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Vector Network Analyzers
ZNA
The R&S®ZNA vector network analyzers are the high-end series of the R&S VNA portfolio: excellent RF-performance is combined with a wide range of software features and a unique hardware concept. The touch-only operation together with the DUT-centric approach makes the R&S®ZNA to a powerful, universal and compact measurement system for characterizing both, passive and active devices.
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ALD Services
Our ALD Services help engineers optimize, troubleshoot, and scale their processes, covering everything from custom process development to equipment calibration and advanced film characterization.
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MultiBeam System
FIB
An easy-to-use, out-lens type scanning electron microscope (SEM) equipped with a Schottky electron gun, as well as a new FIB column capable of large current processing (maximum ion current 90nA) installed into one chamber. JIB-4610F enables high-resolution SEM observation after high-speed cross-section milling with FIB, and high-speed analysis with a variety of analytical instruments, such as energy dispersive X-ray spectroscopy (EDS) that takes advantage of the Schottky electron gun delivering a large probe current (200nA), electron back scatter diffraction (EBSD) to perform crystallographic characterization, and cathodoluminescence (CLD). In addition, the 3D analysis function Cut & See is included in the standard configuration, allowing cross-section milling to be executed automatically at fixed intervals, while acquiring SEM images for each cross section.
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SSD
M.2 SSD (iSLC)
Innodisk M.2 (S42) 3IE4 is characterized by L3 architecture with the latest SATA III (6.0GHz) Marvell NAND controller. Innodisk’s exclusive L3 architecture is L2 architecture multiplied LDPC (Low-Density Parity Check). L2 (Long Life) architecture is a 4K mapping algorithm that reduces WAF and features a real-time wear-leveling algorithm to provide high performance and prolong lifespan with exceptional reliability.
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K-50 Series Probes
The K-50 coaxial probe provides an instrumentation-quality interface for broadband R.F. measurements up to 4 GHz. With the K-50 R. F. circuit design, impedance characterization measurements can be performed using it as a Network Analyzer port-extending accessory. Accurate and repeatable small signal and R.F. power (50 Watts) measurements provide consistent and repeatable results.
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Beam Diagnostics Systems
Characterize the spatial intensity distribution and size of laser beams, and visualize beam shape, with speed and accuracy.
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Profile Imaging Modules
The Opto profile imaging modules are characterized by the U-shaped all-aluminum housing, which is only 40mm wide.
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Pattern Generator
PI-2005
As a test engineer or digital designer you must have state-of-the-art tools to test, characterize and verify your complex semiconductor devices and digital circuit boards. The PI-2005 Pattern Generator will generate a wide range of simple or complex digital patterns for any test application that requires a serial or parallel digital data stream. To meet the requirements of complex devices and digital circuits, the pattern generator can be configured from 16 to 64 output channels.
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Snap-on RF Current Monitoring Probe
TBCP2-250
The TBCP2-250 is a snap-on RF current monitoring probe. The probe has a very flat response with a 3dB bandwidth of 250 MHz and is characterized over the frequency range from 30kHz to 300 MHz. Upon request, it can also be supplied with a test protocol covering the frequency range 1 kHz to 350 MHz. The aperture of the RF current monitoring probe is 32 mm. Its transfer impedance is > 12 dB Ohm in the range from 700 kHz to 300 MHz.
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Thermal Warpage Measurement Tool
PS600S
The TherMoir PS600S is a metrology solution that utilizes the shadow moir measurement technique combined with automated phase-stepping to characterize out-of-plane displacement for samples up to 600 mm x 600 mm. With time-temperature profiling capability, the TherMoir PS600S captures a complete history of a sample's behavior during a user-defined thermal excursion.
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EV Profiler Kit V2
Harness the power of single-molecule localization microscopy to characterize EVs across scales. Quantify nanometer small, rare, and precious EV samples with super-resolution precision. ONI’s EV Profiler helps you focus on answering the right questions about your EV populations.
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Modulation Distortion Up To 53 GHz
S95070B
S95070B software enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 53 GHz. The wide dynamic range and vector error correction of the PXI VNA results in an extremely low residual EVM from the test setup, giving you a complete picture of your device’s performance without test system interference. S95070B software measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals through spectral correlation between the input and output spectrum, without doing demodulation. Integration with the PXI VNA’s measurement flexibility enables you to do quick modulation distortion measurements along with traditional VNA tests.
