Correlators
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Product
Leak Correlators
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Advanced acoustic tools used to detect and pinpoint underground water leaks in pressurized pipe networks.
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Correlative Microscopy
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Our modular software platforms enable you to acquire, process and analyze images in multiple dimensions and over various timepoints
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Phase Noise Analyzer
NXA-26
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This new NXA-26 is a sea-change in Phase Noise Test Systems. Making both residual and absolute noise measurements out to 26.5 GHz, this self-contained instrument uses either internal or external references with cross correlation for maximum dynamic range. The NXA-26 combines over 25 years of Phase Noise Measurement Technology with an easy to navigate user interface. System operation requires minimal training that will have you making measurements in minutes.
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Product
NI-9423, 24 V, 8 Channel (Sinking Input), 1 µs C Series Digital Module
783735-01
Digital Module
24 V, 8 Channel (Sinking Input), 1 µs C Series Digital Module - The NI‑9423 works with industrial logic levels and signals to connect directly to a wide array of industrial switches, transducers, and devices. Each channel is compatible with 24 V logic levels, can accept up to … 30 V discrete logic levels, and has an LED that indicates the status. The NI‑9423 offers isolation between the input and output banks from channel to earth ground. The NI‑9423 is a correlated digital module, so it can perform correlated measurements, triggering, and sychronization when installed in a CompactDAQ chassis.
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Product
Infrastructure Performance Monitoring & Analytics
VirtualWisdom5
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The VirtualWisdom platform provides insights into the performance, availability, health and utilization of your storage infrastructure–across physical, virtual, and cloud environments. This out-of-band solution intelligently correlates and analyzes an unmatched breadth and depth of data via agentless software probes and purpose-built hardware devices, to collect wire-data, the platform intelligently collects, correlates, and analyzes an unmatched breadth and depth of data, transforming it into answers and actionable insights. VirtualWisdom analyzes persisted real-time data directly from your infrastructure – something that no other monitoring solution can do.
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Fibre Channel Test & Simulation Interface for PCI
PCI-FC4
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Avionics Interface Technologies
Supports Point-to-Point, Switched Fabric, and Arbitrated Loop topologies - Two independent Fibre Channel ports - Two SFP sockets accept fiber or copper transceivers - Each port supports 1, 2, and 4 Gbps speeds - Comprehensive decoding of FC-1, FC-2, and Upper Layer Protocol (ULP) frames - Full Error Injection and Detection - IRIG-B Time Code Encoder/Decoder for Data Correlation - In-line Port Configuration for Transparent AnalyzerSupports multiple ULPs including FC-AE-ASM, FC-AE-RDMA, FC-AE-1553, and FC-AV - Compatible with AIT’s fcXplorer GUI Bus Analyzer Software
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Product
ENA-X Vector Network Analyzer
E5081A
Vector Network Analyzer
Our spectral correlation technique directly analyzes the modulated input and output signals in the frequency domain on the network analyzer. Current solutions on the market require a network and spectrum analyzer to characterize components fully. With the new ENA-X, you can ensure test accuracy and repeatability with a single test setup using full vector correction at the DUT plane. Avoid manually reconfiguring setups or automating complex switch-based systems — verify device performance faster and with less error potential with the ENA-X network analyzer.
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Product
PCI-6280 , 16 AI (18-Bit, 625 kS/s), 24 DIO PCI Multifunction I/O Device
779108-01
Multifunction I/O
16 AI (18-Bit, 625 kS/s), 24 DIO PCI Multifunction I/O Device - The PCI‑6280 offers analog input, correlated digital I/O, two 32‑bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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Product
Temperature Controlled Microscope Stage
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Linkham Scientific Instruments
Specialists in temperature controlled microscopy, Linkam Scientific Instruments, announce the launch of their Optical DSC450 which enables simultaneous visualization of thermal processes for improved materials characterisation. The Optical DSC450 enables the user to measure glass transitions and melting behaviour of a wide range of substances whilst accurately controlling temperature from -196 °C to 450 °C. The atmosphere of the stage can also be purged with gas as required by the user. A new feature which will increase the characterisation capabilities of the DSC system is to combine it with imaging capability. The new LINK Digital Imaging module enables additional information to be obtained by correlating optical changes such as colour with temperature. The new TASC analysis tool takes this further. TASC (Thermal Analysis by Surface Characterisation) is a new image analysis capability which enables structural changes in samples to be tracked and quantified optically. It has the unique ability to measure local transition temperatures allowing different points on a sample to be identified. The new DSC system is great tool to use in research and quality control to measure quantitative values for glass transitions, melting peaks and sample purity and, when combined with TASC, even sample homogeneity.
