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Nanomechanical Test Systems
Bruker’s nanomechanical test systems deliver the highest degree of performance, accuracy, reliability, and versatility for quantitative mechanical and tribological characterization at the nanoscale and microscale. Utilizing multiple patented and proprietary technologies, the Hysitron product line of standalone nanomechanical test systems enable quantitative characterization at length scales unreachable by others.
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Cell Isolation & Analysis
Life's complexity originates in cells, spanning cellular structure, genetic diversity, gene expression, and complex tissue formation. Serving as the fundamental unit, cells form the foundation of all biology. Characterization of cells, their processes and interactions can provide insights into areas like medicine, symbiosis, and biological diversity. Bio-Rad supports these inquiries, offering innovative technologies for your cell biology research.
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PXIe-5654, 10 GHz or 20 GHz RF Signal Generator
783126-01
The PXIe‑5654 features an ideal combination of exceptional phase noise and frequency tuning time. These features address applications such as blocker test/receiver desensitization, high-performance intermodulation distortion measurements, and various electronic warfare applications. The PXIe‑5654 is designed to meet the challenging requirements of RFIC characterization, satellite test, and radar applications.
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Handheld Retroreflectometer
932
Patented design to fully characterize the retroreflection (RA) and retroreflected night-time (CIE1931xy) color of road signs, high visibility safety clothing and other materials.
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PNA-X Microwave Network Analyzer
N5241A
Reach for unrivaled excellence in your measurements and designs Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the worlds widest range of single-connection measurement applications Test linear and nonlinear device characterization more accurately with the world's best PNA-X Every spec verified, adjustments included Lock in support & peak performance from the start
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PXI Vector Component Analyzer, 100 kHz to 44 GHz
M9817AS
The PXI vector component analyzer enables complex multiport device characterization with continuous wave and modulated signal measurements.
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Modulation Distortion Up To 70 GHz
S930707B
S930707B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 70 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930707B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Thermal Analysis
Thermal Analysis is important to a wide variety of industries, including polymers, composites, pharmaceuticals, foods, petroleum, inorganic and organic chemicals, and many others. These instruments typically measure heat flow, weight loss, dimension change, or mechanical properties as a function of temperature. Properties characterized include melting, crystallization, glass transitions, cross-linking, oxidation, decomposition, volatilization, coefficient of thermal expansion, and modulus. These experiments allow the user to examine end-use performance, composition, processing, stability, and molecular structure and mobility.
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ULTRA Test Cells
The ULTRA Series of high performance MEMS handling, stimulus and test cells provides unparalled flexibility and capability for engineering development, characterization or high volume production test of inertial MEMS (accelerometer, gyroscope) semiconductor devices.
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PNA Microwave Network Analyzer
N5227B
Meet your toughest measurement challenges with the highest performing microwave network analyzer in the industry Measure S-parameters with the smallest uncertainty and highest stability Efficiently characterize active components with applications that simplify setups Meet your specific budget and measurement needs by customizing to just the right level of performance Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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The CryoLab
The CryoLab is designed to perform rapid material or circuit characterization measurements from room temperature down to cryogenics in a fully automated manner. Doing measurements doesn’t require any experience or know-how on cryogenics, vacuum technology or thermodynamics from the user.
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Optical Spectrum Analyzer Module
OSAPXIe
OSAPXIe enables new measurement capabilities in PXI for truly effective mixed-signal testing. Conduct all your DUT characterization from one platform and spend less time switching cables and patchcords between instruments.
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PXIe-4137, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 100 fA Precision System PXI Source Measure Unit
783761-02
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 100 fA Precision System PXI Source Measure Unit - The PXIe-4137 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology helps you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4137 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers
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PXI Vector Component Analyzer, 100 kHz to 32 GHz
M9816AS
The PXI vector component analyzer enables complex multiport device characterization with continuous wave and modulated signal measurements.
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Spectroscopic Analyzer / Test
Optokey's products offer complete sample characterization solutions and yield situationally sensitive spectrum data and detailed insight into the elemental and molecular composition of the sample. These systems and proprietary software can be precisely tailored to customer's requirements to sense a wide range of analytes, including organics, heavy metals, and biomolecules (DNA, peptides, lipids, etc.) and other materials.
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Differential Scanning Calorimetry
Nano DSC
The Nano DSC differential scanning calorimeter is designed to characterize the molecular stability of dilute in-solution biomolecules. The Nano DSC obtains data using less sample than competitive designs. Solid-state thermoelectric elements are used to precisely control temperature and a built-in precision linear actuator maintains constant or controlled variable pressure in the cell. Automated, unattended continuous operation with increased sample throughput is achieved with the optional Nano DSC Autosampler.
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Widefield Confocal Microscope
Smartproof 5
The versatile ZEISS Smartproof 5 widefield confocal microscope is your integrated system for surface analysis: fast, precise and repeatable. Put it to work on a wide range of industrial applications - such as roughness and topographical characterization - that come up every day in QA/QC departments, production environments and R&D labs. This high quality confocal system is driven by the powerful software ZEISS Efficient Navigation (ZEN) to bring you the added benefits of maximum user comfort and increased productivity.
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Particle Analyzers in Liquids and Gases
Particle analyzers determine the size and distribution of particles in a material.Particle size analyzers work in many areas of research and development, product testing, manufacturing and quality control. Particle size analysis is important in characterizing a wide range of product performance factors.There are several many analytical techniques and approaches for particle size analysis.It depends on the range, the nature of the sample, the method of analysis and the sampling output.Particle size analysis is a very important test and is used for quality control in many different industries like Food and beverages,Pharmaceuticals,Aerosols and more.The tests should be adjusted according to the different materials.