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Fiber Optic Network Test
Test and characterize fiber optic cables, assemblies and network with unmatched speed, precision and spatial resolution. Luna’s OBR reflectometers can analyze loss with a spatial resolution and sensitivity unmatched in the industry.
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PNA Microwave Network Analyzer
N5225B
Meet your toughest measurement challenges with the highest performing microwave network analyzer in the industry Measure S-parameters with the smallest uncertainty and highest stability Efficiently characterize active components with applications that simplify setups Meet your specific budget and measurement needs by customizing to just the right level of performance Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Automated Tuners / Impedance Tuners / Load Pull Tuners
MT97x, MT98x and XT98x series automated tuners (also known as automated impedance tuners and automated load pull tuners) are precision instruments that are optimized for a broad class of in-fixture and on-wafer applications, and may be used in any automated or manual application requiring the ability to match the impedance of a microwave circuit element or to establish specific impedances at a terminal interface. The tuner design is based on the slide screw concept using the inherently broadband slab-line transmission structure. Each unit has two non-contacting probes deliver high VSWR with superb accuracy and reliability over a wide frequency range. These probes can be fully retracted leaving a low-loss, well-matched transmission line, which is a significant benefit in power related applications where two-port tuners capable of handling large amounts of power are required. As integral components of Maury Device Characterization Solutions, these PC-based tuners are controlled using Maury's family of Device Characterization Software tools, including MT930 IVCAD, MT993 ATS and the DLL-based measurement automation environment. Maury Microwave automed impedance tuners are ideal for load pull, harmonic load pull, active load pull, hybrid active load pull, noise figure, noise parameters and all automated tuner applications.
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Capillary Rheometers
Plastics are amazing materials with the unique ability to flow when heated to relatively low temperatures. They can be formed into a wide variety of shapes and tailored for many different applications. However, their flow properties during this process are complex and affected by many parameters. Instron® provides comprehensive and effective testing solutions in plastics applications and industries through the CEAST SmartRHEO Series. This capillary rheometer simulates the process conditions, measuring the plastic materials flow behavior that characterizes the rheology of materials.
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SSA-J Precision Clock Jitter Analysis Software
E5001A
To meet the demanding needs of today's advanced digital communication systems, Keysight offers Precision Clock Jitter Analysis software (E5001A SSA-J) for more precise and accurate characterization and evaluation of clock-signal jitter.
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SparkFun Spectral Sensor Breakout
AS7263 NIR (Qwiic)
The SparkFun AS7263 Near Infrared (NIR) Spectral Sensor Breakout brings spectroscopy to the palm of your hand, making it easier than ever to measure and characterize how different materials absorb and reflect different wavelengths of light. The AS7263 Breakout is unique in its ability to communicate by both an I2C interface and serial interface using AT commands. Hookup is easy, thanks to the Qwiic connectors attached to the board --- simply plug one end of the Qwiic cable into the breakout and the other into one of the Qwiic shields, then stack the board on a development board. You’ll be ready to upload a sketch to start taking spectroscopy measurements in no time.
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ATCA 5U 14 Slot Dual Star 40G - with bused IPMB
109ATCA514-0003R
The 5U 14 slot ATCA backplane is a dual start with bused IPMI, designed to meet 40Gbps (4 x 10G ports) data rates. Elma's ATCA backplanes have been simulated and characterized by our signal integrity lab to optimize performance.
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Dynamic Particle Image Analysis System
iSpect DIA-10
Shimadzu's iSpect DIA-10 Dynamic Image Analyzer combines particle size and image analysis technology to offer complete particle characterization. It can perform particle imaging, size analysis, and foreign object detection, and obtain size distributions and number concentration, in as little as two minutes.
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Hydrogen Storage Analyzer
IMI-HTP
The IMI-HTP is designed to characterize hydrogen storage materials using Sieverts method up to pressures of 200 bar. High accuracy is ensured by a minimized dead volume, all-metal construction, high thermal stability and accurate pressure measurement. Every IMI-HTP is specified to meet the challenging demands of high pressure H2 operation, with permanent overpressure protection to satisfy the most rigorous safety requirements.