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Product
EYE Super Xenon Tester
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Xenon Tester is the standard climatic wear testing device under domestic and international standards such as ISO, JIS, and ASTM as its light source achieves spectral energy distribution that approximates sunlight which has high correlation to natural outdoor exposure.
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High-Speed Digital Image Correlation System
Q-450
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The 3D High-Speed Image Correlation System Q-450 allows the full-field, non-contact and three-dimensional dynamic measurement of shape, displacements and strains on components and structures made from almost any material. Based on the digital image correlation technique, the Q-450 system is designed for full-field vibration analysis and high speed transient events. This makes it ideal for ballistics testing, fracture mechanics, shock excitations, the Hopkinson Bar test, or Impact Testing.
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Product
PCIe Gen3 Full HD, High Speed, Compact Camera for Testing
CB019CG-LX-X8G3
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Full HD, High speed, compact, fast camera for: Vehicle Impact, Airbag Deployment and Safety Restraints Testing, Digital Image Correlation (DIC), Projectile, Explosives, Ballistics, Combustion and Missile Launch Tracking, Fluid and Flow Visualization, Sports Broadcasting, Commercial Film, Television and Studio Production, Fluidics and Particle Image Velocimetry (PIV), Flat panel inspection (FPD), printed circuit board (PCB) examination and more.
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Product
PCI-6229, 32 AI (16-Bit, 250 kS/s), 4 AO, 48 DIO PCI Multifunction I/O Device
779068-01
Multifunction I/O
32 AI (16-Bit, 250 kS/s), 4 AO, 48 DIO PCI Multifunction I/O Device - The PCI-6229 offers analog I/O, correlated digital I/O, two 32-bit counters/timers, and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.
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Product
External Contact Adapter
DT141
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This MicroLog sensor monitors Reed Relay contacts and switch status (open/closed), to identify the correlation between phenomena such as temperature change and door status.
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Product
Fibre Channel, Ethernet, & MIL-Firewire Protocol Analyzer
Cipher
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Avionics Interface Technologies
Supports Multiple Network Protocols including Ethernet, FibreChannel, & MIL-Firewire (AS5643) - High Performance Filtering & Search - Built-in protocol decoders for: FC-AE-ASM, FC-AE-RDMA, FCAE-1553, AS5643, Ethernet, IPv4, IPv6, UDP - User defined “protocol decoders” for custom & proprietary protocols - Database architecture for handling very large data sets - Multiple, Simultaneous views of data sets with time correlation of data across multiple views. - Compatible with common network analysis tools such as - Wireshark (e.g. Imports/Exports to PCAPNG) - Compatible with AIT’s Fibre Channel Test - Instruments for live capture, triggering, and filtering.
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Phase Noise Analyzer
NXA-6
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This new NXA-6 is a sea-change in Phase Noise Test Systems. Making both residual and absolute noise measurements out to 6 GHz, this self-contained instrument uses either internal or external references with cross correlation for maximum dynamic range.
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Product
Systems for Water Leak Detection
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Here you are getting an overview about our devices for water leak detection. In our portfolio you can find systems for electro-acoustic water leak detection, compact onehand receiver, correlators, stationary noise loggers and a lot more...
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Product
Modulation Distortion Up To And Beyond 125 GHz
S930713B
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S930713B enables fast and accurate active-device modulation distortion characterization under modulated stimulus conditions up to and beyond 125 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S930713B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196C
Test Fixture
The 16196C surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Massively Parallel Parametric Test System
P9001A
In-Circuit Test System
The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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VIS/NIR Sensor
AF26
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The AF26 is a high precision dual channel color sensor for inline operation; the secondary wavelength is designed to compensate the desired light absorbance measurement from any undesired light scattering influence, such as suspended solids, gas bubbles, immiscible fluids or window fouling. The AF26 sensor’s output can be correlated to almost any color scale including APHA and Hazen.
