Correlators
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Product
Smart Factory Solutions
Smart4Metrics Factory 4.0
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Teradyne’s Smart4Metrics Factory4.0 solution closely integrates the TestStation in-circuit tester operating conditions, status and health data with existing data collection systems in the factory. By providing a single interface to convey both production data and production tester data, correlation of production results with other equipment or environmental conditions is easily integrated.
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Product
NI-9423, 24 V, 8 Channel (Sinking Input), 1 µs C Series Digital Module
783735-01
Digital Module
24 V, 8 Channel (Sinking Input), 1 µs C Series Digital Module - The NI‑9423 works with industrial logic levels and signals to connect directly to a wide array of industrial switches, transducers, and devices. Each channel is compatible with 24 V logic levels, can accept up to … 30 V discrete logic levels, and has an LED that indicates the status. The NI‑9423 offers isolation between the input and output banks from channel to earth ground. The NI‑9423 is a correlated digital module, so it can perform correlated measurements, triggering, and sychronization when installed in a CompactDAQ chassis.
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Product
Corrosion Analysis
Resipod
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Resipod is a fully integrated 4-point Wenner probe, designed to measure the electrical resistivity of concrete in a completely non-destructive test. It is the most accurate instrument available, extremely fast and stable and packaged in a robust, waterproof housing designed to operate in a demanding site environment. The Resipod is the successor of the classic CNS Farnell Resistivity Meter.Surface resistivity measurement provides extremely useful information about the state of a concrete structure. Not only has it been proven to be directly linked to the likelihood of corrosion and the corrosion rate, recent studies have shown that there is a direct correlation between resistivity and chloride diffusion rate and even to determination of early compressive strength. This makes it one of the most versatile NDT methods for concrete.
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Product
PCE Series Opto-Electric Measurement System
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Hangzhou Everfine Photo-E-Info Co., LTD
This system delivers various photometric, colorimetric and electrical parameters as required by CIE standards.Measurement parameters are luminous flux (with integrating sphere), relative spectral power distribution, chromaticity coordinate, CCT(correlated colour temperature), CRI (color rendering index), SDCM (standard deviation of color matching), color purity, peak wavelength, dominant wavelength, etc.
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Product
NI-9411, ±5 V to 24 V, 6 Differential/Single-Ended Channels, 500 ns C Series Digital Module
779005-02
Digital Module
±5 V to 24 V, 6 Differential/Single-Ended Channels, 500 ns C Series Digital Module - The NI‑9411 works with industrial logic levels and signals for direct connection to a wide array of industrial switches, transducers, and devices. The NI‑9411 is a correlated digital module, so it can perform correlated measurements, triggering, and synchronization when installed in a CompactDAQ chassis.
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Product
Medium-size Reverberation Chamber
E-Series
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The E medium-size multicavity Reverberation Chamber Series represents that state-of-the-art in reverberation chamber technology. The E-Series can make single measurements, batch tests, protocols or campaign tests for different frequency bands, different technologies and different channel models, running overnight without human intervention. Embedded frequency-, mode-, source- and platform-stirring in a double-shielded set of cavities allow Passive MIMO (Efficiency, Correlation, Diversity Gain, MIMO Capacity and others), Active MIMO OTA (TRP, TIS, TPUT, MTS, CQI, M2TxDT, RSRP, MCL and others) and Time-Domain MIMO (DL/UL TCP/UDP TPUT, RMS DS, STD, PL, CBW, Mute%, eNodeB, VDT-OTA) measurements up to 8x8 and 8DLCC to be performed for antennas and devices up to 50cm and 50kg ranging from 2G to 4G, covering all available cellular and wireless technologies to date, including wearables devices, sound acoustic mute, WLAN and W-IoT testing. There is no RC in the market more advanced than the E-Series.
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Product
Phase Noise Analyzer
NXA-6
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This new NXA-6 is a sea-change in Phase Noise Test Systems. Making both residual and absolute noise measurements out to 6 GHz, this self-contained instrument uses either internal or external references with cross correlation for maximum dynamic range.
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Product
Ex-Interface / Multiplexer
IXT0
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Intelligent Ex separation interface for Ex-safe connection of correlation sensors
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Product
Natural Weathering Testing
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Atlas Material Testing Solutions
The increased demand for getting decision-making data as fast as possible makes more and more companies turn to accelerated weathering. But no accelerated weathering program can be complete without the confirmation from and correlation to natural weathering. Natural weathering provides the data you need to ensure that your product is covered against costly liability issues.
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Product
Phase Noise Analyzers
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The phase noise analyzer portfolio from Rohde & Schwarz offers an affordable, mid-range solution with high sensitivity and fast measurements as well as high-end ultra-high-sensitivity solutions with advanced measurements modes. Ideal for phase noise analysis and VCO tests, the industry-leading solutions enable two-path phase noise analysis with real-time cross correlation and fast VCO characterization with built-in low-noise DC sources. Additionally, high-end signal and spectrum analysis can be added into a single box.
