Test Cards
See Also: Cards, Extender Cards, Probe Cards, POST Cards
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Product
Scienlab Battery Test System – Pack Level, 330 KW
SL1740A
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Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Product
Automated Test Systems
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WinSoft designs, develops and integrates automated functional test systems for use in aerospace, military, high tech and commercial applications
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Product
TestStand
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TestStand is industry-standard test management software that helps test and validation engineers build and deploy automated test systems faster. TestStand includes a ready-to-run test sequence engine that supports multiple test code languages, flexible result reporting, and parallel/multithreaded test.
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Product
PCI Express Graphics Card With NVIDIA RTX 5000 Ada
NVIDIA RTX 5000 Ada
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- NVIDIA Ada Lovelace Architecture- Full height, full length design- PCIe Gen4x16 interface- 32GB GDDR6 Memory, 256-bit Bandwidth- 12800 CUDA Cores, 65.3 TFLOPS SP Peak
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Product
2-Module ICT System, I317x Series 6
E9902G
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Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Product
Digital I/O Switch Card - 96 Open Collector Channels in 12 Groups of 8 Bits Each
1260-14/14C
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The Astronics 1260-14 Digital I/O Switch Card provides 96 open collector channels in 12 groups of eight bits each. With the open collector version each independent group can utilize a separate internal or external pull-up supply up to 32VDC.Each channel can be configured as an input or an output and individually controlled in the asynchronous mode, or be synchronous with other channels.
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Product
Component Test Fixture For N1413 With B2980 Series
N1428A
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The N1428A is designed to operate specifically with the B2985B / 87B electrometer / high resistance meter. It is provided with two component modules, which are used to hold SMD, lead, and various types of devices. Electrical noise effects are reduced by the employment of a shielded case. A built-in interlock circuit enables safe high-voltage measurements. The N1413A high resistance meter fixture adapter is also required to connect the N1428A to the B2985B / 87B.
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Product
PXI Integration Platform
ATS-3100
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The new ATS-3100 enables you to rise above the module level and shift your focus to the sophisticated test solution you’re actually building. Simply add your instruments, software, and customization to create a complete solution. Or, if you're short on time or resources, ask Astronics Test Systems to do the finishing work for you.
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Product
PCI Express Graphics Card With NVIDIA RTX 2000 Ada
NVIDIA RTX 2000 Ada
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- NVIDIA Ada Lovelace Architecture- Half height, half length design- PCIe Gen4x8 interface- 16GB GDDR6 Memory, 128-bit Bandwidth- 2816 CUDA Cores, 12 TFLOPS SP Peak- 88 Tensor Cores, 191.9 TFLOPS- 4 x mDP (mini Display Port 1.4), 1 x USB-C
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Product
Test Fixture, Axial And Radial
16047A
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The 16047A is designed for impedance evaluation of axial/radial lead type devices of up to 13MHz. The 16047A employs Kelvin contacts which realize a wide impedance measurement range. The contact tip can be changed according to the device shape.
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Product
Standalone Bench Test System for FCT, ICT, ISP and Boundary Scan
LEON Bench
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The LEONBench test system is a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors. The system is optimized for high pin count test applications. Furthermore, it can be equipped with vacuum and pneumatic. Support for multi-level contact fixtures enables separate contact levels for FCT and ICT. The Konrad ITA (Interchangeable Test Adapter) frame allows various fixture houses all over the world to build custom fixtures for the LEONBench. Up to 15U additional rack space allows adding a bunch of high-performance measurement devices from various manufactures. An integrated power distribution unit takes care about power on and off sequencing.As part of the LEON Family, LEONBench is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Product
In-Line Test Fixture for 6TL33/6TL36
AB799/AT799
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Fixture Kit for Platforms featuring receiver Virginia Panel 9025 and external pusher system. Its heavy duty design supports more than 1.000N.nnThe fixture kit includes the Base fixture (probe plate) as well as the Puhsers plate.
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Product
ARINC PCI Express One Lane Interface Card
PCIE1L-A429
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The ARINC PCIE1L-A429 Interface Card and AltaAPI Support Software Represent the Latest ARINC 32-bit FPGA Protocol Engine Technology. Encode and Decode almost Any ARINC-429 PHY Level Label/Word Signal. The First Card in the Industry to Offer Advanced Test Functions of Signal Generation and A/D Signal Capture. The one lane card PCIe is the industry first low profile
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Product
ARINC-429/717 PMC Interface For SBCs, VPX, VME, CPCI/PXI Systems
PMC-A429
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The PMC-A429 card is based on the industry’s most advanced 32-bit ARINC FPGA protocol engine, AltaCore™, and a feature-rich application programming interface, AltaAPI™, which is a multi-layer ANSI C and Windows .NET 2.0 (MSVS 2005 C++, C#, VB .NET) architecture. This hardware and software package provides increased system performance and flexibility while reducing integration time.
