Correlators
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Product
Dynamic Calibration for ROSS Streak Cameras
DynaCal
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The DynaCal Optical Calibration Module (OCM) is designed exclusively for the Sydor ROSS Streak Camera to ensure accuracy, both over time and in situ, so you can be confident that the data from your shot is certified to be correlated to the calibration of your camera. The beauty of in situ calibration is that the cost of removing and resetting the camera is avoided—and so is the risk of the replacement of the camera and shifting or disturbing the sensitive nature of streak camera results. Only in situ calibration will reveal the real world effects of EMR, gravity, electronic noise and more when they distort your camera results.
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Product
Emissions Reference Source (ERS)
Emissions
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The ERS is a comb generator that radiates RF continuously every 2MHz over the range 30MHz - 1000MHz. Each 2MHz peak is precisely measured during the calibration process with the ERS orientated both vertically and horizontally. These measurements are correlated against a 3m OATS such that any fully implemented CISPR16 site, measuring at 3m and using height scanning, will read the same.
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Product
ARINC 429 Test And Simulation VME Module
VME-429
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*8, 16, 32 or 64 software programmable TX / RX channels*Programmable high / low speed operation*Simultaneous operation of all TX / RX channels*PXI interrupts, star trigger, and PXI clock*Error entry and detection*128 MB RAM*Label selective triggering for recording / filtering*IRIG-B timecode encoder / decoder for data correlation*Real-time recording and later analysis of multiple channels*VXI Plug & Play driver including soft front panel*Supports: C, C ++, C # and .net*Driver support: Windows, Linux, VxWorks and other systems
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Product
ARINC 429 Test And Simulation PCIe Module
PCIe-C429
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*4, 8, 16 or 32 software programmable TX / RX channels*X4 lane PCI Express host interface*Programmable high / low speed operation*Simultaneous operation of all TX / RX channels*Error entry and detection*128 MB RAM*Label selective triggering for recording / filtering*Sorting according to SDI field*IRIG-B timecode encoder / decoder for data correlation*Real-time recording and later analysis of multiple channels*Supports: C, C ++, C # and .net*Driver support: Windows, Linux, VxWorks and other systems
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Product
PC-Based Time Interval Analyzer
GT658PCI
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GuideTech’s GT658PCI is an ultra-fast, high resolution, DC – 400 MHz Time Interval Analyzer (TIA), ideal for most PC-based lab bench (timing) test applications. What makes the GT 658 superior to traditional counters is analogous to the difference between volt meters & digital scopes. While both measure voltage, the scope provides much more information about the dynamics of the signal. This is because our patented TIA substantially increases measurement speed, and the measurements are displayed as afunction of time. All of these features, along with the benefit of ‘continuous time correlation to a common reference between all measurement time stamps,’ enable our TIAs to make measurements that weren’t previously possible with traditional counters.
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Product
PCIe Gen3 4K at 500 Fps High Speed Compact Camera for Testing
CB160MG-LX-X8G3
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4K at 500 Fps High speed, compact, fast camera for: Vehicle Impact, Airbag Deployment and Safety Restraints Testing, Digital Image Correlation (DIC), Projectile, Explosives, Ballistics, Combustion and Missile Launch Tracking, Fluid and Flow Visualization, Sports Broadcasting, Commercial Film, Television and Studio Production, Fluidics and Particle Image Velocimetry (PIV), Flat panel inspection (FPD), printed circuit board (PCB) examination and more.
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Product
Test Chambers
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The left-hand axis scales the level of the 100 measurements and the right-hand axis displays the uncertainty to a statistical confidence level of 95%; proving the repeatability is better than +/-0.25dB between the measured values. Guaranteeing repeatability, accuracy and correlation across Lab’s, across Production lines and across the World
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Product
Phase Noise Analyzer
NXA-6
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This new NXA-6 is a sea-change in Phase Noise Test Systems. Making both residual and absolute noise measurements out to 6 GHz, this self-contained instrument uses either internal or external references with cross correlation for maximum dynamic range.
