Developers
See Also: Development, Software Development, Development Boards, Test Development
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Product
High Content Screening Instruments
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Get the sensitivity and throughput you need to image more samples and analyze more parameters with high content screening. Our high content screening instruments help you answer the most complex biological questions. With powerful yet simple imaging and analysis capabilities for a wide range of applications -- from basic research to assay development and screening -- these powerful high content screening microscope systems produce the highest possible image quality to take your research further, in less time than ever before, especially when combined with PerkinElmer's robotic systems and advanced data analytics.
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RFID Test Instrument
RAIN Xplorer
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The CISC RAIN Xplorer is a unique RFID test product developed for convenient tag frequency sensitivity, communication range, and backscatter measurements. The RFID tester is designed for open area tests and measurements in an RF-controlled environment using portable or fixed RF test chambers. The system is supplied with software and a reference tag for self-calibration.
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OEM Energy Sensors
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The OEM “standard” sensors are actually families of existing OEM sensors with typical specifications shown. They can be tailored as needed to fit your specific requirements. In addition to the products described, Ophir has developed hundreds of other OEM solutions. Simply fill out the Sensor Customization form so we can provide just the right solution for your needs.
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Hardware-in-the-Loop Test Systems
HIL
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Our early development efforts and NI VeriStand expertise uniquely qualify us to maximize the benefits of and provide top-notch integration services for this software platform. Wineman Technology offers powerful and flexible MIL and HIL testing solutions, such as: Full range of MIL and HIL test systems. Software for testing. Software for simulating electronic control modules. Fault insertion unit (FIU)..
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LED Test
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Neosem developed and released the LX500 - LED Accelerated Aging Tester to provide our customers with the capability to deliver highly reliable automotive LED products to the market. By adopting Neosem’s patented temperature control algorithm, the customer can execute the LED device aging test at very stable temperatures.
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Product
Galvanometer Optical Scanner
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Citizen Chiba Precision Co., Ltd.
High performance and high reliability galvanoscanner (or called as galvanometer/galvanomotor/galvanoscanner motor) with high accurate optical analogue sensor which we newly developed.
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Product
Software
DPM-3
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Was developed to read and edit Plug and Play Smart Sensors that are compliant to the IEEE 1451.4 Standard. TEDS, or transducer Electronic Data Sheet, is a set of electronic data in a standardized format defined within the IEEE 1451.4 standard. This data specifies what type of sensor is present, describes its interface, and gives technical information such as sensitivity, bridge type , excitation, etc. This information is stored in an EEPROM chip attached to the sensor. By having this chip, the sensor can identify and describe itself to the network and or Smart Load Cell Meter (DPM-3), thereby easing automatic system configuration.
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Product
Scanner Probe
RFS set
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The RFS set consits of three passive near field probes designed for the use in a measurement scanner during the development of E-field and magnetic field. They are designed for frequency ranges of 30 MHz to 3 GHz. The probe heads of the RFS set allow for close measurements needed to correctly localize interference sources on an electronic assembly. They document the whole image of the device under test`s near field. The scanner probes have a sheath current attenuation and are electrically shielded. They are connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance. The measuring signal can be increased with PA 203 or PA 303 preamplifier. On request RFS, LFS and XFS scanner probes can be produced.
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Product
Caibration Equipment For Lab Use
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In the field of high-power semiconductor testing, PONOVO has launched a smart test platform with high-speed high-frequency, high-voltage, high-current power sources, combined with high-speed, high-precision high-voltage, high-current analog acquisition technology and high-speed digital processing control system. The platform can complete the testing of dynamic parameter parameters, static parameters, thermal parameters and mechanical parameters, and power life parameter of various types of high-power semiconductor devices, modules, and chips, which could meet different testing requirements. It is the universal testing platform for automated testing for different application purpose, such as the research and development testing, engineering acceptance test, factory acceptance test, etc.
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Product
Seno-Con Test System
PANTHER 2K QST
Test System
Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
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Diagnostic Software
Developer Toolbox
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The world's most widely used SCSI diagnostic software product is now available in a reference library. The Developer Toolbox uses our proven interface to access SCSI, Fibre Channel, or ATAPI devices from Visual Basic or C++ running on all 32 bit versions of Windows.
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Product
Additional Products: 200 Pin D Cables - 200 Pin to 200-Pin
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The connector to connector cable assemblies below are not compatible with Pickering products, however, are offered for developing a connection solution for use with other products.
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Product
Unified Functional Testing
ZAP-fiX
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ZAP-fiX is an add-in for HP (UFT) Unified Functional Testing, it extends HP UFT for test automation on Mobile; Win; Mac; and Linux in Cross-Platform fashion. ZAP-fiX allows HP UFT users to create test automation in order to support Agile/CI development methodologies.
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Product
Bit Error Rate Testing
BERT
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An invaluable tool for manufacturing, development engineers, and field service engineers*Generate multi-speed, multi-application, and custom test patterns*Verify and validate lowest level connectivity down to 10-12*Support up to 32 ports of testing
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Computing Systems
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Curtiss-Wright Defense Solutions
Mission computers are the heart of every platform. To ensure your mission success, our embedded computing systems are backed by decades of experience developing C5ISR, vetronics, and program-specific system solutions.
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Development Boards
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Advantech Development boards provide a schematic software & reference to reduce design effort at the development stage. Development Boards have been designed in order to allow customers to verify the functions of COM, text carrier board problems and support COM series. Advantech has designed a Development Board which can be used to test carrier board problems and support COM series, and Qseven, ETX / XTX form factors.
