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Areal Confocal 3D Measurement
µsurf
The measuring system of the µsurf-product line enable automated 3D surface measurements of roughness, topography, layer thickness and volume. µsurf-measuring systems are available in different designs: from compact mobile systems and laboratory solutions up to multisensor setups on granite portal for use near production lines.
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High Quality UCI - And Leeb-measuring Technology
SONODUR Product Family
Foerster Instruments, Incorporated
The non-destructive UCI test method (Ultrasonic Contact Impedance) as well as the Leeb test method enable fast and mobile measurement as a supplement to the classical hardness test. Due to the compact measuring probes and sensors of the SONO series, the devices can also be used in difficult test positions and with complex component geometries. Fields of application are e.g. incoming goods inspection, mix-up testing, production control, quality assurance, weld seam testing, cut edge testing, maintenance on installed components as well as the replacement of dynamic hardness testers for small material thicknesses (below 50 mm, e.g. boilers, tubes).
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Push-Pull Flexible Cables
New FPC connectors corresponding to the manufacturer’s recommended flexible board thickness of 0.15 mm and 0.2 mm for 0.3 mm pitch and 0.25 mm and 0.3 mm for 0.5 mm pitch are affixed to a proud plate and inserted and disconnected 10 times. The connectors are replaced with new connectors after checking conductivity, and the test is repeated with the number of insertion/disconnection cycles recorded for each pitch and board until conductivity fails.he boards are inserted and disconnected manually, taking care to insert and disconnect horizontally. The boards are inserted with the connector opened and disconnected with the connector closed.(Durability figures are guidelines, not guarantees. Actual performance will depend on connector specifications and conditions of use. Hold connectors close to the pins when inserting and disconnecting.)
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ITO (Indium Tin Oxide) Electrode
This quite unique material transmits only visible light whereas it does not transmit UV radiation. Our ITO electrodes consist of 100 nm thick of ITO layer deposited on quartz or borosilicate glass substrate (0.5 mm thick).
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Spectroscopic Ellipsometers
SENresearch 4.0
The SENresearch 4.0 is the new SENTECH spectroscopic ellipsometer. Every individual SENresearch 4.0 spectroscopic ellipsometer is a customer-specific configuration of spectral range, options and field upgradable accessories. SENresearch 4.0 uses fast FTIR ellipsometry for the NIR up to 2,500 nm or 3,500 nm, respectively. It provides broadest spectral range with best S/N ratio and highest, selectable spectral resolution. Silicon films up to 200 µm thickness can be measured. The measurement speed of FTIR ellipsometry compares to diode array configurations, which are also selectable up to 1,700 nm. The new motorized Pyramid Goniometer features an angle range from 20 deg to 100 deg. Optical encoders ensure highest precision and long term stability of angle settings. The spectroscopic ellipsometer arms can be moved independently for scatterometry and angle resolved transmission measurements.
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Cubes/Holders
IDEX Health & Science stocks filter cubes used in fluorescence microscope platforms from the major microscope manufacturers, including Leica Microsystems, Nikon Instruments, Olympus Corp., and Zeiss Microscopy. Our super-resolution filter cubes set the new standard for laser-based microscopes and are optimized for mounting half-wave flatness, 1 mm thick super-resolution dichroic beam-splitters. Whether you order a custom or catalog filter set, complimentary filter mounting into the filter cube of your choice is performed by the certified staff.
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Beam Directional Power Supply Mains
SiteX CP160D
The CP160D is the lightest and most compact generator of the CPSERIES. Featuring a built-in Beryllium window, it is the perfect generator for the inspection of light alloys such as aluminum, magnesium or fiber based materials like glass and carbon, as well as the greater thickness of steel. In fact, with its penetration capacity that is capable of reaching up to 37 mm of steel, the CP160D is able to execute many different types of NDT tasks without the need to ever have to add extra accessories.
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Wafer Sorter and Inspection
SolarWIS Platform
Eliminating the opportunity for problematic wafers to enter cell manufacturing lines greatly improves output and yield. ASM AE’s wafer sorter features 3D area inspection capability to inspect wafer thickness, total thickness variation (TTV), saw marks, as well as wafer bow and warpage. SolarWIS also includes modules that can inspect for stain, geometry, micro-cracks, edge chips, resistivity, P or N conductivity and lifetime.
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Cross Sections and Metallography
Rocky Mountain Laboratories, Inc.