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ENA Vector Network Analyzer
E5080B
As devices become highly integrated, complete characterization requires a complete RF and microwave measurement solution. The E5080B provides R&D performance up to 53 GHz and advanced test flexibility. Best-in-class dynamic range, trace noise, and temperature stability guarantee reliability and repeatability.
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PXIe-5654, 250 kHz to 20 GHz, PXI RF Analog Signal Generator
783126-02
PXIe, 250 kHz to 20 GHz, PXI RF Analog Signal Generator - The PXIe-5654 features a combination of exceptional phase noise and frequency tuning time. These features address applications such as blocker test/receiver desensitization, high-performance intermodulation distortion measurements, and various electronic warfare applications. The PXIe-5654 is designed to meet the challenging requirements of RFIC characterization, satellite test, and radar applications. Some PXIe-5654 options include a PXIe-5696 Amplitude Extender Module. The PXIe-5696 supports a frequency range of 250 kHz to 20 GHz and an extended amplitude range up to 27 dBm.
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PCI Express 4 Base Specification Receiver Test Automation
N5991PB4A
The N5991PB4A is the receiver test automation software for bit error ratio testers, allowing you to test and characterize PCI Express 4.0 ASICs.
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Analytical Instrument
LabSpec 4 Hi-Res
Analytical Spectral Devices, Inc.
The LabSpec 4 Hi-Res analytical spectrometer is designed for analysis of materials that are characterized by sharp spectral features that may require more resolute spectral data for accurate detection and identification.
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ATCA 5U 6 Slot Dual Dual Star 40G - with bused IPMB
109ATCA506-1003R
The 5U 6 slot ATCA backplane is a dual dual start with bused IPMB, designed to meet 40Gbps (4 x 10G ports) data rates. Elma Bustronic’s ATCA backplanes have been simulated and characterized by our signal integrity lab to optimize performance.
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Device Characterization Software with Test Automation
14565B
The Keysight 14565B device characterization software is designed for easy evaluation of portable battery powered device (like 3G handsets, PDA, WLAN, and Bluetooth enable devices) current profiles to ensure long operating life of devices.
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Specialty Instruments
Advanced Thermal Solutions, Inc.
ATS offers a variety of unique specialty instruments, designed for specific applications across the electronics industry. These instruments range from providing heat flux measurements and cold plate characterization, to precise isothermal surface temperature control and fan flow characterization.
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Surface Resistance Meter Kit - Test Anti-Static, Static Dissipative and Conductive Surfaces
PRS-812RM
- Surface Resistance Tester from 0.10 Ω to 1 Teraohm- Constant Voltages 10 volts and 100 volts- Automatic Electrification Period- Determines if a surface is Dissipative, Conductive, or Insulative- Measures resistance point-to-point(Rtt) and resistance to ground (Rtg)- Measures resistance of ESD Flooring, ESD Worksurfaces and Packaging- Conforms to all ESD Association Standards for Resistive Characterization- Includes 2 each Surface Resistance Probes- Packaged in a hard shell Carrying Case- Certificate of Calibration Traceable to NIST included- 2-year Limited Warranty on Main Instrument
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In-situ Gas Analyzers
Real-time gas analysis directly within the processInnovative measurement technology that allows the devices to be mounted directly at the measurement site: In-situ gas analyzers take measurements directly within the process under system conditions. These analyzers are primarily characterized by their minimal maintenance requirements and extremely short response times. SICK's in-situ gas analyzers are available in two different versions:The cross-duct version for representative measurement results across the entire duct diameterThe measuring probe version, optimized for single-sided gas duct installation
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2-MGEM Optical Anisotropy Factor Measurement System
The 2-MGEM Optical Anisotropy Factor Measurement System is a normal-incidence polarization reflection microscope designed to measure the sample Mueller matrix and is a 2008 R&D 100 Award Winner. This system is designed specifically to evaluate the Optical Anisotropy Factor (OPTAF) of cross sections of TRISO nuclear fuel pyrocarbon layers. Other possible material characterizations include measuring Mueller matrix elements of other crystals, carbon compounds, and thin film coatings (e.g. surfacedeposition films) at normal incidence. The 2-MGEM can also measure retardation (d), circular diattenuation (CD) and the polarization factor (ß). These parameters are not measurable using older techniques, since those techniques do not incorporate a compensating optical element.
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Syscal Pro
The Syscal Pro is an all-in-one multinode resistivity and induce polarization sounding and profiling system for environmental and engineering geophysical studies. The Syscal Pro gathers a 10 channels receiver and a 250 W internal transmitter which make it the more powerful system of the Syscal range. Compact, easy-to-use and field proof, the Syscal Pro measures both resistivity and chargeability. It is ideal for environmental and civil engineering applications such as depth-to-rock determination, weathered bedrock mapping. With a maximal output voltage of 2000Vpp, the Syscal Pro is very adapted to detect deep fault in fractured aquifers or to characterize the depths and thickness of the groundwater aquifers.
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HDT & Vicat Systems
The Instron line of CEAST Thermo-mechanical systems are used to characterize the behavior of plastic materials at high temperatures, measuring the heat deflection temperature (HDT) and the Vicat softening temperature (Vicat). These HDT and VICAT testers range from very simple units for quality control labs to more advanced and automated systems.