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Product
Dual Port Simulator Fiber Channel XMC Module
XMC-FC4 Simulyzer
Simulator
*Two independent fiber channel ports*The two SFPs accept electrical as well as optical transceivers*Each port supports 1, 2, or 4 Gbps*Supports customer-specific defined transmission speed*Comprehensive decoding of FC-1, FC-2 and Upper Layer Protocol (ULP) frames*Triggering and filtering*Supports DMA for high-speed streaming*IRIG-B time code encoder / decoder for data correlation*Supports ULPs such as FC-AE-ASM, FC-AE-RDMA, FC-AE-1553 and FC-AV*Supports HS-1760E applications such as AS5653, AS5652 and AS5627*Optional fcXplorer, Windows-based FC simulation and analysis test software*FC SDK (Software Development Kit) provides drivers and APIs for Windows XP / 7,*Linux, VxWorks, QNX Neutrino RTOS and others on request
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Product
Infrastructure Performance Monitoring & Analytics
VirtualWisdom5
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The VirtualWisdom platform provides insights into the performance, availability, health and utilization of your storage infrastructure–across physical, virtual, and cloud environments. This out-of-band solution intelligently correlates and analyzes an unmatched breadth and depth of data via agentless software probes and purpose-built hardware devices, to collect wire-data, the platform intelligently collects, correlates, and analyzes an unmatched breadth and depth of data, transforming it into answers and actionable insights. VirtualWisdom analyzes persisted real-time data directly from your infrastructure – something that no other monitoring solution can do.
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Product
PCI-6225, 80 AI (16-Bit, 250 kS/s), 2 AO, 24 DIO PCI Multifunction I/O Device
779295-01
Multifunction I/O
80 AI (16-Bit, 250 kS/s), 2 AO, 24 DIO PCI Multifunction I/O Device - The PCI‑6225 offers analog I/O, correlated digital I/O, two 32-bit counters/timers, and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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Product
Wafer ESD Tester lineup
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Hanwa Electronic Ind. Co.,Ltd.
◆Correspond to 300mm Wafer. This tester can measure LED or the large sizes Wafer, such as a system LSI. And Zap of HBM/MM can be performed. The Automatic destructive judging by V/I measurement can also be performed after Zap.◆Waveform guarantee in Zap needles. HED-W5100D carries out the calibration before shipment in the place of Zap needles. Therefore, Correlation of the Result of a Package Device becomes clear easily.◆Correspondence to Standards This Tester corresponds to the Standard of JEITA, ESDA, and JEDEC. A Zap unit adopts the plug-in system and also has the waveform of Customer's requests.◆Connection with TLP This Tester is the best for TLP Testing with deep relation of ESD. The protection circuit of a device with an ESD problem is investigated.
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Product
Modulation Distortion Up To 125 GHz
S930712B
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S930712B enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 125 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S93072B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
NI-9435, ±5 VDC to ±250 VDC/10 VAC to 250 VAC, 4-Channel (Sinking/Sourcing Input), 3 ms C Series Digital Module
779010-01
Digital Module
±5 VDC to ±250 VDC/10 VAC to 250 VAC, 4-Channel (Sinking/Sourcing Input), 3 ms C Series Digital Module - The NI‑9435 works with industrial logic levels and signals to connect directly to a wide array of industrial switches, transducers, and devices. Each channel accepts signals from ±5 VDC to ±250 VDC and 10 VAC to 250 VAC; features transient overvoltage protection between the input channels and earth ground; and has an LED that indicates the status. The NI‑9435 is a correlated digital module, so it can perform correlated operations, triggering, and synchronization when installed in a CompactDAQ chassis.
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Product
Active Monitoring or Synthetic Transactions
CloudReady
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Always-on, end-to-end user experience monitoringNo complex scripting required, Exoprise maintains the actions the sensors takeMonitors app performance via both Web UI and API transactionsFull network path performance information for correlation and outage detection
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Product
PXI-6284, 32 AI (18-Bit, 625 kS/s), 48 DIO, PXI Hybrid, Multifunction I/O Module
779122-01
Multifunction I/O
32 AI (18-Bit, 625 kS/s), 48 DIO, PXI Multifunction I/O Module—The PXI‑6284 offers analog input, correlated digital I/O, two 32‑bit counter/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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Product
Intel Atom® Processor-Based Embedded IoT Gateway Platform
MXE-200i Series
IoT Gateway Platform
ADLINK's new Matrix MXE-200i series Embedded IoT Gateway Platform is based on the Intel Atom® SoC processor E3826 and has superior-class construction meeting a wide variety of specific industrial needs. Supporting Intel® IoT Gateway, with pre-loaded Wind RiverR IDP XT 2.0/3.1 enabling full IoT function, the MXE-200i series offers the most reliable Embedded IoT Gateway for use in harsh environments, compliant with industrial grade EMI/EMS (EN61000-6-4,61000-6-2), protecting customer assets and reducing TCO. Opposing conventional correlations between size and computing power, the MXE-200i series features large-scale performance in an ultra-compact package.