Cross sections are prepared by mounting samples in epoxy and then grinding and polishing the mount for imaging in the optical microscope or Scanning Electron Microscopy (SEM). Valuable information from cross sectioning can include: film thicknesses, inclusions, corrosion thickness, dimensional verification, and subsurface defects. Metallographic cross sections are typically etched to reveal the microstructure. Microstructural analysis can provide information about heat treatment history, corrosion susceptibility, as well as undesirable microconstituents.
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PosiTector Inspection Kits
PosiTector Inspection Kits contain a PosiTector gage body (Standard or Advanced) and 3 probes – coating thickness, environmental and surface profile, as well as, accessories in a convenient hard shell carrying case.
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High Voltage Porosity Detection
High Voltage Technique: The high voltage, or porosity technique, can be used to test coatings up to 25mm (1”) thick and is ideal for inspecting pipelines and other protective coatings. Coatings on concrete can also be tested using this method.
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Thickness Gauges for Plastic films & Paper
CHY-CA
CHY-CA is a highly precise thickness gauge with mechanical contact method, which can be used to measure the thickness of films, sheeting, paper, corrugated paperboard, textiles, non-woven fabrics, and solid insulation materials, etc.
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Blackbody System
IR-2103/301
Infrared Systems Development Corp.
Infrared Systems Development introduces a NEW Low-Cost Thermo-Electrically cooled / Heated blackbody source. The 0.375" Thick solid Copper Emitter plate provides superior uniformity and energy emission. Our Proprietary High Emissivity Black Coating provides >0.95 uniform Emissivity from 0.8 to 30 um.
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Leading Edge Sensors
The LaserGauge® Leading Edge Profiling System consists of a handheld or benchtop sensor and the Leading Edge software application. Designed to scan both sides of the blade simultaneously, the sensor returns a complete profile around the radius of the blade, which allows accurate measurements of the thickness and the plotting of the blade profile for comparison to its engineering design.
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Falling Dart Impact Tester
DRK135A
Shandong Drick Instruments Co., Ltd.
DRK135A Falling Dart Impact Tester is applicable in the impact result and energy measurement of the falling dart from a certain height against plastic films and sheets with thickness less than 1mm, which would result in 50% tested specimen failure.
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Bond Inspection
Increasingly thin wires, finer pitches, as well as more applications of thick wire for higher capacities are among the current trends in wire bonding. At the same time, the requirements for robust and defect-free bonds are increasing, for example in assistance systems in the automotive sector and in RF modules in the 5G mobile communications network. This makes reliable inspections extremely important.
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Process EDXRF Spectrometer
NEX LS
Applied Rigaku Technologies, Inc
Featuring advanced third generation EDXRF technology, the Rigaku NEX LS represents the next evolution of scanning multi-element process coatings analyzers for web or coil applications. To deliver superior analytical performance and reliability, the EDXRF measuring head assembly was derived from the established Rigaku NEX Series high-resolution benchtop instrumentation. With this proven technology, the Rigaku NEX LS delivers rapid, non-destructive, multi-element analyses — for coat weight, coating thickness and/or composition — for elements from aluminum (Al) through uranium (U). The measuring head is mounted on a rigid beam and is equipped with a linear traversing mechanism positioned over a roller so that the head-to-surface distance is constant. Common applications include silicone release coaters, converters, denesting Si for vacuum-formed plastics, RoHS compliance, conversion coatings, metalized plastic, top coatings on metal coil and fire retardants on fabric.
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Shallow Water Ice Profiler
The Shallow Water Ice Profiler (SWIP) is a real-time acoustic ice thickness measurement (ice draft) instrument for shallow water applications. The underwater components include a low-cost acoustic transducer, a tilt sensor, a high-precision pressure sensor and a temperature sensor, all providing suitably high resolution for shallow water measurements.
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Graphene Foils
for thicknesses ≥5 µm. At this time, graphene foils are not part of our regular product portfolio yet. A small quantity of research samples is available upon special request.
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Anti-Sulfur Resistors
Panasonic Industrial Devices Sales Company of America
Panasonic offers a wide variety of Thick Film Current Sense Resistors (ERJ-B1, B2, xB, xBW, xCW) in a large range of case sizes and in wide terminal types for high solder joint reliability. The ERJ Series of Current Sense Resistors offers power ratings up to 2W with low ohmic ratings ranging from 5mΩ to 10Ω. Panasonic’s Thick Film Current Sense Resistor portfolio offers a more cost effective option with high reliability. Panasonic has a wide line of case size options ranging from 0402 to 2512 in conventional terminal and 0612 to 1020 for wide terminal.