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Product
Massively Parallel Parametric Test System
P9001A
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The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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Product
cPCI Card
EXC-4000cPCI/xx
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The EXC-4000cPCI/xx card for Compact PCI computers supports up to four dual redundant 1553 channels using the M4K1553Px(S) module and is compatible with all common variations of MIL-STD-1553 (A, B).
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Product
SoC Test System
V93000 SoC / Smart Scale
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Advantest’s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. The user benefits are reduced test time, best repeatability and simplified program creation. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change.
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Product
In-Circuit Test System Repairs
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Forwessun provides expert repair services for a wide range of Test Systems, helping you maintain optimal performance and extend the life of your equipment. Our team of skilled technicians quickly identifies and addresses issues, ensuring that your system is back in operation with minimal downtime. We handle both routine and complex repairs, offering comprehensive solutions to keep your systems running efficiently and reliably.
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Product
2-Axis Stepping And Servo Motor Control Universal PCI Card
PCI-1220U
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Independent 2-axis motion controlHand wheel and jog function2-axis linear interpolation function2-axis circular interpolation functionContinuous interpolation functionProgrammable T/S-curve acceleration/deceleration rateUp to 4 Mpps output for each axisTwo pulse output types: CW/CCW or pulse/directionUp to 1 MHz encoder input for each axisTwo encoder pulse input types: A/B phase or up/downConstant speed controlPosition management and software limit switch functionBoardID™ switch
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Product
6TL36 Inline Handler
AM304
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Test handler 6TL36 able to test DUTs inside Faraday ChamberDual line (bypass)
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Product
2 Port 100GbE Fiber Bypass Network Mezzanine Card
NMC-6004FBD
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1 x NVIDIA Connect X-6, 2 ports 100GBase-SR4. PCIe x 16, Gen 4, CE/FCC, RoHS compliant.
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Product
Terotest iTest
iTest
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iTest is primarily a Functional Test platform which is easily configured to test PCB's, complete assemblies or individual devices. In addition, iTest's MDA capability offers the user the opportunity to perform low cost In- Circuit (MDA) testing as well as Combinational testing. Easy integration of 3U & 6U PXI modules, LXI, USB, GPIB and more.
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Product
64-Ch Isolated Digital I/O PCIE Card
PCIE-1756
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Wide output range (5 ~ 40 VDC)High sink current on isolated output channels (500mA max./ch)Wide input range (10 ~ 30 VDC)High-voltage isolation (2,500 VDC)Interrupt handling capability2,000 VDC ESD protectionEither +/- voltage input for DI by groupHigh over-voltage protection (70 VDC)Output status read-backKeeps the output settings and values after system hot resetChannel-freeze function
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Product
True Concurrent Test
TestStation Duo
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The TestStation Duo is a true concurrent test system with independent test modules providing fast in-circuit test throughput and lowering high-volume production costs.It effectively doubles the test throughput of conventional in-circuit test systems, without doubling capital equipment costs or increasing manufacturing floor space, by combining two complete and independent test modules inside a single tester frame.
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Product
Memory Test System
T5221
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The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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Product
High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
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Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
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Product
ARINC PCI Interface Card
PCI-A429
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Alta Data Technologies’ PCI-A429 interface module offers a variety of ARINC-419/429/575/573/717 channel configurations with software selectable RX/Tx channels, baud rates, bit encoding and word configurations (Start/Sync/Stop length, Parity, bits/word, MSB/LSB). Encode or decode almost any ARINC-429 physical layer signal.
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Product
SoC/Analog Test System
3650-S2
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The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
Flexible Cable, 2.4 Mm To 3.5 Mm
85134H
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The Keysight 85134H is a 62.9 cm (24.75 in) long1 flexible cable with a 2.4 mm female2 to 3.5 mm male connector. Cable frequency range is dc to 26.5 GHz with a return loss greater than or equal to 16 dB. Insertion loss is 0.31 * sqrt (f) + 0.2 (where f is frequency is GHz) for the test port connector and 1.8 dB at maximum frequency for the device connector. Phase stability of semi-rigid/flexible cables is characterized with a 90 degree bend using a 2.5 inch radius. Stability1 of the Keysight 85134H is less than 0.12 dB and phase is less than 0.13o * f + 0.5o, (where f is frequency in GHz).
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Product
ARINC-708 Module
M4K708
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The M4K708 module is an ARINC-708 / 453 2-channel test and simulation module for the Weather Radar Display Databus. The M4K708 supports two ARINC-708 / 453 channels, each selectable as transmit or receive.
