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Spectroscopic Ellipsometry
Spectroscopic ellipsometry is a surface-sensitive, non-destructive, non-intrusive optical technique widely used for thin layers and surface characterization. It is based simply on the change in the polarization state of light as it is reflected obliquely from a thin film sample. Depending on the type of material, spectroscopic ellipsometers can measure thickness from a few Å to tens of microns. It is also an excellent technique for multi-layers measurement.
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Booster and In-line Amplifier
Amonics' EDFA range adopts unique design to produce maximum signal gain and saturated output power while maintaining low noise figure, enabling test capabilities in system or component level manufacturing and characterizing processes, as well as facilitating highly demanding R&D applications. The compact turnkey benchtop or 19" rackmount unit incorporates a user-friendly front panel housing with a LCD monitor display, key switch, power control knob and optical connectors. An integrated RS232 computer interface enables easy control, diagnostic functions and data acquisition.
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Magnetic Sensors
Magnetic proximity sensors are characterized by the possibility of large switching distances, available from sensors with small dimensions. They detect magnetic objects (usually permanent magnets), which are used to trigger the switching process. As the magnetic fields are able to pass through many non-magnetic materials, the switching process can also be triggered without the need for direct exposure to the target object. By using magnetic conductors (e.g., iron), the magnetic field can be transmitted over greater distances so that, for example, the signal can be carried away from high temperature areas.
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PathWave BenchVue Electronic Load App
BV0012B
Easily control your dynamic electronic loads, build automated tests and visualize measurements over time for better device characterization.
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PNA-X Microwave Network Analyzer
N5247B
Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Accurately test linear and nonlinear device characterization using advanced error correction Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Test Fixture
OCP NIC 3.0
These test fixtures are necessary for testing within the OCP NIC subgroup (found under the OCP Server Work Group). These fixtures will arrive meeting the OCP NIC 3.0 Specification with a characterization of the boards. These fixtures mate with the OCP form factor connector, and will allow an electrical break out of each signaling lane.
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3D Optical Profilers
ZYGO's 3D Optical Profiler instruments enable precise, quantitative, ISO-compliant, non-contact surface measurement and characterization of micro- and nano-scale surface features, capturing up to two million data points in just seconds. Applications range from topography and waviness to roughness and microstructure characterization on samples as that vary from ultra-smooth sub-angstrom optical surfaces, to extremely rough and diffuse 3D printed surfaces.
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Economy Mechanical Calibration Kit, DC To 26.5 GHz, 3.5 Mm
85052D
The Keysight 85052D economy mechanical calibration kit contains precision standard devices to characterize the systematic errors of Keysight network analyzers in the 3.5 mm interface. This kit also contains adapters to change the gender of the test port and a torque wrench for proper connection. Connector gauges may be ordered separately.
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Wood Moisture Meters
PeakTech Prüf- und Messtechnik GmbH
High quality wood and material moisture meter, which is characterized by its ease of use and universal applicability. The device has an LCD display, in which measured values of humidity and ambient temperature are displayed. In addition, it is equipped with an LED display, which enables a quick good-bad assessment of the measured values. When burning wood in a wood-burning stove with a high moisture content, the efficiency of the stove decreases, while at the same time the emission of pollutants, such as soot and fine dust, increases. In addition, there is a build-up of soot in the chimney, which can lead to a fire. Therefore, this device is ideal for wood storage, control during the heating season or use in construction.
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Comprehensive Test and Assessment for IoT Devices
Ixia IoT
Keysight Network Applications and Security
Characterize and optimize IoT devices under real-world deployment conditions
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Scienlab Battery Test System – Cell Level
SL113XA | SL100XA Series
The cell is the basis of any battery system and directly influences its function, performance and safety. Therefore, it is essential to test and characterize the cell at an early development stage. For this purpose, Keysight offers reliable test systems for precise and reproducible measurement results. The Cell Level Series (SL1002A, SL1004A, SL1007A, SL1132A and SL1133A) — also known as Battery Cell Tester — emulates sink and source for battery cells for automotive and industrial applications.
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Nanomechanical Test System
Hysitron TI Premier
Bruker’s Hysitron TI Premier nanoindenter was specifically designed to deliver industry-leading, quantitative nanomechanical characterization within a compact platform. Built upon proven Hysitron technology, the TI Premier provides a broad suite of nanoscale mechanical and tribological testing techniques.
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Thermal/Mechanical Testing
Accolade Engineering Solutions
As new products employ advanced materials and processes, the need to measure and characterize those material properties becomes increasingly important. DSC is used to measure heat flow in to or out of a material. Some DSC applications include measurement of melting temperature, polymorphic transitions, crystallization temperature, thermal stability, heat of fusion and degree of cure. TMA is used to measure dimensional changes of a material as a function of temperature.
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Solar Array Simulator
G5.SAS
The G5.SAS series are unidirectional sources. It was developed specifically for testing inverters and simulating solar arrays and is suitable for use in laboratories and on test benches. The modular and finely graded G5.SAS series is characterized by highly dynamic response times and a wide current-voltage range with an auto-ranging factor 3. The power supplies feature especially low capacitance values in the output filter stage and switchable earth leakage resistors for adaptation to the insulation measurement of the DUT.
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NTA Particle Size Analyzers
NanoSight Range
The Malvern Panalytical NanoSight range of instruments utilizes Nanoparticle Tracking Analysis (NTA) to characterize nanoparticles from 10nm -2000nm* in solution. Each particle is individually but simultaneously analyzed by direct observation and measurement of diffusion events. This particle-by-particle methodology produces high resolution results for nanoparticle size distribution and concentration, while visual validation provides users with additional confidence in their data. Both particle size and concentration are measured, while a fluorescence mode provides differentiation of intrinsic or fluorescently labelled nanoparticles.