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Product
PCIe Gen3 4K at 500 Fps High Speed Compact Camera for Testing
CB160CG-LX-X8G3
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4K at 500 Fps High speed, compact, fast camera for: Vehicle Impact, Airbag Deployment and Safety Restraints Testing, Digital Image Correlation (DIC), Projectile, Explosives, Ballistics, Combustion and Missile Launch Tracking, Fluid and Flow Visualization, Sports Broadcasting, Commercial Film, Television and Studio Production, Fluidics and Particle Image Velocimetry (PIV), Flat panel inspection (FPD), printed circuit board (PCB) examination and more.
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Product
Wafer ESD Tester lineup
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Hanwa Electronic Ind. Co.,Ltd.
◆Correspond to 300mm Wafer. This tester can measure LED or the large sizes Wafer, such as a system LSI. And Zap of HBM/MM can be performed. The Automatic destructive judging by V/I measurement can also be performed after Zap.◆Waveform guarantee in Zap needles. HED-W5100D carries out the calibration before shipment in the place of Zap needles. Therefore, Correlation of the Result of a Package Device becomes clear easily.◆Correspondence to Standards This Tester corresponds to the Standard of JEITA, ESDA, and JEDEC. A Zap unit adopts the plug-in system and also has the waveform of Customer's requests.◆Connection with TLP This Tester is the best for TLP Testing with deep relation of ESD. The protection circuit of a device with an ESD problem is investigated.
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Product
ARINC 429 PMC Interface Module
PMC-429
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Avionics Interface Technologies
4, 8, 16, or 32 Software Programmable Tx/Rx ChannelsProgrammable High/Low Speed Operation - Concurrent operation of all Tx/Rx Channels at high data rates - Conduction-cooling and/or conformal coating available - Designed for extended temperature operations - Rate-oriented Label Transmission - Label Selective Trigger for Capture/Filtering - IRIG-B Time Code Encoder/Decoder for Data Correlation - ANSI Application Interface supporting C++, C#, and .net DevelopmentDevice Driver Support: Windows, Linux, VxWorks, and other operating system - Compatible with AIT’s Flight Simulyzer GUI Bus Analyzer Software
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Product
NI-9474, 30 V, 8-Channel (Sourcing Output), 1 µs C Series Digital Module
779003-01
Digital Module
30 V, 8-Channel (Sourcing Output), 1 µs C Series Digital Module - The NI‑9474 works with industrial logic levels and signals to directly connect to a wide array of industrial switches, transducers, and devices. Each channel is compatible with signals from 5 V to 30 V, features transient overvoltage protection between the output channels and earth ground, and has a LED that indicates the status. The NI‑9474 is a correlated digital module, so it can perform correlated operations, triggering, and synchronization when installed in a CompactDAQ chassis.
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Product
0.3M Integrating Sphere For Leds Luminous Flux Test
CX-0.3S
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Shenzhen Chuangxin Instruments Co., Ltd.
Thesystem are composed of integrating sphere, spectroradiometer and computer to determine the spectroradiometric and colorimetric parameters, e.g. spectral power distribution, chromaticity coordinates, correlated color temperature, color rendering index, color tolerance, color difference, luminous flux, current, voltage, wattage, etc.
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Product
Atomic Force Microscope for SEM/FIB
AFSEM® AFM Insert
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AFSEM is an atomic force microscope (AFM), designed for integration in a SEM or Dualbeam (SEM/FIB) microscope. Its open access design allows you to simultaneously operate SEM and AFM inside the SEM vacuum chamber. The correlated image data of AFM and SEM enable unique characterization of your sample, and the combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEM enables you to easily combine two of the most powerful analysis techniques to greatly extend your correlative microscopy and analysis possibilities.
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Product
Real-time and Direct Correlative Nanoscopy
LabRAM Soleil Nano
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Fully integrated system based on our OmegaScope scanning probe microscope and LabRAM Soleil Raman microscope. LabRAM Soleil Nano offers unprecedented capabilities for direct co-localized AFM-Raman and photoluminescence measurements. AFM imaging modes (topographic, electrical, mechanical, etc.) and Raman acquisition can be performed either sequentially or simultaneously at the same location of the sample surface. Optical nano-resolution is also achievable with Tip-Enhanced Raman Spectroscopy and Photoluminescence (TERS/ TEPL). LabRAM Soleil Nano is compatible with the environmental chamber for AFM and Raman measurements in controlled atmosphere and at low temperatures.
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Product
LED Lighting Test Instrument Integrating Sphere
CX-I.5S
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Shenzhen Chuangxin Instruments Co., Ltd.