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Product
Data Logger & Measuring Instruments
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Data loggers and measuring instruments of the ALMEMO® series were developed for different measuring tasks and a very wide range of applications. The system consists of a data logger or a measuring device and intelligent connectors, which are used to connect the corresponding sensors. On the instrument side, the versions differ only in the number of measurement inputs. Device types ranging from 1-channel transmitters to measurement data acquisition systems with up to 1000 measurement inputs are available.
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Product
PCIe 3.0 Protocol Analyzer
Summit T34
Protocol Analyzer
The Teledyne LeCroy Summit T34 PCI Express protocol analyzer is designed for PCIe storage, add-in card and embedded application developers. It supports x1 to x4 lane widths with the capability of expanding to x8 with two boxes connected together, and deep buffer memory that is expandable from 4GB to 64GB ideal for storage analysis, the Summit T34 provides unmatched capability and flexibility for developers and users of advanced PCI Express products. Teledyne LeCroy has been the leader in NVM Express and SATA Express protocol analysis since 2010. This storage analyzer incorporates all of these powerful legacy features and adds the latest in storage queuing performance analysis.
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In-Circuit Programmer/Loader
SKU-018-01
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The In-Circuit Programmer/Loader (“EasyLoader” or “eLoader”) is a standalone device that was designed to provide a flexible and cost-effective solution for electronic device manufacturers, as well as for hardware design companies and their customers. It allows you to upgrade code on any JTAG/SPI/I2C compliant device (like FPGA/CPLD/EEprom/Flash, etc.) or Microcontrollers at any time of development, testing or production.
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Product
PXI-5670, 2.7 GHz RF Vector Signal Generators
PXI-5670 / 778768-03
Vector Signal Generator
2.7 GHz PXI Vector Signal Generator—The PXI‑5670 has the power and flexibility you need for product development applications from design through manufacturing. It can generate custom and standard modulation formats such as AM, FM, PM, ASK, FSK, PSK, MSK, and QAM. The PXI‑5670 delivers a highly flexible and powerful solution for scientific research, consumer electronics, communications, aerospace/defense, and semiconductor test applications as well as for emerging areas including software defined radio, radio frequency identification (RFID), and wireless sensor networks.
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Avionics Test
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VIAVI Solutions offers a wide range of avionics test solutions supporting engineering, factory, flightline, and return to service test requirements. Working closely with avionic OEM’s and users, we strive to develop a comprehensive and user friendly solution utilizing modern technology to meet the long term needs of the aviation industry.
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Signal Generator Extension Modules
SGX
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Virginia Diodes, Inc. (VDI) Signal Generator Extension (SGX) modules provide high performance frequency extension of microwave signal generators into the THz range. VDI SGX modules offer full waveguide band coverage and are available from WR15 (50 to 75 GHz) to WR1.0 (750 to 1100 GHz) with additional bands under development. This turn-key, sweepable solution is compatible with any microwave signal generator that meets the input frequency and power requirements.
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Product
NI-9853, CAN Interface Module
780178-01
CAN Interface
2-Port, High-Speed C Series CAN Interface Module—The NI‑9853 is a high-speed Controller Area Network (CAN) interface for developing FPGA-based applications with the NI‑RIO driver on CompactRIO. The NI‑9853 is ideal for low-level FPGA‑based control and triggering applications that are programmed using the LabVIEW FPGA Module. The NI‑9853 is ideal for byte-level manipulation of CAN frames using the LabVIEW FPGA Module. The NI‑9853 is only compatible with CompactRIO systems.
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Product
Services
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Our extensive in-house know-how allows us to develop customer-specific projects, starting with the selection of the cell-internal components through to the manufacture of complex overall systems. We always focus on considering renewable energies.
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Wafer Test Solutions
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Wafer Test Solutions has established leadership positions in developing and deploying application-specific test solutions for MEMS devices, offering wafer and frame probing stations suitable for R&D, Wafer Sort, and Final Test. We offer state-of-the-art solutions to test environmental and motion sensors in wafer and other advanced packages.
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Product
Drivetrain Tester
G5.DT
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The G5.DT series is bidirectional regenerative. It was developed specifically for testing DC components of the electrical drive train or DC components of other parts of the vehicle electrical system. It is suitable for use in laboratories and on test benches. The modular and finely graded G5.DT series is characterized by highly dynamic response times and a wide current-voltage range with an auto-ranging factor 3. The power supplies are equipped with a powerful CAN multi-protocol interface (1 kHz, 16 bit) and optionally offer test bench relevant safety functions such as PL e according to EN ISO 13849, insulation monitoring as well as automatic discharge on the load side in case of shutdown.
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Product
Sensing System
FBG
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A cost-effective FBG (Fiber Bragg Grating) interrogation system that includes a tunable laser diode, 6 photodiodes, and several fiber-optic couplers has been developed with very simple coniguration. Especially, it is not necessary to compensate the accurate wavelength because the wavelength sweeping is precisely performed in terms of the response time of which external cavity material is 5 msec. Moreover, time-varying temperature trends as well as spectra of FBGs can be observed through the front display.
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Automated Optical Inspection System
506
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We are proud to introduce the latest member of our model 505 AOI product family, the 506. This system was developed to provide a high coverage, easy to program AOI system for the larger backplanes / backpanels being produced today.