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Product
Ex-Interface / Multiplexer
MPX0
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Intelligent multiplexer for connection of correlation sensors
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Product
PXI-6224, 32 AI (16-Bit, 250 kS/s), 48 DIO, PXI Hybrid, Multifunction I/O Module
779114-01
Multifunction I/O
32 AI (16-Bit, 250 kS/s), 48 DIO, PXI Multifunction I/O Module—The PXI‑6224 offers analog input, correlated digital I/O, two 32‑bit counter/timers, and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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Product
Correlation Analysis
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EDM Modal Correlation Analysis allows the user to correlate two modal models; EMA and/or FEA models. Comparing the experimental data with that acquired through finite element analysis helps in validating the test results. Users can import the geometry model and mode shape data from FEA or EMA software.
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Product
Systems for Water Leak Detection
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Here you are getting an overview about our devices for water leak detection. In our portfolio you can find systems for electro-acoustic water leak detection, compact onehand receiver, correlators, stationary noise loggers and a lot more...
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Product
Modulation Distortion For E5081A Up To 20 GHz
S960704B
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The Keysight S960704B modulation distortion software application enables fast and accurate active device modulation distortion characterization under modulated signal conditions up to 20 GHz. The wide dynamic range and vector error correction of the ENA-X yield an extremely low residual EVM of the test setup, delivering a complete picture of your device’s signal distortion performance without test system interference. S960704B software measures EVM, NPR, ACPR, and decomposes linear and nonlinear signals by spectrally correlating input and output spectrum without needing to demodulate. Integration with the ENA-X measurement flexibility enables quick modulated signal distortion measurements along with traditional VNA tests.
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Product
PXIe-6259, PXIe, 32 AI (16-Bit, 1.25 MS/s), 4 AO, 48 DIO, PXI Multifunction I/O Module
779778-01
Multifunction I/O
The PXIe-6259 offers analog I/O, correlated digital I/O, two 32-bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.
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Product
FLIM Upgrade Kits for LSMs
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As technology leader in equipment and techniques for single photon counting, Becker & Hickl offers a wide range of high-grade Fluorescence Lifetime Imaging (FLIM) systems for laser scanning microscopes since 1998. Our techniques have found broad application within the scope of Life Sciences, Clinical FLIM, Diffuse Optical Tomography (DOT), Fluorescence Correlation (FCS, FCCS), Förster Resonance Energy Transfer (FRET) and more.
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Product
Turbidity Meter
TF16-N
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The TF16-N is a high precision turbidity meter for installation into pipelines measuring scattered and unscattered light at two independent angles in various liquid process streams. The ratio of scattered to un-scattered light can then be correlated.
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Product
Frequency Response Analyser
DP-cPCI-7554
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DP-cPCI-7554 is a cPCI module capable of analyzing the phase and gain characteristics of a system. The system under test is stimulated by the user defined waveform. The obtained response is correlated with the applied stimulus by the on-board DSP processor to determine the phase difference and the gain.Gain and the face analysis is carried out only at sine waveform.
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Product
Calibration and Test Equipment Management
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Is every value precise? The comparability of measurement results has never been more important than in the present era of globalization. The ability to reduce variables to basic units is the fundamental prerequisite to objectively guarantee, increase, and optimize quality. Our calibration service guarantees full correlation to national standards for test equipment of all physical variables – either at our laboratory or on your premises (for measuring tools).
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Product
PXI-6221, 16 AI (16-Bit, 250 kS/s), 2 AO, 24 DIO, PXI Multifunction I/O Module
779629-01
Multifunction I/O
The PXI-6221 offers analog I/O, correlated digital I/O, two 32-bit counters/timers, and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.
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Product
Sonin Moisture Test Meter
50211
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The Sonin Moisture Test Meter offers additional features & performance beyond those of the Moisture Test Tool. The meter’s contact probes are at the end of 3 foot coiled cable for detecting moisture in difficult to reach locations. Scale & reference chart correlate relative and moisture percentage readings
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Product
PXI-6251, 16 AI (16-Bit, 1.25 MS/s), 2 AO, 24 DIO, PXI Multifunction I/O Module
779117-01
Multifunction I/O
The PXI-6251 offers analog I/O, correlated digital I/O, two 32-bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.