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PXI-6229, 32 AI (16-Bit, 250 kS/s), 4 AO, 48 DIO, PXI Multifunction I/O Module
779115-01
Multifunction I/O
32 AI (16-Bit, 250 kS/s), 4 AO, 48 DIO, PXI Multifunction I/O Module—The PXI‑6229 offers analog I/O, correlated digital I/O, two 32‑bit counter/timers, and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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Modulation Distortion Up To 26.5 GHz
S930702B
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S930702B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 26.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930702B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Mid-Range Gas Filter Correlation CO Analyzer
Model T300M
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Teledyne Advanced Pollution Instrumentation
The Model T300M CO analyzer measures low to mid ranges of carbon monoxide by comparing infrared energy absorbed by a sample to that absorbed by a reference gas according to the Beer-Lambert law. Using a Gas Filter Correlation Wheel, a high-energy IR light source is alternately passed through a CO filled chamber and a chamber with no CO present. The light path then travels through the sample cell, which has a folded path of 2.56 meters.
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Sonin Moisture Test Meter
50211
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The Sonin Moisture Test Meter offers additional features & performance beyond those of the Moisture Test Tool. The meter’s contact probes are at the end of 3 foot coiled cable for detecting moisture in difficult to reach locations. Scale & reference chart correlate relative and moisture percentage readings
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PCIe Gen3 4K Compact, High Speed Camera for Testing
CB120MG-CM-X8G3
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4K, compact, high speed camera for: Vehicle Impact, Airbag Deployment and Safety Restraints Testing, Digital Image Correlation (DIC), Projectile, Explosives, Ballistics, Combustion and Missile Launch Tracking, Fluid and Flow Visualization, Sports Broadcasting, Commercial Film, Television and Studio Production, Fluidics and Particle Image Velocimetry (PIV), Flat panel inspection (FPD), printed circuit board (PCB) examination and more.
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Motadata ServiceOps
Problem Management
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Motadata ServiceOps ITSM platform’s Problem Management solution manages the complete lifecycle of problems faced by different organizations and helps to diagnose and identify the root cause of incidents. The problem management system prevents problems and resulting incidents from happening, eliminates recurring incidents and minimizes the impact of incidents that cannot be prevented with incident management. With Motadata problem management tool, you can easily correlate incident tickets with a problem. The correlated incidents have a distinctive tag to highlight the relationship.
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Hydrogeology
HAPPIE
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The H.A.P.P.I.E. program (Hazard of Aquifer Pollution Potential Impact Evaluation) provides a conservative answer to the problem of determining risk levels in emergency conditions, which means that areas where illegal waste disposal sites, overflows and ruptures of impermeable sheeting are present and where water withdrawal should be discontinued can be identified. H.A.P.P.I.E. in fact offers a conservative response to the problem of the determination of the environmental impact in critical conditions that can usually be correlated to the requirements of defining areas in which the supply operations should be interrupted in emergency conditions, therefore in very short times and without the possibility of obtaining an accurate collection of the hydrogeological data.
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Wafer ESD Tester lineup
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Hanwa Electronic Ind. Co.,Ltd.
◆Correspond to 300mm Wafer. This tester can measure LED or the large sizes Wafer, such as a system LSI. And Zap of HBM/MM can be performed. The Automatic destructive judging by V/I measurement can also be performed after Zap.◆Waveform guarantee in Zap needles. HED-W5100D carries out the calibration before shipment in the place of Zap needles. Therefore, Correlation of the Result of a Package Device becomes clear easily.◆Correspondence to Standards This Tester corresponds to the Standard of JEITA, ESDA, and JEDEC. A Zap unit adopts the plug-in system and also has the waveform of Customer's requests.◆Connection with TLP This Tester is the best for TLP Testing with deep relation of ESD. The protection circuit of a device with an ESD problem is investigated.