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Covermeter & Half-Cell Meters
A covermeter, or rebar locator, is a gauge that measures the thickness of concrete cover over steel reinforcement bars and metal pipes. The covermeter can tell you the depth of the rebar, the location and orientation of reinforcement bar (rebar) and determine the diameter of the rebar.
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Screw Side Action Tensile Grips
2710-100 Series
The Instron screw side-action tensile grips are precision mechanical grips engineered for tensile testing across a broad spectrum of specimen materials (e.g. metals, plastics, textiles, thin foils) and geometries. Their dual-acting screw mechanism delivers concentric clamping and allows for adjustments to accommodate varying specimen thicknesses or unique components — ensuring reliable load alignment. With quick, tool-free jaw face changes and a wide assortment of interchangeable jaw face types (smooth-ground, serrated, rubber-coated, etc.), these grips offer flexibility in test setup.
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High Resolution Wafer Thickness & Thickness Variation Gauge
MX 10x series
The MX10x series measure thickness and thickness variation on silicon wafers. It has a resolution of 10 nanometers and can be adapted to different thickness ranges within a few seconds.
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Paper & Packaging Testing Equipment
Dongguan Amade Instruments Technology Co., Ltd
Packaging testing equipment are intended to measure the resistance of corrugated containers to various crushes and burst at given conditions, applied to bursting strength test, ring crush test, edge crush test, flat crush test, pin adhesion test, puncture strength test, bending stiffness test, corrugating medium test, compression test, damp-proof test etc. As corrugated boxes assume the important responsibility of loading and protecting goods playing an inevitable role in modern logistics, so the properties of corrugated boards have to be mastered by manufacturers and users prior to use. The physical performances which are measured by a series of testings are core factors for judging the quality of packaging boxes. Paper testing items mainly include quantification, thickness measurement, whiteness, smoothness,breaking elongation, burst resistance, folding resistance, stiffness, tearability, degree of sizing, etc.
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Hall probes
Axial, transverse, multi-axis, and tangential Hall probes for measuring magnetic flux density. Choose from a wide range of lengths and thicknesses—probes are also available for cryogenic applications.
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Manual Screw Flat Grips
Screw flat grips are general-purpose grips used for static tensile testing of a wide range of materials, most commonly, rubbers, plastics, textiles, and paper, and specimens such as plates and wires. Another advantage of these grips is they can be used to test thick specimens, up to 16 mm (0.63 in).
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Probes, Cables & Detectors
Probe has a mica window that has a thickness of 1.8 to 2.0 mg/cm2. This allows detection of alpha radiation as low as 3.0 MeV when in close proximity to the window. Beta radiation in excess of 35 keV and X-ray or gamma radiation greater than 6 keV can also be deteched. The detector is provided with a BNC connector. It can be used with most count rate and survey meters which accept Geiger Mueller (GM) detectors operating at 900V DC.
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Wet Film & Powder Thickness
When applying a liquid coating, by measuring the uncured film thickness, it is possible to determine the eventual dry film thickness. Applying too much coating wastes time and materials. It can also affect the performance and finish of the product. Too much wet film can cause the coating to crack as it cures; too little coating increases the risk that the substrate will not be sufficiently protected, leading to rust spots.
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Surface Resistance Tester
MR – 1
The different specific resistances are specified by selecting one of the pre-programmed materials, or by measuring the specific resistance of unknown materials and entering the result. Preferably the coat thickness is displayed, but the measurement and display of the actual resistance, the square resistance and the specific resistance is possible, too. All measured values can be transmitted into a PC via a serial interface. Controlling the MR-1 on the other hand is not possible.
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Time-Resolved Electrochemical Quartz Crystal Microbalance
400C Series
The quartz crystal microbalance (QCM) is a variant of acoustic wave microsensors that are capable of ultrasensitive mass measurements. Under favorable conditions, a typical QCM can measure a mass change of 0.1-1 ng/cm2. QCM oscillates in a mechanically resonant shear mode under the influence of a high frequency AC electric field which is applied across the thickness of the crystal. Figure 1b below shows an edge view of a QCM crystal undergoing oscillatory shear distortion. The central portions of the top and bottom of the crystal are coated with a typically disk-shaped thin metal film (e.g., gold).