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Base Station Emulator
SUTP 5018
Designed to create a custom cellular environment to serve testing and characterization needs. The combination of high power, real-time computing and the software defined radio platform enables this instrument to create your own cells for testing in a compact size and cost-efficient way.
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Nand Flash Tester
NplusT
NplusT was created in December 2002 by Tams Kerekes' 20-years experience in the field of electrical semiconductors and reliability testing.The company started with the sales representation of semiconductor equipment and consumable suppliers. In the meantime, qualified engineering services, linked to the represented products, were provided in Europe.In 2003 NplusT started to market "RIFLE", the non-volatile memory engineering tester, and related services. In a few years, this product has become a reference platform for many memory makers.In 2005 Liliom Laboratories, a Hungarian software development company, merged into NplusT. Thanks to this operation, the company became leader in the test data collection and processing segment.From 2008 a dominant portion of NplusTs turn-over derived from licensing software products. Today almost every European along with several Far East semicon companies license our software products and make use of qualified engineering services.From 2011, NplusT provides turn-key solutions for device testing and characterization, including hardware, software and support.
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Combination Measurement Workstation
WS500
The WS500 is a combination measurement workstation that incorporates several different measurement types that can be included in a single characterization sequence.
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Adhesion Tester
Surf-2
Rtec Adhesion Tester is a turn key solution to measure Pull up Adhesion force, Work of Adhesion and Shear Adhesion of materials. Equipped with Ultra-Sensitive Capacitance Load Cells this tester provides µN level resolution with forces up to 5N. The High-Resolution sensors allow characterization of large samples over macroscopic length scales to study the effect of texture and other surface modifications. Integrated with High Resolution Inverted Camera, it allows the researchers to measure Contact Area vs. Force making it extremely useful in measuring Adhesion of Soft Materials, Biomimetics and Hydrogels.
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Powerful and Cost Effective Spectroscopic Ellipsometer
Smart SE
The Smart SE from HORIBA Scientific is a versatile spectroscopic ellipsometer for fast and accurate thin film measurements. It characterizes thin film thickness from a few Angstroms to 20µm, optical constants (n,k), and thin film structure properties (such as roughness, optical graded and anisotropic layers, etc).The spectral range from 450 to 1000nm is measured in a few seconds and ellipsometric data are analyzed using the DeltaPsi2 software platform. The software integrates two levels of software to fulfil both routine analysis with predefined recipes and advanced analysis with state-of-the art ellipsometric modelling.
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Pulse Pattern Generator, 3.35 GHz, dual-channel
81134A
When timing and performance requirements are critical, for example in high-speed serial bus applications like PCI Express or Serial ATA, its fast rise times and low intrinsic jitter allow the precise and in-depth characterization of devices, e.g. receivers or backplanes. On top of that, it allows to generate application-specific signal levels like pre- and de-emphasis (PCI Express) or squelch (Serial ATA). The Keysight 81134A lets you test your DUT instead of the pulse or data source!
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Arbitrary Function Generator
HMF2525/HMF2550
Powerful pulse generator Provides pulses with a recurrence rate of up to 12.5 MHz/25 MHz; the pulse width can be set from 15 ns to 999 s with a resolution of 5 ns. Rise/fall time can be selected from 8 ns to 500 ns – a very useful feature when characterizing input hysteresis of semiconductor devices Easily create arbitrary waveforms Arbitrary waveforms can be developed with PC software. Stored waveforms can be loaded via front USB port or imported via the complimentary HMExplorer software (available for download)
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Acoustic Microscope
AMI D9650
Specifically designed to serve as a general purpose tool for failure analysis, process development, material characterization and low volume production inspection, the capabilities of the D9650 are truly unmatched. Representing the latest in C-SAM acoustic micro imaging, the D9650 delivers the unrivaled accuracy and robustness that you would expect from Nordson Test & Inspection instruments, plus improved electronics and software that raises the performance level for laboratory acoustic microscopes.
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Validation Testers
M Series
The M Series line introduces a new class of massively parallel SerDes validation testers that are ideal for high-volume data collection and characterization. Constructed using a collection of Introspect Technology’s D Series modules that are operated seamlessly using the Introspect ESP software, these massively parallel testers are able to interface to high-speed devices in their entirety.
