specified by CTIA and 3GPP.The system software provides ready-to-use test templates for OTA measurements and supports all wireless standards.The integrated report function collects all measured test data such as graphics or numeric results, test environments, EUT information and hardware setup in one document.
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Product
Test Instruments
Test Instrument
Test instrumentation from COTS to custom, including VXI, PXI and LXI-based platforms.
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Product
ARINC PCI Express 4 Lane Interface Cards
PCIE4L-A429
Interface Card
Alta Data Technologies’ PCIE4L-A429 interface module offers a variety of ARINC-419/429/575/573/717 channel configurations with software selectable RX/Tx channels, baud rates, bit encoding and word configurations (Start/Sync/Stop length, Parity, bits/word, MSB/LSB). Encode or decode almost any ARINC-429 physical layer signal. The 4 lane card (PCIE4L) is normal 1/2 height common for most desktop and larger server systems.
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Product
Communications Test System for Frontline Diagnostics
CTS-2750
Test System
The CTS-2750 is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The field-upgradeable, software-defined architecture features easy-to-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets can be created easily using the included TestEZ® software suite.
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Product
Digital/Pattern/PE Card
PE32H
Interface Card
The PE32H represents a new level of performance and capabilities for PXI-based digital instrumentation. Based on the proven architecture of the PE32, the PE32H offers high performance pin electronics and an enhanced timing generator in a compact, 3U PXI form factor. Each card can function as a stand-alone digital subsystem or if required, multiple cards can be interconnected, supporting up to 256 bi-directional pins (8 boards). The PE32H also supports deep pattern memory by offering 32M of on-board vector memory with dynamic per pin direction control and with test rates up to 66 MHz. With new 32M log memory, PE32H can capture 32 channels data or fail log.
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Product
Modular Cards
SET 14XX
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The carrier boards from the SET Modular Card 1415 / 1416 / 1417 series offer slots for 8 functional/measuring modules from the SET “SMARTbrick” series.
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Product
Network Interface Card
NIC10G
Interface Card
Featuring the Intel 82599ES dual 10GbE controller, the NIC10G supports flow control, integrated IPsec security engines, optimized queues, IPv6 offloading, advanced filtering capabilities, and Tx/Rx IP, TCP and UDP checksum offloading capability. Also has integrated a PCI Express Gen 2 interface supporting up to 8 lanes.
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Product
Carrier Card
VIPC627-ET
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VIPC627-ET is a 6U VME carrier card with four IP slots and extended temperature range. Two 50-pin, 0.1 inch flat ribbon cable connectors mounted in the front panel provide access to all IP I/O lines. Also, all I/O lines of 'IP D' are routed to VME P2 and 14 user selectable I/O lines of 'IP C' can be routed to VME P2 via a jumper field.
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Product
LTE RRM Test System
T4010S
Test System
The T4020S LTE RRM tester is the Keysight platform for LTE RRM conformance testing of LTE UEs. T4020S belongs to the Keysight LTE product family and, as the other LTE T4000S test platforms, is based on the T2010A LTE Wireless Communications Test Set.
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Product
Daughter Cards
FMC/BPX
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Daughter cards provide extensions to HES or TySOM boards providing additional devices and peripherals not included in these boards. Due to using non-proprietary connectors like FMC or BPX the daughter cards can be reused across different hardware platforms.
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Product
H(3)TRB & HTGB Test Systems
Test System
SET offers two H(3)TRB and HTGB product lines which differ in the number of test object channels and the range of technical possibilities. The innovative systems are scalable, modular and standardized.
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Product
Probe Card
VS Series
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Japan Electronic Materials Corp.
*Vertical contact Probe Card with Spring*Suitable for Area array Bump Test
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Product
Digital Test Instruments
Test Instrument
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.
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Product
In-Line RF Test Platform
AR925
Test Platform
This functional and RF test platform combines outstanding productivity with substantial equipment savings. The Faraday chamber of the fixture comes with an interchangeable cassette to minimize the testing cost of each new product
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Product
In-Circuit Test System
TestStation LX
Test System
TestStation LX is a cost-effective in-circuit test solution providing high-volume electronics manufacturers with reliable, high-quality test for the latest printed circuit board assembly technologies.
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Product
CompactFlash Cards
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Curtiss-Wright Defense Solutions
Our CompactFlash cards are removable mass storage devices that are rugged for use in our recorder products. The recorder controls data storage to the CompactFlash card. Card data is read and erased using a standard CompactFlash card readers. For information on card initialization, recording and playback refer to the respective recorder data sheet.
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Product
FPGA Card
VP868
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The VP868 is a high performance 6U OpenVPX (VITA-65) compliant plug-in module with advanced digital signal processing capabilities. At the heart of the VP868 is a Zynq dual Arm-9 device for processing offload and board management.
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Product
Probe Card
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Japan Electronic Materials Corp.
The probe card is a tool for testing semiconductors used at "Wafer Test" to check quality of IC or LSI in the first process of semiconductor manufacturing. The probe card is expendable.
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Product
Embedded MXM GPU Module with NVIDIA® Quadro® Embedded RTX5000
EGX-MXM-RTX5000
Graphics Card
The EGX-MXM-RTX5000 module features advanced NVIDIA® Turing™ GPU technology in MXM 3.1 Type B+ form factor. It’s compact, slim and reliable design makes it suitable for mission critical environment. EGX-MXM-RTX5000 supports 4 DP 1.4b displays offering a flexible and easy solution for medical and gaming applications.
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Product
GSM/EDGE Analysis Using NI PXI RF Test Instruments
NI-RFmx GSM/EDGE
Test Instrument
The NI-RFmx GSM/EDGE personality is a highly optimized API for performing physical layer measurements on GSM/EDGE cellular standard signals. NI-RFmx GSM/EDGE is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