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Custom Bench Test
TestEdge provides customized bench test. If your device has specialized test requirements, it may be necessary to test your device using specialized bench equipment rather than traditional ATE. In other situations, both ATE and a custom bench setup may be required to fully characterize the device and provide necessary correlation. Finally, it may be useful to create a custom bench setup to facilitate device debug.
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PNA-L Microwave Network Analyzer
N5234B
Perform basic analysis of passive components and simple active devices Measure S-parameters with good accuracy up to43.5 GHz in cost-sensitive applications Get the world's best price-to-performance ratio for microwave manufacturing Configure an economical solution for signal-integrity measurements and materials characterization Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Physisorption & Chemisorption
ASAP 2020 Plus
The ASAP 2020 Plus permits one instrument to accommodate almost any surface characterization need in your lab.
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LXI Microwave Matrix, 10GHz, Dual 4x4
60-750-244
The 60-750-244 is a dual 4x4 10GHz microwave matrix. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 18GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Accelerated Life Test Systems
Test systems for accelerated life testing and product burn-in utilize Intepro’s electronic loads that are ideal where high power bulk loading is required. Characterization applications within Telecommunication and Aerospace sectors benefit from Intepro’s environmental stress screening (ESS)/Burn-in solutions
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WavePulser 40iX High-speed Interconnect Analyzer
WavePulser 40iX Series
WavePulser 40iX is the ideal single measurement tool for high-speed hardware designers and test engineers. The combination of S-parameters (frequency domain) and Impedance Profiles (time domain) in a single acquisition with a deep toolbox provides unmatched characterization insight of high-speed interconnects.
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Probe Series
CAPELLA Series
MPI Photonics Automation is the industry leading provider of turnkey test solutions for the LED / Mini LED manufacturing industry. With more than 10,000 MPI probers installed worldwide, the CAPELLA series of probers have a proven track record of superior performance and reliability. The CAPELLA series probers support electrical and optical characterization of all LED product types (Vertical chip, Lateral chip, Flip-chip) from wafer to packaged die level. Whether you need a high-performance, cost-effective or specialty prober system, MPI PA has the most comprehensive range of LED wafer/chip probers to meet your exacting requirements.
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Power Management Analyzer Test Suites for 802.3at, 802.3bt, & Hybrid PSEs
While most PSE ports are part of multi-port PSE, behaviors of such systems of PSE ports are beyond the scope of IEEE 802.3 specifications. Sifos offers two fully automated analyzer suites that uniquely characterize PSE port administration and power management behaviors including PD admittance policies, PSE capacity management, LLDP policies, and powering stability. Each of these suites are built upon Live PD Emulation, a feature that enables each test port to independently and continuously emulate user-described PD’s.
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ENA Vector Network Analyzer
E5071C
9 kHz to 4.5/6.5/8.5/14/20 GHz2- or 4-port, 50 ohm, S-parameter test set Improve accuracy, yield and margins with wide dynamic range 130 dB, fast measurement speed 8 ms and excellent temperature stability 0.005 dB/CObtain design confidence through complete characterization of high-speed serial interconnects with enhanced time domain analysis option Protect your investment with upgradability across all of the options Every spec verified, adjustments included Lock in support & peak performance from the start
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Terahertz Spectrometers
Due to its non-invasive and non-ionizing properties, terahertz (THz) radiation is unparalleled in its sensing capabilities. Based on state-of-the-art research results, HÜBNER Photonics division developed innovative and highly compact plug & play systems – allowing contact-free detection, characterization and analysis as well as hyperspectral imaging of materials by THz spectroscopy within a few seconds.
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Fine Pitch Probes
Fine pitch probes are spring contact probes with pitches between 0.10 / 4mil and 1.00mm / 40mil.In this pitch, direct soldering and the use of mounting receptacles is usually no longer possible. Therefore, almost all fine pitch probes are designed as double-sided spring-loaded contact probes. Fine pitch probes are installed in corresponding test sockets, which enable exact contacting of the test points. Feinmetall fine pitch probes are suitable for common components such as BGA, LGA, QFP, QFN or WLCSP. Precision and 100% quality control characterize these probes.In smaller pitches of 60 – 300µm, carrier needles (beams) are also used.
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Probe Card
VC20E Series
The 20mm VC20 is a highly adaptable probe card solution for a wide variety of tests including Modeling & Characterization, Wafer Level Reliability or Parametric Test. It can be easily combined with different interfaces to create modular probe cards supporting Keithley, Keysight or other custom tester platforms. Probes can be configured in either single or dual layer.
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White Light Continuum Generator
JIBE
A powerful coherent light source. Due to its amazing wide spectral band, the white light continuum is being applied in different areas such as optical parametric amplification, optical metrology, optical coherence tomography, materials characterization, etc.
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PCI Express 4 U.2 Receiver Test Automation
N5991PU4A
The N5991PU4A is the receiver test automation software for bit error ratio testers, allowing you to test, debug and characterize PCI Express U.2 devices and hosts at 8 GT/s.
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Basic Spectrum Analyzer
N9322C
Quickly uncover key insights through fast, value-priced, general-purpose performance up to 7 GHz with -152 dBm DANL and 0.6 dB overall amplitude accuracy Streamlined for straightforward and efficient operation with marker demodulation, one-button optimization, and user-definable soft keys Robust measurement features for easily characterizing your product Automation and communication interface with industry standard SCPI language support and USB and LAN connectivity choices