Measure Luminous Flux, Luminous efficacy, radiant power, Spectral Power Distribution, Chromaticity Coordinate, Correlated Color Temperature, Peak Wavelength, Dominant Wavelength, Spectral Half Width, Color Rendering Index, Colorimetric Purity, red ratio, Standard deviation of color matching(SDCM), voltage, current, power, power factor, harmonics, and etc. It meets the requirements of CIE standards.
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Product
PXI-6229, 32 AI (16-Bit, 250 kS/s), 4 AO, 48 DIO, PXI Hybrid, Multifunction I/O Module
779630-01
Multifunction I/O
32 AI (16-Bit, 250 kS/s), 4 AO, 48 DIO, PXI Multifunction I/O Module—The PXI‑6229 offers analog I/O, correlated digital I/O, two 32‑bit counter/timers, and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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Product
CellTest Multichannel Potentiostat
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Simultaneous Electrochemical Impedance Spectroscopy (EIS) tests can be run on multiple cells by connecting Solartron 1455A/1451A series frequency response analyzer (FRA) modules to the 1470E. These FRAs can operate in single sine correlation or multi-sine / Fast Fourier Transform (FFT) analysis mode, providing the ultimate in speed, precision and accuracy. The 1455A FRA provides high performance impedance measurements over the frequency range 10 μHz to 1 MHz, while the 1451A FRA operates from 10 μHz to 100 kHz.
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Product
Modulation Distortion Up To And Beyond 125 GHz
S930713B
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S930713B enables fast and accurate active-device modulation distortion characterization under modulated stimulus conditions up to and beyond 125 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S930713B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
Analysis System
Pegasus (EDS-EBSD)
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The Pegasus Analysis System enables the simultaneous collection of Energy Dispersive Spectroscopy (EDS) (chemistry) and Electron Backscatter Diffraction (EBSD) (crystallography) data, allowing direct correlation between the elemental content and microstructural aspects of the material being studied.
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Product
Gas Gravitometers
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Gas gravitometers provide a simple, reliable method of measuring the specific gravity of a gas or analysis of the composition of the process gas when specific gravity can be correlated to composition.
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Product
High Power LED Photo-color-semi Automatic Selector
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Shenzhen Chuangxin Instruments Co., Ltd.
Can divide LED in to several groups by chromatic coordinates, correlated color temperature, dominant wavelength or luminous flux.
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Product
ARINC 429 Test And Simulation VME Module
VME-429
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*8, 16, 32 or 64 software programmable TX / RX channels*Programmable high / low speed operation*Simultaneous operation of all TX / RX channels*PXI interrupts, star trigger, and PXI clock*Error entry and detection*128 MB RAM*Label selective triggering for recording / filtering*IRIG-B timecode encoder / decoder for data correlation*Real-time recording and later analysis of multiple channels*VXI Plug & Play driver including soft front panel*Supports: C, C ++, C # and .net*Driver support: Windows, Linux, VxWorks and other systems
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Product
Concrete Strength Testers
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This category of products comprises the range of instruments utilized to evaluate construction material strength. The range of instruments is typically considered to be two parts. The first are non-destructive field tests of compressive strength. The second are tensile field tester systems to either determine the tensile strength of an overlay or bond material, or tensile strength of anchors embedded in the concrete. The first group is pure Non-Destructive Testing where the strength of the material is determined by correlation to another parameter more easily available and readily apparent. This is typically the hardness of the concrete or the resistance to penetration by either a pin or probe. The Windsor Probe, Windsor Pin and our line of Rebound Hammers all fall within this category. These are widely used standard tests and as such have seen use throughout the world.
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Product
TCSPC Lifetime Fluorometer
DeltaFlex
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The DeltaFlex time correlated single photon counting (TCSPC) system is one of our Delta series of next generation time correlated single photon counting lifetime instrumentation. The DeltaFlex offers the ultimate in flexibility.
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Product
Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
test
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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Product
Spectral Domain Signal Analyzer
Baudline
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Baudline is a time-frequency browser designed for scientific visualization of the spectral domain. Signal analysis is performed by Fourier, correlation, and raster transforms that create colorful spectrograms with vibrant detail. Conduct test and measurement experiments with the built in function generator, or play back audio files with a multitude of effects and filters. The baudline signal analyzer combines fast digital signal processing, versatile high speed displays, and continuous capture tools for hunting down and studying elusive signal characteristics.
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Product
PCIe Gen3 Full HD, High Speed, Compact Camera for
CB019MG-LX-X8G3
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Full HD, High speed, compact, fast camera for: Vehicle Impact, Airbag Deployment and Safety Restraints Testing, Digital Image Correlation (DIC), Projectile, Explosives, Ballistics, Combustion and Missile Launch Tracking, Fluid and Flow Visualization, Sports Broadcasting, Commercial Film, Television and Studio Production, Fluidics and Particle Image Velocimetry (PIV), Flat panel inspection (FPD), printed circuit board (PCB) examination and more.
